JPS60225841A - Photosensitive resin composition - Google Patents
Photosensitive resin compositionInfo
- Publication number
- JPS60225841A JPS60225841A JP8309584A JP8309584A JPS60225841A JP S60225841 A JPS60225841 A JP S60225841A JP 8309584 A JP8309584 A JP 8309584A JP 8309584 A JP8309584 A JP 8309584A JP S60225841 A JPS60225841 A JP S60225841A
- Authority
- JP
- Japan
- Prior art keywords
- formula
- compd
- ethylenically unsaturated
- resin composition
- photosensitive resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011342 resin composition Substances 0.000 title claims description 21
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims abstract description 14
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims abstract description 8
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 claims abstract description 5
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims abstract description 5
- 125000002947 alkylene group Chemical group 0.000 claims abstract description 3
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims abstract description 3
- PAPBSGBWRJIAAV-UHFFFAOYSA-N ε-Caprolactone Chemical compound O=C1CCCCCO1 PAPBSGBWRJIAAV-UHFFFAOYSA-N 0.000 claims abstract description 3
- 150000001875 compounds Chemical class 0.000 claims description 37
- -1 tribromomethyl group Chemical group 0.000 claims description 11
- 239000001257 hydrogen Substances 0.000 claims description 6
- 229910052739 hydrogen Inorganic materials 0.000 claims description 6
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 6
- 150000002896 organic halogen compounds Chemical class 0.000 claims description 6
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical group [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 claims description 2
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Chemical group BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 claims description 2
- 229910052794 bromium Chemical group 0.000 claims description 2
- 125000004432 carbon atom Chemical group C* 0.000 claims description 2
- 229910052801 chlorine Inorganic materials 0.000 claims description 2
- 239000000460 chlorine Substances 0.000 claims description 2
- 125000004029 hydroxymethyl group Chemical group [H]OC([H])([H])* 0.000 claims description 2
- 125000001309 chloro group Chemical group Cl* 0.000 claims 1
- 229920000642 polymer Polymers 0.000 abstract description 12
- 230000035945 sensitivity Effects 0.000 abstract description 11
- 239000000463 material Substances 0.000 abstract description 5
- 150000003254 radicals Chemical class 0.000 abstract description 5
- AOJDZKCUAATBGE-UHFFFAOYSA-N bromomethane Chemical compound Br[CH2] AOJDZKCUAATBGE-UHFFFAOYSA-N 0.000 abstract 1
- 239000007859 condensation product Substances 0.000 abstract 1
- 150000002148 esters Chemical class 0.000 abstract 1
- 238000007747 plating Methods 0.000 description 24
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 12
- 238000000034 method Methods 0.000 description 11
- 239000000243 solution Substances 0.000 description 10
- 238000012360 testing method Methods 0.000 description 9
- 239000002202 Polyethylene glycol Substances 0.000 description 8
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 8
- 125000003827 glycol group Chemical group 0.000 description 8
- 229920001223 polyethylene glycol Polymers 0.000 description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 7
- 229910052802 copper Inorganic materials 0.000 description 7
- 239000010949 copper Substances 0.000 description 7
- 239000000126 substance Substances 0.000 description 7
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 6
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 6
- 239000000178 monomer Substances 0.000 description 6
- 206010034972 Photosensitivity reaction Diseases 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- 230000036211 photosensitivity Effects 0.000 description 5
- HCLJOFJIQIJXHS-UHFFFAOYSA-N 2-[2-[2-(2-prop-2-enoyloxyethoxy)ethoxy]ethoxy]ethyl prop-2-enoate Chemical compound C=CC(=O)OCCOCCOCCOCCOC(=O)C=C HCLJOFJIQIJXHS-UHFFFAOYSA-N 0.000 description 4
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 4
- 238000004132 cross linking Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- 150000002734 metacrylic acid derivatives Chemical class 0.000 description 3
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- SOGAXMICEFXMKE-UHFFFAOYSA-N Butylmethacrylate Chemical compound CCCCOC(=O)C(C)=C SOGAXMICEFXMKE-UHFFFAOYSA-N 0.000 description 2
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- DAKWPKUUDNSNPN-UHFFFAOYSA-N Trimethylolpropane triacrylate Chemical compound C=CC(=O)OCC(CC)(COC(=O)C=C)COC(=O)C=C DAKWPKUUDNSNPN-UHFFFAOYSA-N 0.000 description 2
- OKKRPWIIYQTPQF-UHFFFAOYSA-N Trimethylolpropane trimethacrylate Chemical compound CC(=C)C(=O)OCC(CC)(COC(=O)C(C)=C)COC(=O)C(C)=C OKKRPWIIYQTPQF-UHFFFAOYSA-N 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- DIKBFYAXUHHXCS-UHFFFAOYSA-N bromoform Chemical compound BrC(Br)Br DIKBFYAXUHHXCS-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 239000000539 dimer Substances 0.000 description 2
- 238000009472 formulation Methods 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- OKJPEAGHQZHRQV-UHFFFAOYSA-N iodoform Chemical compound IC(I)I OKJPEAGHQZHRQV-UHFFFAOYSA-N 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 230000035515 penetration Effects 0.000 description 2
- 229920000058 polyacrylate Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000001294 propane Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 150000005846 sugar alcohols Polymers 0.000 description 2
- HJUGFYREWKUQJT-UHFFFAOYSA-N tetrabromomethane Chemical compound BrC(Br)(Br)Br HJUGFYREWKUQJT-UHFFFAOYSA-N 0.000 description 2
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- OGVPXEPSTZMAFF-UHFFFAOYSA-N 1,1,1,2,2-pentabromoethane Chemical compound BrC(Br)C(Br)(Br)Br OGVPXEPSTZMAFF-UHFFFAOYSA-N 0.000 description 1
- RVHSTXJKKZWWDQ-UHFFFAOYSA-N 1,1,1,2-tetrabromoethane Chemical compound BrCC(Br)(Br)Br RVHSTXJKKZWWDQ-UHFFFAOYSA-N 0.000 description 1
