JPS60117162A - Method for judging life of discharge lamp - Google Patents
Method for judging life of discharge lampInfo
- Publication number
- JPS60117162A JPS60117162A JP22732183A JP22732183A JPS60117162A JP S60117162 A JPS60117162 A JP S60117162A JP 22732183 A JP22732183 A JP 22732183A JP 22732183 A JP22732183 A JP 22732183A JP S60117162 A JPS60117162 A JP S60117162A
- Authority
- JP
- Japan
- Prior art keywords
- filament
- voltage
- circuit
- lamp
- life
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 8
- 238000001514 detection method Methods 0.000 abstract description 4
- 239000003990 capacitor Substances 0.000 abstract description 3
- 239000007858 starting material Substances 0.000 abstract description 2
- 239000007772 electrode material Substances 0.000 description 10
- 238000010586 diagram Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000012857 radioactive material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Landscapes
- Circuit Arrangements For Discharge Lamps (AREA)
Abstract
Description
【発明の詳細な説明】
(技術分野)
本発明は、螢光ランプの如き放電灯の寿命判定方法に関
する。TECHNICAL FIELD The present invention relates to a method for determining the life of a discharge lamp such as a fluorescent lamp.
(背景技術)
螢光ランプの寿命を判定する方法として、螢光ランプの
点灯経過に伴って進行する電極上の電子放射性物質(以
下、電極物質という)の損耗のレベルを検知する方法が
知られている。(Background Art) As a method of determining the lifespan of a fluorescent lamp, there is a known method of detecting the level of wear and tear of the electron radioactive material on the electrode (hereinafter referred to as electrode material) that progresses as the fluorescent lamp is lit. ing.
かかる判定方法を第1図及び第2図を参照して説明する
。第1図は最も一般的な螢光灯点幻回路で、このような
点灯状態における電極物質の損へ機構は、下記のようで
ある。This determination method will be explained with reference to FIGS. 1 and 2. FIG. 1 shows the most common fluorescent lamp lighting circuit, and the mechanism for loss of electrode material in such lighting conditions is as follows.
点灯時のホットスポットは、11[他物質の付着範囲伺
の最も電源に近い部分に形成され、点灯経過に伴ってホ
ットスポットの生じた端部より次第に電極物質が損耗し
てい(。つまり、点灯時間の短い〈新しい〉ランプは、
第2図(alに示すように、フィラメントF上には電極
物質Eが十分に付着して2す、ホットスポットはフィラ
メントFの電源側端部Piに形成される。そして、点灯
時間の経過とともに蒸発、飛散などによって電極物質E
が点Piから次第に損耗していき、f4S2図(blを
経て第2図(C)の状態へと移っていく。ホットスポッ
トも、同様に、電源側端部から次第に非電源側端部へと
移動してい(。A hot spot at the time of lighting is formed at the part closest to the power source in the area where other substances have adhered, and as the lighting progresses, the electrode material is gradually worn away from the end where the hot spot occurs (in other words, the hot spot is A <new> lamp with a short operating time is
As shown in FIG. 2 (al), the electrode material E is sufficiently deposited on the filament F, and a hot spot is formed at the power supply side end Pi of the filament F. Then, as the lighting time elapses, Electrode material E due to evaporation, scattering, etc.
gradually wears out from point Pi, passing through f4S2 (bl) and moving to the state shown in Figure 2 (C). Similarly, the hot spot gradually moves from the power supply side end to the non-power supply side end. I'm moving (.
このような損耗機構を基に、陰極サイクルでのフィラメ
ント両端の電圧Vfよりホットスポットの位置を推定し
て電極物質の損耗状態を判定する方法が従来から研究さ
れている。つまり、第2図(a)に示す状態では、陰極
サイクルでのフィラメント電圧Vt は、フィラメント
Fの継線部からホットスポットP までの間の電圧降下
Vflとなり、同図(bJ、(C)に示す状態の場合も
同様に、それぞれV(2、Vfaトナル。ソシテ、
0 < V41< Vt2 < VfBの関係より点灯
時間の経過状況、つまり電極物質の残存状態を知ること
ができるというものであ4このように、市、極物質の残
存量を推定することによりランプ寿命を判定するのであ
るが、電極物質の残存量を推定するのに、従来は上述の
如く陰極電圧Vf の大きさを検知していたが、かかる
場合、次のような間融があった。Based on such a wear mechanism, research has been carried out on a method of estimating the position of a hot spot from the voltage Vf across the filament during a cathode cycle and determining the state of wear of the electrode material. In other words, in the state shown in Fig. 2(a), the filament voltage Vt during the cathode cycle becomes the voltage drop Vfl between the connection part of the filament F and the hot spot P, and the voltage drop Vfl in the cathode cycle is as shown in Fig. 2(bJ, (C)). Similarly, in the case of the state shown in FIG. In this way, the lamp life is determined by estimating the remaining amount of electrode material, but conventionally, the magnitude of the cathode voltage Vf is detected as described above to estimate the remaining amount of electrode material. However, in such cases, there were the following meltdowns.
