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JPS5945695A - Ic memory - Google Patents

Ic memory

Info

Publication number
JPS5945695A
JPS5945695A JP57157217A JP15721782A JPS5945695A JP S5945695 A JPS5945695 A JP S5945695A JP 57157217 A JP57157217 A JP 57157217A JP 15721782 A JP15721782 A JP 15721782A JP S5945695 A JPS5945695 A JP S5945695A
Authority
JP
Japan
Prior art keywords
data
storage means
control
memory
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57157217A
Other languages
Japanese (ja)
Inventor
Yuichi Furukawa
祐一 古川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57157217A priority Critical patent/JPS5945695A/en
Publication of JPS5945695A publication Critical patent/JPS5945695A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
  • Read Only Memory (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (a)  発明の技術分野 本発明は電気消去可能の読出し専用記憶回路(EEPR
OM)+こよるICメモリの改良に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to electrically erasable read only memory circuits (EEPR).
OM) + related to improvements in IC memory.

(b)  技術の背分 従来より半導体技術の発達Gこ伴い多様のICメモリが
提供されている。読出し専用記憶回路/素子(ROM)
は一度記憶した内容を何回でも読出しが出来、月その間
にあって電源の供給を遮断しても記憶が失われない不揮
発性のメモリである。
(b) Technology Background With the development of semiconductor technology, a variety of IC memories have been provided. Read-only memory circuit/element (ROM)
It is a nonvolatile memory that can read out the stored contents any number of times, and the memory will not be lost even if the power supply is cut off for a period of time.

ROM1こも検数の移類が提供されており、例えば文字
のドノトデータのように一旦記憶すnば書替える必要の
ない用途に適用するものやシステムにおける初期化動作
のプログラムのようζこ書替えの頻度は少いが長い時間
間隔であっても書替え機能が必要な用途に適用するもの
が存在する。こ\では後者のためlこ提供される通常の
メモリ(こおける書込み読出し動作においてはROMと
して作動し、異なる′[に気伯号の操作によって配憶内
容を消去し、新たにデータを書込むことが可能なEEP
ROMに関するものである。
ROM 1 also provides the transfer of numbers, for example, for applications that do not need to be rewritten once stored, such as character donot data, and for programs for initialization operations in systems, such as the frequency of rewriting. There are some methods that can be applied to applications that require a rewrite function even at long time intervals, although the number of rewrites is small. In this case, a normal memory is provided for the latter (it operates as a ROM during write/read operations, and the stored contents are erased by a different operation and new data is written). EEP that can
It is related to ROM.

(C)  従来技術と問題点 従来よりE E P ROM  は有限の1可えば10
1〜1011回の1N込み寿命を有し、その限度Mv 
l!iでメモリ動作が保iFさnている。従ってソステ
ムに組込んで利用するとき、該EEPROMの這込み寿
命(こ比較して、書込み頻度が極めて少く、1込み寿命
を意識する必要がないときには倍込み回砂は全く管理す
ること々く放置しても問題はない。しかじ省込み寿命(
こ比較して書込牟頻就が割合に多いとさは、E EPR
OMを曽込み回@管理するだめの回路を設けて計数し、
指足さJtだ限度に遅したときは以後に発生ずる確度が
高い除害を避いJるためEEPROMを交換する使用方
法が行われている。第1図に従来における書込回数管理
手段を備えたE E I) ROMのブロック図を示す
。図において1は第1制御部、2は第2制御部、3は第
1記憶部、4は第2記憶部、5はカウンタおよび6は比
較部である。第1制窮1部lはバスを経由して受信する
第1記憶部3への汎用データDATAIについてアドレ
スデータADD1、制+1(1信号C0NTlおよびW
Eを与えて書込み動作寸たは第1記憶部3の読取り動作
を制御する他、第1記憶部の書込回数を管理するためア
ドレスデータADD2、制御(i¥号C0NT2を与え
て1込回数の計数データDATA2を第1記憶部3の一
部領域に書込/読出すための制御を行う。第2制狙1部
2は第1制M部1よりのライトイネーブル悟号WEを受
信する都度カウンタ5の保持する旧計数データにCL 
Kを送出してlを加′lFせしめて引数データDATA
 2を第1制御部1へ送出さゼる。
(C) Conventional technology and problems Conventionally, EEPROM has a finite number of 1, preferably 10
It has a life including 1N of 1 to 1011 times, and its limit Mv
l! Memory operation is maintained with iF. Therefore, when the EEPROM is incorporated into a system and used, the write-in frequency is extremely low and there is no need to be aware of the 1-input life, so the doubling cycle is not managed at all. However, there is no problem with it.
Compared to this, if there is a relatively high number of writers, E EPR
Set up a circuit to manage OM and count it.
When the delay reaches a limit of Jt, the EEPROM is replaced in order to avoid abatement that is likely to occur later. FIG. 1 shows a block diagram of a conventional EEI ROM equipped with a write count management means. In the figure, 1 is a first control section, 2 is a second control section, 3 is a first storage section, 4 is a second storage section, 5 is a counter, and 6 is a comparison section. The first constraint 1 part l receives address data ADD1, constraint +1 (1 signal C0NTl and W
In addition to controlling the write operation size or the read operation of the first storage unit 3 by giving E, address data ADD2 and control (i\ number C0NT2 are given to control the number of writes to the first storage unit 3). Control is performed to write/read the counting data DATA2 in a partial area of the first storage section 3.The second control section 1 2 receives the write enable Gogo WE from the first control M section 1. CL to the old count data held by counter 5 each time.
Send K and add l to argument data DATA.
2 is sent to the first control section 1.

