JPS6148101B2 - - Google Patents
Info
- Publication number
- JPS6148101B2 JPS6148101B2 JP17250081A JP17250081A JPS6148101B2 JP S6148101 B2 JPS6148101 B2 JP S6148101B2 JP 17250081 A JP17250081 A JP 17250081A JP 17250081 A JP17250081 A JP 17250081A JP S6148101 B2 JPS6148101 B2 JP S6148101B2
- Authority
- JP
- Japan
- Prior art keywords
- load
- power
- wave power
- plasma
- high frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000009616 inductively coupled plasma Methods 0.000 claims description 3
- 239000003381 stabilizer Substances 0.000 claims 1
- 230000001939 inductive effect Effects 0.000 description 3
- 230000007774 longterm Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
【発明の詳細な説明】
本発明は高周波誘導結合プラズマ発光分光分析
装置のプラズマ光源安定化装置に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a plasma light source stabilization device for a high frequency inductively coupled plasma emission spectrometer.
従来上述した発光分光分析装置では、通過形電
力形を用いて負荷への高周波入射波電力を検出し
この電力が一定になるような負帰還制御によつて
光源の安定を計つていた。しかし負荷のインピー
ダンスはプラズマへの供給ガス流量によつて変化
し、試料を導入しても変化するので高周波電源の
周波数を一定に保つていても、電源と負荷との整
合状態がずれ反射波が生ずるので、入射波電力を
一定に保つように制御していても負荷に吸収され
る電力が一定になる保証はない。またプラズマの
特性として消費電力が減少した場合、プラズマは
誘導性となる特性があるため、或る状態で電源と
負荷とのインピーダンスが整合していると、その
状態からプラズマ炎が誘導性となるよう変化した
場合、反射波がでて消費電力が減るとプラズマは
ますます誘導性となつて整合のずれはひどくな
り、ついにはプラズマを維持する電力がつぎこめ
なくなり消えてしまう。従つて入射波電力を一定
に保つ制御だけではプラズマ炎の安定は困難で別
途電源と負荷との整合を正確に維持する制御が必
要であつた。 Conventionally, in the above-mentioned emission spectrometer, the light source is stabilized by detecting the high frequency wave power incident on the load using a pass-through power type and performing negative feedback control to keep this power constant. However, the impedance of the load changes depending on the flow rate of the gas supplied to the plasma, and also changes even when the sample is introduced, so even if the frequency of the high-frequency power source is kept constant, the matching state between the power source and the load will shift and reflected waves will occur. Therefore, even if the incident wave power is controlled to be constant, there is no guarantee that the power absorbed by the load will be constant. Also, as a characteristic of plasma, when power consumption decreases, plasma becomes inductive, so if the impedance between the power supply and the load matches in a certain state, the plasma flame becomes inductive from that state. When such a change occurs, as reflected waves are generated and power consumption is reduced, the plasma becomes more inductive and mismatching becomes more severe, and eventually the plasma disappears because there is no longer enough power to maintain it. Therefore, it is difficult to stabilize the plasma flame by controlling only to keep the incident wave power constant, and a separate control to accurately maintain matching between the power source and the load is required.
本発明は上述したような現状に鑑み、より簡単
なシステムで高周波誘導結合プラズマ光源の安定
化を可能にしようとしてなされた。この目的に従
つて本発明は負荷への入射波電力Pfと負荷からの
反射波電力Prを検出し、負荷の吸収電力Pp=Pf
−Prが一定になるようにした制御装置を提供す
る。以下実施例によつて本発明を説明する。 In view of the above-mentioned current situation, the present invention was made in an attempt to make it possible to stabilize a high frequency inductively coupled plasma light source with a simpler system. In accordance with this purpose, the present invention detects the incident wave power Pf to the load and the reflected wave power Pr from the load, and calculates the absorbed power Pp of the load = Pf
-Provide a control device that keeps Pr constant. The present invention will be explained below with reference to Examples.
図は本発明の一実施装置を示す。1は高周波電
源回路、2は負荷で3は通過形電力計である。高
周波電源1から出力される高周波は通過形電力計
3を通過して負荷2に供給される。通過形電力計
3は2コの出力端子を有し、一方に入射波電力Pf
の検出値が出力され、もう一つの出力端子には負
荷2からの反射波電力Prの検出値が出力されて
いる。4は引算回路で通過形電力計3の2つの出
力信号に対してPf−Prに対応する引算演算を行
う。この引算回路4の出力は増幅器5を経て比較
回路6に印加され基準信号と比較され、比較回路
6の出力によつて高周波電源回路1の出力制御が
なされ、比較回路6の出力が0になるように制御
される。 The figure shows an apparatus for implementing the invention. 1 is a high frequency power supply circuit, 2 is a load, and 3 is a pass-through wattmeter. The high frequency output from the high frequency power supply 1 passes through the pass-through wattmeter 3 and is supplied to the load 2. The pass-through power meter 3 has two output terminals, one of which receives the incident wave power Pf.
