JPS62173045U - - Google Patents
Info
- Publication number
- JPS62173045U JPS62173045U JP6160586U JP6160586U JPS62173045U JP S62173045 U JPS62173045 U JP S62173045U JP 6160586 U JP6160586 U JP 6160586U JP 6160586 U JP6160586 U JP 6160586U JP S62173045 U JPS62173045 U JP S62173045U
- Authority
- JP
- Japan
- Prior art keywords
- optical disk
- readout signal
- measuring device
- scratch
- reference level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Signal Processing For Digital Recording And Reproducing (AREA)
- Optical Recording Or Reproduction (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
第１図は本考案の光デイスクのキズ測定装置の
一実施例を示す構成図、第２図はその動作状態を
示す波形図、第３図は従来の光デイスクのキズ測
定装置の一例を示す構成図、第４図および第５図
はその動作状態を示す波形図である。
１……光デイスク、２……測定ヘツド、３……
比較回路、４……ハイパスフイルタ、５……キズ
パルス分析器。
Fig. 1 is a configuration diagram showing an embodiment of the optical disc scratch measuring device of the present invention, Fig. 2 is a waveform diagram showing its operating state, and Fig. 3 is an example of a conventional optical disc scratch measuring device. The configuration diagram, FIGS. 4 and 5 are waveform diagrams showing the operating state thereof. 1... Optical disk, 2... Measuring head, 3...
Comparison circuit, 4...high pass filter, 5...flaw pulse analyzer.
Claims (1)
定の基準レベルと比較し読出し信号のレベル変化
からキズの有無を検出するようにした光デイスク
のキズ測定装置において、前記読出し信号を基準
レベルと比較する比較回路の前にハイパスフイル
タを挿入してなる光デイスクのキズ測定装置。 In an optical disk scratch measuring device that compares a readout signal proportional to the reflectance of the optical disk with a constant reference level and detects the presence or absence of a scratch from a change in the level of the readout signal, the readout signal is compared with the reference level. An optical disk scratch measuring device that has a high-pass filter inserted before the comparison circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6160586U JPS62173045U (en) | 1986-04-23 | 1986-04-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6160586U JPS62173045U (en) | 1986-04-23 | 1986-04-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62173045U true JPS62173045U (en) | 1987-11-04 |
Family
ID=30895091
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6160586U Pending JPS62173045U (en) | 1986-04-23 | 1986-04-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62173045U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008111830A (en) * | 2006-10-02 | 2008-05-15 | Hitachi High-Technologies Corp | Disk peripheral surface defect detection method and detection apparatus |
| JP2008122365A (en) * | 2006-10-16 | 2008-05-29 | Hitachi High-Technologies Corp | Glass disk peripheral surface defect detection optical system and peripheral surface defect detection device |
-
1986
- 1986-04-23 JP JP6160586U patent/JPS62173045U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008111830A (en) * | 2006-10-02 | 2008-05-15 | Hitachi High-Technologies Corp | Disk peripheral surface defect detection method and detection apparatus |
| JP2008122365A (en) * | 2006-10-16 | 2008-05-29 | Hitachi High-Technologies Corp | Glass disk peripheral surface defect detection optical system and peripheral surface defect detection device |
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