JPS6021897A - Process for liquid phase epitaxial crystal growth - Google Patents
Process for liquid phase epitaxial crystal growthInfo
- Publication number
- JPS6021897A JPS6021897A JP12718083A JP12718083A JPS6021897A JP S6021897 A JPS6021897 A JP S6021897A JP 12718083 A JP12718083 A JP 12718083A JP 12718083 A JP12718083 A JP 12718083A JP S6021897 A JPS6021897 A JP S6021897A
- Authority
- JP
- Japan
- Prior art keywords
- crystal growth
- substrate
- epitaxial crystal
- substrates
- spacer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 24
- 238000000034 method Methods 0.000 title claims abstract description 20
- 239000007791 liquid phase Substances 0.000 title claims description 8
- 239000000758 substrate Substances 0.000 claims abstract description 37
- 238000007654 immersion Methods 0.000 claims abstract description 10
- 125000006850 spacer group Chemical group 0.000 claims abstract description 7
- 238000002109 crystal growth method Methods 0.000 claims description 7
- 229910002804 graphite Inorganic materials 0.000 abstract description 5
- 239000010439 graphite Substances 0.000 abstract description 5
- 238000005498 polishing Methods 0.000 abstract description 4
- 229910052799 carbon Inorganic materials 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 9
- 238000007598 dipping method Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000003630 growth substance Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B19/00—Liquid-phase epitaxial-layer growth
- C30B19/06—Reaction chambers; Boats for supporting the melt; Substrate holders
- C30B19/068—Substrate holders
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【発明の詳細な説明】
(発明の背景と目的〕
本発明は液相エピタキシャル結晶成長方法に係り、特に
浸漬法による液相エピタキシャル結晶成長方法の改良に
関するものである。DETAILED DESCRIPTION OF THE INVENTION (Background and Objects of the Invention) The present invention relates to a liquid phase epitaxial crystal growth method, and particularly to an improvement of a liquid phase epitaxial crystal growth method using a dipping method.
従来、液相エピタキシャル法による多層結晶成長方法と
しては、スライドボート法によるものおよび浸漬法によ
るものがある。これらは、いずれもエピタキシャル結晶
成長物質を溶質として含む融液内に温度差をつけ、上記
溶質の温度勾配により基板上にその基板と組成の異なる
化合物半導体を単層または多層に成長させる方法である
。このいわゆる温度差法は、成長層各部分の成長温度が
常に一定であることから、過冷却の状態から冷却する冷
却法に比へ、成長結晶の組成の均一性、添加不純物濃度
の均一性等結晶性に優れた成長層を得ることが可能であ
る。Conventionally, multilayer crystal growth methods using liquid phase epitaxial methods include methods using a slide boat method and methods using an immersion method. In both of these methods, a temperature difference is created in a melt containing an epitaxial crystal growth substance as a solute, and a compound semiconductor having a composition different from that of the substrate is grown in a single layer or in multiple layers on a substrate using the temperature gradient of the solute. . In this so-called temperature difference method, the growth temperature of each part of the growth layer is always constant, so compared to the cooling method that cools from a supercooled state, it is possible to improve the uniformity of the composition of the grown crystal and the uniformity of the concentration of added impurities. It is possible to obtain a grown layer with excellent crystallinity.
しかし、その反面、スライドボート法は、昇温−成長−
降温の過程に時間がかかり、量産性に何かないという欠
点がある。また、浸漬法は、量産性は良好であるが、溶
液により基板の裏面にもエピタキシャル結晶成長が起こ
り、それを研磨等により取り除く]二程が必要となり、
工程上不都合な面があるいう欠点がある。However, on the other hand, the slide boat method is
The disadvantage is that it takes time to cool down the temperature, making it difficult to mass-produce. In addition, although the immersion method is good for mass production, the solution causes epitaxial crystal growth on the back surface of the substrate, which requires two steps to be removed by polishing, etc.
The disadvantage is that there are some inconveniences in the process.
本発明は上記に鑑みてなされたもので、その目的とする
ところは、量産性が良好で、しかも、基板の裏面にエピ
タキシャル結晶成長が起こることがない浸漬法による液
層エピタキシャル結晶成長方法を提供することにある。The present invention has been made in view of the above, and its purpose is to provide a liquid layer epitaxial crystal growth method using an immersion method that is suitable for mass production and does not cause epitaxial crystal growth on the back surface of a substrate. It's about doing.
本発明の特徴は、溶液中へ基板【浸漬する工程において
、基板の裏面を互いに背中合わせにし、その間にスペー
サをはさんて、上記スパー1ノとの間の隙間をなくし、
上記各基板の裏面にエピタキシャル結晶成長が起こるこ
となく、上記各基板の表面のみに同時にエピタキシャル
結晶成長させるようにした点にある。The feature of the present invention is that in the step of dipping the substrate into the solution, the back surfaces of the substrates are placed back to back to each other, and a spacer is inserted between them to eliminate the gap between the substrate and the spar 1,
The present invention is characterized in that epitaxial crystal growth is simultaneously caused only on the front surfaces of the respective substrates without epitaxial crystal growth occurring on the back surfaces of the respective substrates.