The detected value of the reflected wave power Pr from the load 2 is outputted to the other output terminal. A subtraction circuit 4 performs a subtraction operation corresponding to Pf-Pr on the two output signals of the pass-through wattmeter 3. The output of this subtraction circuit 4 is applied to a comparison circuit 6 via an amplifier 5 and compared with a reference signal, and the output of the high frequency power supply circuit 1 is controlled by the output of the comparison circuit 6, so that the output of the comparison circuit 6 becomes 0. controlled so that
本発明装置は上述したような構成で、負荷のイ
ンピーダンス変動に関係なく常に負荷が消費する
電力が一定になるように動作するので、長時間使
用時に負荷の整合状態がドリフトしても、その影
響を受けないで分析ができ分析の長時間安定性が
向上し、負荷の状態を変化させた場合、例えばプ
ラズマのガス流量を変えたり或は試料溶媒の種類
を変えた場合等でも従来のように負荷と電源との
整合をとり直す必要がなく、プラズマ炎の安定性
が従来に比し向上しているので、プラズマを安定
に点灯できる同調範囲が広くなり、同調をとるの
が容易になり、しかもプラズマを安定化する他の
制御装置が不要である。 The device of the present invention has the above-described configuration and operates so that the power consumed by the load is always constant regardless of load impedance fluctuations, so even if the load matching state drifts during long-term use, the influence of the drift will be minimized. The long-term stability of the analysis is improved, and even when the load condition is changed, such as when changing the plasma gas flow rate or the type of sample solvent, There is no need to re-match the load and power supply, and the stability of the plasma flame is improved compared to conventional models, so the tuning range in which the plasma can be lit stably is widened, making it easier to tune. Furthermore, no other control device for stabilizing the plasma is required.
なお本発明装置は積極的に負荷を整合状態に戻
すように作用するものではないから、負荷の整合
状態が大きくずれた場合、高周波電源回路は非常
に大きな出力を行うように強制されることになる
ので、高周波電源回路に無理な負担がかゝらない
ように、図の通過形電力計3の反射波電力検出出
力をモニタして反射波電力が或るレベルに達する
までは上述した制御動作を行い、このレベル以上
に反射波電力が増大しても、高周波出力を増大さ
せないようクランプするようにしておいてもよ
い。 Note that the device of the present invention does not actively return the load to a matching state, so if the matching state of the load deviates significantly, the high frequency power supply circuit will be forced to produce a very large output. Therefore, in order to avoid putting an undue burden on the high-frequency power supply circuit, the reflected wave power detection output of the pass-through power meter 3 shown in the figure is monitored, and the above-mentioned control operation is performed until the reflected wave power reaches a certain level. Even if the reflected wave power increases beyond this level, the high frequency output may be clamped so as not to increase.
図面は本発明の一実施例装置の構成を示すブロ
ツク図である。
1……高周波電源回路、2……負荷、3……通
過形電力計、4……引算回路、6……比較回路。
The drawing is a block diagram showing the configuration of an apparatus according to an embodiment of the present invention. 1... High frequency power supply circuit, 2... Load, 3... Pass-through wattmeter, 4... Subtraction circuit, 6... Comparison circuit.
Claims (1)
負荷からの反射波電力を検出し、入射波電力から
反射波電力を引いた差が一定になるように高周波
供給電力を制御するようにした高周波誘導結合プ
ラズマ安定装置。1 Using a pass-through wattmeter, detect the incident wave power to the load and the reflected wave power from the load, and control the high-frequency power supply so that the difference between the incident wave power and the reflected wave power is constant. High frequency inductively coupled plasma stabilizer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17250081A JPS5873848A (en) | 1981-10-27 | 1981-10-27 | Stabilizer for high frequency induction coupling plasma |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17250081A JPS5873848A (en) | 1981-10-27 | 1981-10-27 | Stabilizer for high frequency induction coupling plasma |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5873848A JPS5873848A (en) | 1983-05-04 |
JPS6148101B2 true JPS6148101B2 (en) | 1986-10-22 |
Family
ID=15943120
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17250081A Granted JPS5873848A (en) | 1981-10-27 | 1981-10-27 | Stabilizer for high frequency induction coupling plasma |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5873848A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005286936A (en) * | 2004-03-31 | 2005-10-13 | Daihen Corp | Output power control method for high frequency power supply and high frequency power supply device |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60207075A (en) * | 1984-03-31 | 1985-10-18 | Shimadzu Corp | High frequency power display apparatus for icp analytical apparatus |
JPS6116314A (en) * | 1984-07-02 | 1986-01-24 | Matsushita Electric Ind Co Ltd | High frequency power supply device |
FR2616932B1 (en) * | 1987-06-16 | 1989-11-03 | Applied Res Lab | METHOD FOR REGULATING PLASMA IN A SPECTROSCOPIC ANALYSIS APPARATUS |
GB9226335D0 (en) * | 1992-12-17 | 1993-02-10 | Fisons Plc | Inductively coupled plasma spectrometers and radio-frequency power supply therefor |
CA2116821C (en) * | 1993-03-05 | 2003-12-23 | Stephen Esler Anderson | Improvements in plasma mass spectrometry |
DE69509046T2 (en) * | 1994-11-30 | 1999-10-21 | Applied Materials, Inc. | Plasma reactors for the treatment of semiconductor wafers |
JP2005172473A (en) * | 2003-12-08 | 2005-06-30 | Horiba Ltd | Power feeding method for glow discharge, glow discharge emission analyzer, and power feeder |
JP2007205897A (en) * | 2006-02-02 | 2007-08-16 | Shimadzu Corp | High-frequency power supply apparatus for icp |
-
1981
- 1981-10-27 JP JP17250081A patent/JPS5873848A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005286936A (en) * | 2004-03-31 | 2005-10-13 | Daihen Corp | Output power control method for high frequency power supply and high frequency power supply device |
Also Published As
Publication number | Publication date |
---|---|
JPS5873848A (en) | 1983-05-04 |
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