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JPS61189443A - Printed circuit board pattern inspection equipment - Google Patents

Printed circuit board pattern inspection equipment

Info

Publication number
JPS61189443A
JPS61189443A JP3128285A JP3128285A JPS61189443A JP S61189443 A JPS61189443 A JP S61189443A JP 3128285 A JP3128285 A JP 3128285A JP 3128285 A JP3128285 A JP 3128285A JP S61189443 A JPS61189443 A JP S61189443A
Authority
JP
Japan
Prior art keywords
printed circuit
circuit board
pattern
signal
copper foil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3128285A
Other languages
Japanese (ja)
Inventor
Yoshikatsu Satomi
里見 義勝
Akira Sase
佐瀬 昭
Takeo Osada
長田 太計男
Masao Fukunaga
福永 正雄
Yutaka Sakurai
桜居 裕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP3128285A priority Critical patent/JPS61189443A/en
Publication of JPS61189443A publication Critical patent/JPS61189443A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/72Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はプリント基板パターン検査装置に係り、特にプ
リント基板のパターンを2値化画像として検出してその
良否を判定する微細なパターンを有するプリント基板に
好適なプリント基板パターン検査製置に関するものであ
る。
Detailed Description of the Invention [Field of Application of the Invention] The present invention relates to a printed circuit board pattern inspection device, and particularly to a printed circuit board having a fine pattern that detects the pattern of the printed circuit board as a binary image and determines its acceptability. The present invention relates to a printed circuit board pattern inspection and preparation suitable for.

〔発明の背景〕[Background of the invention]

従来のプリント基板パターン検査装置は、第5因に示す
ように、プリント基板11の表面にハロゲンランプ30
1などからの可視光を集光レンズ302を通して照射し
、銅箔部111の表面からの反射光を焦点合わせ用レン
ズ303を通してCODカメラ304等によって受光撮
像してパターン画像を得る反射光検出方式のものでめっ
た。
As shown in the fifth factor, the conventional printed circuit board pattern inspection apparatus uses a halogen lamp 30 on the surface of the printed circuit board 11.
1, etc., through a condensing lens 302, and the reflected light from the surface of the copper foil section 111 is passed through a focusing lens 303, and is received and imaged by a COD camera 304, etc., to obtain a pattern image. I ran into a lot of stuff.

この方式では、銅箔部111の表面が均一で、かつ、き
れいにみがかれている状態では強力な反射光が得られる
が、銅箔部111の表面が汚れてい九り、傷がついてい
たり、あるいは、エツチング不光分により黒化残銅部が
あると、弱反射元または乱反射光となり、導体パターン
として正常なところを欠陥として判定しfcシ、パター
ン間の短絡欠陥を見逃がす結果となる。さらに、近年の
プリント基板は、高密度化しており、大形計算機用の多
層基板、一部のOA@器用プリント基板には、銅箔パタ
ーン幅が数十〜百ミクロン程度まで微細化しているもの
がらり、このような微細パターンに対しては、表面に付
着したごみや繊維ぐずをパターンの欠陥として判足し、
検査装置としての信租性が大幅に低下するという欠点を
生ずる。また、フルダレシストを施したプリント基板は
検査不能であるという問題もある。
In this method, strong reflected light can be obtained when the surface of the copper foil section 111 is uniform and cleanly polished, but if the surface of the copper foil section 111 is dirty or scratched, Alternatively, if there is a blackened residual copper part due to etching obscurity, it becomes a weak reflection source or diffusely reflected light, and a normal part of the conductor pattern is determined to be a defect, resulting in a short-circuit defect between patterns being overlooked. Furthermore, printed circuit boards in recent years have become denser, and the copper foil pattern width of multilayer boards for large computers and some printed circuit boards for office automation equipment has become finer, ranging from tens to hundreds of microns. For such fine patterns, dust and fibers attached to the surface can be considered as defects in the pattern.
This has the disadvantage that the reliability of the inspection device is significantly reduced. There is also the problem that printed circuit boards that have been subjected to full-dare resist cannot be inspected.

その他の従来例として第6図に示す蛍光検出方式を用い
た検査装置がある。第6図においては、光源を水銀ラン
プ401とし、特定波長の紫外線を透過するフィルタ4
02を通して集光レンズ403にて集光し、ノ・−7ミ
ラー404で反射させてプリント基板11に照射する。
Another conventional example is an inspection apparatus using a fluorescence detection method shown in FIG. In FIG. 6, a mercury lamp 401 is used as a light source, and a filter 4 that transmits ultraviolet rays of a specific wavelength is used.
02, is focused by a condensing lens 403, reflected by a No.-7 mirror 404, and irradiated onto the printed circuit board 11.