以下本発明の方法の一実施例を第1図、第2図を用いて
詳細に説明する。An embodiment of the method of the present invention will be described in detail below with reference to FIGS. 1 and 2.
第1図は本発明に係る浸漬による液層による液層エピタ
キシャル結晶成長を行う場合の基板の支持機構の一例を
示す構成図で、(a)は正面図、(b)側面図である。FIG. 1 is a configuration diagram showing an example of a support mechanism for a substrate when performing liquid layer epitaxial crystal growth using a liquid layer by immersion according to the present invention, (a) being a front view and (b) a side view.
第1図において、lは基板、2はグラファイトスペーサ
、3はホルダーで、それぞれ2枚の基板lの裏面を背中
合わせとし、その間ζこクラファイトスペーサ2をはさ
んで、基板1とクラファイトスペーサ2との間に隙間が
ないように基板ボルダ−3で保持しつある。In Fig. 1, l is a substrate, 2 is a graphite spacer, and 3 is a holder.The back surfaces of the two substrates l are placed back to back, and the graphite spacer 2 is sandwiched between the substrate 1 and the graphite spacer 2. The board is held by the board boulder 3 so that there is no gap between the board and the board.
本発明の方法においては、このように構成したものを゛
浸漬用溶液に浸漬し、エピタキシャル結晶成長させ る
ようにした。In the method of the present invention, the structure thus constructed is immersed in a dipping solution to grow epitaxial crystals.
ここに、表面を鏡面研磨した55mm X 50mm
XO,4mm 大きさの2枚のGaΔS基板l基板面な
背中合わせにして、その間に1 mm厚さのグライドス
ペーサ2をはさみ、これを1組として10組をグラフア
イ製の基板ボルダ3によって第1図に示すようにセット
した。これを互いに組成の異なる3つの浸漬用溶液に順
次浸漬し、多層エピタキシャル結晶成長を行った。結晶
成長後、基板ボルダ3から基板lをはずして観察したと
ころ、基板lの表面は、厚さ均一に結晶成長していたが
、基板lの裏面には結晶成長のまわり込みがなく、良好
な3層エピタキシャルウェハが得られる。Here is a 55mm x 50mm mirror polished surface.
Two GaΔS substrates with a size of Set up as shown in the figure. This was sequentially immersed in three immersion solutions having different compositions to perform multilayer epitaxial crystal growth. After the crystal growth, when the substrate l was removed from the substrate boulder 3 and observed, the surface of the substrate l had crystal growth with a uniform thickness, but the back surface of the substrate l had no wraparound of crystal growth and was in good condition. A three-layer epitaxial wafer is obtained.
なお、従来の浸漬法による液相エピタキシャル結晶成長
方法によれば、第2図に示すように、基板の両面にエピ
タキシャル結晶成長層4,5゜6が形成され、このため
、結晶成長後、# 3000の炭化珪素の粉末でGaA
s基板l基板面のエピタキシャル結晶成長層4,5..
6を除去する必要があった。In addition, according to the conventional liquid phase epitaxial crystal growth method using the immersion method, as shown in FIG. GaA with 3000 silicon carbide powder
Epitaxial crystal growth layers 4, 5 on the s-substrate and l-substrate surfaces. ..
6 had to be removed.
これに対して、本発明の方法によれば、液相エピタキシ
ャル結晶成長を行っただけで、使用可能の三層構造のエ
ピタキシャルウェハを得ることができる。In contrast, according to the method of the present invention, a usable epitaxial wafer with a three-layer structure can be obtained simply by performing liquid phase epitaxial crystal growth.
なお、上記した実施例では、グラファイトスペーサ3を
用いているが、ガーガンスペーサとしでもよく、要する
熱伝導性が良好で、不純物の混入がなく、基板lの面内
の温度分イ[の均一性および結晶成長層の高純度化をは
かれるものであればよい。In the above embodiment, the graphite spacer 3 is used, but a Gargan spacer may also be used, which has good thermal conductivity, is free from contamination of impurities, and is uniform in temperature within the plane of the substrate l. Any material may be used as long as it can improve the purity and purity of the crystal growth layer.
