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JPS62147464A - Eletrophotographic sensitive body - Google Patents

Eletrophotographic sensitive body

Info

Publication number
JPS62147464A
JPS62147464A JP60287437A JP28743785A JPS62147464A JP S62147464 A JPS62147464 A JP S62147464A JP 60287437 A JP60287437 A JP 60287437A JP 28743785 A JP28743785 A JP 28743785A JP S62147464 A JPS62147464 A JP S62147464A
Authority
JP
Japan
Prior art keywords
layer
amorphous silicon
film thickness
amorphous
deposited
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60287437A
Other languages
Japanese (ja)
Other versions
JPH083645B2 (en
Inventor
Hiroyuki Mizukami
裕之 水上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Komatsu Ltd
Original Assignee
Komatsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Komatsu Ltd filed Critical Komatsu Ltd
Priority to JP60287437A priority Critical patent/JPH083645B2/en
Priority to DE8686117502T priority patent/DE3678403D1/en
Priority to US06/942,350 priority patent/US4699861A/en
Priority to EP86117502A priority patent/EP0226207B1/en
Priority to KR1019860010898A priority patent/KR940004212B1/en
Publication of JPS62147464A publication Critical patent/JPS62147464A/en
Publication of JPH083645B2 publication Critical patent/JPH083645B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
    • G03G5/082Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
    • G03G5/082Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
    • G03G5/08214Silicon-based
    • G03G5/08221Silicon-based comprising one or two silicon based layers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photoreceptors In Electrophotography (AREA)

Abstract

PURPOSE:To obtain a clear record of the titled body by inserting an amorphous silicon carbide or an amorphous silicon nitride between a photoconductive layer composed of a hydrogenated amorphous silicon layer and a surface layer composed of an amorphous boron nitride layer. CONSTITUTION:The alumite layer 2 composed of a barrier layer 2a having 100Angstrom film thickness and a porous layer 2b having 1mum film thickness, and the boron dopted hydrogenated amorphous silicon layer 3 having 20mum film thickness and 9.3atm% hydrogen content is deposited on the surface of the porous layer 2b as the photoconductive layer by means of a plasma CVD method. The amorphous silicon nitride layer 4 having 100Angstrom film thickness is deposited on the layer 3 as the intermediate layer. And, the hydrogen contg. amorphous boron nitride layer 5 having 1,500Angstrom film thickness is deposited on the layer 4 as the surface layer. The layer 3, the layer 4 and the layer 5 may be formed continuously and successively by changing a reactive gas. Thus, the titled body having the clear recording image may be obtd.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電子写真感光体に係り、1jtに、(6;流
れを防止するための電子写真感光体の構造に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an electrophotographic photoreceptor, and (6) relates to a structure of an electrophotographic photoreceptor for preventing flow.

〔従来技術J3よびその問題点〕 近年、セレン系感光体に代わるしのと・して、耐熱性、
耐摩耗性、無公害性、光感度特性に優れていることから
、アモルファスシリコン層あるいtよ、水素等をドーピ
ングしたアモルファスシリコン層を光導電層に使用した
7モルフ?スシリコン系の電子写真感光体が注目されて
さ゛ている。
[Prior art J3 and its problems] In recent years, heat-resistant,
Because of its excellent abrasion resistance, non-pollution, and photosensitivity characteristics, an amorphous silicon layer or an amorphous silicon layer doped with hydrogen or the like is used as a photoconductive layer. Silicon-based electrophotographic photoreceptors are attracting increasing attention.

従来、アモルファスシリコン系の電子写し1感光体とし
ては、支持体として、アルミニウムを使用し、この表面
に光導電層としてアモルファスシリコン層を形成したも
のが広く用いられている。このとぎアモルファスシリコ
ンはアルミニウムに処1するイ・1着力が充分でないこ
とから、本発明者らは、第6図に示す如くアルミニウム
11の表面に予め、アルンイト処理(酸化処理)を施し
、表面が多数の微細孔を有する無水の無定形酸化アルミ
ニウム層からなる多孔質層12bで被覆された状態にし
、封孔処理を施すことなくそのまま水素化アモルファス
シリコン層13を着膜するようにし、(”I N性を高
めるという手段をとるようにしている。
Conventionally, as an amorphous silicon-based electrophotographic photoreceptor, one in which aluminum is used as a support and an amorphous silicon layer is formed as a photoconductive layer on the surface of the support has been widely used. Since this amorphous silicon does not have sufficient adhesion to aluminum, the present inventors applied an arunite treatment (oxidation treatment) to the surface of the aluminum 11 in advance, as shown in FIG. The porous layer 12b made of an anhydrous amorphous aluminum oxide layer having a large number of micropores is coated with the porous layer 12b, and the hydrogenated amorphous silicon layer 13 is directly deposited without any sealing treatment. I am trying to take measures to increase my N-ness.

