[go: up one dir, main page]

JPS62197720A - Manufacture of color identifying element - Google Patents

Manufacture of color identifying element

Info

Publication number
JPS62197720A
JPS62197720A JP3818486A JP3818486A JPS62197720A JP S62197720 A JPS62197720 A JP S62197720A JP 3818486 A JP3818486 A JP 3818486A JP 3818486 A JP3818486 A JP 3818486A JP S62197720 A JPS62197720 A JP S62197720A
Authority
JP
Japan
Prior art keywords
stem
chip
sealing
vacuum baking
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3818486A
Other languages
Japanese (ja)
Inventor
Mikio Matsumoto
幹雄 松本
Masahiro Ebara
江原 正廣
Kensuke Funabiki
船引 健介
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP3818486A priority Critical patent/JPS62197720A/en
Publication of JPS62197720A publication Critical patent/JPS62197720A/en
Pending legal-status Critical Current

Links

Landscapes

  • Spectrometry And Color Measurement (AREA)
  • Optical Filters (AREA)

Abstract

PURPOSE:To obtain an element free from deterioration or the like in spectral characteristics even when the filling rate of MgF2 film is about 0.7, by executing a vacuum baking before a can sealing to form a film at a normal temperature. CONSTITUTION:First, a photodiode is formed on an Si wafer and a interference filter 2 comprising a multilayer film made up of a Ag and MgF2 is formed on a light receiving surface of the photodiode by vacuum evaporation. Then, this wafer is taken out into outside air divided into one-chip units. Then, one chip element 1 is dye bonded on a stem 6 by a conducting paste or the like and an electrode on the chip 1 is connected to an electrode on the stem 6 by wire bonding using Au wire or the like. The stem 6 is sent into a vacuum baking furnace 11. Then, a door 1a following a sealing chamber 12 of the vacuum baking furnace 11 is opened to send the stem carrying the chip, a cap and the like to the sealing chamber 12 where a can sealing is done. After the sealing, the completed element is taken outside from a take-off port 13.

Description

【発明の詳細な説明】 発明の要約 色識別素子の製造プロセスにおいて、キャンシール前に
真空ベークを実施することにより、それ以前のプロセス
中に吸着した水分を除去した状態でキャンシールに移る
ことができる。これにより2分光特性の再現性がよくな
り1 また経時変化の少ない色識別素子が得られる。
[Detailed Description of the Invention] Summary of the Invention In the manufacturing process of a color identification element, by performing vacuum baking before CanSeal, it is possible to transfer to CanSeal with moisture adsorbed during the previous process removed. can. As a result, 2 the reproducibility of spectral characteristics is improved, 1 and a color discrimination element with little change over time can be obtained.

発明の背景 技術分野 この発明は、被色識別物体の色を識別するために用いら
れる色識別素子の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a color identification element used to identify the color of a color recognition object.

従来技術 色識別素子は通常、ステムと、このステム1−に固定さ
れた素子チップと、素子チップの受光面に光を入射させ
るための入射光用窓を何しかつステムに固定されたキャ
ップとを備えている。素子チップは、一般に、半導体基
板に形成された1個もしくは複数個の受光素子(フォト
ダイオード)と、これらの受光素子の上に形成され、入
射光に対して異なる分光透過特性をHする光学フィルタ
とを備えている。この光学フィルタは干渉フィルタであ
り、それは金属膜と誘電体膜とが交互に積層された多層
膜で構成されており、金属膜としては可視領域で吸収の
ないAgか、誘電体としては所望の分光透過特性を設計
できるよう低屈折率のMgF2が選ばれている。
A conventional color discrimination element usually includes a stem, an element chip fixed to the stem 1-, a cap fixed to the stem, and an incident light window for allowing light to enter the light-receiving surface of the element chip. It is equipped with An element chip generally includes one or more light-receiving elements (photodiodes) formed on a semiconductor substrate, and an optical filter formed on these light-receiving elements and having different spectral transmission characteristics for incident light. It is equipped with This optical filter is an interference filter, and is composed of a multilayer film in which metal films and dielectric films are alternately laminated.The metal film is made of Ag, which has no absorption in the visible region, or the dielectric is made of a desired material. MgF2 with a low refractive index was selected so that the spectral transmission characteristics could be designed.

このような色識別素子は、第5図に示すように、受光素
子をもつ基板上に干渉フィルタを蒸着し、その後、この
基板を分割してチップ化し。
As shown in FIG. 5, such a color discrimination element is produced by depositing an interference filter on a substrate having a light receiving element, and then dividing the substrate into chips.

