JPS5951025B2 - Image matching device - Google Patents
Image matching deviceInfo
- Publication number
- JPS5951025B2 JPS5951025B2 JP6032180A JP6032180A JPS5951025B2 JP S5951025 B2 JPS5951025 B2 JP S5951025B2 JP 6032180 A JP6032180 A JP 6032180A JP 6032180 A JP6032180 A JP 6032180A JP S5951025 B2 JPS5951025 B2 JP S5951025B2
- Authority
- JP
- Japan
- Prior art keywords
- image
- seal
- pattern
- concentric
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012795 verification Methods 0.000 claims description 24
- 238000010586 diagram Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 238000004364 calculation method Methods 0.000 description 5
- 230000000875 corresponding effect Effects 0.000 description 5
- 238000005311 autocorrelation function Methods 0.000 description 4
- 230000002596 correlated effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/22—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes
- G01B21/24—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes for testing alignment of axes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Collating Specific Patterns (AREA)
Description
【発明の詳細な説明】
この発明は登録された画像データ(登録画像)と入力さ
れた画像データ(照合画像)を位置、角度を合わせて照
合する画像照合装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an image matching device that matches registered image data (registered image) and inputted image data (matching image) by matching their positions and angles.
従来この種の装置として第1図に示すものがあつた。A conventional device of this type is shown in FIG.
図において1は入力装置、2はパターン・メモリ、3は
中心測定装置、4はパターン回転装置、5は一致度計測
装置、6は判定装置である。第2図はこの種の装置が扱
う画像の例として印影を例示したもので、101は登録
印鑑、102および103は照合印鑑の印影である。以
下画像とし印鑑が用いられたもので説明する。次に動作
について説明する。In the figure, 1 is an input device, 2 is a pattern memory, 3 is a center measuring device, 4 is a pattern rotation device, 5 is a coincidence degree measuring device, and 6 is a determining device. FIG. 2 shows a seal impression as an example of an image handled by this type of apparatus, where 101 is a registered seal impression, and 102 and 103 are seal impressions of a verification seal impression. The image will be explained below using a seal. Next, the operation will be explained.
入力装置1により印鑑登録票に押印された登録印鑑ない
し小切手、手形に押印された照合印鑑の印影を、基盤の
目状に走査し、2値化したディジタル・データとしてパ
ターン・メモリ2に入力する。従つてこのパターン・メ
モリ2には、印肉のついた部分は1、印肉のつかない部
分は0の値がそれぞれ対応して入力される。パターン・
メモリ2には通常、一つの印影をよこ(x方向)・たて
(y方向)とも100点以上に分割して構成される各画
素を記憶している。次いで沖心測定装置3により、登録
印鑑及び照合印鑑の印影の中心が測定される。The input device 1 scans the imprint of the registered seal stamped on the seal registration form or the verification stamp stamped on the check or bill on the grid pattern of the base, and inputs it into the pattern memory 2 as binarized digital data. . Therefore, in the pattern memory 2, a value of 1 is input for the part with the ink pad, and a value of 0 is input for the part without the ink pad. pattern·
The memory 2 normally stores each pixel formed by dividing one seal impression into 100 or more points both horizontally (x direction) and vertically (y direction). Next, the center of the seal impression of the registered seal stamp and the verification seal stamp is measured by the off-center measuring device 3.