そして、この水素化アモルファスシリコン層の上位に表
面層として、絶縁性に優れ、光吸収■が少なく、反射防
止機能を具え、かつ、環境変化に強いアモルファスボロ
ンナイトライド層14(a−BN)を形成するようにし
ている。
Then, as a surface layer on top of this hydrogenated amorphous silicon layer, an amorphous boron nitride layer 14 (a-BN) with excellent insulation properties, low light absorption, anti-reflection function, and resistance to environmental changes is formed. I'm trying to form it.

ところで、電子写真では、次のようにして記録が行なわ
れる。まず、コロナ放電により感光体表面に均一な′r
f1葡を与えた状態で露光する。そして露光による光吸
収によって光導電層中に電子−正孔対が1成され、これ
が前記表面の電荷によって移動し、未露孔領域にのみ電
荷対が残留りる(潜像の形成)。このようにして形成さ
れる潜像が光z99麿9表面層を越えて外へ及ぼす電界
′IJなりも電気力線によって、これとは反対電動をも
つトナーがひきつけられて付着し、潜像面が可祁2化さ
れる。そして、この可視像が記録用紙に転写されるわt
ノであるが、像の流れ、あるいはぽ1′Iが生じ、鮮明
な記録を行なうことができないという問題があった。
By the way, in electrophotography, recording is performed in the following manner. First, by corona discharge, a uniform 'r
Exposure with f1 grapes applied. Then, one electron-hole pair is created in the photoconductive layer by light absorption due to exposure, and this electron-hole pair is moved by the charge on the surface, and the charge pair remains only in the unexposed region (formation of a latent image). The electric field 'IJ' which the latent image formed in this way exerts to the outside beyond the surface layer of the light is also due to the electric lines of force, and the toner having the opposite electric power is attracted and adheres to the latent image surface. is converted to 2. This visible image is then transferred to the recording paper.
However, there was a problem in that image drift or porosity occurred, making it impossible to record clearly.

ごれは、電気力線が、光導電層J3J、び表面層の存在
により減衰されるためであると尤えられているが、この
問題を解決する手だては4’いとされていた。
It is believed that the staining is due to the electric lines of force being attenuated by the presence of the photoconductive layer J3J and the surface layer, but 4' was considered to be the solution to this problem.

本発明は、前記実情に鑑みてなさt;たもので、像の流
れあるいはぼけをなくし鮮明tJ記録を行なうことを目
的とづる。
The present invention was made in view of the above-mentioned circumstances, and an object of the present invention is to eliminate image drift or blurring and perform clear tJ recording.

〔問題点を解決するための手段〕[Means for solving problems]

そこで本発明では、水素化アモルファスシリコン層から
なる光導電体層と、アモルファスボロンナイトライド層
からなる表面層との間に中間層としてアモルファスシリ
コンカーバイド又はアE/レファスシリコンナイトライ
ドを介(iLI、めるJ:うにしている。
Therefore, in the present invention, amorphous silicon carbide or amorphous silicon nitride (iLI) is interposed as an intermediate layer between the photoconductor layer consisting of a hydrogenated amorphous silicon layer and the surface layer consisting of an amorphous boron nitride layer. , Meru J: I'm making a sea urchin.

〔作用〕[Effect]

上記構成により、露光によって生成される電気力線の減
衰が抑制され、感光体表面に鮮明な潜像を形成すること
ができるものと考えられる。
It is believed that the above configuration suppresses the attenuation of the lines of electric force generated by exposure, making it possible to form a clear latent image on the surface of the photoreceptor.