- MSAHTMIQULFMRG-UHFFFAOYSA-N 1,2-diphenyl-2-propan-2-yloxyethanone Chemical compound C=1C=CC=CC=1C(OC(C)C)C(=O)C1=CC=CC=C1 MSAHTMIQULFMRG-UHFFFAOYSA-N 0.000 description 1
- HSKPJQYAHCKJQC-UHFFFAOYSA-N 1-ethylanthracene-9,10-dione Chemical compound O=C1C2=CC=CC=C2C(=O)C2=C1C=CC=C2CC HSKPJQYAHCKJQC-UHFFFAOYSA-N 0.000 description 1
- IISHLYLZTYTIJJ-UHFFFAOYSA-N 1-hydroxyethyl 2-methylprop-2-enoate Chemical compound CC(O)OC(=O)C(C)=C IISHLYLZTYTIJJ-UHFFFAOYSA-N 0.000 description 1
- BGJQNPIOBWKQAW-UHFFFAOYSA-N 1-tert-butylanthracene-9,10-dione Chemical compound O=C1C2=CC=CC=C2C(=O)C2=C1C=CC=C2C(C)(C)C BGJQNPIOBWKQAW-UHFFFAOYSA-N 0.000 description 1
- WHTZQYDVDPHTAM-UHFFFAOYSA-N 2,2,2-tribromo-1-phenylethanone Chemical compound BrC(Br)(Br)C(=O)C1=CC=CC=C1 WHTZQYDVDPHTAM-UHFFFAOYSA-N 0.000 description 1
- UFUXVJFOILLERS-UHFFFAOYSA-N 2,2-dimethylpropane-1,3-diol;prop-2-enoic acid Chemical compound OC(=O)C=C.OCC(C)(C)CO UFUXVJFOILLERS-UHFFFAOYSA-N 0.000 description 1
- RNIPJYFZGXJSDD-UHFFFAOYSA-N 2,4,5-triphenyl-1h-imidazole Chemical class C1=CC=CC=C1C1=NC(C=2C=CC=CC=2)=C(C=2C=CC=CC=2)N1 RNIPJYFZGXJSDD-UHFFFAOYSA-N 0.000 description 1
- KUBDPQJOLOUJRM-UHFFFAOYSA-N 2-(chloromethyl)oxirane;4-[2-(4-hydroxyphenyl)propan-2-yl]phenol Chemical compound ClCC1CO1.C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 KUBDPQJOLOUJRM-UHFFFAOYSA-N 0.000 description 1
- JKNCOURZONDCGV-UHFFFAOYSA-N 2-(dimethylamino)ethyl 2-methylprop-2-enoate Chemical compound CN(C)CCOC(=O)C(C)=C JKNCOURZONDCGV-UHFFFAOYSA-N 0.000 description 1
- DPBJAVGHACCNRL-UHFFFAOYSA-N 2-(dimethylamino)ethyl prop-2-enoate Chemical compound CN(C)CCOC(=O)C=C DPBJAVGHACCNRL-UHFFFAOYSA-N 0.000 description 1
- JDPZLHCKBWMLDH-UHFFFAOYSA-N 2-[2-[2-[2-[2-[2-[2-[2-(2-prop-2-enoyloxyethoxy)ethoxy]ethoxy]ethoxy]ethoxy]ethoxy]ethoxy]ethoxy]ethyl prop-2-enoate Chemical compound C=CC(=O)OCCOCCOCCOCCOCCOCCOCCOCCOCCOC(=O)C=C JDPZLHCKBWMLDH-UHFFFAOYSA-N 0.000 description 1
- ZCDADJXRUCOCJE-UHFFFAOYSA-N 2-chlorothioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(Cl)=CC=C3SC2=C1 ZCDADJXRUCOCJE-UHFFFAOYSA-N 0.000 description 1
- KMNCBSZOIQAUFX-UHFFFAOYSA-N 2-ethoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OCC)C(=O)C1=CC=CC=C1 KMNCBSZOIQAUFX-UHFFFAOYSA-N 0.000 description 1
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 description 1
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 1
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 1
- WHNWPMSKXPGLAX-UHFFFAOYSA-N N-Vinyl-2-pyrrolidone Chemical compound C=CN1CCCC1=O WHNWPMSKXPGLAX-UHFFFAOYSA-N 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- HVVWZTWDBSEWIH-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(CO)(COC(=O)C=C)COC(=O)C=C HVVWZTWDBSEWIH-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 1
- 150000007824 aliphatic compounds Chemical class 0.000 description 1
- 150000001336 alkenes Chemical class 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 150000008366 benzophenones Chemical class 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- FQUNFJULCYSSOP-UHFFFAOYSA-N bisoctrizole Chemical compound N1=C2C=CC=CC2=NN1C1=CC(C(C)(C)CC(C)(C)C)=CC(CC=2C(=C(C=C(C=2)C(C)(C)CC(C)(C)C)N2N=C3C=CC=CC3=N2)O)=C1O FQUNFJULCYSSOP-UHFFFAOYSA-N 0.000 description 1
- 229950005228 bromoform Drugs 0.000 description 1
- KVNRLNFWIYMESJ-UHFFFAOYSA-N butyronitrile Chemical compound CCCC#N KVNRLNFWIYMESJ-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000007334 copolymerization reaction Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- FJBFPHVGVWTDIP-UHFFFAOYSA-N dibromomethane Chemical compound BrCBr FJBFPHVGVWTDIP-UHFFFAOYSA-N 0.000 description 1
- NZZFYRREKKOMAT-UHFFFAOYSA-N diiodomethane Chemical compound ICI NZZFYRREKKOMAT-UHFFFAOYSA-N 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- XPPKVPWEQAFLFU-UHFFFAOYSA-J diphosphate(4-) Chemical compound [O-]P([O-])(=O)OP([O-])([O-])=O XPPKVPWEQAFLFU-UHFFFAOYSA-J 0.000 description 1
- 235000011180 diphosphates Nutrition 0.000 description 1
- GMSCBRSQMRDRCD-UHFFFAOYSA-N dodecyl 2-methylprop-2-enoate Chemical compound CCCCCCCCCCCCOC(=O)C(C)=C GMSCBRSQMRDRCD-UHFFFAOYSA-N 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 238000010291 electrical method Methods 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 125000004185 ester group Chemical group 0.000 description 1
- 125000001033 ether group Chemical group 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 239000003999 initiator Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- KCAMXZBMXVIIQN-UHFFFAOYSA-N octan-3-yl 2-methylprop-2-enoate Chemical compound CCCCCC(CC)OC(=O)C(C)=C KCAMXZBMXVIIQN-UHFFFAOYSA-N 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920000193 polymethacrylate Polymers 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- JPYTXSWRYBJQHD-UHFFFAOYSA-N prop-2-enoic acid;prop-1-enylbenzene Chemical compound OC(=O)C=C.CC=CC1=CC=CC=C1 JPYTXSWRYBJQHD-UHFFFAOYSA-N 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- CNCAHWAKBQIUMY-UHFFFAOYSA-N tribromo(tribromomethylsulfonyl)methane Chemical compound BrC(Br)(Br)S(=O)(=O)C(Br)(Br)Br CNCAHWAKBQIUMY-UHFFFAOYSA-N 0.000 description 1
- DWWMSEANWMWMCB-UHFFFAOYSA-N tribromomethylsulfonylbenzene Chemical compound BrC(Br)(Br)S(=O)(=O)C1=CC=CC=C1 DWWMSEANWMWMCB-UHFFFAOYSA-N 0.000 description 1
- 229920006305 unsaturated polyester Polymers 0.000 description 1
- 229920006163 vinyl copolymer Polymers 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/029—Inorganic compounds; Onium compounds; Organic compounds having hetero atoms other than oxygen, nitrogen or sulfur
- G03F7/0295—Photolytic halogen compounds
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は感光性樹脂組成物、更に詳しくは印刷配線板の
製造、金属の精密加工等に用いられるエツチングレジス
ト又はめつきレジストとして、特に優れた密着性と作業
性又は高感度を有する感光性樹脂組成物に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention provides a photosensitive resin composition, more specifically, an etching resist or a plating resist used in the production of printed wiring boards, metal precision processing, etc., which has particularly excellent adhesion and workability. The present invention relates to a photosensitive resin composition having high sensitivity.