このよう(こ第1制イδV部1はDATAIおよびDA
TA21こついて第1記憶部3のそれぞn異なる領域−
\書込み且読出し制御を行う、第1記憶部3はEEPR
OMによって構成畜れ第1制御部1の制御に従って畳込
み読出しを行う記憶部である。
In this way (the first control point δV part 1 is DATAI and DA
TA21 gets stuck in each n different area of the first storage unit 3-
\The first storage unit 3 that performs write and read control is an EEPR
It is a storage section configured by OM and performs convolutional reading under the control of the first control section 1.

第2Me坊部4は書込回数の管理値を言ピ憶する例えば
マスク型の胱出し専用記憶回路(ROM )により構成
される。勿論外部において適轟なA込み手段により予め
書込み処理を施したヒユーズ型のROMtたはEEPR
OMによって構成しても良い。
The second memory section 4 is constituted by, for example, a mask-shaped memory circuit (ROM) dedicated to bladder extraction, which stores the management value of the number of times of writing. Of course, it is a fuse type ROMt or EEPR which has been written in advance by an appropriate A writing means externally.
It may also be configured by OM.

何fL+こしても例えば書込回数管理値103回のとき
は1111101000の10ビツトテータ、10’回
のときは11000011010100000の17ビ
ツトデータを固に的に保持する。
No matter how many fL+, for example, when the write count management value is 103 times, the 10-bit data of 1111101000 is held, and when the write count is 10' times, the 17-bit data of 11000011010100000 is always held.

前述の第2制御[2が電源投入時における初期状態設足
動作tこおいて第1記干、意i131こ記憶する旧計数
データをカウンタ51こセットし、その後41制御部l
より受信するWE信号毎(こカウンタ5をして1づつ加
算して得られる計数データDATA2をその都度第1制
御部lのADD2、C0NT2およびWEによって第1
記憶部3へ記憶する都度該DATA2は第1制御部1の
制御に従い比較部6へ送出される。一方第2制御部2の
制伊1信号C0NT3)こ従って比較部6は該]) A
 T A 2と第2記憶部4より受信する管理値と比較
して出力端子(OUT)よりその判定結果例えはDAT
A2(管理値のときは高レベルを送出して書込み可とし
DATA22管理値のときは低レベルを送出して書込み
不可としてOを送出し該第1記憶部3が規定の書込回数
になったとして交換することを通報するよう番こしてい
た。このように従来は書込回数の計数データを管理値と
比較してEEPROMlこよる第1BC惰s3を管理す
るために種々の外部付加回路を設ける場合余分なスペー
スを必要とする他、計数データDATA2の管理値への
近隣状況を把握するためには汎用データDATAIと共
tこDATA2を送出せしめて点検する必要があった。
The above-mentioned second control [2] sets the initial state when the power is turned on, and then performs the first recording.
For each WE signal received from
Each time the DATA 2 is stored in the storage section 3, it is sent to the comparison section 6 under the control of the first control section 1. On the other hand, the control unit 1 signal C0NT3) of the second control unit 2 is therefore the comparator 6.
Compare T A 2 with the management value received from the second storage unit 4 and output the judgment result from the output terminal (OUT), for example, DAT.
A2 (When it is a management value, it sends a high level to enable writing; when it is a management value, it sends a low level to indicate that writing is not possible, and sends O; the first storage unit 3 has reached the specified number of writes. In this way, in the past, various external additional circuits were provided in order to compare the count data of the number of writes with the control value and manage the first BC according to the EEPROM1. In addition to requiring extra space, it was necessary to send out DATA2 together with the general-purpose data DATAI for inspection in order to grasp the proximity of the count data DATA2 to the control value.