〔効果〕〔effect〕

このようにして、本発明によれば、像の流れあるいはぼ
けのない鮮明な記録画像を得ることが可能となる。
In this way, according to the present invention, it is possible to obtain a clear recorded image without image drift or blur.

〔実施例〕〔Example〕

以下、本発明の実施例について図面を参照しつつ詳細に
説明する。
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

この電子写真感光体は第1図に断面図を承り如く、支持
体として円筒状の適宜な形状に加工され、表面に化学構
造的に水を含まないアルマイト層2の形成された純度9
9.5′%以上のアルミニウム1を用い、該アルマイト
層の表面に光導電層として股厚20μm、水素含有漕9
.3atm%の水素化アモルファスシリコン謂3 (a
−3i : If)、中間層として膜厚100Aのアモ
ルファスシリコンナイトライト>I(a−SiN)4、
表面層として水素を含むアしルファスボロンナイトライ
ド5(a−BN)を順次積層せしめてなるしのである。
As shown in the cross-sectional view in FIG. 1, this electrophotographic photoreceptor is processed into a suitable cylindrical shape as a support, and has an alumite layer 2 of purity 9, which is chemically free of water, formed on its surface.
9.5'% or more of aluminum 1 was used, and a hydrogen-containing tank 9 with a crotch thickness of 20 μm was used as a photoconductive layer on the surface of the alumite layer.
.. 3 atm% hydrogenated amorphous silicon so-called 3 (a
-3i: If), amorphous silicon nitrite with a film thickness of 100A as the intermediate layer>I(a-SiN)4,
It is made by sequentially laminating alphus boron nitride 5 (a-BN) containing hydrogen as a surface layer.

なお、前記アルマイト層は膜厚100Aの結晶性の酸化
アルミニウムからなる緻密4に層であるバリア層と膜厚
1μ雇の無水の無定形酸化アルミニウムからなり多数の
微細孔を有する多孔質層との二重構造となっている。
The alumite layer is composed of a dense barrier layer made of crystalline aluminum oxide with a thickness of 100A and a porous layer made of anhydrous amorphous aluminum oxide with a thickness of 1μ and having many micropores. It has a double structure.

次に、この電子写真感光体の製造方法について説明する
Next, a method for manufacturing this electrophotographic photoreceptor will be explained.

まず、支持体として円筒状等の適宜の形状にrJ11工
された純アルミニウムを陽極とし、硫酸あるいはシュウ
酸を電解液として用いた電解処理を行なうことにより、
第2図゛(a)に示す如く、膜厚100Aのバリア層2
aと膜厚1μ雇の多孔質層2bとからなるアルマイト層
2を形成する。このときの電解電圧は10〜20V、電
解時間は2分〜30分、電解液の温度は10〜25℃、
5麿は10〜20%、電流密度は1〜2△/dmどした
First, pure aluminum processed into an appropriate shape such as a cylinder is used as an anode as a support, and electrolytic treatment is performed using sulfuric acid or oxalic acid as an electrolyte.
As shown in FIG. 2(a), a barrier layer 2 with a thickness of 100A
An alumite layer 2 consisting of a and a porous layer 2b having a thickness of 1 μm is formed. At this time, the electrolysis voltage was 10~20V, the electrolysis time was 2 minutes~30 minutes, the temperature of the electrolyte was 10~25℃,
The current density was 10 to 20%, and the current density was 1 to 2 Δ/dm.

続いて、第2図(b)に示す如くこのアルマイト層2に
何ら封孔処理を施すことなくそのまま、上記多孔質層2
bの表面に光導電層としてプラズマCVD法により、膜
厚2oμm、水素含有Q’+g、3atm%のボロンド
ープの水素化アモルファスシリコン朽3を着膜する。こ
のときの着膜条件は、基板(支持体)湿度:325℃9
反応ガス:シラン(SiH4)とジボラン(82H6)
の混合ガス、ガス圧: 1.0Torr、ガス流量:5
it−1101005c、B2B21−1650se。
Subsequently, as shown in FIG. 2(b), the alumite layer 2 is coated with the porous layer 2 without any sealing treatment.
As a photoconductive layer, a boron-doped hydrogenated amorphous silicon film 3 having a thickness of 2 μm and containing Q'+g and containing 3 atm % is deposited on the surface of the photoconductive layer by plasma CVD. The film deposition conditions at this time were: substrate (support) humidity: 325℃9
Reactive gas: silane (SiH4) and diborane (82H6)
Mixed gas, gas pressure: 1.0 Torr, gas flow rate: 5
it-1101005c, B2B21-1650se.

