[go: up one dir, main page]

JPS62187143A - Method for processing glass - Google Patents

Method for processing glass

Info

Publication number
JPS62187143A
JPS62187143A JP2781886A JP2781886A JPS62187143A JP S62187143 A JPS62187143 A JP S62187143A JP 2781886 A JP2781886 A JP 2781886A JP 2781886 A JP2781886 A JP 2781886A JP S62187143 A JPS62187143 A JP S62187143A
Authority
JP
Japan
Prior art keywords
pattern
photosensitive film
glass
light
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2781886A
Other languages
Japanese (ja)
Inventor
Takashi Hatano
秦野 高志
Toru Iseda
徹 伊勢田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP2781886A priority Critical patent/JPS62187143A/en
Publication of JPS62187143A publication Critical patent/JPS62187143A/en
Pending legal-status Critical Current

Links

Landscapes

  • Manufacturing Optical Record Carriers (AREA)
  • Surface Treatment Of Glass (AREA)

Abstract

PURPOSE:To form a pattern having high dimensional precision on the glass surface with high productivity by forming a two-dimensional pattern on a photosensitive film provided on the glass surface, removing the photosensitive film on the pattern part, and then etching the film. CONSTITUTION:One or plural two-dimensional patterns are compositely formed on the photosensitive film provided on the glass surface, and exposed by a photomagnetic method to form the desired two-dimensional pattern. As the photomagnetic method, a photomask is arranged by a contact or proximity method, and UV light or Deep UV light is irradiated. An amorphous chalcogenide vapor-deposited film having 0.01-0.3mum thickness is appropriately used as the photosensitive film. Subsequently, when the photosensitive film is of positive type, the pattern forming part is removed by etching, etc., or the non-photosensitized part is removed when the film is of negative type. Then the obtained exposed part of glass is etched by RIE, plasma etching, etc. Consequently, a pattern of micron order or below is formed on the glass surface.

Description

【発明の詳細な説明】 [産業上の利用分野1 ガラスの加工方法、特に光ディスクまたは光磁気ディス
ク用の溝付き基板の製造技術に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field 1] The present invention relates to a glass processing method, particularly to a manufacturing technique for grooved substrates for optical disks or magneto-optical disks.

[従来の技術] 溝付き基板には、グループ法と2F(フォトポリマー)
法との二方法がある。グループ法は、ポジ型レジストの
場合には2ガラス板に7オトレジスト(以下レジストと
記す)を塗布したのちレーザー光で渦巻きまたは同心円
のパターンを点図形の連続として描いたのちエツチング
等の方法により感光部分を除去しくネガ型レジストの場
合は非感光性部分を除去する)ガラスを露出させる。こ
のあとRIE (反応性イオンエツチング)などの方法
でガラスの露出部分をエツチング加工し所定のパターン
を得る。2P法は感光性樹脂を用いガラス面に凹凸の膜
面を積上げ構成する方法で、ガラスを除去するグループ
法とは原理的に異なる。
[Conventional technology] Group method and 2F (photopolymer) are used for grooved substrates.
There are two ways with the law. In the case of a positive resist, the group method involves coating two glass plates with a 7-photoresist (hereinafter referred to as resist), drawing a spiral or concentric circle pattern as a series of dots with a laser beam, and then exposing the resist to light using a method such as etching. Remove the non-photosensitive parts (in the case of a negative resist) to expose the glass. Thereafter, the exposed portion of the glass is etched using a method such as RIE (reactive ion etching) to obtain a predetermined pattern. The 2P method is a method in which a photosensitive resin is used to build up an uneven film surface on a glass surface, and is fundamentally different from the group method in which glass is removed.

[発明の解決しようとする問題点] 溝パターンは通常中0.8μ腫、ピッチ1.6μ厘、深
さ0.07μ鳳で、円板口径3.5”(インチ、以下同
じ)ないし5.25″である。レーザー光線でこのパタ
ーンを描くのに約20分を要す、この工程がガラスの溝
付き基板の製造速度を決定して生産効率がよくない、ま
た同機能を狙う2P法の場合はガラス表面にポリマーが
存在することで記録膜の耐久性の点で信頼性に乏しいこ
とと、材料コストの高い欠点があり、また射出成形でで
きるプラスチックの溝付き基板は信頼性および寸法精度
の点で問題があり、ガラスのもつ安定性に大きく及ばな
い。
[Problems to be Solved by the Invention] The groove pattern is usually 0.8 μm in diameter, 1.6 μm in pitch, 0.07 μm in depth, and has a disc diameter of 3.5 inches (inches) to 5.5 inches. It is 25″. It takes about 20 minutes to draw this pattern with a laser beam, and this process determines the manufacturing speed of the glass grooved substrate, making it inefficient.Also, in the case of the 2P method, which aims at the same function, polymer is applied to the glass surface. Due to the presence of , the recording film is unreliable in terms of durability and the material cost is high.Furthermore, the plastic grooved substrate made by injection molding has problems in terms of reliability and dimensional accuracy. , the stability is far inferior to that of glass.