また図示省略したが必要(こよって別途選択手段を設け
てDATAIとDATA2を分離する必要がある等の欠
点を有していた。
In addition, although not shown in the drawings, it is necessary (therefore, it is necessary to provide a separate selection means to separate DATAI and DATA2).

(dl  発明の目的 本発明の目的(了、V込回数を処理するための回路と汎
用データを記憶するEEPROMを同一基板上に設けて
無駄な実装スペースを削除すると共に複数の管理値をF
j″′憶、且照合することfこより最終管理値への近接
状況を把握し易くする他、汎用データと計数データとを
別回路lこ分離して両データが同一端子に出力されるよ
うな事なく容易な管理手段を有するEEPROIVNこ
よるICメモリを提供しようとするものである。
(dl Purpose of the Invention Purpose of the Invention) A circuit for processing the number of input voltages and an EEPROM for storing general-purpose data are provided on the same board to eliminate wasted mounting space and to store multiple management values
In addition to making it easier to understand the state of proximity to the final control value by remembering and collating it, it is also possible to separate general-purpose data and counting data into separate circuits so that both data are output to the same terminal. The present invention aims to provide an IC memory based on EEPROIVN which has easy management means without any problems.

(e)  発明の構成 この目的(J同−基板十に、汎用データを記憶する第1
の記憶手段、該第1記憶手段の書込回数を計数する手段
、該書込回数計数(こおはる襟斂の管理値をMF’憶す
る第2の記憶手段、訪計V手段による計数データを配憶
する第3のMF′憶手段、該第3記憶手段の計数データ
を第2記憶手段tこおける複数の管理値を比較する手段
を備えてなり、第1、第3記憶手段を電1気消去可能の
読出し専用1e憧回路、第2記憶手段を固定オたは電気
消去可能の読出し専用記憶回路により構成し、制御部は
第1記慎手段の吊込信号を受信する毎に計む手段をして
第3記憶手段における旧計数データlこ1を加算して計
Vデータを更新せしめ、実に引数データを比較手段に送
出して管理値と比較濾ゼてその判定結果を送出せしめる
ことを特徴とするICメモリを枦供することによって達
成することが出来る。
(e) Structure of the Invention This purpose (J same--the first to store general-purpose data on the substrate 10)
storage means, means for counting the number of writings in the first storage means, second storage means for storing the number of writings (MF') for counting the number of writings (Koharu Erito's management value), and counting by means for visiting the counter V means. A third MF' storage means for storing data, a means for comparing the count data of the third storage means with a plurality of management values in the second storage means t, and the first and third storage means The second storage means is configured with a fixed or electrically erasable read-only storage circuit, and each time the control section receives a hanging signal from the first warning means, The counting means adds the old count data l in the third storage means to update the total V data, and actually sends the argument data to the comparison means to compare it with the control value and send out the judgment result. This can be achieved by providing an IC memory characterized by the following characteristics.