高周波周波数: 13.56MIIz、 高周波電カニ
100Wとする。形成される層中の水素含有吊は基板温
度に依存する。この基板温度と水素含有量との関係は第
3図に示す如くである。
High frequency: 13.56MIIz, high frequency electric crab 100W. The hydrogen content in the formed layer depends on the substrate temperature. The relationship between the substrate temperature and hydrogen content is as shown in FIG.

そして、中間層として、同様にプラズマCVD法にJ、
す、膜厚100Aのアモルファスシリコンブイドライド
層4を4模する。このとき着膜条件は、基板温度325
℃2反応ガス;シラン(SiH)とアンモニア(NH3
’)の混合ガス。
Then, as an intermediate layer, J,
Four amorphous silicon hydride layers 4 with a thickness of 100 Å are prepared. At this time, the film deposition conditions were as follows: substrate temperature: 325
°C2 reaction gas; silane (SiH) and ammonia (NH3
') mixed gas.

ガスrf:1.0Torr、ガス流ffi : S i
 l−1450secm、NH350secm、高周波
周波数:13.56MHz、高周波゛市カニ100Wと
する。(第2図(C)) 更に、表面層としてプラズマCVD法により、膜厚15
00Aの水素含有アモルファスボロンノイドライド層5
を着膜する。このとさ、着膜条1′1は、基板温度32
5℃2反応ガス:ジボラン(B2H6)とアンモニア(
Nト13)の混合ガス。
Gas rf: 1.0 Torr, gas flow ffi: Si
l-1450sec, NH350sec, high frequency: 13.56MHz, high frequency: 100W. (Figure 2 (C)) Furthermore, a surface layer with a thickness of 15
00A hydrogen-containing amorphous boronoid layer 5
Deposit a film. At this point, the deposited film strip 1'1 has a substrate temperature of 32
5℃2 Reactant gas: diborane (B2H6) and ammonia (
13) mixed gas.

ガス圧1.0Torr、ガス流ffi:’1132H,
3100sccm、N1−1350secm、高周波周
波数:13.56M)−1z、高周波電カニ100Wと
する。
Gas pressure 1.0 Torr, gas flow ffi: '1132H,
3100sccm, N1-1350sec, high frequency frequency: 13.56M)-1z, high frequency electric crab 100W.

なお、これら、水素化アモルファスシリコン1☆3、ア
モルファスシリコンナイトライドVf44.アモルファ
スボロンナイトライド層の形成は反応ガスの切換により
順次連続して行なうことができる。
These include hydrogenated amorphous silicon 1☆3, amorphous silicon nitride Vf44. Formation of the amorphous boron nitride layer can be performed sequentially and continuously by switching the reaction gas.

着膜に際しては、まず、プラズマCVD装置の反応室内
に前記支持体をセットし10’Torr程度に真空吸引
する。
When depositing a film, first, the support is set in a reaction chamber of a plasma CVD apparatus, and vacuum suction is applied to about 10'Torr.

そして支持体の温度を325℃に安定化さけた後、マス
フローコントローラにより流jn調゛整を?−1ないつ
つ混合ガスを反応室内に導入し、史に、ガス圧コントロ
ーラにより反応室内を1.0TOrrに設定する。
After stabilizing the temperature of the support at 325°C, adjust the flow using a mass flow controller. -1, a mixed gas was introduced into the reaction chamber, and the inside of the reaction chamber was set at 1.0 TOrr using a gas pressure controller.

この状態で、該支持体を接地し、マツチングボックスに
よりインピーダンスマッヂングをとりながら高周波電力
を印加することにより着膜を行なう。
In this state, the support is grounded and a film is deposited by applying high frequency power while performing impedance matching using a matching box.

そして所望の膜厚に到達したところで高周波電力および
反応ガスの導入を停止する。
Then, when the desired film thickness is reached, the introduction of high frequency power and reaction gas is stopped.