[問題点を解決するための手段] ミクロンオーダーないしそれ以下の微細寸法のパターン
をガラス面に形成するのに、1個の2次元パターンない
し複数個の2次元パターンの複合により所望のパターン
を、ガラス表面に設けた感光性膜面内に、電磁光学的な
方法で形成したのちエツチング等の方法により、ポジ型
レジストの場合はこの部分を除去しくネガ型レジストの
場合は非感光性部分を除去する)てガラスの露出面をつ
くり、次いでこの部分をRIEなどの方法でエツチング
する。
[Means for solving the problem] In order to form a pattern with minute dimensions on the order of microns or smaller on a glass surface, a desired pattern is formed by using one two-dimensional pattern or a combination of a plurality of two-dimensional patterns. A photosensitive film is formed on the glass surface using an electromagnetic optical method, and then etched or other methods are used to remove this part in the case of a positive resist or remove the non-photosensitive part in the case of a negative resist. The exposed surface of the glass is then etched using a method such as RIE.

前記電磁光学的な方法としては、UV光(紫外光、波長
的300〜400nm)あるいはDeepU V光(遠
紫外光、波長約200〜300n層)による照射を採用
することができる。
As the electromagnetic optical method, irradiation with UV light (ultraviolet light, wavelength of about 300 to 400 nm) or deep UV light (far ultraviolet light, wavelength of about 200 to 300 nm) can be employed.

[実施例1 実施例1 露光装置:キャノンP L A−5213マスク配位モ
ード:ソフトコンタクト 光源: soow高圧水銀灯、入= 29hmマスク:
 DNP解像力チャート4″ (0,5゜0.75.1
.0μ層のポジおよびネガパターン付) ガラス:ソーダライムガラス、板厚2■■レジスト(感
光性II) :東京応化製0DUR1000、0,4μ
層厚 露光: 49.58.113. f19 (謹J/c■
2)現像:東京応化製1010現像液で23℃、 2m
1n。
[Example 1 Example 1 Exposure device: Canon PLA-5213 Mask arrangement mode: Soft contact Light source: SOOW high pressure mercury lamp, ON = 29hm Mask:
DNP resolution chart 4″ (0.5°0.75.1
.. Glass: Soda lime glass, plate thickness 2■■Resist (photosensitive II): 0DUR1000 manufactured by Tokyo Ohka, 0.4μ
Layer thickness exposure: 49.58.113. f19 (J/c)
2) Development: 23°C, 2m using Tokyo Ohka 1010 developer
1n.

リンス二東京応化製リンサー、23℃、11n。Rinse Ni Tokyo Ohka Rinser, 23°C, 11n.

0.5終■の線巾のパターンを形成するのに、53mJ
/c肩2の露光が最適なことを光学顕微鏡による観察で
得た。この条件でパターンを形成したガラスをRIE装
置にかけ同寸法のパターンをガラス表面に形成した。ガ
ラスのRIE加工は次の要領で行った。
To form a pattern with a line width of 0.5 mm, it takes 53 mJ.
Observation using an optical microscope revealed that the exposure of /c shoulder 2 was optimal. The glass patterned under these conditions was subjected to RIE equipment to form a pattern of the same size on the glass surface. RIE processing of glass was performed in the following manner.

RIE装置:キヤノンGIR−280 エツチング条件: ガス  02F630 cm3/5inHe   80
   // 圧力  100 Pa 電力  30〇一 時間  1層in。
RIE device: Canon GIR-280 Etching conditions: Gas 02F630 cm3/5inHe 80
// Pressure 100 Pa Power 30〇1 hour 1 layer in.

この結果、線巾はマスクと同一で深さ700人のパター
ンをガラス表面上に形成できた。
As a result, a pattern with the same line width as the mask and a depth of 700 people could be formed on the glass surface.