紫外線を励起光として作用させると、プリント基板11
の基材部112より蛍光が誘起される。この蛍光をノ・
−7ミラー404を透過させ、蛍光透過フィルタ令 405、焦へpせレンズ406を通して蛍光検出カメラ
407にて受光撮像することにより銅箔部111をシル
エット画像として得るようにしである。この方式におい
ては、銅箔部1110表面状態による影響はないが、ご
み付着による欠陥虚報を発生する。また、一般に蛍光量
が微弱であるため、蛍光検出カメラ407としては、高
価な高感度撮偉管を使用しなければならず、2次元撮像
のために画面を一旦訃止させなければならない。したが
って、プリント基板11の全面走査には、テーブルのス
テップ、リピート制御を必要とし、その結果、検査装置
としてのスループットが大幅に低下するという欠点があ
る。また、ツルダレジス)f施したプリント基板は検査
不能である。
When ultraviolet rays act as excitation light, the printed circuit board 11
Fluorescence is induced from the base material portion 112 of. This fluorescence
The copper foil portion 111 is obtained as a silhouette image by transmitting the light through a -7 mirror 404, passing through a fluorescence transmission filter 405 and a focusing lens 406, and capturing the received light with a fluorescence detection camera 407. In this method, there is no influence from the surface condition of the copper foil portion 1110, but a false defect report is generated due to the adhesion of dust. Further, since the amount of fluorescence is generally weak, an expensive high-sensitivity imaging tube must be used as the fluorescence detection camera 407, and the screen must be temporarily stopped for two-dimensional imaging. Therefore, scanning the entire surface of the printed circuit board 11 requires step and repeat control of the table, and as a result, there is a drawback that the throughput of the inspection apparatus is significantly reduced. Furthermore, printed circuit boards coated with Tsurudaregis cannot be inspected.

〔発明の目的〕[Purpose of the invention]

本発明は上記に鑑みてなされたもので、その目的とする
ところは、銅箔表面の状態の影響を受けることがなく、
かつ、ごみによる虚報も低減でき、連続走査が可能なプ
リント基板パターン検査装置を提供することにある。
The present invention has been made in view of the above, and its purpose is to avoid being affected by the condition of the surface of the copper foil.
Another object of the present invention is to provide a printed circuit board pattern inspection device that can reduce false alarms due to dust and can perform continuous scanning.

〔発明の概要〕[Summary of the invention]

本発明の特徴は、xY座標で表わされる2次元パターン
を有するプリント基板を固定するX、 Y軸方向に移動
するテーブルと、該テーブル上の上記プリント基板表面
に局部的に温風を吹き付ける温風噴射手段と、上記プリ
ント基板に対向する位置に設けた局部的に温風加熱され
た上記プリント基板面上を順次走査する赤外光検出装置
と、この赤外光検出装置によって得られた信号を2値化
法によって上記プリント基板の銅箔部信号と基材部信号
とに正確に分離する2値化回路と、この信号2値1ヒ回
路からの2値化パタ一ン信号から上記プリント基板の銅
箔パターンの良否を判定する欠陥判定回路とからなる構
成とした点にある。
The present invention is characterized by a table that moves in the X and Y axis directions for fixing a printed circuit board having a two-dimensional pattern represented by x and Y coordinates, and a hot air blowing hot air locally onto the surface of the printed circuit board on the table. an infrared light detection device that sequentially scans the surface of the printed circuit board that is locally heated with hot air, which is provided at a position facing the printed circuit board, and a signal obtained by the infrared light detection device; A binarization circuit that accurately separates the copper foil part signal and the base material part signal of the printed circuit board by a binarization method, and a binarization pattern signal from this signal binary 1-hi circuit is used to convert the above printed circuit board into a binary pattern signal. and a defect determination circuit for determining the quality of the copper foil pattern.

〔発明の実施例〕[Embodiments of the invention]

以下本発明を第1因、第2図、第4図に示した実施例お
よび第3図を用いて詳細に説明する。
The present invention will be explained in detail below using the first factor, the embodiments shown in FIGS. 2 and 4, and FIG.