以上の操作を繰り返し、3つの層を順次形成する。The above operations are repeated to sequentially form three layers.

そして最後に反応室内を真空吸引した後、支持体の加熱
を止め、リークして該支持体を反応室から取り出す。
Finally, after vacuuming the inside of the reaction chamber, the heating of the support is stopped, and the support is taken out from the reaction chamber after leaking.

この感光体において、中間層としてのアモルファスシリ
コンナイトライド層の膜厚のみを変化させたとき、膜厚
と画像特性との関係を表1に示す。
Table 1 shows the relationship between the film thickness and the image characteristics when only the film thickness of the amorphous silicon nitride layer serving as the intermediate layer was changed in this photoreceptor.

表I中、夫々、「◎」は「極めて良θI’J、「○」は
「良好」、「Δ」は「首通」、「×」は「不可」である
ことを示す。この表からアモルファスシリコンナイトラ
イド層の膜厚は200OA以下とするのが望ましいこと
がわかる。
In Table I, "◎" indicates "extremely good θI'J,""○" indicates "good,""Δ" indicates "successful," and "×" indicates "unsatisfactory." From this table, it can be seen that the thickness of the amorphous silicon nitride layer is desirably 200 OA or less.

表  1 また、表面層および中間層に、人々、アしルフ?スボロ
ンナイトライド層およびア[シフ2フ99121485
41層を用いた場合と、表面層にアモルファスシリコン
ナイトワイド層のみを用いた場合(中間層ナシ)、表面
層に71ルフアスボロンナイトライドのみを用いた場合
(中間層ナシ)との表面電位、光感度、画像特性の比較
データをアモルファスシリコンナイトライド、表面1ζ
・1どしてアモルファスボロンナイトライドを用いた場
合が表面電位、光感度、画像特性共に1つれている。
Table 1 Also, in the surface layer and the middle layer, people, Alf? Suboron nitride layer and a [Schiff2F99121485
Surface potential when using 41 layer, when only amorphous silicon night wide layer is used for the surface layer (no intermediate layer), and when only 71 rufus boron nitride is used for the surface layer (without intermediate layer) , photosensitivity, and image characteristics comparison data of amorphous silicon nitride, surface 1ζ
・The surface potential, photosensitivity, and image characteristics are all the same when amorphous boron nitride is used.

これに対し、アモルファスシリコンナイI・ライド層の
みを用いた場合は表面電位および光感度が充分ではなく
、アモルファスボロンナイl−ライド層のみを用いた場
合は像流れが生じている。
On the other hand, when only an amorphous silicon nyl-ride layer is used, the surface potential and photosensitivity are insufficient, and when only an amorphous boron nyl-ride layer is used, image blurring occurs.

更にまた、アモルファスシリコンナイトライド層の窒素
含有IBを変化させたときの画像特性を表Hに示す。
Furthermore, Table H shows image characteristics when varying the nitrogen content IB of the amorphous silicon nitride layer.

表  ■ この表から窒素含右皐は4Qat%以下とするのが望ま
しいことがわかる。
Table 1 From this table, it can be seen that it is desirable that the nitrogen-containing nitrogen content be 4Qat% or less.

このようにして形成された感光体は、中間層の介在によ
り像の流れやぼけを生じることなく、鮮明な記録を行な
うことができる。
The photoreceptor thus formed can perform clear recording without causing image drift or blurring due to the presence of an intermediate layer.

また、光S重層と支持体との付着強度も十分であり、か
つ光電特性も極めて良好であった。
Furthermore, the adhesion strength between the optical S multilayer and the support was sufficient, and the photoelectric properties were also extremely good.

ところで、アルマイト層におけるバリアff12aと多
孔質N2bの膜厚は陽極酸化工程における反応条f1に
よって可変であるが、陽極酸化によるアルマイト層の形
成条件を変化さぜ、バリア層2aの膜厚αと、多孔質層
2bの膜厚βと(光S電層との)付着力および光電特性
の関係を測定したものを表■に示す。表■において、r
OJは「優れている」ことを示し、rXJは「劣ってい
る」ことを示し、「Δ」は[優れてはいないが実用上は
特に支障を来たさない]ことを示すしのとする。
By the way, the film thicknesses of the barrier ff12a and the porous N2b in the alumite layer are variable depending on the reaction condition f1 in the anodic oxidation step, but by changing the formation conditions of the alumite layer by anodic oxidation, the film thickness α of the barrier layer 2a, The relationship between the film thickness β of the porous layer 2b, the adhesion force (to the photo-S electric layer), and the photoelectric properties is shown in Table (2). In Table ■, r
OJ indicates "excellent", rXJ indicates "inferior", and "Δ" indicates [not excellent, but does not cause any practical problems]. .