チップをステム上にダイボンドし、さらにワイヤ・ボン
ディングによって配線を施し、そして最後に入射光用窓
をもつキャップをステムにキャン・シール(バーメチイ
ンク・シール)するというプロセスで製造される。
The chip is die-bonded onto the stem, the wiring is wire bonded, and finally a cap with a window for incident light is can-sealed to the stem.

さて、上記干渉フィルタの多層膜中の最上層のMgF2
の主目的は、その下にあるAg膜を保護することにある
。ところが9M g F 2膜は常温で成膜させると、
充填率が0,7程度の為、真空蒸着装置から取出すとす
ぐに空気中の水分を吸着してしまう。干渉フィルタのM
gF2膜が水分を吸着したままの状態でキャン・シール
されるために次のような問題が生じていた。
Now, MgF2 of the top layer in the multilayer film of the above interference filter
The main purpose of this is to protect the underlying Ag film. However, when a 9M g F 2 film is formed at room temperature,
Since the filling factor is about 0.7, moisture in the air is adsorbed immediately after being taken out from the vacuum evaporation apparatus. M of interference filter
Since the gF2 membrane is can-sealed while adsorbing moisture, the following problems have arisen.

(1)吸着した水の口によりM g F 2膜のみかけ
上の屈折率が変わり1分光特性の再現性が悪くなる。
(1) The apparent refractive index of the M g F 2 film changes due to the presence of adsorbed water, resulting in poor reproducibility of 1-spectral characteristics.

(2)吸着した水が時間がたつにつれてAg膜を酸化し
、光識別能力が低下する。
(2) The adsorbed water oxidizes the Ag film over time, resulting in a decrease in optical discrimination ability.

(3)周囲温度の変化によってキャンプ内で水の吸脱着
が繰返され、その都度2分光特性が変わる。
(3) Adsorption and desorption of water is repeated within the camp due to changes in ambient temperature, and the 2-spectral characteristics change each time.

上述の充填率とは次のような概念をいう。一般に、真空
蒸着法等で成膜させたIIIは、微視的にみると、柱(
コラム)状に結晶成長し、柱と柱の間には空隙がある。
The above-mentioned filling rate refers to the following concept. In general, when III is formed into a film by vacuum evaporation method etc., when viewed microscopically, it looks like a column (
The crystals grow in the form of columns, with voids between the columns.

充填率とは、全薄膜の体積からこの空隙を差引いて得ら
れる結晶の柱の体積の全薄膜の体積に対する割合をいう
。したがって、充填率が1に近いほどその薄膜は緻密で
、0に近いほど粗いことになる。充填率は次式で表わさ
れる。
The filling factor refers to the ratio of the volume of the crystal pillars to the total thin film volume, which is obtained by subtracting the voids from the total thin film volume. Therefore, the closer the filling factor is to 1, the denser the thin film is, and the closer the filling factor is to 0, the coarser it is. The filling rate is expressed by the following formula.

(充填率)−[(薄膜の全体積)−(空隙)コ/(薄膜
の全体積) −(結晶の柱の体積)/ (薄膜の全体積)基板温度を
200℃以上の高温にしてMgF2を成膜させるとその
充填率は1に近づき、特性の変化を防ぐことができる。
(Filling rate) - [(Total volume of thin film) - (Void) / (Total volume of thin film) - (Volume of crystal pillars) / (Total volume of thin film) MgF2 at a high substrate temperature of 200°C or higher When a film is formed, the filling factor approaches 1, and changes in characteristics can be prevented.

しかしながら、高温にすると金属膜であるAgが再配列
を起こし、これによって干渉フィルタの分光特性が変わ
ってしまうという問題が生じる。
However, when the temperature is raised, the Ag metal film rearranges, which causes a problem in that the spectral characteristics of the interference filter change.

発明のlI!E要 発明の目的 この発明は、常温で成膜させてM g F 2膜の充填
率か0.7程度であっても1分光特性の劣化等の生じな
り色識別素子の製造方法を提供することを目r白とする
Invention lI! E. Purpose of the Invention The present invention provides a method for manufacturing a color discrimination element, which does not cause deterioration of spectral characteristics even when the MgF2 film is formed at room temperature and has a filling rate of about 0.7. I take this to heart.