印刷配線板の製造、金属の精密加工等の分野において、
エツチング、めっき等の基材の化学的。In the fields of printed wiring board manufacturing, metal precision processing, etc.
Chemical base materials such as etching and plating.
電気的手法を用いる際にレジスト材料として感光性樹脂
組成物及びこれを用いた感光性エレメントを使用するこ
とが知られている。感光性エレメントとしては支持体上
に感光性樹脂組成物を積層したものが広く使用されてい
る。It is known to use a photosensitive resin composition and a photosensitive element using the same as a resist material when using an electrical method. As a photosensitive element, one in which a photosensitive resin composition is laminated on a support is widely used.
従来、印刷配線板の製造法には、テンティング法とめつ
き法という二つの方法がある。テンティング法は、チッ
プ搭載のための銅スルーホールをレジストで保護し、エ
ツチング、レジストはくりを経て、電気回路形成を行な
うのに対し、めっき法は、電気めっきによってスルーホ
ールに銅を析出させ、半田めっきで保護し、レジストは
くり。Conventionally, there are two methods for manufacturing printed wiring boards: a tenting method and a plating method. In the tenting method, the copper through-hole for mounting the chip is protected with a resist, and then an electric circuit is formed through etching and resist peeling, whereas in the plating method, copper is deposited in the through-hole by electroplating. , protect with solder plating, and remove the resist.
エツチングによって電気回路の形成を行なう方法である
。多くの印刷配線板のメーカーは、この方法を用途によ
って使い分けている。従って、使用する感光性樹脂組成
物は、現像液や水洗のスプレー圧に耐えうる充分な膜強
度と、長時間のめっき液浸漬に耐えうる充分な耐薬品性
を有することが要求される。This is a method of forming electric circuits by etching. Many printed wiring board manufacturers use this method depending on the application. Therefore, the photosensitive resin composition used is required to have sufficient film strength to withstand the spray pressure of the developer and water washing, and sufficient chemical resistance to withstand long-term immersion in the plating solution.
従来の感光性樹脂組成物は、特公昭45−28063号
公報に開示されているように、エチレン性不飽和化合物
として、1官能以上のアクリレート又はメタクリレート
を1種以上用いることによって。Conventional photosensitive resin compositions, as disclosed in Japanese Patent Publication No. 45-28063, use one or more monofunctional or more functional acrylates or methacrylates as ethylenically unsaturated compounds.
良好な感度、解像度、密着性を得ることができる。Good sensitivity, resolution, and adhesion can be obtained.
特に、高感度の感光性樹脂組成物を得る方法として9組
成物が遊離ラジカル発生開始剤及び不飽和化合物からな
る重合系においては、それに用いられる不飽和化合物の
感光度を高めることが一般的である。このような目的で
種々の不飽和化合物が検討されているが多価アルコール
のポリアクリレート類が広く使われている。その中でも
高感度のアクリレートとしてポリエーテル結合、特にポ
リエチレングリコール構造を有するアクリレートが特に
有用である。この目的に合致したものとしてテトラエチ
レングリコールジアクリレート、ノナエチレングリコー
ルジアクリレート等がアシ、これらは市販品として例え
ば新中村化学■よ、9 、 NKエステルA−40,A
−9Gとして提供されている。場合によっては不飽和化
合物以外にも同様の目的でポリエチレングリコール構造
を導入するとともある。特公昭55−33801号公報
にはそのような例が示されている。In particular, as a method for obtaining a highly sensitive photosensitive resin composition, in a polymerization system in which the composition consists of a free radical generating initiator and an unsaturated compound, it is common to increase the photosensitivity of the unsaturated compound used therein. be. Although various unsaturated compounds have been studied for this purpose, polyacrylates of polyhydric alcohols are widely used. Among these, acrylates having a polyether bond, particularly a polyethylene glycol structure, are particularly useful as highly sensitive acrylates. Tetraethylene glycol diacrylate, nonaethylene glycol diacrylate, etc. are suitable for this purpose, and these are commercially available products such as Shin Nakamura Kagaku, 9, NK Ester A-40, A.
-9G. In some cases, polyethylene glycol structures may be introduced in addition to unsaturated compounds for the same purpose. Such an example is shown in Japanese Patent Publication No. 55-33801.
しかしながら、このようなポリエチレングリコール構造
を有するアクリレート等の化合物は、感光性樹脂組成物
及びこれを用いた感光性エレメントの感度向上には有用
であるが、ポリエチレングリコール構造が親水性である
ため、めっき液などとの親和性が強く耐めっき性を低下
させるという欠点を有する。特にめっき液のpHが高く
、比較的高温で使用されるビロリン酸銅めっきの耐性は
。However, although compounds such as acrylates having such a polyethylene glycol structure are useful for improving the sensitivity of photosensitive resin compositions and photosensitive elements using the same, since the polyethylene glycol structure is hydrophilic, they are difficult to use for plating. It has the disadvantage that it has a strong affinity with liquids and reduces plating resistance. In particular, the durability of birophosphate copper plating, which is used at relatively high temperatures due to the high pH of the plating solution, is important.