表  ■ この表■から、多孔v1層は厚い方が付着力の面からは
有効であるが、光電特性をも考慮づると、ぜい「い5μ
雇程度までにおさえるのが好ましいことがわかる。また
バリア層は薄いほど良いが、10A〜500Aの範囲で
あれば光電特性的に支障はない。
Table ■ From this table ■, the thicker the porous V1 layer is, the more effective it is in terms of adhesion, but if we also take into account the photoelectric properties,
It can be seen that it is preferable to keep it to the level of employment. Further, the thinner the barrier layer is, the better, but as long as it is in the range of 10A to 500A, there will be no problem in terms of photoelectric properties.

また、光導電層の形成に際して、反応・ガスの組成を変
化させていくことにより、水素化アモルファスシリコン
層中の水素ff1(at%)を変化させて感光体を形成
し、これらについて水素量と帯電能(V/μ)との関係
を測定した。この結果を第4図に示す。縦軸は帯電能、
横軸は水素量どした。この図からも明らかなように、水
素含有けは20at%以下、特に5〜13 a t%の
範囲にあるとき、特に良好な結果を呈するということが
わかる。
In addition, when forming the photoconductive layer, by changing the reaction and gas composition, the hydrogen ff1 (at%) in the hydrogenated amorphous silicon layer is changed to form a photoreceptor, and the amount of hydrogen and The relationship with chargeability (V/μ) was measured. The results are shown in FIG. The vertical axis is chargeability,
The horizontal axis is the amount of hydrogen. As is clear from this figure, particularly good results are obtained when the hydrogen content is 20 at% or less, particularly in the range of 5 to 13 at%.

このように、支持体として、表面に結晶水を含まないア
ルマイト層を形成せしめた純アルミニウム製の円筒を使
用し、これに光W ?ff層としての水素化アモルファ
スシリ:】ン層、中間層としてのアモルファスシリコン
ナイトライド層、表面層としてのアモルファスボロンナ
イトライド層を順次積層せしめた感光体は像の流れもな
く、付着力充電特性等において極めて優れている。
In this way, a cylinder made of pure aluminum on which an alumite layer containing no crystal water is formed is used as a support, and a cylinder made of pure aluminum is coated with light W? The photoreceptor has a hydrogenated amorphous silicon layer as an ff layer, an amorphous silicon nitride layer as an intermediate layer, and an amorphous boron nitride layer as a surface layer, and has no image drift and excellent adhesive charging characteristics. It is extremely excellent in terms of etc.

なお、実施例では、中間層としてア[ルフ7スシリコン
ナイトライト層を用いたが、アモルファスシリコンカー
バイド層でもよい。
In the embodiment, an amorphous silicon nitrite layer was used as the intermediate layer, but an amorphous silicon carbide layer may also be used.

更に支持体表面のアルマイト層におけるバリア層の厚さ
αを10OA、多孔質層の厚ざβを1μmとしたが、バ
リア層はなくてもよく、又できるだけ婢い方が光電特性
が改善されるが、アルマイト処理において必ず形成され
てしまうしのであるため10A≦α≦500A、O<0
65μmの範囲内となるように処理条件を選択すれば良
い。
Further, the thickness α of the barrier layer in the alumite layer on the surface of the support was set to 10 OA, and the thickness β of the porous layer was set to 1 μm, but the barrier layer may not be provided, and the photoelectric properties are improved by making it as thin as possible. is always formed during alumite treatment, so 10A≦α≦500A, O<0
Processing conditions may be selected so that the thickness falls within the range of 65 μm.

また、光導電層の水素含有mCはC11≦20at%、
望ましくは5at%≦C11≦13at%、史に望まし
くは7at%≦C11≦10at%の範囲で適宜選択す
ればよい。
Further, the hydrogen-containing mC of the photoconductive layer is C11≦20at%,
It may be appropriately selected within the range of preferably 5 at%≦C11≦13 at%, and more preferably 7 at%≦C11≦10 at%.