発明の構成と効果 この発明は、ステム上に素子チップを固定しかつ必要な
配線を施こしたのち、入射光用の窓をもつキャップを上
記ステムに被せて封止することによって色識別素子を製
造するものにおいて、上記キャップによる封止工程の直
前に、ステム上の素子チップに真空ベーク工程を実施し
、その後、ステムおよび素子チップを大気にさらすこと
なく封止工程に移ることを特徴とする。
Structure and Effects of the Invention The present invention fixes an element chip on a stem and performs necessary wiring, and then covers the stem with a cap having a window for incident light to seal the color identification element. Immediately before the sealing process with the cap, the device chip on the stem is subjected to a vacuum baking process, and then the sealing process is performed without exposing the stem and the device chip to the atmosphere. .

キャン・シール直前に、真空ベーク工程を施すことによ
って、製造プロセス中で吸着した水分等を素子チップ等
から除去することかでき、これによって素子チップは乾
燥された状態でキャン・シールされる。したがって、M
gF2膜の屈折率は一定となり2分光特性の再現性がよ
い、水分を含まないため、Ag膜の酸化もなく色識別能
力の経時変化が少ない、さらに1分光特性の温度変化も
少ない、といった効果が得られる。
Immediately before can-sealing, a vacuum baking process is performed to remove moisture adsorbed during the manufacturing process from the element chip, etc., so that the element chip is can-sealed in a dry state. Therefore, M
The refractive index of the gF2 film is constant and the reproducibility of the 2-spectral characteristics is good.Since it does not contain water, there is no oxidation of the Ag film, so there is little change in color discrimination ability over time, and there is also little temperature change in the 1-spectral characteristics. is obtained.

この発明は、−チップ上に複数の受光素子を設け、これ
らの受光素子上に相互に穴なる分光特性をもつ干渉フィ
ルタを形成した色識別素子のみならず、−チップ上に一
個の受光素子を設けこの受光素子上に特定波長の通過帯
域をもつ干渉フィルタを形成した単色用の素子にも適用
可能であるのはいうまでもない。
This invention is applicable not only to a color discrimination element in which a plurality of light receiving elements are provided on a chip and an interference filter having mutually holed spectral characteristics is formed on these light receiving elements; Needless to say, the present invention can also be applied to a monochromatic element in which an interference filter having a passband of a specific wavelength is formed on the light receiving element.

実施例の説明 第2図は、製造された色識別素子の(1−製造を示して
いる。Siチップ1には、受光素子としてのフォトダイ
オードが腹数個設けられており、これらのフォトダイオ
ードの受光面上に相互に分光透過特性の異なる干渉フィ
ルタ2が形成されている。このようなチップ1はステム
6上に導電的に固定され、かつ各フォトダイオードの端
子がステム6に設けられた端子にワイヤ・ボンディング
されている(ワイヤを4で示す)。そして、チップ1を
乗せたステム6に、入射光を通過させる窓すなイつちガ
ラス窓3をもつキャップ5が肢せられ。
DESCRIPTION OF EMBODIMENTS FIG. 2 shows (1-manufacturing) of a manufactured color identification element. The Si chip 1 is provided with several photodiodes as light receiving elements, and these photodiodes Interference filters 2 having mutually different spectral transmission characteristics are formed on the light receiving surface of the chip 1. Such a chip 1 is conductively fixed on a stem 6, and the terminals of each photodiode are provided on the stem 6. Wire bonding is made to the terminals (the wires are indicated by 4).The stem 6 carrying the chip 1 is then provided with a cap 5 having a window, i.e. a glass window 3, through which incident light passes.

気密に封止(キャン・シール)されている。Can-sealed.

このような色識別素子は、第1図に示す工程によって製
造される。
Such a color identification element is manufactured by the steps shown in FIG.

まず、S1ウエハ上にフォトダイオードを形成し、この
フォトダイオードの受光面上にAgとMgF2との多層
膜からなる干渉フィルタを真空蒸着法により形成する。
First, a photodiode is formed on the S1 wafer, and an interference filter made of a multilayer film of Ag and MgF2 is formed on the light receiving surface of the photodiode by vacuum evaporation.

このウェハを大気中に取出し、lチップずつにプレキン
グする。すなわち分割する。
This wafer is taken out into the atmosphere and pre-kneaded into one chip at a time. In other words, divide.

1チツプ素子1をステム6上に導電性ペースト等により
ダイボンドし、Au線等によるワイヤボンディングによ
ってチップ1上の電極をステム6七の電極に接続する。
The one-chip element 1 is die-bonded onto the stem 6 using a conductive paste or the like, and the electrodes on the chip 1 are connected to the electrodes of the stem 67 by wire bonding using Au wire or the like.