(f)  P、明の実施例 」Lノ、下水発明の一実施例について図面を参照しつ5
説明する。第2図は本発明の一実施例番こおける書込回
数管卯手段を備えたEEPROM 1こよるICメモリ
のブロック図を示す。図ζこおいてIaは第1制御部、
2aげ第2制御部、3は第1記憶部、4aは第2記憶部
、5はカウンタ、6aは比較部および7は第2記1f!
部である。尚lOは本発明の一実施例における同一基板
領域を示す。第1図と共辿の符号を有する第1記憶部3
とカウンタ5は従来のそれと同等であり共通の機能を有
する。旬し第1記伊部3は第1制御部1aより汎用デー
タDATA1の弓1゛倭励作制御のみを受け、計数デー
タDATA2のイ[1で!動作制御を受けないEEPR
OMEN成−こよるI) A、T A 1専用メモリと
して作動する。その他の第1 i1制御都1aS第2制
御部2a。
(f) P, Ming's Embodiment"L, An embodiment of the sewage invention with reference to the drawings 5
explain. FIG. 2 shows a block diagram of an IC memory consisting of an EEPROM 1 equipped with a write count control means according to an embodiment of the present invention. In the figure ζ, Ia is the first control section,
2a is the second control section, 3 is the first storage section, 4a is the second storage section, 5 is the counter, 6a is the comparison section, and 7 is the second section 1f!
Department. Note that lO indicates the same substrate area in one embodiment of the present invention. A first storage unit 3 having co-traced codes as in FIG.
and counter 5 are equivalent to the conventional ones and have common functions. At this time, the first recording section 3 receives only the excitation control of the general-purpose data DATA1 from the first control section 1a, and the first recording section 3 receives only the excitation control of the general-purpose data DATA1 at 1! EEPR not subject to motion control
OMEN Sei-Koyoru I) A, T A 1 operates as a dedicated memory. Other first i1 control unit 1aS second control unit 2a.

第2贅i1″俤部4aおよび比較部6aも基本動作とし
ては従来のサフィックスのないオ・1号を有する構成部
材の機能に類似の機能を備え部分的(こ異なる動作を行
う。
The second extension part 4a and the comparison part 6a also have a basic function similar to that of the conventional component having O.1 without a suffix, and perform partially different operations.

第1制御部1aはバスより受信するデータに従いアドレ
スデータA DD L制御信号C0NTlおよびライト
イネーブルWEIを第1記憶部3へ力え汎用データDA
TAIを書込み寸たADDIおよびC0NTlを与えて
Fl!川し動作を行う。
The first control unit 1a outputs the address data ADDL control signal C0NTl and write enable WEI to the first storage unit 3 according to the data received from the bus, and outputs the general-purpose data DA.
Write TAI, give ADDI and C0NTl, and write Fl! Perform a river movement.

@2制御部2aは従来と同様知源投入に伴って初期状態
のl゛、゛定動作および計IHt’i制御り力作を行う
The @2 control unit 2a performs the initial state l', '' constant operation and the total IHt'i control operation in response to input of the knowledge source as in the conventional case.

但し従来と異り旧計数データけTG EI) ROΔ・
1で構成する引数データ専用メモリ第3記倚部7より得
てカウンタ5にセットし、WEIを受信する毎tこフヮ
ックCLKをカウンタ5に送出して1づつ加p−計敬し
、計数データDATA2を第3記憶部7に送出させると
共に第2制りI音1; ? a Iばら11徂I伯ぢC
0NT2およびライトイネーブルWE2を第3記憶部7
に1y“出してDATA2を丈干、賃させると共にDA
TA2を比較部6aに送出させる。こ\て第3記憶都7
はEEPROMで前厄されそのアドレスは記憶内容が従
来と同じく例えば10sを示す10ビツトとかIO1′
を示す17ビツトのようlこ一連のビットデータであり
、特にアドレスデータを必要としない。第2百ピ憶都4
aも従来と同様イこ管理値をi1惰するマスク型ROM
1たけヒーーズ型ROMあるいはEEFROMで構成す
る。伊し従来と異なり接舷の管理値を記憶させる。例え
ば書込回σ最終菅」」値を10’回としてIJIIIO
loooと予報管3里値9XIQ”回としてl1100
00100を同一ビット数によりイ芳成且連AσC。
However, unlike before, the old counting data (TG EI) ROΔ・
The argument data is obtained from the third storage unit 7, which is a memory dedicated to argument data, and is set in the counter 5, and every time the WEI is received, the clock CLK is sent to the counter 5 and incremented by 1, and the counted data is Sends DATA2 to the third storage unit 7, and at the same time, outputs the second depressed I sound 1; ? a 11 roses I rose C
0NT2 and write enable WE2 in the third storage unit 7.
put out 1y" and DATA2, let it be rented and DA
TA2 is sent to the comparator 6a. This is the third memory capital 7
is stored in an EEPROM, and its address is the same as before, such as 10 bits indicating 10 seconds or IO1'.
This is a series of bit data such as 17 bits indicating , and does not particularly require address data. 200th Pi Memorandum 4
A is also a mask type ROM that controls the power management value i1 as before.
It consists of a single heats type ROM or EEFROM. Unlike conventional models, the control value for joining alongside is memorized. For example, if the write times σ final tube' value is 10' times, IJIIIO
looo and forecast tube 3litre value 9XIQ”times l1100
00100 with the same number of bits.