第1図は本発明のプリント基板パターン検査装置の一実
施例を示す概念図である。第1図において、2次元パタ
ーンを有する検査対象プリント基板11.12は、X軸
方向に移動可能のXテーブル21上に設けられた微調用
ΔXテーブル31゜ΔYテーブル32に固定されている
。Xテーブル21はY軸方向に移動可能のYテーブル2
2上にろり、23はXテーブル駆動モータ、24はYテ
ーブル駆動モータであり、33はΔXテーブル駆動モー
タ、34はΔYテーブル駆動モータである。
FIG. 1 is a conceptual diagram showing an embodiment of the printed circuit board pattern inspection apparatus of the present invention. In FIG. 1, a printed circuit board 11, 12 to be inspected having a two-dimensional pattern is fixed to a fine adjustment ΔX table 31 and a ΔY table 32 provided on an X table 21 movable in the X-axis direction. The X table 21 is a Y table 2 that is movable in the Y axis direction.
2, 23 is an X table drive motor, 24 is a Y table drive motor, 33 is a ΔX table drive motor, and 34 is a ΔY table drive motor.

41はベース、42はリニアボールベアリングである。41 is a base, and 42 is a linear ball bearing.

このときのプリント基板11.12の位置決めは、ガイ
ドビン方式や基板端部基準による機械的方法であり、0
.1〜0.2m程度の精度で位置合わせすることができ
る。
At this time, the printed circuit boards 11 and 12 are positioned by a guide bin method or a mechanical method based on the board edge reference.
.. Positioning can be performed with an accuracy of about 1 to 0.2 m.

54.52は画像検出部で、プリント基板11゜12の
同一位置をそれぞれ撮像する位置に固足してめる。画像
検出部51.52の出力信号は、それぞれ2値化回路6
1.62を経てマトリック状に配置されたデータ記憶装
置71.72に2値化パタ一ン信号として一時記憶され
、欠陥判定回路80に送られてパターン内の断線、ショ
ート、凹凸、ピンホール、残銅付着等の欠陥が抽出され
る。
Reference numerals 54 and 52 denote image detection units that fix the same positions on the printed circuit boards 11 and 12 at positions where images are to be taken, respectively. The output signals of the image detection units 51 and 52 are respectively sent to the binarization circuit 6.
1.62, it is temporarily stored as a binary pattern signal in the data storage devices 71.72 arranged in a matrix, and sent to the defect determination circuit 80 to detect disconnections, shorts, irregularities, pinholes, etc. in the pattern. Defects such as residual copper adhesion are extracted.

90は位置ずれ検出回路、99は制御回路でるる。90 is a positional deviation detection circuit, and 99 is a control circuit.

第2図は第1図の検査対象プリント基板の板面レイアウ
トの一実施例を示す平面図である。第2図において、1
01は位置合わせガイドピン穴、102は基板外周部、
103はプリント基板仕上り外&線、104はプリント
パターンエリアで、検査範囲はプリントパターンエリア
104で、必要に応じて基板仕上り外形線103内も検
査する。
FIG. 2 is a plan view showing an example of the board layout of the printed circuit board to be inspected in FIG. 1. In Figure 2, 1
01 is the alignment guide pin hole, 102 is the outer periphery of the board,
Reference numeral 103 indicates the outside and line of the finished printed circuit board, and 104 indicates the printed pattern area.The inspection range is the printed pattern area 104, and the inside of the finished outer line of the printed circuit board 103 is also inspected if necessary.

基板外周部102の4隅に位置するコーナパターンP1
〜P4は、いず牡もプリント基板11 (12)の基材
部112と銅箔部111(第4囚参照)とか直角をなす
境界線が得られ、その直角境界線はテーブル移動軸のX
Y方向と一致することから、その1個所または複数個所
を用いて正確な位置合わせおよび基板相互の寸法差、ず
れ量等の検出ノくターンとして用いる。
Corner patterns P1 located at the four corners of the substrate outer peripheral portion 102
~P4 is a boundary line that forms a right angle between the base material part 112 of the printed circuit board 11 (12) and the copper foil part 111 (see prisoner 4), and that right-angled boundary line is parallel to the table movement axis X.
Since it coincides with the Y direction, one or more locations are used for accurate alignment and for detecting dimensional differences, misalignment, etc. between the substrates.

第3図はプリント基板パターンの欠陥モード例を示す図
で、111は銅箔部、112は基板部で、113は断線
、114は欠げ、115はピンホール、116はショー
ト部、117は突起、118は残銅で、エツチンク工程
において、エツチング不光分が発生すると、銅箔厚みが
中途半端な形で残り、その表面は黒化した状態で残る。
FIG. 3 is a diagram showing an example of a defect mode of a printed circuit board pattern, where 111 is a copper foil part, 112 is a board part, 113 is a disconnection, 114 is a chip, 115 is a pinhole, 116 is a short part, and 117 is a protrusion. , 118 is residual copper, and when etching non-light components occur in the etching process, the thickness of the copper foil remains halfway and the surface thereof remains in a blackened state.