更に、光導電層の膜厚tについても、5μm≦t≦80
μmnの範囲内で適宜選択1ればよい。
Furthermore, regarding the film thickness t of the photoconductive layer, 5 μm≦t≦80
It is sufficient to select 1 as appropriate within the range of μmn.

史にまた、光導電層中のボロンのドーピング吊についで
も、10  at%〜1O−5a1%の範囲内で適宜選
択すればよい。
Additionally, the boron doping level in the photoconductive layer may be appropriately selected within the range of 10 at% to 1O-5a1%.

加えて、表面層のアモルファスボロンナイトライド層 るようにするのが望ましく、BN   としたと  1
−x ぎ0.2≦X≦0.8の範囲にとるようにする。
In addition, it is desirable to have a surface layer of amorphous boron nitride, and when BN is used, 1
-x should be within the range of 0.2≦X≦0.8.

そして膜厚dについても0.01μm≦d≦10μm、
望ましくは0.05μm≦d≦5μTrLとするとよい
And the film thickness d is also 0.01μm≦d≦10μm,
It is preferable that 0.05 μm≦d≦5 μTrL.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明実施例の感光体の断面+14造を示す
説明図、第2図(a)乃至(C)は、同感光体の》1造
工稈図、第3図は、光導電層の形成に際しての基板温度
と層中の水素含有酪との関係を示7図、第4図は、光導
電層中の水素mと帯電能との関係を示す図、第5図は、
本発明実施例の感光体と従来の感光体との表面電位、光
感度、画像特性の比較データを示す図、第6図は、従来
の感光体の断面構造を示す図である。 1、11・・・純アルミニ『クム、2a・・・バリア層
、2b,12b・・・多孔質層、2・・・アルマイト層
、3、13・・・水素化アモルファスシリコン層、4・
・・アモルファスシリコンナイトライド廠、5、14・
・・アモルファスボロンナイトライド層。 j:;47′  ・ ・、t:1 出願人代理人   木  村  高  久  ゝ一。 第1図 第2図(Q) 第2図(b) 基板温度(”C) 第3図 第5図
FIG. 1 is an explanatory diagram showing the cross section of the photoreceptor according to the embodiment of the present invention, FIG. FIG. 7 shows the relationship between the substrate temperature and the hydrogen content in the layer during the formation of the conductive layer, FIG. 4 shows the relationship between the hydrogen m in the photoconductive layer and the charging ability, and FIG.
FIG. 6 is a diagram showing comparative data of surface potential, photosensitivity, and image characteristics between a photoreceptor according to an embodiment of the present invention and a conventional photoreceptor, and FIG. 6 is a diagram showing a cross-sectional structure of a conventional photoreceptor. 1, 11...Pure aluminum cum, 2a...Barrier layer, 2b, 12b...Porous layer, 2...Alumite layer, 3, 13...Hydrogenated amorphous silicon layer, 4.
・・Amorphous silicon nitride factory, 5, 14・
...Amorphous boron nitride layer. j:;47' ・ ・, t:1 Applicant's agent Takahisa Kimura. Figure 1 Figure 2 (Q) Figure 2 (b) Substrate temperature (''C) Figure 3 Figure 5

Claims (1)