次に照合印鑑の印影の情報を、その中心のまわりにパタ
ーン回’転装置4によつて微小角△θ (通常は0.5
〜80)ずつ回転させる。具体的には回転前の座標を(
x、y)、回転後の座標を(x’、y’)、回転の中心
を (x。、y。)、回転角をθとすると、x’■(x
−xo)coJ+(y−yo)sinθ+X0l、、ィ
4)y’ ■(x−x。)slnθ+(y−yo)si
nθ+yoなる関係によつて定る回転後の座標系(x’
、y’)における画素の値(0か1か)として回転前の
座標系(x、y)の画素の値をあて、回転後の印影パタ
ーンを形成する。次に照合印鑑の印影データをパターン
回転装置4で微小角△θ回転するごとに、登録印鑑と照
合印鑑の印影の一致度が一致度計測装置5で、計測され
る。Next, the information on the seal impression of the verification seal is rotated around its center by a small angle △θ (usually 0.5
-80) rotation. Specifically, the coordinates before rotation are (
x, y), the coordinates after rotation are (x', y'), the center of rotation is (x., y.), and the rotation angle is θ, then x'■(x
-xo)coJ+(y-yo)sinθ+X0l,, y4)y' ■(x-x.)slnθ+(y-yo)si
The coordinate system after rotation (x'
, y') is assigned the pixel value (0 or 1) in the coordinate system (x, y) before rotation to form a stamp pattern after rotation. Next, each time the seal impression data of the verification seal stamp is rotated by a small angle Δθ by the pattern rotation device 4, the degree of coincidence between the registered seal impression and the impression of the verification seal stamp is measured by the coincidence measurement device 5.
ここにいう一致度Mとは、例えば、登録印鑑と照合印鑑
の印影とを中心が一致するよう重ね合せ、重なつた値1
の画素の個数をA、登録印鑑の印影の値1の画素の個数
をB、照合印鑑の印影の値1の画素の個数をCとすると
きM=A/B − C ・・・・・・・・・(2)ない
し、M=A/Bで計算されるものである。The degree of coincidence M referred to here is, for example, when the registered seal impression and the stamp impression of the verification seal are superimposed so that their centers match, and the overlap value is 1.
When the number of pixels of the registered seal impression is A, the number of pixels of the registered seal impression has a value of 1 is B, and the number of pixels of the verification seal impression has a value of 1 is C, then M=A/B - C... ...(2) Or, it is calculated by M=A/B.
照合印鑑の印影が一回転(360゜)した後、判定装置
6は、各回転角における一致度Mのうち最大のものをえ
らび、このMが基準値M。After the seal impression of the verification seal has rotated once (360 degrees), the determination device 6 selects the maximum matching degree M at each rotation angle, and this M is the reference value M.
を越えていれば登録印鑑と照合印鑑の印影は一致してい
ると判定する。従来の画像照合装置は以上のように構成
されて−いるので、画像を精度よく照合するためには回
転に伴つて行われる多くの計算のため処理に時間がか・
る欠点があつた。If the difference exceeds , it is determined that the registered seal impression and the verification seal impression match. Conventional image matching devices are configured as described above, so in order to match images with high accuracy, many calculations are performed during rotation, which takes a long time.
There were some shortcomings.
この発明は上記のような従来のものの欠点を除去するた
めになされたもので、登録画像と照合画.像とのなす回
転角の計測を、画像全面ではなく登録の際に登録画像よ
り求めて画像と共に登録した半径の数個の同心円パター
ンを用いて行うことにより、少ない計算量でできるよう
に構成した画像照合装置を提供することを目的としてい
る。This invention was made in order to eliminate the drawbacks of the conventional ones as described above, and it uses registered images and matching images. The rotation angle formed with the image is measured using several concentric circular patterns with radii determined from the registered image at the time of registration and registered with the image, rather than the entire image, so that it can be done with a small amount of calculation. The purpose is to provide an image matching device.
以下、この発明の一実施例を第3図にもとづいて説明す
る。1は入力装置、2はパターン・メモリ、3は中心測
定装置、4はパターン回転装置、5は一致度計測装置、
6は判定装置、7は同心円展開装置、8は同心円パター
ン・メモリ、9は同.心円パターン・シフト装置、10
は同心円一致度計測装置、11は回転角計算装置、12
はフアイル装置である。Hereinafter, one embodiment of the present invention will be described based on FIG. 3. 1 is an input device, 2 is a pattern memory, 3 is a center measurement device, 4 is a pattern rotation device, 5 is a coincidence measurement device,
6 is a determination device, 7 is a concentric circle expansion device, 8 is a concentric pattern memory, and 9 is the same. Centroid pattern shift device, 10
11 is a concentric circle coincidence measurement device, 11 is a rotation angle calculation device, 12 is
is a file device.
第4図は、同心円展開装置7の同心円展開に関する説明
図である。FIG. 4 is an explanatory diagram regarding concentric circle expansion by the concentric circle expansion device 7.
