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JPS5989229U - Cryogenic measurement equipment - Google Patents

Cryogenic measurement equipment

Info

Publication number
JPS5989229U
JPS5989229U JP18532382U JP18532382U JPS5989229U JP S5989229 U JPS5989229 U JP S5989229U JP 18532382 U JP18532382 U JP 18532382U JP 18532382 U JP18532382 U JP 18532382U JP S5989229 U JPS5989229 U JP S5989229U
Authority
JP
Japan
Prior art keywords
cryogenic
constant current
measurement equipment
measuring
measuring element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18532382U
Other languages
Japanese (ja)
Inventor
是永　均
正美 清水
Original Assignee
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社東芝 filed Critical 株式会社東芝
Priority to JP18532382U priority Critical patent/JPS5989229U/en
Publication of JPS5989229U publication Critical patent/JPS5989229U/en
Pending legal-status Critical Current

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  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図および第２図はそれぞれ極低温の計測装置の従来
の構成を示す回路図、第３図、第４図および第５図はそ
れぞれ本考案の各実施例を示す回゛路図である。 １・・・測定素子、４・・・定電流電源、５・・・ツェ
ナーダイオード、６・・・クライオスタット。FIGS. 1 and 2 are circuit diagrams showing the conventional configuration of a cryogenic measuring device, and FIGS. 3, 4, and 5 are circuit diagrams showing each embodiment of the present invention, respectively. . 1... Measuring element, 4... Constant current power supply, 5... Zener diode, 6... Cryostat.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 定電流電源に１個または複数個の測定素子を直列に接続
して定電流を通電し、各測定素子の端子電圧を測定する
極低温の計測装置において、主、記測定素子の直列回路
または各測定素子ごとにツェナーダイオードを逆並列接
続し、測定素子が異常によって抵抗値を増大したとき対
応するツェナータイオードに上記定電流の一部を分流さ
せることを特徴とする極低温の計測装置。In a cryogenic measuring device that connects one or more measuring elements in series to a constant current power supply, passes a constant current, and measures the terminal voltage of each measuring element, the main A cryogenic measuring device characterized in that a Zener diode is connected in antiparallel to each measuring element, and when the resistance value of the measuring element increases due to an abnormality, a part of the constant current is shunted to the corresponding Zener diode.
JP18532382U 1982-12-09 1982-12-09 Cryogenic measurement equipment Pending JPS5989229U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18532382U JPS5989229U (en) 1982-12-09 1982-12-09 Cryogenic measurement equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18532382U JPS5989229U (en) 1982-12-09 1982-12-09 Cryogenic measurement equipment

Publications (1)

Publication Number Publication Date
JPS5989229U true JPS5989229U (en) 1984-06-16

Family

ID=30400585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18532382U Pending JPS5989229U (en) 1982-12-09 1982-12-09 Cryogenic measurement equipment

Country Status (1)

Country Link
JP (1) JPS5989229U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018536858A (en) * 2015-11-26 2018-12-13 ロベルト・ボッシュ・ゲゼルシャフト・ミト・ベシュレンクテル・ハフツングＲｏｂｅｒｔ Ｂｏｓｃｈ Ｇｍｂｈ Semiconductor device comprising first temperature measuring element and method for determining current flowing through the semiconductor device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5142710A (en) * 1974-10-09 1976-04-12 Sumitomo Cement Co Kogyoyoroniokeru kyasutaburusekohoho
JPS5224716U (en) * 1975-08-13 1977-02-21

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5142710A (en) * 1974-10-09 1976-04-12 Sumitomo Cement Co Kogyoyoroniokeru kyasutaburusekohoho
JPS5224716U (en) * 1975-08-13 1977-02-21

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018536858A (en) * 2015-11-26 2018-12-13 ロベルト・ボッシュ・ゲゼルシャフト・ミト・ベシュレンクテル・ハフツングＲｏｂｅｒｔ Ｂｏｓｃｈ Ｇｍｂｈ Semiconductor device comprising first temperature measuring element and method for determining current flowing through the semiconductor device

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