とりわけ悪く実用に供することができない。このため耐
めっき性が要求される用途には、このようなポリエチレ
ングリコール構造を有するアクリレート等の化合物の使
用量は制限され、その分感光度の低下をまねくという問
題があった。It is particularly bad and cannot be put to practical use. For this reason, in applications where plating resistance is required, the amount of compounds such as acrylates having such a polyethylene glycol structure to be used is limited, resulting in a corresponding decrease in photosensitivity.
一方、従来の感光性樹脂組成物中のエチレン性不飽和化
合物は、感光速度を速め、光照射後の架橋密度を高くす
るという目的で3官能の化合物を用いてきた。しかしな
がら、3官能の化合物を1種又は2種以上使用しても、
架橋密度が十分てけなく、スルーホールのテント破れ、
欠け、スルーホールエツチングなどの製品欠陥が発生す
るという欠点があった。従って、エチレン性不飽和化合
物として、4官能以上の化合物を使用し、光照射後の架
橋密度を更に高くして、膜強度を上げる要求が生じた。On the other hand, as the ethylenically unsaturated compound in conventional photosensitive resin compositions, trifunctional compounds have been used for the purpose of increasing the photosensitive speed and increasing the crosslinking density after light irradiation. However, even if one or more trifunctional compounds are used,
The cross-linking density is not sufficient and the through-hole tent is torn.
This method has the disadvantage that product defects such as chipping and through-hole etching occur. Therefore, there has been a demand for using a tetrafunctional or higher functional compound as the ethylenically unsaturated compound and further increasing the crosslinking density after light irradiation to increase the film strength.
しかしながら、工業用に市販されている4官能以上のエ
チレン性不飽和化合物は、その数が限られており、入手
が困難であるばかりか市販されているものでも粘度が高
いものが多く。However, the number of tetrafunctional or higher ethylenically unsaturated compounds commercially available for industrial use is limited, and not only are they difficult to obtain, but many of the commercially available compounds have high viscosity.
実際にフィルムに塗工する際、希釈溶媒を多量に用いな
ければならず、工業的に有用であるとはいい難い。When actually coating a film, a large amount of diluting solvent must be used, and it is difficult to say that it is industrially useful.
本発明者らは、上記の欠点を解消すべく研究を重ねた結
果2本発明に至った。The present inventors have conducted repeated research in order to eliminate the above-mentioned drawbacks, and as a result, have arrived at two inventions.
本発明は。The present invention is.
CAl 弐(Ilで表わされるエチレン性不飽和化合物
式(I)
(式中Bt 、 R2は水素又はメチル基9mは1又は
2の整数、a、bはa−1−、b=6となる整数であり
。Ethylenically unsaturated compound formula (I) represented by CAl 2 (Il) (wherein Bt, R2 is hydrogen or a methyl group, 9m is an integer of 1 or 2, a, b are integers such that a-1-, b=6 Yes.
a又はbはOでもよい)
及び式[11)で表わされるエチレン性不飽和化合物(
式中2はフェニル基又は置換フェニル基、R1は炭素数
が1〜3のアルキレン基、R2け水素又tlチル基 B
Sは水素、メチル基、エチル基又はCHtXであり、X
は塩素又は臭素である)(Bl 有機/・ロゲン化合物
(C) フィルム性付与ポリマ
ならびに
(DJ 活性線によシ遊離ラジカルを生成しうる増感剤
及び/又は増感剤系
を含有してなる感光性樹脂組成物に関する。a or b may be O) and an ethylenically unsaturated compound represented by formula [11] (
In the formula, 2 is a phenyl group or substituted phenyl group, R1 is an alkylene group having 1 to 3 carbon atoms, R2 is hydrogen or tl-thyl group, B
S is hydrogen, methyl group, ethyl group, or CHtX;
is chlorine or bromine) (Bl organic/-rogen compound (C) film-imparting polymer and (DJ) containing a sensitizer and/or sensitizer system capable of generating free radicals by actinic radiation. The present invention relates to a photosensitive resin composition.
このように、エチレン性不飽和化合物として。Thus, as ethylenically unsaturated compounds.
ポリエチレングリコール構造を持たない6官能のアクリ
レート、又はメタクリレート及びポリエチレングリコー
ル構造を持たない1官能のアクリレート又はメタクリレ
ートを組合せて用いることによって、従来用いられてき
た3官能以下のエチレン性不飽和化合物の組合せでは得
られなかった耐めっき性と強固な膜強度を得ることがで
きる。By using a combination of hexafunctional acrylate or methacrylate that does not have a polyethylene glycol structure and monofunctional acrylate or methacrylate that does not have a polyethylene glycol structure, it is possible to eliminate the conventional combination of trifunctional or less ethylenically unsaturated compounds. It is possible to obtain plating resistance and strong film strength that were previously unavailable.
式(11で表わされるアクリレート又はメタクリレート
は6官能であり、従来用いられてきた3官能以下のもの
と比較すると、光照射後の架橋密度が高く、テント強度
は、従来のものがa9ogf/3.2φであったのに対
し460 gf/3.2φ乃至はそれ以上のテント強度
を持つようになる。又、このような6官能のエチレン性
不飽和化合物は、1分子中にラジカル重合性の不飽和基
を数多く持っているため、感光速度が速く、同一露光量
で比較すると感度が0.5〜1.0段高くなる。又、同
時に光発色剤を存在させておくと、光照射後の色相が濃
く、印刷配線板の製造工程中の修正作業が容易になると
いう利点を持つ。The acrylate or methacrylate represented by formula (11) is hexafunctional, and when compared with conventionally used trifunctional or less functional ones, the crosslinking density after light irradiation is higher, and the tent strength of the conventional one is a9ogf/3. 2φ, it now has a tent strength of 460 gf/3.2φ or more.In addition, such hexafunctional ethylenically unsaturated compounds contain radically polymerizable unsaturated compounds in one molecule. Because it has a large number of saturated groups, the photosensitivity is fast, and when compared with the same exposure amount, the sensitivity is 0.5 to 1.0 steps higher.Also, if a photochromic agent is present at the same time, the It has a dark hue and has the advantage of facilitating correction work during the manufacturing process of printed wiring boards.
置換フェニル基としては、アルキル基、エーテル基、エ
ステル基、水酸基、カルボキシル基等で置換されたフェ
ニル基が用いられる。As the substituted phenyl group, a phenyl group substituted with an alkyl group, an ether group, an ester group, a hydroxyl group, a carboxyl group, etc. is used.