第4図において102は登録・印鑑の印影の一例、10
5はその印影の中心、106は印影上に仮想的に引かれ
た半径R,の円、107は同じく半径R。の円、108
は同心円展開の際の角度θの基準線を示している。第5
図は上記同心円展開によつて得られた同心円パターンの
画素構成例で、−部分は印肉のついている部分、□部分
は印肉のついていない部分に対応させて示している。In Figure 4, 102 is an example of a registration/seal imprint; 10
5 is the center of the seal impression, 106 is a circle drawn virtually on the seal impression with radius R, and 107 is also radius R. circle, 108
indicates the reference line of the angle θ when concentric circles are developed. Fifth
The figure shows an example of the pixel configuration of a concentric pattern obtained by the above-mentioned concentric circle expansion, where - portions correspond to portions with ink pads and □ portions correspond to portions without ink pads.
なお、よこ軸は回転方向の測度で画素の数に対応してい
る。次に動作について説明する。Note that the horizontal axis is a measure of the rotational direction and corresponds to the number of pixels. Next, the operation will be explained.
入力装置1により登録印鑑ないし照合印鑑の印影を2値
のデイジタル・データとしてパターン・メモリ2に登録
し、次いで、中心測定装置3により印影の中心が測定さ
れることは従来装置と同様である。次に、登録印鑑の印
影を同心円展開装置7により、同心円展開し、印鑑パタ
ーンを同心円パターンに変換する。Similar to the conventional apparatus, the input device 1 registers the impression of a registered seal or a verification seal into the pattern memory 2 as binary digital data, and then the center of the seal is measured by the center measuring device 3. Next, the seal imprint of the registered seal stamp is concentrically developed by a concentric circle developing device 7 to convert the stamp pattern into a concentric circle pattern.
この同心円展開とは、予め定められた半径Rl,.R2
・・・・・・・・・・・・について、その半径Riに反
比例して定まる角ピツチ△θ (たとえば、△θ=稗・
:度)、毎に式3で定まる座標(x、y)R1を求め、
座標(x、y)に最も近い点の画素の値(0ないし1)
を順に算出することである。This concentric expansion is defined by a predetermined radius Rl, . R2
Regarding ......
: degrees), find the coordinates (x, y) R1 determined by equation 3,
Pixel value (0 to 1) of the point closest to the coordinates (x, y)
It is to calculate in order.
x=RcOs(n ・△θ)+XOy二Rsin(n
・△θ) +YO} ・・・・・・・・・(3)(ただ
し、X。x=RcOs(n ・△θ)+XOy2Rsin(n
・△θ) +YO} ・・・・・・・・・(3) (However, X.
、Y。は中心の座標、nは整数で、0<n・△θ<36
0(度)を満たす)この同心円展開装置7で展開された
同心円パターンは、同心円パターン・メモリ8に記憶さ
れる。,Y. is the coordinate of the center, n is an integer, and 0<n・△θ<36
The concentric circle pattern developed by the concentric circle development device 7 is stored in the concentric pattern memory 8.
この同心円パターン・メモリ8には半径Riに対する円
に関しては、Riに比例した個数の画素が記憶されてい
る。ここに半径R1、R2の2つの円を用いた同心円展
開の例を第5図A,B,C,Dに示す。This concentric pattern memory 8 stores a number of pixels proportional to Ri for a circle with a radius Ri. Examples of concentric circle development using two circles with radii R1 and R2 are shown in FIGS. 5A, B, C, and D.
第4図の登録印鑑の印影102上の、半径R,の円10
6、半径R。の円107で展開した同心円パターンは第
5図Aのように各々展開パターン206,207で示さ
れる。又、これと同じもの第5図Bのようにもう一組2
08,209で示す。次に、同心円パターン・シフト装
置9は半径R,の円で展開された印影の展開パターン2
08を、同心円パターン・メモリ8上でl画素ずつシフ
トできるようになつていて次のように動作する。Circle 10 with radius R on the seal imprint 102 of the registered seal stamp in Figure 4
6. Radius R. The concentric patterns developed by the circle 107 are shown as developed patterns 206 and 207, respectively, as shown in FIG. 5A. Also, another set 2 of the same thing as shown in Figure 5 B.