この後、チップ1を乗せたステム6は、必要ならばこの
ステム6に披せられるキャップ5とともに真空ベーク工
程に送られる。真空ベーク工稈とは、第3図に示すよう
に、真空ベーク炉11を真空装置14によって真空に引
きかつ炉ll内のヒータ15によって適温まで温度を上
げ、この炉11内に導入されたステム、ステム上のチッ
プ、チップ−トの干渉フィルタ、キャップ等に吸着して
いるN20やその他のガスを除去する工程である。この
真空べ−り処理ののち、真空ベーク炉11内にN2ガス
を導入して常圧に戻す。真空ベークの条件としては、た
とえば真空度1O−ITorr、温度150’c、時間
90分である。
After this, the stem 6 carrying the chip 1 is sent to a vacuum baking process together with the cap 5 that can be placed on the stem 6 if necessary. As shown in FIG. 3, a vacuum baking process is a process in which a vacuum baking furnace 11 is evacuated by a vacuum device 14, the temperature is raised to an appropriate temperature by a heater 15 in the furnace 11, and a stem introduced into the furnace 11 is heated to an appropriate temperature. This is a process to remove N20 and other gases adsorbed on the tip on the stem, the interference filter of the tip, the cap, etc. After this vacuum baking process, N2 gas is introduced into the vacuum baking furnace 11 to return it to normal pressure. The vacuum baking conditions are, for example, a degree of vacuum of 10-ITorr, a temperature of 150'C, and a time of 90 minutes.

真空ベーク炉11にはハーメチック・シール室12が直
結しており、この室12内もまたN2ガス雰囲気に保た
れている。真空ベーク炉11のシール室12に続く扉1
1aを開けることにより、チップを搭載したステム、キ
ャップ等をシール室12に送り、ここでキャン伊シール
する。すなわち、ステム6上にキャップ5が被せられ電
気溶接によって封止される。この封止の・のち2完成し
た色識別素子は取出口13から外部に取出される。
A hermetic seal chamber 12 is directly connected to the vacuum baking furnace 11, and the inside of this chamber 12 is also maintained in an N2 gas atmosphere. Door 1 leading to seal chamber 12 of vacuum baking furnace 11
By opening 1a, the stem, cap, etc. on which the chip is mounted are sent to the sealing chamber 12, where they are sealed. That is, the cap 5 is placed on the stem 6 and sealed by electric welding. After this sealing, the completed color identification element is taken out from the exit port 13.

このように、真空ベーク炉からハーメチック・シール室
まで試料は常にN2ガス中に保たれ。
In this way, the sample is always kept in N2 gas from the vacuum baking oven to the hermetic seal chamber.

大気にふれることはなく、真空ベークによってH,O等
が除去されているから、もはや色識別素子のキャップ内
のチップ等にH20等が付着することはない。
Since it is not exposed to the atmosphere and H, O, etc. are removed by vacuum baking, H20 etc. will no longer adhere to the chip etc. inside the cap of the color identification element.

第4図は、上述の方法によって製造された色識別素子と
従来の方法で製造された色識別素子の光電流の経時変化
の比較を示すものである。Aで示すものがこの発明の製
造方法によって真空ベーク工程を施こした素子の特性で
あり、Bが真空べ一り工程を施こさない従来の素子の特
性である。このグラフからも明らかなように、この発明
の方法によって製造された色識別素子の特性の経時変化
はきわめて小さく、信頼性が向1−シている。
FIG. 4 shows a comparison of photocurrent changes over time between a color discrimination element manufactured by the above-described method and a color discrimination element manufactured by a conventional method. The characteristics indicated by A are the characteristics of the device subjected to the vacuum baking process according to the manufacturing method of the present invention, and the characteristics shown by B are the characteristics of the conventional device not subjected to the vacuum baking process. As is clear from this graph, the changes over time in the characteristics of the color discrimination element manufactured by the method of the present invention are extremely small, and the reliability is very low.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、この発明による色識別素子の製造工程を示す
フロー・チャート、第2図は製造された色識別素子の構
造を示す断面図、第3図は真空ベーク炉とハーメチック
・シール室とを示す概略構成図、第4図は、この発明の
方法によって製造された色識別素子と従来の方法によっ
て製造された素子との光電流の経時変化の比較を示すグ
ラフである。 第5図は従来の製造工程を示すフロー・チャートである
。 1・・・Siチップ、    2・・・干渉フィルタ。 3・・・ガラス窓、     4・・・ワイヤ。 5・・・キャップ、     6・・・ステム。 11・・・真空ベーク炉。 12・・・ハーメチック・シール室。 以  上
Figure 1 is a flow chart showing the manufacturing process of a color identification element according to the present invention, Figure 2 is a sectional view showing the structure of the manufactured color identification element, and Figure 3 is a diagram showing a vacuum baking furnace and a hermetic seal chamber. FIG. 4 is a graph showing a comparison of photocurrent changes over time between a color discrimination element manufactured by the method of the present invention and an element manufactured by a conventional method. FIG. 5 is a flow chart showing a conventional manufacturing process. 1...Si chip, 2...Interference filter. 3...Glass window, 4...Wire. 5...Cap, 6...Stem. 11...Vacuum baking oven. 12...Hermetic seal chamber. that's all