式(II)で表わされるアクリレート又はメタクリレー
トは、Zがフェニル基又社置換フェニル基の場合、従来
見られなかった耐めっき性、特に耐ピロリ酸銅めつき性
が著しく向上する。これはフェニル基又は置換フェニル
基がポリエチレングリコール構造に比べて疎水性であシ
、めっき液など筈の親和力が極めて低いため、長時間め
っき液に浸漬しても、めっき液が感光性樹脂組成物中に
浸透しにくいことによる。一方、このようなフェニル基
又は置換フェニル基は、塩素系溶剤現像液に対して耐性
が強いため、現像液がレジストへ浸透するのを防ぎ、レ
ジストの密着性を向上させ、めっき液の浸透を防いでい
るためと推定される。しかしながら、このような1官能
のアクリレート又はメタクリレートは、感光速度が非常
に遅いため、3官能以上のアクリレート又はメタクリレ
ートと組合せて初めて実用に供されるに足る感光度を得
るに至る。In the acrylate or methacrylate represented by formula (II), when Z is a phenyl group or a substituted phenyl group, plating resistance, particularly resistance to copper pyrolic acid plating, which has not been seen in the past, is significantly improved. This is because the phenyl group or substituted phenyl group is more hydrophobic than the polyethylene glycol structure, and has extremely low affinity with the plating solution, so even if immersed in the plating solution for a long time, the plating solution will not react with the photosensitive resin composition. This is due to the fact that it is difficult to penetrate inside. On the other hand, such phenyl groups or substituted phenyl groups have strong resistance to chlorinated solvent developers, so they prevent the developer from penetrating into the resist, improve the adhesion of the resist, and prevent the penetration of plating solutions. It is presumed that this is due to prevention. However, since such monofunctional acrylates or methacrylates have a very slow photosensitivity, they can only be used in combination with trifunctional or higher functional acrylates or methacrylates to obtain a photosensitivity sufficient for practical use.
本発明に用いられる式(Ilで表わされるエチレン性不
飽和化合物のm、a、bの値には表1のような場合があ
るが
表1
(3)の場合が好ましい。The values of m, a, and b of the ethylenically unsaturated compound represented by the formula (Il) used in the present invention may be as shown in Table 1, but the values shown in Table 1 (3) are preferable.
又式(If)で表わされるエチレン性不飽和化合物とし
ては、耐水性の面からアクリレートよシもメタクリレー
トの方が好ましく、γ−クロローβヒドロキシプロピル
−β′−メタクリロイル(又はアクリロイル)オキシエ
ステル−〇−フタレートカ好ましい。In addition, as the ethylenically unsaturated compound represented by the formula (If), methacrylate is more preferable than acrylate from the viewpoint of water resistance, and γ-chloroβ-hydroxypropyl-β′-methacryloyl (or acryloyl) oxyester-〇 - Phthalate is preferred.
本発明における感光性樹脂組成物中のエチレン性不飽和
化合物の他に、第3成分として従来知られているものを
加えて用いることができるが、感度が高いという点よシ
、アクリレート単量体又はメタクリレート単量体の使用
が好ましい。例えばトリメチロールプロパントリアクリ
レート、ペンタエリスリトールトリアクリレート、1.
6−ヘキサンジオールジアクリレート、2.2−ビス(
4−メタクリロキシエトキシフェニル)プロノくン、ス
2−ビス(4−アクリロキシエトキシフェニル)プロパ
ン、ジペンタへリスリトールペンタアクリレート、トリ
メチロールプロパントリメタクリレート等の多価アルコ
ールのポリアクリレート又はポリメタクリレート、トリ
メチルプロパントリグリシジルエーテルのアクリル酸又
はメタクリル酸との付加物、ビスフェノールAエピクロ
ルヒドリン系のエポキシ樹脂のアクリル酸又はメタクリ
ル酸付加物等のエポキシアクリレート、無水フタル酸−
ネオペンチルグリコール−アクリル酸の1:1:2の縮
合物等の低分子不飽和ポリエステルが挙げられる。In addition to the ethylenically unsaturated compound in the photosensitive resin composition of the present invention, conventionally known third components can be added and used, but in terms of high sensitivity, acrylate monomers Alternatively, the use of methacrylate monomers is preferred. For example, trimethylolpropane triacrylate, pentaerythritol triacrylate, 1.
6-hexanediol diacrylate, 2,2-bis(
Polyacrylates or polymethacrylates of polyhydric alcohols such as 4-methacryloxyethoxyphenyl)pronokun, 2-bis(4-acryloxyethoxyphenyl)propane, dipentaherythritol pentaacrylate, trimethylolpropane trimethacrylate, trimethyl Epoxy acrylates such as adducts of propane triglycidyl ether with acrylic acid or methacrylic acid, acrylic acid or methacrylic acid adducts of bisphenol A epichlorohydrin-based epoxy resins, phthalic anhydride-
Examples include low-molecular unsaturated polyesters such as a 1:1:2 condensate of neopentyl glycol-acrylic acid.
フィルム性付与ポリマに対して式(1)で表わされるエ
チレン性不飽和化合物を10〜45重量%。The amount of the ethylenically unsaturated compound represented by formula (1) is 10 to 45% by weight based on the film properties imparting polymer.
式(I)で表わされるエチレン性不飽和化合物を10〜
45重量%用いることが好ましい。式(Ilで表わされ
るエチレン性不飽和化合物が10重量−未満では感度が
不足し、45重量%を越えると耐めっき性が低下する傾
向がある。式(It)で表わされるエチレン性不飽和化
合物が10重量%未満では耐めっき性が不足し、45重
量%を越えると感度の低下をまねく傾向がある。The ethylenically unsaturated compound represented by formula (I) is 10 to
It is preferable to use 45% by weight. If the amount of the ethylenically unsaturated compound represented by the formula (Il) is less than 10% by weight, the sensitivity will be insufficient, and if it exceeds 45% by weight, the plating resistance will tend to decrease.The ethylenically unsaturated compound represented by the formula (It) If it is less than 10% by weight, the plating resistance will be insufficient, and if it exceeds 45% by weight, it will tend to cause a decrease in sensitivity.
有機ハロゲン化合物としては、活性光により容易にハロ
ゲンラジカルを遊離するもの又は、連鎖移動により容易
にハロゲンラジカルを遊離するものが好ましい。The organic halogen compound is preferably one that easily releases halogen radicals by actinic light or one that easily releases halogen radicals by chain transfer.
有機ハロゲン化合物の例としては、四塩化炭素。An example of an organic halogen compound is carbon tetrachloride.
