[go: up one dir, main page]

JPS6067651U - Analyzer sample mounting device - Google Patents

Analyzer sample mounting device

Info

Publication number
JPS6067651U
JPS6067651U JP15997883U JP15997883U JPS6067651U JP S6067651 U JPS6067651 U JP S6067651U JP 15997883 U JP15997883 U JP 15997883U JP 15997883 U JP15997883 U JP 15997883U JP S6067651 U JPS6067651 U JP S6067651U
Authority
JP
Japan
Prior art keywords
sample mounting
mounting device
sample
analyzer
analyzer sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15997883U
Other languages
Japanese (ja)
Other versions
JPH037881Y2 (en
Inventor
啓義 副島
Original Assignee
株式会社島津製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社島津製作所 filed Critical 株式会社島津製作所
Priority to JP15997883U priority Critical patent/JPS6067651U/en
Publication of JPS6067651U publication Critical patent/JPS6067651U/en
Application granted granted Critical
Publication of JPH037881Y2 publication Critical patent/JPH037881Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図A、 Bは夫々異る従来例の縦断面図、第2図A
、 B、 Cは上記従来例で不定形の試料を扱った場合
の縦断面図、第3図は本考案の一実施例の縦断面図、第
4図は同実施例の斜視図、第5図は本考案の他の一実施
例の斜視図、第6図は更に他の実施例の要部断面図であ
る。 1・・・試料ホルダ本体、2・・・蟻溝、3・・・試料
ステージ、5・・・キャップ、6・・・内向き張り出し
、8・・・ピン、9・・・押え板、10・・・窓。
Figures 1A and B are longitudinal sectional views of different conventional examples, and Figure 2A
, B, and C are longitudinal cross-sectional views of the conventional example described above when handling an irregularly shaped sample, FIG. 3 is a vertical cross-sectional view of an embodiment of the present invention, FIG. 4 is a perspective view of the same embodiment, and FIG. The figure is a perspective view of another embodiment of the present invention, and FIG. 6 is a sectional view of a main part of still another embodiment. DESCRIPTION OF SYMBOLS 1... Sample holder body, 2... Dovetail groove, 3... Sample stage, 5... Cap, 6... Inward protrusion, 8... Pin, 9... Holding plate, 10 ···window.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)試料が収容される試料ホルダの底面に裏側から突
出量が調節可能なピンを複数本突設し、同試料ホルダの
上面開口に、窓を有する押え板を着脱自在に取着してな
る分析装置の試料取付は装置。
(1) A plurality of pins whose protrusion amount can be adjusted from the back side are provided on the bottom of the sample holder in which the sample is accommodated, and a holding plate with a window is removably attached to the top opening of the sample holder. The sample mounting of the analyzer is the device.
(2)互に形状の異る窓を有する複数種の押え板が用意
されて任意選択可能になっている実用新案登録請求の範
囲第1項記載の分析装置の試料取付は装置。
(2) A sample mounting device for an analyzer according to claim 1, wherein a plurality of types of holding plates having windows of different shapes are provided and can be selected arbitrarily.
JP15997883U 1983-10-15 1983-10-15 Analyzer sample mounting device Granted JPS6067651U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15997883U JPS6067651U (en) 1983-10-15 1983-10-15 Analyzer sample mounting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15997883U JPS6067651U (en) 1983-10-15 1983-10-15 Analyzer sample mounting device

Publications (2)

Publication Number Publication Date
JPS6067651U true JPS6067651U (en) 1985-05-14
JPH037881Y2 JPH037881Y2 (en) 1991-02-27

Family

ID=30352006

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15997883U Granted JPS6067651U (en) 1983-10-15 1983-10-15 Analyzer sample mounting device

Country Status (1)

Country Link
JP (1) JPS6067651U (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5217776U (en) * 1975-06-20 1977-02-08
JPS5240660U (en) * 1975-09-17 1977-03-23
JPS53114286U (en) * 1977-02-18 1978-09-11

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5150964A (en) * 1974-10-30 1976-05-06 Jii Pii Dei Kk Dairisekichono moyoojusurufuhowahoriesuterujushiseikeihinno seizoho

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5217776U (en) * 1975-06-20 1977-02-08
JPS5240660U (en) * 1975-09-17 1977-03-23
JPS53114286U (en) * 1977-02-18 1978-09-11

Also Published As

Publication number Publication date
JPH037881Y2 (en) 1991-02-27

Similar Documents

Publication Publication Date Title
JPS6067651U (en) Analyzer sample mounting device
JPS60111027U (en) Capacitor mounting structure
JPS5852152U (en) container holder
JPS58119962U (en) Soldering jig
JPS6093418U (en) cable holder
JPS58134743U (en) Detector holding device
JPS6045654U (en) Sample flattening jig
JPS6054280U (en) tape cassette
JPS6054328U (en) Lead frame magazine case for semiconductor devices
JPS59132773U (en) Spacer attachment/detachment tool
JPS60111046U (en) wafer holder
JPS60478U (en) Single lid type U-shaped gutter
JPS6144884U (en) Cabinet mounting device
JPS60103650U (en) Sample holder for automatic polishing machine
JPS59178673U (en) display device
JPS58104219U (en) wall panel mounting device
JPS59113747U (en) Corrosion test piece holder
JPS60151754U (en) Water drop removal device
JPS6080490U (en) nameplate cover
JPS60184671U (en) book holder for reading
JPS59168341U (en) carrying tool
JPS6113885U (en) Sample plate holding device
JPS5915217U (en) Suspension wire rack
JPS60112478U (en) One touch case set case
JPS59155537U (en) Parallel block for holding sample