It is shown as 08,209. Next, the concentric pattern shift device 9 moves the developed pattern 2 of the seal impression developed in a circle with radius R.
08 can be shifted by l pixels on the concentric pattern memory 8, and the operation is as follows.
すなわち同心円パターン・シフト装置9は、上記のよう
にlシフトずつデータのシフトを行ない、半径R,で展
開パターン210,211等を第5図C,Dのように次
々に作成する。つまり半径R,の円についての展開パタ
ーンについて、その全画素分の回数シフトした後は、半
径R2で同様のシフトをくりかえし、すべての半径につ
いての展開パターンについてこの操作を行なえるように
なつている。次に、上記のシフトを1回するごとに、登
録印鑑の印影の展開パターン206と照合印鑑の印影の
シフト・パターン(208,210,211等)との間
の一致度を同心円一致度計測装置10で計測する。That is, the concentric pattern shift device 9 shifts the data by l shifts as described above, and successively creates developed patterns 210, 211, etc. with a radius R, as shown in FIG. 5C and D. In other words, after shifting the expanded pattern for a circle with radius R a number of times for all pixels, the same shift is repeated for radius R2, and this operation can be performed for expanded patterns for all radii. . Next, each time the above-mentioned shift is performed, the degree of coincidence between the development pattern 206 of the seal impression of the registered seal impression and the shift pattern (208, 210, 211, etc.) of the seal impression of the verification seal impression is measured by the concentric circle coincidence degree measuring device. Measure in 10.
この一致度とは、登録印艦の印影の該当半径の展開パタ
ーンと照合印鑑の該当半径の展開パターンとを重ね合せ
、重なつた値1の画素の個数をa、登録印鑑の印影の該
当半径の展開パターンの値1の画素の個数をb、照合印
鑑の印影の該当半径の展開パターンの値1の画素の個数
をCとするとき、で計算されるものである。This degree of matching is calculated by superimposing the development pattern of the corresponding radius of the seal impression of the registered seal and the development pattern of the corresponding radius of the verification seal, and calculating the number of overlapping pixels with a value of 1 as a, and the corresponding radius of the seal impression of the registered seal. It is calculated as follows, where b is the number of pixels with a value of 1 in the developed pattern of , and C is the number of pixels with a value of 1 in the developed pattern of the corresponding radius of the stamp of the verification seal stamp.
同心円パターン・シフト装置9の各々のシフト毎に、同
心円一致度計測装置10で一致度mの計測を行ない、こ
れによりある半径での同心円パターンの自己相関関数が
求まつたことになる。これを第6図に示す。当然mの値
はシフト量がOのときに最大値をとる。この点をP1、
第2ピークをP2とすると、P1におけるmの値m1と
P2におけるmの値M2の比m1/M2が大の程、照合
印鑑の展開パターンと相関をとつたと、きに正しい値が
求まりやすい。このため登録印鑑で1の周辺の連続する
Vの値での展開パターンの自己相関関数を調べ、m1が
ある値以上でm1/M2の比が与えられた値以上のvの
値をV1としてフアイル装置に登録する。For each shift of the concentric pattern shift device 9, the degree of coincidence m is measured by the degree of concentricity measuring device 10, thereby determining the autocorrelation function of the concentric pattern at a certain radius. This is shown in FIG. Naturally, the value of m takes the maximum value when the shift amount is O. This point is P1,
Assuming that the second peak is P2, the larger the ratio m1/M2 of the value m1 of m at P1 to the value M2 of m at P2, the easier it is to find the correct value when correlated with the development pattern of the verification seal. . For this purpose, examine the autocorrelation function of the expansion pattern at consecutive values of V around 1 using the registered seal, and set the value of v for which m1 is greater than a certain value and the ratio of m1/M2 is greater than the given value as V1 in the file. Register to the device.