クロロホルム、ブロモホルム、LLI−1クロロエタン
、臭化メチレン、ヨウ化メチレ/、塩化メチレン、四臭
化炭素、ヨードホルム、1,1,2.2=テトラブロモ
エタン、ペンタブロモエタン、トリブロモアセトフェノ
ン、ビス−(トリブロモメチル)スルホン、トリブロモ
メチルフェニルスル(ホン、塩化ビニル、塩素化オレフ
ィン等が挙げられ為。炭素−)・ロゲン結合強度の弱い
脂肪族・・ロゲン化合物、特に同一炭素上に2個以上の
ノ・ロゲン原子が結合している化合物とシわけ有機ブロ
ム化合物が好ましい。トリブロモメチル基を有する有機
ハロゲン化合物が一層好ましい結果をあたえる。Chloroform, bromoform, LLI-1 chloroethane, methylene bromide, methylene iodide/, methylene chloride, carbon tetrabromide, iodoform, 1,1,2.2=tetrabromoethane, pentabromoethane, tribromoacetophenone, bis- Examples include (tribromomethyl)sulfone, tribromomethylphenylsulfone, vinyl chloride, chlorinated olefins, etc.Carbon-)・Aliphatic compounds with weak rogen bond strength...Rogen compounds, especially two atoms on the same carbon Organic bromine compounds, which are different from the compounds to which the above-mentioned nitrogen atoms are bonded, are preferable. Organic halogen compounds having a tribromomethyl group give more favorable results.
本発明に用いられるフィルム性付与ポリマは。The film properties imparting polymer used in the present invention is as follows.
特に制限はないがビテル共重合によって得られる高分子
量体が好ましい。ビニル共重合体に用いられるビニル重
合性単量体としては、メタクリル酸メチル、メタクリル
酸ブチル、メタクリル酸α−エチルヘキシル、メタクリ
ル酸ラウリル、アクリル酸エチル、アクリル酸メチルス
チレン、ビニルトルエン、N−ビニルピロリドン、α−
メチルスチレン、α−ヒドロキシエチルメタクリレート
。Although there are no particular limitations, a polymer obtained by Vitel copolymerization is preferred. Vinyl polymerizable monomers used in vinyl copolymers include methyl methacrylate, butyl methacrylate, α-ethylhexyl methacrylate, lauryl methacrylate, ethyl acrylate, methylstyrene acrylate, vinyltoluene, and N-vinylpyrrolidone. ,α−
Methylstyrene, α-hydroxyethyl methacrylate.
2−ヒドロキシエチルアクリレート、アクリルアミド、
アクリロニトリル、ジメチルアミノエチルメタクリレー
ト、ジメチルアミノエチルアクリレート等が用いられる
。2-hydroxyethyl acrylate, acrylamide,
Acrylonitrile, dimethylaminoethyl methacrylate, dimethylaminoethyl acrylate, etc. are used.
又9本発明における活性線により遊離ラジカルを生成し
うる増感剤及び増感剤系についても何ら制限はなく、従
来知られているものを用いることができる。例えば、ベ
ンゾフェノン、4.4’−ジメチルアミノベンゾフェノ
ン、4.4’−ジエチルアミノベンゾフェノン、4.4
’−ジクロルベンゾフェノン等のベンゾフェノン類、2
−エチルアントラキノン、t−ブチルアントラキノン等
のアントラキノ:yfR,2−クロロチオキサントン、
ベンゾインイ
エチルエーテル、ベンゾインイソプロピルエーテル、ベ
ンジル、2,4.5−)リアリールイミダゾールニ量体
(ロフィン二量体)などの1種又は2種以上が用いられ
る。Furthermore, there are no restrictions on the sensitizer and sensitizer system capable of generating free radicals by actinic rays in the present invention, and conventionally known ones can be used. For example, benzophenone, 4.4'-dimethylaminobenzophenone, 4.4'-diethylaminobenzophenone, 4.4
'-Dichlorobenzophenone and other benzophenones, 2
- Anthraquino such as ethyl anthraquinone and t-butylanthraquinone: yfR, 2-chlorothioxanthone,
One or more of benzoin ethyl ether, benzoin isopropyl ether, benzyl, 2,4.5-)lyarylimidazole dimer (lophine dimer), etc. are used.
本発明になる感光性樹脂組成物においてフィルム性付与
ポリマ、式(1)で表わされるエチレン性不飽和化合物
および式(Illで表わされるエチレン性不飽和化合物
100重量部に対して、活性線により△
遊離ラジカルを生じうる増感剤及び/又は増感剤系を0
.5〜10重量部、有機ハロゲン化合物を0.2〜10
重景部用いることが好ましい。これらの材料の混合順序
、混合法等については特に制限はない。In the photosensitive resin composition of the present invention, the film property-imparting polymer, the ethylenically unsaturated compound represented by formula (1), and the ethylenically unsaturated compound represented by formula (Ill) are 100 parts by weight by actinic radiation. Zero sensitizers and/or sensitizer systems that can generate free radicals
.. 5 to 10 parts by weight, 0.2 to 10 parts by weight of organic halogen compound
It is preferable to use heavy background. There are no particular restrictions on the mixing order, mixing method, etc. of these materials.
なお9本発明になる感光性樹脂組成物には、染料、可塑
剤、顔料、難燃剤、安定剤等を必要に応じて添加するこ
ともできる。又、密着性付与剤を使用することも可能で
ある。Note that dyes, plasticizers, pigments, flame retardants, stabilizers, etc. can also be added to the photosensitive resin composition of the present invention, if necessary. It is also possible to use an adhesion imparting agent.
本発明の詳細な説明する。The present invention will be described in detail.
実施例1
−a
以下に記した手順によシフイルム性付与ポリマを合成し
た。Example 1-a A cyfilm-imparting polymer was synthesized by the procedure described below.
表2の配合に従ってモノマ混合溶液400gを調整した
。次に冷却器、温度計1滴下装置がつながったII!4
ツロ反応フラスコにトルエン2509、表1で秤量した
モノマ溶液各4009のうち150gを入れ、窒素気流
を通じ93℃に昇温した。次いで残りのモノマ2509
.)ルエン1509、アゾビスイソブチロニトリル0.
509を混合し、溶解したものを3時間にわたって滴下
した。400 g of a monomer mixed solution was prepared according to the formulation in Table 2. Next, a cooler and a thermometer 1 dripping device were connected! 4
Toluene 2509 and 150 g of each of the 4009 monomer solutions weighed in Table 1 were placed in a Tulo reaction flask, and the temperature was raised to 93° C. through a nitrogen stream. Then the remaining monomer 2509
.. ) toluene 1509, azobisisobutyronitrile 0.
509 was mixed and the dissolved solution was added dropwise over 3 hours.