Claims (1)

【特許請求の範囲】 ステム上に素子チップを固定しかつ必要な配線を施こし
たのち、入射光用の窓をもつキャップを上記ステムに被
せて封止することによって色識別素子を製造するものに
おいて、 上記キャップによる封止工程の直前に、 ステム上の素子チップに真空ベーク工程を実施し、 その後、ステムおよび素子チップを大気にさらすことな
く封止工程に移ることを特徴とする、色識別素子の製造
方法。
[Scope of Claims] A color identification element is manufactured by fixing an element chip on a stem and performing necessary wiring, and then covering and sealing the stem with a cap having a window for incident light. Immediately before the sealing process with the cap, the element chip on the stem is subjected to a vacuum baking process, and then the sealing process is carried out without exposing the stem and the element chip to the atmosphere. Method of manufacturing elements.
JP3818486A 1986-02-25 1986-02-25 Manufacture of color identifying element Pending JPS62197720A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3818486A JPS62197720A (en) 1986-02-25 1986-02-25 Manufacture of color identifying element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3818486A JPS62197720A (en) 1986-02-25 1986-02-25 Manufacture of color identifying element

Publications (1)

Publication Number Publication Date
JPS62197720A true JPS62197720A (en) 1987-09-01

Family

ID=12518291

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3818486A Pending JPS62197720A (en) 1986-02-25 1986-02-25 Manufacture of color identifying element

Country Status (1)

Country Link
JP (1) JPS62197720A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60789A (en) * 1983-06-16 1985-01-05 Matsushita Electric Ind Co Ltd Semiconductor laser device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60789A (en) * 1983-06-16 1985-01-05 Matsushita Electric Ind Co Ltd Semiconductor laser device

Similar Documents

Publication Publication Date Title
DE69929042T2 (en) METHOD OF MANUFACTURING A SEMICONDUCTOR PAD WITH SEALED CHAMBERS
EP1049921B1 (en) Micromachined gas-filled chambers and method of microfabrication
US4426769A (en) Moisture getter for integrated circuit packages
US6753526B2 (en) Radiation detectors and methods for manufacturing them
US6018211A (en) Surface acoustic wave device and method of manufacturing the same
JPH0369171A (en) Thin film photoelectric panel and manufacture thereof
CN101691200A (en) Low temperature vacuum encapsulation structure of non-refrigeration infrared detector and manufacturing method thereof
FR2815953A1 (en) MICROMECHANICAL COMPONENT AND METHOD FOR MANUFACTURING SUCH COMPONENT
EP1518279A2 (en) Device for maintaining an object under vacuum and methods for making same, use in non-cooled infrared sensors
JPS612371A (en) Semiconductor photodetector
JPS62197720A (en) Manufacture of color identifying element
EP2172753B1 (en) A method for manufacturing infrared sensor on a wafer basis
US6156483A (en) Integrated optical devices
EP2172755A1 (en) Infrared sensor with front side bandpass filter and vacuum cavity
EP0209425A1 (en) Method for producing a semiconductor device with several levels of gates
JPH0680695B2 (en) Semiconductor device
CN105990377A (en) CMOS image sensor and formation method thereof
JPS62197721A (en) Color identifying element
CN108281437A (en) The backside structure and preparation method of back side illumination image sensor
JPS6028148B2 (en) photodiode
EP2172754A1 (en) Infrared sensor with back side infrared filter
CN113161442A (en) Silicon schottky junction line array near infrared photoelectric detector
CN115576043A (en) Long-wave-pass infrared filter, preparation method thereof and infrared thermometer
CN220897091U (en) Thermopile chip structure of integrated lens
JPH04250665A (en) Mounting method for solid state image sensor