同様に、V2、V3・・・・・・・・・・・・も求めて
登録する。照合の際にはこの1、V2・・・・・・・・
・・・・をフアイル装置より読み出して、この半径で登
録印影、照合而影の展開パターンを求めて同じ半径での
2つめ展開パターンの相関をとり、最大値を求める点よ
り角度を求めればよい。複数のV1、V2・・・・・・
・・・・・・での求まつた角度のいくつかがほぼ一致す
るものを正しい角度とすればよい。角度の求め方は回転
角計算装置11で以下のようにして、登録印鑑の印影に
対する照合印鑑の印影の回転角dを求める。Similarly, V2, V3, etc. are also determined and registered. When checking, use this 1, V2...
... from the file device, find the development pattern of the registered seal impression and verification impression at this radius, correlate the second development pattern at the same radius, and find the angle from the point where the maximum value is found. . Multiple V1, V2...
The correct angle may be one where some of the angles found in . The rotation angle calculation device 11 calculates the rotation angle d of the seal impression of the verification seal stamp with respect to the seal impression of the registered seal stamp as follows.
一致度mの最大の与えるシフトが半径Riの第kシフト
でおこつたとする。事前に、この半径Riの1シフトに
相当する回転角は式(3)により、△θと定っているの
でd=k・△θ ・・・・・・・・・(5)と
求まる。次に印鑑パターン計測装置4で、印鑑パターン
・メモリ2に記憶されている照合印鑑パターンを角(−
d)回転させ、登録印鑑と照合印鑑との印影の一致度を
従来装置と同様に印鑑一致度計測装置5で計測し、一致
度Mを求め、その一致度Mに判定装置7で基準値M。Assume that the shift giving the maximum matching degree m occurs at the k-th shift of radius Ri. Since the rotation angle corresponding to one shift of the radius Ri is determined in advance to be Δθ according to equation (3), d=k·Δθ . . . (5) is obtained. Next, the stamp pattern measuring device 4 measures the verification stamp pattern stored in the stamp pattern memory 2 at the corner (-
d) Rotate and measure the degree of coincidence of the seal imprints between the registered seal stamp and the verification seal stamp using the seal stamp coincidence degree measurement device 5 in the same way as the conventional device, obtain the degree of coincidence M, and set the degree of coincidence M to the reference value M by the determination device 7. .
と比較し、M>MOであれば登録印鑑と照合印鑑とは一
致していると判定する。なお、上記説明では登録印鑑と
照合印鑑の印影は同じ印鑑ないし似た印鑑によつて押印
されたものとしたが、別の印鑑から押印されたものであ
る場合は、同心円一致度計測装置10で求めた一致度m
は、どのシフトにおいても低い値しか出ない。If M>MO, it is determined that the registered seal stamp and the verification seal stamp match. In the above explanation, it is assumed that the registered seal impression and the verification seal impression are affixed by the same seal or a similar seal, but if they are affixed by different seals, the concentric circle coincidence measurement device 10 The obtained degree of matching m
gives only a low value in every shift.
よつて、回転角計算装置11で、すべてのシフトにおい
て、しきい値亀未満の場合は、登録印鑑と照合印鑑の印
影とは異つているとみなされ、その旨判定装置6に知ら
される。以上のように本発明による画像照合装置では、
登録の際に同心円展開パターンの自己相関関数を求め、
この第1ピークと第2ピークの差が大となる半径を求め
フアイルに登録して照合の際にこの半径での同心円展開
パターンの相関より角度を求めているので、精度よく正
しい角度を求めることができる。Therefore, in the rotation angle calculating device 11, if the shift is less than the threshold value in all shifts, the registered seal impression and the verification seal impression are considered to be different, and the determination device 6 is notified to that effect. As described above, in the image matching device according to the present invention,
During registration, find the autocorrelation function of the concentric circle expansion pattern,
The radius where the difference between the first peak and the second peak is large is determined and registered in a file, and during verification, the angle is determined from the correlation of the concentric circle development pattern at this radius, so the correct angle can be determined with high precision. I can do it.