滴下終了後頁に7時間保温を続けた。この間フラスコの
温度は93℃に保たれた。次にアゾビスインブチロニト
リル0.259を)ルエン759に溶解したものを30
分にわたυ滴下した。滴下後4時間保温を続けたものを
トルエン75g、メチルエチルケトン759で希釈した
ものをそれぞれポリマi1)、 +2>とした。得られ
たポリマの特性を表3に示した。After the completion of the dropping, the pages were kept warm for 7 hours. During this time, the temperature of the flask was maintained at 93°C. Next, dissolve 0.259 of azobisin butyronitrile in 759 of toluene and add 30
I dripped it in minutes. After the dropwise addition, the mixture was kept warm for 4 hours and diluted with 75 g of toluene and 759 g of methyl ethyl ketone to give polymers i1) and +2>, respectively. Table 3 shows the properties of the obtained polymer.
表2 表3 −b 表4に示す配合で以下の感光性樹脂組成物を配合した。Table 2 Table 3 -b The following photosensitive resin compositions were blended according to the formulations shown in Table 4.
*1 新中村化学■製 トリメチロールプロパントリア
クリレート
*2新中村化学■製 テトラエチレングリコールジアク
リレート
*3 日本化薬H#! &ar2’−テトラキス(ヒド
ロキシメチル) −3,3’−オキシジブロバノールと
6−ヘキサノリド付加物との縮合物とアクリル酸のエス
テル化物
*4大阪有機化学工業■製 γ−クロローβ−ヒドロキ
シプロピル−β′−メタクリロイルオキシエステル−〇
−フタレート
*5新中村化学■製 トリメチロールプロパントリメタ
クリレート
*6川ロ化学工業■製 2,2′−メチレンビス(4−
エチル−6−t−ブチ化フェノール)/;I憂1/−J
a
表4中、 V −5過舎V −9が本発明になる実施例
であシ、他は比較例である。*1 Trimethylolpropane triacrylate manufactured by Shin Nakamura Chemical *2 Tetraethylene glycol diacrylate manufactured by Shin Nakamura Chemical *3 Nippon Kayaku H#! &ar2'-tetrakis(hydroxymethyl) -3,3'-oxydibrobanol and 6-hexanolide adduct condensate and esterified product of acrylic acid *4 Osaka Organic Chemical Industry ■ γ-chloro β-hydroxypropyl- β'-Methacryloyloxyester-〇-phthalate *5 Manufactured by Shin-Nakamura Chemical ■ Trimethylolpropane trimethacrylate *6 Manufactured by Kawaro Chemical Industry ■ 2,2'-methylenebis(4-
ethyl-6-t-butylated phenol)/;I-1/-J
a In Table 4, V-5 and V-9 are examples of the present invention, and the others are comparative examples.
−c v−i〜V−12の感光性樹脂組成物溶液を。-c photosensitive resin composition solutions of vi to V-12.
厚み23μmを有するポリエチレンテレフタル−トフィ
ルム(束し■製ルミ5−’)に乾燥後、膜厚が50μm
となるように塗工乾燥し、厚み35μmのポリエチレン
フィルムで被覆して感光性エレメントを得た。得られた
感光性エレメントからポリエチレンフィルムを剥離しな
がら、その感光層面を、スコッチプライト[有]バフロ
ール(住人スIJ−M製)により研磨、乾燥し清浄にさ
れた銅張積層板(100mmX200mm)の銅面上に
日立高温ラミネーターを用い連続的に積層して試験片を
得fc。積層条件を表5に示す。After drying, the film thickness was 50 μm on a polyethylene terephthalate film having a thickness of 23 μm (Lumi 5-' manufactured by Bunshishi ■).
The photosensitive element was coated and dried, and then covered with a polyethylene film having a thickness of 35 μm to obtain a photosensitive element. While peeling off the polyethylene film from the obtained photosensitive element, the photosensitive layer surface was polished with a Scotchprite Buff Roll (manufactured by Jusumu IJ-M), and a copper-clad laminate (100 mm x 200 mm) that had been dried and cleaned was polished. A test piece was obtained by continuously laminating fc on a copper surface using a Hitachi high-temperature laminator. The lamination conditions are shown in Table 5.
表5
*エア圧力
ct
1−cで得られた各試験片につき2次に示す試験を行な
った。Table 5 *Air pressure ct The following test was conducted for each test piece obtained in 1-c.
(1)耐ピロリン酸銅めっき性試験
1−cで得られた各試験片を、超高圧水銀灯(オーク社
製HMW−6−N型、 21@)で21段ステップタブ
レットの7段になるように露光し、1゜1.1−トリク
ロロエタンシャワーによって現像した(60秒、18℃
、 1.5 kg/cm2)。(1) Pyrophosphate copper plating resistance test Each test piece obtained in 1-c was heated to form 7 steps of a 21 step tablet using an ultra-high pressure mercury lamp (HMW-6-N type, 21@ manufactured by Oak Co., Ltd.). and developed with a 1°1.1-trichloroethane shower (60 seconds, 18°C).
, 1.5 kg/cm2).
得られた基板を表6に示すめっき条件でめっきし、レジ
ストのライン際のめつき液の浸透状態を評価基準を表7
に示す。The obtained substrate was plated under the plating conditions shown in Table 6, and the evaluation criteria for the penetration state of the plating solution near the resist line were shown in Table 7.
Shown below.
表7
(2)膜強度試験
直径3.2 mmのスルーホール銅張積層板に表5の条
件で感光性エレメントを積層し、21段ステップタブレ
ットで7段になるように露光しi、 i、 1−トリク
ロロエタンシャワーで現像する。第1図に示すようにス
ルーホール3に硬化した感光層2でテントを張った状態
とする。次に第1図に示すように2m+n径の針1を、
5 WIm/m inでテント部を押し、荷重を増し
てゆく。4は銅張積層板である。Table 7 (2) Film strength test Photosensitive elements were laminated on a through-hole copper-clad laminate with a diameter of 3.2 mm under the conditions shown in Table 5, and exposed to light using a 21-step tablet in 7 steps i, i, Develop with 1-trichloroethane shower. As shown in FIG. 1, the through holes 3 are tented with the cured photosensitive layer 2. Next, as shown in Fig. 1, a needle 1 with a diameter of 2 m + n is inserted.
Push the tent part at 5 WIm/min and increase the load. 4 is a copper-clad laminate.
テントが破れる時の荷重を測定し、膜強度とした。The load at which the tent ruptured was measured and was defined as membrane strength.