実施例2 露光装置:キャノンM P A −500FAマスク配
位モード:ソフトコンタクト 光源: 500w高圧水銀灯  入= 290mmマス
ク: DNP解像力チャート4″(0,5゜0.75.
1.0μ層のポジおよびネガパターン付) ガラス:ソーダライムガラス、°板厚2■■レジスト(
感光性膜)  : As2S3.0.IJAll厚霧光
:  100mJ/crn’ 現像: NaOHおよびNa2HPO4の水溶液(PH
=11.8) 、 23℃、 2++in。
Example 2 Exposure device: Canon MPA-500FA Mask Coordination mode: Soft contact Light source: 500W high pressure mercury lamp On = 290mm Mask: DNP resolution chart 4'' (0.5° 0.75.
(With 1.0μ layer positive and negative pattern) Glass: Soda lime glass, ° board thickness 2■■Resist (
Photosensitive film): As2S3.0. IJAll thick fog light: 100 mJ/crn' Development: NaOH and Na2HPO4 aqueous solution (PH
= 11.8), 23°C, 2++in.

0.5μmの線巾のパターンを形成し、このガラスをR
IE装置にかけ同寸法のパターンを700人の深さにガ
ラス表面に形成できた、RIEの加工条件は実施例の1
に同じ。
A pattern with a line width of 0.5 μm was formed, and this glass was
The RIE processing conditions were as in Example 1, and a pattern of the same size could be formed on the glass surface to a depth of 700 mm using the IE device.
Same as .

[発明の効果] 1、本発明によれば1個の2次元パターンによる全面の
同時露光または複数個の2次元パターンの複合自合成に
よりパターンをガラス面に形成することができるのでパ
ターンの寸法精度が極めて高い、グループ法や2P法に
おけるレーザー光による直接描画の場合には被露光物ま
たは光源の駆動が必要であるが、機械動作には寸法誤差
を生じやすく、精度を確保するのに著しく精巧な機械装
置を必要とするのに対し、本発明の方法は極めて有利で
ある。
[Effects of the Invention] 1. According to the present invention, a pattern can be formed on a glass surface by simultaneous exposure of the entire surface with one two-dimensional pattern or by composite self-synthesis of a plurality of two-dimensional patterns, thereby improving the dimensional accuracy of the pattern. In the case of direct writing using laser light in the group method or 2P method, which has extremely high However, the method of the present invention is highly advantageous.

2、本発明によれば、ガラス面に塗布したレジスト膜へ
の露光はマスクを使う方法により数秒の短時間で行うこ
とができる。一方上記レーザー光による直接描画では数
十分の時間を要するので、本発明の方法は著しく生産性
で優れる。
2. According to the present invention, the resist film applied to the glass surface can be exposed to light in a short time of several seconds by using a mask. On the other hand, since direct drawing using the laser beam described above requires several tens of minutes, the method of the present invention is extremely superior in productivity.

Claims (3)

【特許請求の範囲】[Claims] (1)ミクロンオーダーないしそれ以下の微細寸法のパ
ターンをガラス面に形成する方法において、1個の2次
元パターンないし複数個の2次元パターンの複合により
、2次元の所望のパターンを、ガラス表面に設けた感光
性膜に電磁光学的な方法で露光して形成させたのち、エ
ッチング等の方法により (イ)該感光性膜がポジ型感光性膜の場合は前記所望の
パターンの形成部分を除去し あるいは、 (ロ)該感光性膜がネガ型感光性膜の場合は前記所望の
パターンの形成部分以外の感 光性膜部分を除去し てガラスの露出部分をつくり、次いで該露出部分をRI
E(反応性イオンエッチング)、プラズマエッチングな
どの方法によりエッチングすることを特徴とするガラス
の加工方 法。
(1) In a method of forming a pattern with minute dimensions on the order of microns or smaller on a glass surface, a desired two-dimensional pattern is formed on the glass surface by one two-dimensional pattern or a combination of multiple two-dimensional patterns. After forming the provided photosensitive film by exposing it to light using an electromagnetic optical method, (a) if the photosensitive film is a positive photosensitive film, remove the portion where the desired pattern is formed by a method such as etching; or (b) if the photosensitive film is a negative photosensitive film, remove the photosensitive film portion other than the desired pattern forming portion to create an exposed portion of glass, and then apply RI to the exposed portion.
A glass processing method characterized by etching using methods such as E (reactive ion etching) and plasma etching.
(2)前記所望のパターンを前記感光性膜に電磁光学的
な方法で露光して形成させるに際し、フォトマスクをコ
ンタクトまたはプロキシミティの方法で配置し、UV光
またはDeepUV光(遠紫外光)を用いることを特徴
とする特許請求の範囲第1項記載のガラス加工方法。
(2) When forming the desired pattern on the photosensitive film by exposing it to light using an electromagnetic optical method, a photomask is arranged by a contact or proximity method, and UV light or deep UV light (far ultraviolet light) is applied. A glass processing method according to claim 1, characterized in that the glass processing method is used.
(3)前記感光性膜として、0.01〜0.3μmの範
囲の厚さに設けた非晶質カルコゲナイドの蒸着膜を用い
ることを特徴とする特許請求の範囲第1項記載のガラス
の加工方法。
(3) Processing of glass according to claim 1, characterized in that the photosensitive film is a vapor-deposited film of amorphous chalcogenide with a thickness in the range of 0.01 to 0.3 μm. Method.
JP2781886A 1986-02-13 1986-02-13 Method for processing glass Pending JPS62187143A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2781886A JPS62187143A (en) 1986-02-13 1986-02-13 Method for processing glass