■ ランプ始動時に8けるフィラメント予熱期間中は、
電極物質の残存量にかかわらず、陰極電圧vfが大きく
なり、誤動作を示す。■ During the 8-hour filament preheating period when starting the lamp,
Regardless of the remaining amount of electrode material, the cathode voltage vf increases, indicating malfunction.
■ ランプの電極フィラメントが、ランプの棟類、メー
カによって異なり、微妙なコントロールが難しい。■ The electrode filament of the lamp varies depending on the type of lamp and manufacturer, making delicate control difficult.
(発明の目的)
本発明は上記問題点に鑑みなされたもので、その目的と
するところは、ランプの棟類、メーカを問わず寿命を正
価に推定することができる放電灯の寿命判定方法を提供
するにある。(Object of the Invention) The present invention has been made in view of the above-mentioned problems, and its purpose is to provide a method for determining the lifespan of a discharge lamp, which can estimate the lifespan at a true price regardless of the lamp type or manufacturer. It is on offer.
(発明の開示)
本発明は、点灯中のフィラメント両端電圧の正負非対称
性を検知し、該両端電圧が対称性を有するに到った時点
をランプの寿命と判定するものである。(Disclosure of the Invention) The present invention detects the positive/negative asymmetry of the voltage across the filament during lighting, and determines that the life of the lamp has come to an end when the voltage across the filament becomes symmetrical.
を
以下、本発明姑説明する。第6図は螢光ランプの如き放
電灯の電極フィラメントの両端電圧Vfの波形を示しく
alの点灯初期状態から(b)の状態を経て(CJの寿
命期へ至る電圧波形の変化の様子を示すものである。The details of the present invention will be explained below. Figure 6 shows the waveform of the voltage Vf across the electrode filament of a discharge lamp such as a fluorescent lamp, and shows how the voltage waveform changes from the initial lighting state of AL through the state of (b) (towards the life of CJ). It shows.
同図より明らかなように、陰極サイクルの電圧は(a)
〜(C)へと次第に大きくなるのに対して、陽極サイク
ルの電圧はほとんど変化しないことがわかる。本発明は
このフィラメント両端電圧の正負非対称性に着目したも
のである。As is clear from the figure, the voltage of the cathode cycle is (a)
It can be seen that while the voltage gradually increases from ~(C), the voltage of the anode cycle hardly changes. The present invention focuses on the positive/negative asymmetry of the voltage across the filament.
第4図は本発明を利用したランプ寿命判定装置の構成−
で、電源AC,点灯回路B1螢光ランプFL、スタータ
Sより成る周知の構成に1.フィラメント両端電圧Vf
の正負非対称性を検知する回路Jを、上記螢光ランプF
LのフィラメントFの両端に接続すると共に、該検知回
路Jに表示回路。Figure 4 shows the configuration of a lamp life determination device using the present invention.
1. In the well-known configuration consisting of power supply AC, lighting circuit B1, fluorescent lamp FL, and starter S, 1. Filament voltage across the filament Vf
The circuit J for detecting the positive/negative asymmetry of
A display circuit is connected to both ends of the filament F of L, and a display circuit is connected to the detection circuit J.
Qを接続したものである。Q is connected.
次に上記装置の動作を述べる。フィラメント両端電圧V
(は、前述のように点灯時間の経過とともに負電圧のみ
が大きくなり、正電圧はほぼ一定である。上記検知回路
Jでは、その正負電圧差を検知し表示回路見を動作させ
る0
このように、フィラメント両端電圧の非対称性を検知し
ているため、従来のように始動時における予熱期間の高
電圧や異種フィラメント間での電圧差の影響を受けるこ
とがなく、従って、正確な寿命判定を行なうことができ
る。Next, the operation of the above device will be described. Voltage across filament V
(As mentioned above, only the negative voltage increases as the lighting time elapses, and the positive voltage remains almost constant.The above detection circuit J detects the difference between the positive and negative voltages and operates the display circuit.) Since the asymmetry of the voltage across the filament is detected, it is not affected by the high voltage during the preheating period at startup or the voltage difference between different types of filaments, unlike conventional methods, and therefore accurate life judgment can be performed. be able to.