(3)感度試験
21段ステップタブレットをそなえたネガを通し、超高
圧水銀灯によF) 60 mJ /an”で1−8cで
得られた試験片を露光した。30分放置後、ポリエチレ
ンテレフタレートフイルムヲ剥11111 L 、 1
.1゜1−トリクロロエタンシャワーで現像しステップ
タブレットの硬化段数を読みとった。数字が大きい程、
感度が高いことを示す。(3) Sensitivity test The test piece obtained in 1-8C was exposed to light using an ultra-high pressure mercury lamp at 60 mJ/an'' through a negative equipped with a 21-step step tablet. After being left for 30 minutes, a polyethylene terephthalate film was exposed. wo peel 11111 L, 1
.. It was developed with a 1.1-trichloroethane shower, and the number of curing steps on the step tablet was read. The larger the number,
Indicates high sensitivity.
(1)、 (2)、 (31の実験結果を表8に示す。The experimental results for (1), (2), and (31) are shown in Table 8.
表8で明らかなように、上記のDPCA−60とMEC
HPPとを組み合わせた系は、他に比較して耐ビロリン
酸銅めっき性、膜強度、感度とも良好な結果を示す。As is clear from Table 8, the above DPCA-60 and MEC
The system in combination with HPP shows better results in terms of birophosphate copper plating resistance, film strength, and sensitivity than the others.
第1図は、実施例で行なった膜強度試験法を示す略図で
ある。
符号の説明
1・・・針 2・・・硬化した感光層FIG. 1 is a schematic diagram showing the membrane strength testing method performed in the examples. Explanation of symbols 1... Needle 2... Hardened photosensitive layer
Claims (1)
整数、a、bはa −4−b = 6となる整数であシ
。 a又はbは0でもよい) 及び式(II)で表わされるエチレン性不飽和化合物(
式中2はフェニル基又は置換フェニル基 H,iは炭素
数が1〜3のアルキレン基 R2は水素又はメチル基
Bsは水素、メチル基、エチル基又はCHgXであり、
Xは塩素又は臭素である)(Bl 有機ハロゲン化合物 IC) フィルム性付与ポリマ ならびに (DJ 活性線によシ遊離ラジカルを生成しうる増感剤
及び/又は増感剤系 を含有してなる感光性樹脂組成物。 2、フィルム性付与ポリマに対して式(Ilで表わされ
るエチレン性不飽和化合物を10〜45重量%9式II
I)で表わされるエチレン性不飽和化合物を10〜45
重量%とした特許請求の範囲第1項記載の感光性樹脂組
成物。 3、式(1)で表わされるエチレン性不飽和化合物がz
z2:f−テトラキス(ヒドロキシメチル)−ヘ3′オ
キシジブロバノールと、6−へキサノリド付加物との縮
合物とアクリル酸とのエステル化物であ91式(II)
で表わされるエチレン性不飽和化合物がr−クロロ−β
ヒドロキシグロビルーIメタクリロイルオキシエチル−
〇−フタレートである特許請求の範囲第1項又は第2項
記載の感光性樹脂組成物。 4、有機ハロゲン化合物がトリブロモメチル基を有する
有機ハロゲン化合物である特許請求の範囲第1項、第2
項又は第3項の感光性樹脂組成物。[Claims] Ethylenically unsaturated compound formula (I) represented by formula (1) (in the formula, ratio 1.R2 is hydrogen or a methyl group, 9m is an integer of 1 or 2, and a and b are integers of 1 or 2. It must be an integer such that a -4-b = 6. a or b may be 0) and an ethylenically unsaturated compound represented by formula (II) (
In the formula, 2 is a phenyl group or a substituted phenyl group, H and i are an alkylene group having 1 to 3 carbon atoms, and R2 is hydrogen or a methyl group.
Bs is hydrogen, methyl group, ethyl group or CHgX,
X is chlorine or bromine. Resin composition. 2. 9 Formula II
10 to 45 ethylenically unsaturated compounds represented by I)
The photosensitive resin composition according to claim 1, expressed as % by weight. 3. The ethylenically unsaturated compound represented by formula (1) is z
z2: An esterified product of a condensate of f-tetrakis(hydroxymethyl)-he3'oxydibrobanol and a 6-hexanolide adduct and acrylic acid, 91 formula (II)
The ethylenically unsaturated compound represented by r-chloro-β
Hydroxyglobil-I methacryloyloxyethyl-
The photosensitive resin composition according to claim 1 or 2, which is 〇-phthalate. 4. Claims 1 and 2, wherein the organic halogen compound is an organic halogen compound having a tribromomethyl group.
The photosensitive resin composition according to item 1 or item 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8309584A JPS60225841A (en) | 1984-04-25 | 1984-04-25 | Photosensitive resin composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8309584A JPS60225841A (en) | 1984-04-25 | 1984-04-25 | Photosensitive resin composition |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60225841A true JPS60225841A (en) | 1985-11-11 |
Family
ID=13792619
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8309584A Pending JPS60225841A (en) | 1984-04-25 | 1984-04-25 | Photosensitive resin composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60225841A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6259946A (en) * | 1985-09-10 | 1987-03-16 | Hitachi Chem Co Ltd | Photosensitive resin composition |
JPS6455551A (en) * | 1987-08-26 | 1989-03-02 | Hitachi Chemical Co Ltd | Photosensitive resin composition |
JPH01219734A (en) * | 1988-02-27 | 1989-09-01 | Nippon Synthetic Chem Ind Co Ltd:The | Photosensitive resin composition, dry film using same and image forming method |
JP2016161666A (en) * | 2015-02-27 | 2016-09-05 | 日立化成株式会社 | Photosensitive resin composition, photosensitive element, and method for processing glass substrate |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS501492A (en) * | 1973-05-10 | 1975-01-09 |
-
1984
- 1984-04-25 JP JP8309584A patent/JPS60225841A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS501492A (en) * | 1973-05-10 | 1975-01-09 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6259946A (en) * | 1985-09-10 | 1987-03-16 | Hitachi Chem Co Ltd | Photosensitive resin composition |
JPS6455551A (en) * | 1987-08-26 | 1989-03-02 | Hitachi Chemical Co Ltd | Photosensitive resin composition |
JPH01219734A (en) * | 1988-02-27 | 1989-09-01 | Nippon Synthetic Chem Ind Co Ltd:The | Photosensitive resin composition, dry film using same and image forming method |
JP2016161666A (en) * | 2015-02-27 | 2016-09-05 | 日立化成株式会社 | Photosensitive resin composition, photosensitive element, and method for processing glass substrate |
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