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2781886A JPS62187143A (en) 1986-02-13 1986-02-13 Method for processing glass

Publications (1)

Publication Number Publication Date
JPS62187143A true JPS62187143A (en) 1987-08-15

Family

ID=12231541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2781886A Pending JPS62187143A (en) 1986-02-13 1986-02-13 Method for processing glass

Country Status (1)

Country Link
JP (1) JPS62187143A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2608589A1 (en) * 1986-12-23 1988-06-24 Glaverbel GLASS ARTICLE CARRYING A SERIOUS DRAWING AND METHOD FOR MANUFACTURING SUCH A ARTICLE
EP0407993A2 (en) * 1989-07-14 1991-01-16 Hoechst Aktiengesellschaft Liquid crystal display with structured substrates and method of making structured substrates

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2608589A1 (en) * 1986-12-23 1988-06-24 Glaverbel GLASS ARTICLE CARRYING A SERIOUS DRAWING AND METHOD FOR MANUFACTURING SUCH A ARTICLE
BE1003081A3 (en) * 1986-12-23 1991-11-19 Glaverbel GLASS ARTICLE CARRYING A SERIOUS DESIGN AND METHOD FOR MANUFACTURING SUCH AN ARTICLE.
EP0407993A2 (en) * 1989-07-14 1991-01-16 Hoechst Aktiengesellschaft Liquid crystal display with structured substrates and method of making structured substrates

Similar Documents

Publication Publication Date Title
JP3006199B2 (en) Optical disc manufacturing method
US6671034B1 (en) Microfabrication of pattern imprinting
CN111606300A (en) Method for manufacturing high aspect ratio nano grating
JP2004304097A (en) Pattern forming method, and manufacturing method for semiconductor device
TWI765314B (en) Transfer roller, manufacturing method of transfer roller, optical film, and manufacturing method of optical film
JP5574802B2 (en) Manufacturing method of structure
JP2004013973A (en) Manufacturing method of photoresist master disk, manufacturing method of stamper for producing optical recording medium, stamper, photoresist master disk, stamper intermediate body and optical recording medium
JPS62187143A (en) Method for processing glass
US7354699B2 (en) Method for producing alignment mark
JP2005354017A (en) Optically-hardening reaction control imprint mold and imprint processing method using the same, and imprint processed product
CN1996141A (en) Impression die with zero film thickness and impression-photoetched pattern transferring method
CN104698745A (en) Method for manufacturing size-controlled nano block
US20030063553A1 (en) Manufacturing method of stamper for optical information medium, photoresist master therefor, stamper for optical information medium and optical information medium
CN114200797B (en) Mask for splicing and aligning nano-imprint metal grating and metal grating splicing method
JPH06119661A (en) Stamper and production of stamper
TWI742901B (en) Manufacturing method of transfer roller and manufacturing method of transfer film
JP2010080011A (en) Mold structure and method of manufacturing the same, plate for imprint and method of manufacturing the same, method of imprinting, and magnetic recording medium and method of manufacturing the same
JP2012009776A (en) Method of manufacturing substrate
JPH0128374B2 (en)
JPH02170994A (en) Production of metal mold for duplicating fine pattern
JPH02245322A (en) Manufacture of stamper for optical disc and of optical disc board utilizing the same
JP2995755B2 (en) Manufacturing method of stamper
JP2995754B2 (en) Manufacturing method of stamper
JPH02245321A (en) Manufacture of stamper for optical disc and of optical disc board utilizing the same
JPH04327912A (en) Manufacture of molding tool for molding micro-recessed and projected pattern