第1図は従来の画像照合装置のプロツク図、第2図は登
録画像と照合画像の例を示す図、第3図はこの発明の画
像照合装置のプロツク図、第4図は同心円展開に関する
説明図、第5図は同心円パターンの画素構成例を示す構
成図、第6図は同心円パターンの自己相関関数の図であ
る。
1・・・・・・入力装置、2・・・・・・パターンメモ
l几 3・・・・・・中心測定装置、4・・・・・・パ
ターン回転装置、5・・・・・・一致度計測装置、6・
・・・・・判定回路、7・・・・・・同心円展開装置、
8・・・・・・同心円パターンメモリ、9・・・・・・
同心円パターンシフト装置、10・・・・・・同心円一
致度測定装置、11・・・・・・回転角計算装置、12
・・・・・・フアイル装置である。FIG. 1 is a block diagram of a conventional image matching device, FIG. 2 is a diagram showing an example of registered images and matching images, FIG. 3 is a block diagram of an image matching device of the present invention, and FIG. 4 is an explanation of concentric circle expansion. 5 is a configuration diagram showing an example of the pixel configuration of a concentric pattern, and FIG. 6 is a diagram of an autocorrelation function of the concentric pattern. 1...Input device, 2...Pattern memo 3...Center measuring device, 4...Pattern rotation device, 5... Matching degree measuring device, 6.
...Judgment circuit, 7...Concentric circle expansion device,
8... Concentric pattern memory, 9...
Concentric pattern shift device, 10... Concentric circle coincidence measuring device, 11... Rotation angle calculation device, 12
...It is a file device.
Claims (1)
合わせて重ね合わせ照合する画像照合装置にて、上記画
像より中心を求める手段と、その中心を中心とする1な
いし複数の同心円パターンを求める手段と、2つの同心
円パターンの相関を求める手段、上記相関を示す相関値
の第1ピークと第2ピークの位置およびそのピーク値を
求める手段と、登録画像については同心円パターンの自
己相関値の第1ピーク値および第1ピーク値と第2ピー
ク値の比が各々与えられた値以上になる様な複数の同心
円の半径を画像とともに登録するファイル装置と、照合
時にはファイル装置より読み出した登録画像と照合画像
について中心を求め上記ファイル装置より読み出した半
径での同心円パターンの相関をとり、この相関値の第1
ピークより2つの画像の角度を計算する手段と、複数の
同心円パターンより求めた角度より、その値の近いもの
の数が多いものをとることにより正しい角度を求める手
段と、この角度だけ一方の画像を回転し位置合せして照
合を行う手段とを備えたことを特徴とする画像照合装置
。1. Means for determining the center from the image, and means for determining one or more concentric circular patterns centered on the center, using an image matching device that digitally superimposes and matches the registered image and the matching image by matching their positions and angles. means for determining the correlation between the two concentric patterns; means for determining the positions and peak values of the first and second peaks of the correlation values indicating the correlation; A file device that registers the radii of multiple concentric circles such that the peak value and the ratio of the first peak value to the second peak value are each a given value or more together with the image, and at the time of verification, match the registered image read from the file device. Find the center of the image, take the correlation of the concentric pattern with the radius read from the file device, and calculate the first of this correlation value.
There is a means to calculate the angle of two images from the peak, a means to find the correct angle by taking the angle whose value is more similar than the angles found from multiple concentric circle patterns, and a means to calculate the correct angle by calculating the angle of the two images by this angle. An image matching device characterized by comprising means for performing matching by rotating and aligning the positions.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6032180A JPS5951025B2 (en) | 1980-05-06 | 1980-05-06 | Image matching device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6032180A JPS5951025B2 (en) | 1980-05-06 | 1980-05-06 | Image matching device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56157579A JPS56157579A (en) | 1981-12-04 |
JPS5951025B2 true JPS5951025B2 (en) | 1984-12-12 |
Family
ID=13138784
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6032180A Expired JPS5951025B2 (en) | 1980-05-06 | 1980-05-06 | Image matching device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5951025B2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10206134A (en) * | 1997-01-17 | 1998-08-07 | Matsushita Electric Works Ltd | Position detecting method by image processing |
JP2012118729A (en) * | 2010-11-30 | 2012-06-21 | Fujitsu Frontech Ltd | Seal impression collation device, seal impression collation method, and program |
-
1980
- 1980-05-06 JP JP6032180A patent/JPS5951025B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS56157579A (en) | 1981-12-04 |
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