本発明は、第1因、第2図に示しfC,構成の装置を用
いて第3図に示す欠陥パターンをA、Bチャンネルの撮
像画の比較方式にて検出するものである。
The present invention detects the defect pattern shown in FIG. 3 using the apparatus having the fC configuration shown in FIG.

ところで、画像検出方式として従来の第5図に示す反射
光検出方式によって第3図のパターンをテレビ画面で見
ると、銅箔部111は白く、基材部112は黒く見える
ことになシ、銅箔部111にごみが付着している場合は
、その部分の反射光が得られず、画面上では黒く写り、
その結果、パターンの断線、ピンホールまたは欠は欠陥
とじて判断される。また、ショートパターンが黒化残銅
であつ次場合も正常な反射光が得られず、2世化画像面
では黒く写り、その結果、その部分には銅箔パターンが
ないものと判定される。この場合は、短絡欠陥の見逃が
しとなる場合もあり、検査装置として信頼性が大幅に低
下することになる。
By the way, when the pattern shown in FIG. 3 is viewed on a TV screen using the conventional reflected light detection method shown in FIG. 5 as an image detection method, the copper foil portion 111 appears white and the base material portion 112 appears black. If there is dust attached to the foil part 111, the reflected light from that part will not be obtained and it will appear black on the screen.
As a result, disconnections, pinholes, or defects in the pattern are determined to be defects. Further, even if the short pattern is blackened residual copper, normal reflected light cannot be obtained and it appears black on the secondary image surface, and as a result, it is determined that there is no copper foil pattern in that part. In this case, a short circuit defect may be overlooked, and the reliability of the inspection device will be significantly reduced.

また、従来の蛍光検出方式の場合は、上記の白黒が逆に
得られ、シfcかって、黒化残銅部は銅箔パターンとし
て認識でき、前者のような見逃し不良は発生しないが、
基材部112に付着したごみは励起のための紫外光をさ
えぎυ、また、基材部112からの蛍光をも遮断するの
で、残銅付着と判定され、虚報欠陥が発生する結果とな
る。
In addition, in the case of the conventional fluorescence detection method, the black and white images described above are obtained inversely, and the blackened residual copper part can be recognized as a copper foil pattern, and the missed defect like the former does not occur.
Since the dust adhering to the base material part 112 blocks the ultraviolet light for excitation υ and also blocks the fluorescence from the base material part 112, it is determined that residual copper has adhered, resulting in a false alarm defect.

そこで、本発明においては、第1図の画像検出部51.
52として第4図の実施例に示す赤外光検出方式のもの
を採用するようにした。第4図において、201は赤外
光検出器、202は温風噴射ノズルで、噴射ノズル20
2からは、加熱ヒータ線203で可熱された空気がブロ
ア204で温風としてジェット状に噴射され、プリント
基板11(12)の局部的表面に吹き付けられろ。この
とさ、熱伝導率が大きい銅箔部111は厚み、幅ともに
極く小さいから瞬間的、かつ、平均的に加熱されるが、
基材部112は熱吸収が遅いため、両者間には大幅な温
度差が生ずる。したがって、この温度差を放出される赤
外線から焦点合わせレンズ205全介して赤外光検出器
201にて検出し、第1図に示す2値化回路61.62
’を通すことにより、銅箔部111の鮮明なパターン金
得るようにしてるる。
Therefore, in the present invention, the image detection section 51. of FIG.
52, an infrared light detection method shown in the embodiment shown in FIG. 4 is adopted. In FIG. 4, 201 is an infrared photodetector, 202 is a hot air injection nozzle, and the injection nozzle 20
2, the air heated by the heater wire 203 is jetted as hot air by the blower 204, and is blown onto the local surface of the printed circuit board 11 (12). In this case, since the copper foil portion 111 with high thermal conductivity is extremely small in both thickness and width, it is heated instantaneously and evenly;
Since the base material portion 112 absorbs heat slowly, a large temperature difference occurs between the two. Therefore, this temperature difference is detected by the infrared light detector 201 from the emitted infrared rays through the focusing lens 205, and the binarization circuits 61 and 62 shown in FIG.
By passing through the copper foil section 111, a clear pattern of the copper foil portion 111 can be obtained.

