JPS62167176U - - Google Patents
Info
- Publication number
- JPS62167176U JPS62167176U JP5569186U JP5569186U JPS62167176U JP S62167176 U JPS62167176 U JP S62167176U JP 5569186 U JP5569186 U JP 5569186U JP 5569186 U JP5569186 U JP 5569186U JP S62167176 U JPS62167176 U JP S62167176U
- Authority
- JP
- Japan
- Prior art keywords
- tab
- electrode
- printed circuit
- circuit board
- smaller
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005530 etching Methods 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986055691U JPH0518708Y2 (es) | 1986-04-14 | 1986-04-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986055691U JPH0518708Y2 (es) | 1986-04-14 | 1986-04-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62167176U true JPS62167176U (es) | 1987-10-23 |
| JPH0518708Y2 JPH0518708Y2 (es) | 1993-05-18 |
Family
ID=30883824
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986055691U Expired - Lifetime JPH0518708Y2 (es) | 1986-04-14 | 1986-04-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0518708Y2 (es) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01161170A (ja) * | 1987-12-18 | 1989-06-23 | Japan Synthetic Rubber Co Ltd | 集積回路部品の試験装置 |
| JPH02156168A (ja) * | 1988-12-07 | 1990-06-15 | Nec Corp | 選別装置 |
| JPH02148483U (es) * | 1989-05-19 | 1990-12-17 | ||
| JPH07113840A (ja) * | 1993-09-21 | 1995-05-02 | Micron Technol Inc | 半導体ダイの試験に使用される交換可能な基板を備えたキャリア |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS601574A (ja) * | 1983-06-20 | 1985-01-07 | Ibiden Co Ltd | プリント配線板検査用治具回路板 |
-
1986
- 1986-04-14 JP JP1986055691U patent/JPH0518708Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS601574A (ja) * | 1983-06-20 | 1985-01-07 | Ibiden Co Ltd | プリント配線板検査用治具回路板 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01161170A (ja) * | 1987-12-18 | 1989-06-23 | Japan Synthetic Rubber Co Ltd | 集積回路部品の試験装置 |
| JPH02156168A (ja) * | 1988-12-07 | 1990-06-15 | Nec Corp | 選別装置 |
| JPH02148483U (es) * | 1989-05-19 | 1990-12-17 | ||
| JPH07113840A (ja) * | 1993-09-21 | 1995-05-02 | Micron Technol Inc | 半導体ダイの試験に使用される交換可能な基板を備えたキャリア |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0518708Y2 (es) | 1993-05-18 |