【特許請求の範囲】 表面が多孔質層すなわち無定形の無水酸化アルミニウム
層で被覆された純アルミニウムからなる支持体と、 該支持体表面に形成された水素化アモルファスシリコン
層(a−Si:H)からなる光導電層と、該光導電層上
に積層せしめられたアモルファスシリコンナイトライド
(a−SiN)又はアモルファスシリコンカーバイド(
a−SiC)からなる中間層と、 更に該中間層上に積層せしめられた水素を含むアモルフ
ァスボロンナイトライド(a−BN)からなる表面層と を含むことを特徴とする電子写真感光体。
[Scope of Claims] A support made of pure aluminum whose surface is covered with a porous layer, that is, an amorphous anhydrous aluminum oxide layer, and a hydrogenated amorphous silicon layer (a-Si:H) formed on the surface of the support. ) and amorphous silicon nitride (a-SiN) or amorphous silicon carbide (a-SiN) laminated on the photoconductive layer.
An electrophotographic photoreceptor comprising: an intermediate layer made of (a-SiC); and a surface layer made of amorphous boron nitride (a-BN) containing hydrogen and further laminated on the intermediate layer.
JP60287437A 1985-12-20 1985-12-20 Electrophotographic photoreceptor Expired - Lifetime JPH083645B2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP60287437A JPH083645B2 (en) 1985-12-20 1985-12-20 Electrophotographic photoreceptor
DE8686117502T DE3678403D1 (en) 1985-12-20 1986-12-16 LIGHT SENSITIVE ELEMENT FOR ELECTROPHOTOGRAPHY.
US06/942,350 US4699861A (en) 1985-12-20 1986-12-16 Photosensitive member for use in electrophotography
EP86117502A EP0226207B1 (en) 1985-12-20 1986-12-16 Photosensitive member for use in electrophotography
KR1019860010898A KR940004212B1 (en) 1985-12-20 1986-12-18 Photosensitive member for use in electrophotography

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60287437A JPH083645B2 (en) 1985-12-20 1985-12-20 Electrophotographic photoreceptor

Publications (2)

Publication Number Publication Date
JPS62147464A true JPS62147464A (en) 1987-07-01
JPH083645B2 JPH083645B2 (en) 1996-01-17

Family

ID=17717304

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60287437A Expired - Lifetime JPH083645B2 (en) 1985-12-20 1985-12-20 Electrophotographic photoreceptor

Country Status (5)

Country Link
US (1) US4699861A (en)
EP (1) EP0226207B1 (en)
JP (1) JPH083645B2 (en)
KR (1) KR940004212B1 (en)
DE (1) DE3678403D1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4845001A (en) * 1986-04-30 1989-07-04 Canon Kabushiki Kaisha Light receiving member for use in electrophotography with a surface layer comprising non-single-crystal material containing tetrahedrally bonded boron nitride
JPH0810332B2 (en) * 1988-02-10 1996-01-31 富士ゼロックス株式会社 Method for manufacturing electrophotographic photoreceptor
US20030180445A1 (en) * 2002-03-21 2003-09-25 Industrial Scientific Corporation Method for forming a catalytic bead sensor
KR100448714B1 (en) * 2002-04-24 2004-09-13 삼성전자주식회사 Insulating layer in Semiconductor Device with Multi-nanolaminate Structure of SiNx and BN and Method for Forming the Same
DE10327315B4 (en) * 2003-06-16 2007-08-16 Eastman Kodak Co. A process for processing a support for a photoconductor to form an electrophotographic recording element and accordingly formed recording element

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4464451A (en) * 1981-02-06 1984-08-07 Canon Kabushiki Kaisha Electrophotographic image-forming member having aluminum oxide layer on a substrate
JPS585749A (en) * 1981-07-01 1983-01-13 Minolta Camera Co Ltd Photoreceptor
JPS59128281A (en) * 1982-12-29 1984-07-24 信越化学工業株式会社 Method for manufacturing silicon carbide coating
JPS59165066A (en) * 1983-03-11 1984-09-18 Fuji Electric Corp Res & Dev Ltd Electrophotographic sensitive body
JPS6022132A (en) * 1983-07-18 1985-02-04 Hitachi Ltd Laminated photoreceptor and its manufacturing method
JPS6083957A (en) * 1983-10-13 1985-05-13 Sharp Corp electrophotographic photoreceptor
US4544617A (en) * 1983-11-02 1985-10-01 Xerox Corporation Electrophotographic devices containing overcoated amorphous silicon compositions
JPS61140947A (en) * 1984-12-13 1986-06-28 Komatsu Ltd Manufacture of electrophotographic sensitive body

Also Published As

Publication number Publication date
EP0226207B1 (en) 1991-03-27
EP0226207A3 (en) 1988-06-01
JPH083645B2 (en) 1996-01-17
US4699861A (en) 1987-10-13
KR870006436A (en) 1987-07-11
KR940004212B1 (en) 1994-05-17
EP0226207A2 (en) 1987-06-24
DE3678403D1 (en) 1991-05-02

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