なお、プリント基板11(12)の移動速度や温風温度
および撮像軸と温風吹き付は点との距離などは、あらか
じめ信号2値化レベルとの対応で最適な値に調整してお
く。
Note that the moving speed of the printed circuit board 11 (12), the hot air temperature, the distance between the imaging axis and the hot air blowing point, etc. are adjusted in advance to optimal values in correspondence with the signal binarization level.

上記した実施例によれば、銅箔表面状態に影響されず、
ツルダレジス1−a−施したプリント基板でも検査可能
であり、連続走査により検査のスルーブツトも満足に得
ることができる。
According to the embodiment described above, it is not affected by the copper foil surface condition;
It is also possible to inspect a printed circuit board provided with a Tsuruda resist 1-a, and a satisfactory inspection throughput can be obtained by continuous scanning.

また、温風ジェットによシブリント基板11(12)上
のごみ類はほとんど排除され、残ったとしても銅箔部1
11の信号レベルt−2値化レベルに変換できなくなる
まで低下さぞるほどの影響はなく、常に安定した画像が
得られ、高信頼性のプリント基板パターン検査装置とす
ることができる。さらに、温風噴射ノズル202を複数
個設け、基板移動方向に対して、その前後左右の組み合
わせにて基板移動の往復への対応、ごみ排除率の向上全
はかるようにしてもよい。
In addition, most of the dust on the shiblint board 11 (12) is removed by the hot air jet, and even if it remains, the copper foil part 1
There is no such influence that the signal level of No. 11 is lowered to the point where it cannot be converted to the t-binarization level, stable images can always be obtained, and a highly reliable printed circuit board pattern inspection apparatus can be obtained. Furthermore, a plurality of hot air jet nozzles 202 may be provided, and by combining them front, rear, left and right with respect to the direction of substrate movement, it is possible to deal with the reciprocating movement of the substrate and to improve the dust removal rate.

〔発明の効果〕〔Effect of the invention〕

以上説明し次ように、本発明によれば、銅箔表面の状態
の影響を受けることなく、かつ、ごみによる虚報も低減
でき、連続走査が可能でめシ、さらに、ノルダレシスト
を施したプリント基板にも対応可能であり、検査信頼度
を大幅に向上できるという効果がある。
As explained above and as follows, according to the present invention, it is possible to reduce false alarms due to dust without being affected by the condition of the surface of the copper foil, and to enable continuous scanning. It is also possible to respond to various conditions, and has the effect of significantly improving test reliability.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のプリント基板パターン検査装置の一実
施例を示す概念図、第2図は第1図の検査対象プリント
基板の板面レイアウトの一実施例を示す平面図、第3図
はプリント基板パターンの欠陥モード例を示す図、第4
図は第1図の画像検出部の一実施例を示す赤外光検出方
式のものの構成図、第5囚、第6図はそれぞれ従来の反
射光検出方式および蛍光検出方式の画像検出部の構成図
でおる。 11.12・・・検査対称プリント基板、21.22・
・・X、Yテーブル、31.32・・・ΔX、ΔYテー
ブル、51.52・・・画像検出部、61.62・・・
信号2値化回路、71.72・・・記憶装置、80・・
・欠陥判定回路、90・・・位置すれ検出回路、99・
・・制御回路、111・・・銅箔部、112・・・基材
部、201・・・赤外光検出器、202・・・温風噴射
ノズル、tit力11名】 # 1 口 #2 目 茅3 巴 //δ # 4 目 /I (/2) 羊5 の
FIG. 1 is a conceptual diagram showing an embodiment of the printed circuit board pattern inspection apparatus of the present invention, FIG. 2 is a plan view showing an embodiment of the board surface layout of the printed circuit board to be inspected in FIG. 1, and FIG. Diagram 4 showing an example of a defect mode of a printed circuit board pattern
The figure is a configuration diagram of an infrared light detection type image detection unit showing an example of the image detection unit in Figure 1, and Figures 5 and 6 are configurations of conventional reflected light detection type and fluorescence detection type image detection units, respectively. Illustrated. 11.12... Inspection target printed circuit board, 21.22.
...
Signal binarization circuit, 71.72...Storage device, 80...
・Defect determination circuit, 90... Misalignment detection circuit, 99・
... Control circuit, 111 ... Copper foil part, 112 ... Base material part, 201 ... Infrared light detector, 202 ... Hot air injection nozzle, tit force 11 people] #1 Mouth #2 Eye 3 Tomoe//δ # 4 Eye/I (/2) Sheep 5