以上説明したように、本発明によれば、量産性が良好で
、しかも、基板の裏面にコービタキシA・小結晶成長が
起こることがないので、研磨等の工程をはふくことがで
き、生産性を高めることができるという効果がある。As explained above, according to the present invention, mass productivity is good, and since small crystal growth of Corbitaxy A does not occur on the back side of the substrate, steps such as polishing can be omitted, and productivity is improved. It has the effect of increasing the
第1図は本発明に係る浸漬法による液相エピタキシャル
結晶成長を行う場合の基板の支持機構の一例を示す構成
図、第2図は従来の浸漬法による液相エピタキシャル結
晶成長の場合の基板の結晶成長状態を示す断面図である
。
l:基板、2ニゲラフアイトスペーサ。
3:基板ホルダ。
見 1 図
α)
見 Z 目FIG. 1 is a configuration diagram showing an example of a support mechanism for a substrate when performing liquid phase epitaxial crystal growth by the immersion method according to the present invention, and FIG. FIG. 3 is a cross-sectional view showing a state of crystal growth. l: Substrate, 2 niger roughite spacers. 3: Substrate holder. Look 1 Figure α) Look Z
Claims (1)
面を互いに背中合わせにし、その間にスペーサをはさん
だ状態で溶液中に浸漬し、前記背中合わせにした2枚の
基板の表面のみに同時にエピタキシャル結晶成長させる
ことを特徴とする液相エピタキシャル結晶成長方法。(1) In a crystal growth method using the immersion method, the back surfaces of the substrates are placed back to back to each other and immersed in a solution with a spacer sandwiched between them, and epitaxial crystal growth is simultaneously performed only on the surfaces of the two substrates that are placed back to back. A liquid phase epitaxial crystal growth method characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12718083A JPS6021897A (en) | 1983-07-13 | 1983-07-13 | Process for liquid phase epitaxial crystal growth |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12718083A JPS6021897A (en) | 1983-07-13 | 1983-07-13 | Process for liquid phase epitaxial crystal growth |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6021897A true JPS6021897A (en) | 1985-02-04 |
Family
ID=14953649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12718083A Pending JPS6021897A (en) | 1983-07-13 | 1983-07-13 | Process for liquid phase epitaxial crystal growth |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6021897A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5922126A (en) * | 1996-05-31 | 1999-07-13 | Kabushiki Kaisha Toshiba | Semiconductor liquid phase epitaxial growth method and apparatus, and its wafer holder |
EP2360721A1 (en) * | 2010-02-23 | 2011-08-24 | Saint-Gobain Glass France | Device for positioning at least two objects, assemblies in particular multi-layer body assemblies, assembly for processing, in particular selenization, of objects, method for positioning at least two objects |
EP2360720A1 (en) * | 2010-02-23 | 2011-08-24 | Saint-Gobain Glass France | Device for positioning at least two objects, assemblies in particular multi-layer body assemblies, assembly for processing, in particular selenization, of objects, method for positioning at least two objects |
CN106098859A (en) * | 2016-08-22 | 2016-11-09 | 四川英发太阳能科技有限公司 | A kind of collection collects the storage device being stored in crystal silicon solar cell sheet integrally |
-
1983
- 1983-07-13 JP JP12718083A patent/JPS6021897A/en active Pending
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5922126A (en) * | 1996-05-31 | 1999-07-13 | Kabushiki Kaisha Toshiba | Semiconductor liquid phase epitaxial growth method and apparatus, and its wafer holder |
EP2360721A1 (en) * | 2010-02-23 | 2011-08-24 | Saint-Gobain Glass France | Device for positioning at least two objects, assemblies in particular multi-layer body assemblies, assembly for processing, in particular selenization, of objects, method for positioning at least two objects |
EP2360720A1 (en) * | 2010-02-23 | 2011-08-24 | Saint-Gobain Glass France | Device for positioning at least two objects, assemblies in particular multi-layer body assemblies, assembly for processing, in particular selenization, of objects, method for positioning at least two objects |
WO2011104222A1 (en) * | 2010-02-23 | 2011-09-01 | Saint Gobain Glass France | Arrangement, system, and method for processing multilayer bodies |
WO2011104231A1 (en) * | 2010-02-23 | 2011-09-01 | Saint Gobain Glass France | Device for forming a reduced chamber space, and method for positioning multilayer bodies |
JP2013520565A (en) * | 2010-02-23 | 2013-06-06 | サン−ゴバン グラス フランス | Arrays, systems, and methods for processing multilayer bodies |
US9236282B2 (en) | 2010-02-23 | 2016-01-12 | Saint-Gobain Glass France | Arrangement, system, and method for processing multilayer bodies |
US9352431B2 (en) | 2010-02-23 | 2016-05-31 | Saint-Gobain Glass France | Device for forming a reduced chamber space, and method for positioning multilayer bodies |
CN106098859A (en) * | 2016-08-22 | 2016-11-09 | 四川英发太阳能科技有限公司 | A kind of collection collects the storage device being stored in crystal silicon solar cell sheet integrally |
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