第5図は上記ランプ寿命判定装置の具体的回路構成の一
例を示すもので、抵抗R1とコンデンサCによって積分
回路を構成し、フィラメント両端電圧Viの直流成分の
差を検知し、抵抗R2と発光ダイオードDとで構成する
表示回路qに接続する。−
この場合、コンデンサCの電圧vcと、例えば第2図(
旬〜(C)に対応して第6図(a)〜(C)に示すよう
な電圧レベルになるように、検知回路J、及び表示回路
Qの回路定数を設定して2くことにより、寿命期になる
までは発光ダイオードD(動作電圧宛)を点灯させ、寿
命直前化消灯することによってランプ寿命を知らせるこ
とができる。また、発光ダイオードDを、その動作電流
によって色彩が変化するものを用いれば、より詳細な寿
命データを知らせることもできる。FIG. 5 shows an example of a specific circuit configuration of the above-mentioned lamp life determination device. A resistor R1 and a capacitor C constitute an integrating circuit, detect the difference in the DC component of the voltage Vi across the filament, and connect the resistor R2 and light emit light. It is connected to a display circuit q consisting of a diode D. - In this case, the voltage vc of capacitor C and e.g.
By setting the circuit constants of the detection circuit J and the display circuit Q so that the voltage levels as shown in FIGS. The lamp life can be notified by keeping the light emitting diode D (directed to the operating voltage) on until the end of its life and turning it off just before the end of its life. Furthermore, if a light emitting diode D whose color changes depending on its operating current is used, more detailed life data can be provided.
(発明の効果)
本発明は上記のように、点灯中における放電灯の電極フ
ィラメント両端電圧の正負非対称性を検知し、該両端電
圧が対称性を有するに到った時点と寿命と判定するもの
であるため、点灯始動時における予熱期間の高電圧や異
種フィラメント間での電圧差等の影響を受けることなく
、正確なランプ寿命を判定することができる。(Effects of the Invention) As described above, the present invention detects the positive/negative asymmetry of the voltage across the electrode filament of a discharge lamp during lighting, and determines the end of the life when the voltage between the ends becomes symmetrical. Therefore, the lamp life can be determined accurately without being affected by the high voltage during the preheating period at the time of starting lighting, the voltage difference between different types of filaments, etc.
第1麿は従来の螢光灯点灯回路図、第2図は上記点灯回
路における電極物質の損耗機構を説明する図、第3図は
放電灯の電極フィラメント両端電圧波形図、第4図は本
発明を利用したランプ寿命特許出願人
松下電工株式会社
代理人弁理士 竹 元 敏 丸
(ばか2名)
第1図・
第2図
(a)
第3図
(a) 市、
(()
第4図Figure 1 is a diagram of a conventional fluorescent lamp lighting circuit, Figure 2 is a diagram explaining the wear mechanism of the electrode material in the lighting circuit, Figure 3 is a voltage waveform diagram across the electrode filament of a discharge lamp, and Figure 4 is a diagram of the current lighting circuit. Lamp life patent applicant using the invention Patent attorney representing Matsushita Electric Works Toshimaru Takemoto (two idiots) Figures 1 and 2 (a) Figure 3 (a) City, (() Figure 4
Claims (1)
圧の正負非対称性を検知し、該両端電圧が対称性を有す
るに到った時点を寿命と判定する放電灯の寿命判定方法
。 。(1) A method for determining the lifespan of a discharge lamp, which detects the positive/negative asymmetry of the voltage across the electrode filament of the discharge lamp during lighting, and determines the end of the lifespan when the voltages at both ends become symmetrical. .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22732183A JPS60117162A (en) | 1983-11-29 | 1983-11-29 | Method for judging life of discharge lamp |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22732183A JPS60117162A (en) | 1983-11-29 | 1983-11-29 | Method for judging life of discharge lamp |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60117162A true JPS60117162A (en) | 1985-06-24 |
Family
ID=16858969
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22732183A Pending JPS60117162A (en) | 1983-11-29 | 1983-11-29 | Method for judging life of discharge lamp |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60117162A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5808422A (en) * | 1996-05-10 | 1998-09-15 | Philips Electronics North America | Lamp ballast with lamp rectification detection circuitry |
-
1983
- 1983-11-29 JP JP22732183A patent/JPS60117162A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5808422A (en) * | 1996-05-10 | 1998-09-15 | Philips Electronics North America | Lamp ballast with lamp rectification detection circuitry |
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