Claims (1)

【特許請求の範囲】 1、XY座標で表わされる2次元パターンを有するプリ
ント基板を固定するX、Y軸方向に移動するテーブルと
、該テーブル上の前記プリント基板表面に局部的に温風
を吹き付ける温風噴射手段と、前記プリント基板に対向
する位置に設けた局部的に温風加熱された前記プリント
基板面上を順次走査する赤外光検出装置と、該赤外光検
出装置によつて得られた信号を2値化法によつて前記プ
リント基板の銅箔部信号と基材部信号とに正確に分離す
る信号2値化回路と、該信号2値化回路からの2値化パ
ターン信号から前記プリント基板の銅箔パターンの良否
を判定する欠陥判定回路とからなることを特徴とするプ
リント基板パターン検査装置。 2、前記プリント基板は同一パターンのプリント基板2
枚からなり、前記赤外光検出装置は、前記それぞれのプ
リント基板に対向するように2組設けてあり、前記各プ
リント基板面上を同期して走査するように構成してあり
、前記欠陥判定回路は両者のパターンの局部的特徴の一
致、不一致を判定するようにしてある特許請求の範囲第
1項記載のプリント基板パターン検査装置。
[Claims] 1. A table that moves in the X and Y axis directions for fixing a printed circuit board having a two-dimensional pattern represented by XY coordinates, and blows hot air locally onto the surface of the printed circuit board on the table. A hot air jetting means, an infrared light detection device provided at a position facing the printed circuit board and sequentially scanning the surface of the printed circuit board that is locally heated with hot air, and an infrared light detection device that a signal binarization circuit that accurately separates the signal into a copper foil part signal and a base material part signal of the printed circuit board by a binarization method; and a binarization pattern signal from the signal binarization circuit. A printed circuit board pattern inspection apparatus comprising: a defect determination circuit for determining the quality of the copper foil pattern of the printed circuit board. 2. The printed circuit board has the same pattern.
The infrared light detection device is provided in two sets so as to face each of the printed circuit boards, and is configured to scan the surface of each of the printed circuit boards in synchronization, and the infrared light detection device is configured to scan the surface of each of the printed circuit boards in synchronization. 2. A printed circuit board pattern inspection apparatus according to claim 1, wherein the circuit is configured to determine whether local features of both patterns match or do not match.
JP3128285A 1985-02-19 1985-02-19 Printed circuit board pattern inspection equipment Pending JPS61189443A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3128285A JPS61189443A (en) 1985-02-19 1985-02-19 Printed circuit board pattern inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3128285A JPS61189443A (en) 1985-02-19 1985-02-19 Printed circuit board pattern inspection equipment

Publications (1)

Publication Number Publication Date
JPS61189443A true JPS61189443A (en) 1986-08-23

Family

ID=12326961

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3128285A Pending JPS61189443A (en) 1985-02-19 1985-02-19 Printed circuit board pattern inspection equipment

Country Status (1)

Country Link
JP (1) JPS61189443A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004023122A1 (en) * 2002-09-03 2004-03-18 Hamamatsu Foundation For Science And Technology Promotion Pattern inspection method and inspection device therefor
JP2007093305A (en) * 2005-09-27 2007-04-12 Matsushita Electric Works Ltd Metal-foiled laminate sheet inspection device
CN103018163A (en) * 2011-09-21 2013-04-03 技嘉科技股份有限公司 Fault detection method and fault detection device
CN115389820A (en) * 2022-10-27 2022-11-25 广东微容电子科技有限公司 MLCC insulation resistance detection device and use method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004023122A1 (en) * 2002-09-03 2004-03-18 Hamamatsu Foundation For Science And Technology Promotion Pattern inspection method and inspection device therefor
JPWO2004023122A1 (en) * 2002-09-03 2005-12-22 財団法人浜松科学技術研究振興会 Pattern inspection method and inspection apparatus
JP4504191B2 (en) * 2002-09-03 2010-07-14 財団法人浜松科学技術研究振興会 Pattern inspection method and inspection apparatus
JP2007093305A (en) * 2005-09-27 2007-04-12 Matsushita Electric Works Ltd Metal-foiled laminate sheet inspection device
CN103018163A (en) * 2011-09-21 2013-04-03 技嘉科技股份有限公司 Fault detection method and fault detection device
CN115389820A (en) * 2022-10-27 2022-11-25 广东微容电子科技有限公司 MLCC insulation resistance detection device and use method

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