して記憶ざセでおく。そしてこの床2記慎部4alこお
ける連F;1.するU越の管理値臂前述の比較6116
atこ送出さ7’する管理値と同一ビットθからなるD
ATA2と第2制御部2aは制御部M CO1’J T
 3によっ゛こ抜信回たけ6&ビット構成単位毎に繰返
して比較させ、DA’I’A2<各管理f[のときは高
レベルlを送出さ−b:、DATA2≧管理値のときは
低レベルを退出きゼるようにず扛ば、例えばDATA2
が枚数の管理値t・“一対し倒れも下廻るときは比較部
()alま最終管理値に対して1、予報管理値lこ対し
てもlを出力してJr、、DATA2が両管理値の中間
にあるときは出力】0、DATA2が最終管理値に停し
くなるか土廻り1こときは出力00を出力端子OUTよ
り送出する。このように枚数の管理値を第221惹部4
aに直列シ1.て設定して比較部6aをしてDATA2
の1薄成ビツトを単位として直列に比較を繰返せばDA
TA2がf6F:管理値と等しくなるか十廻るときは0
0律続して検出され、DATA2が最終管理値未開のと
きは予報管理値の設定に従って1を頭とする表示を行い
f4P終管理値への接近度を検出することが出来る。
Then write it down in your memory. And this floor 2nd part 4al koreren F; 1. Comparison of the above management value 6116
D consisting of the same bit θ as the management value to be sent 7'
ATA2 and the second control section 2a are the control section M CO1'J T
3, it is repeatedly compared for each bit configuration unit, and when DA'I'A2<each management f[, high level l is sent -b:, and when DATA2≧management value, If you don't want to leave the low level, for example DATA2
When the number of sheets falls below the management value t, the comparison section ()al outputs 1 for the final management value and l for the forecast management value l, and DATA2 outputs both management values. When the value is between the values, the output is 0, and if DATA2 does not reach the final control value, the output 00 is sent from the output terminal OUT.
In series with a1. DATA2
If we repeat the comparison in series in units of 1 thin bit, we get DA
0 when TA2 becomes equal to f6F: control value or goes around 10 times
When DATA2 is continuously detected as 0 and the final management value is not yet opened, it is displayed starting with 1 according to the setting of the forecast management value, and the degree of approach to the f4P final management value can be detected.

(g)  発明の効果 」ソ上置明したようtこ本発明によれば従来EEPRQ
Mの書込回数を管理する手段を外部回路によっていたの
に比較して同一基板上lこ1チツプとして構成したため
実装スペースを削除低減出来ると共lこ、計敬データ専
用の配俤部を設(・ツて従来の第1制御部はE E P
 RCI Mを単なるメモリ制御のみで書込1ipl数
管理のための制御手段を全く考αすることなく簀易に使
用出来、且最P管■(値に対する掃近度も得られEEP
ROMIこおけるゴ込回敬を容易に管理することが出来
るので有用である。
(g) As stated above in ``Effects of the Invention'', the present invention improves the conventional EEPRQ.
Compared to the external circuit used to manage the number of times M is written, the method is configured as a single chip on the same board, which reduces the mounting space and also allows for the design of a dedicated distribution section for measurement data. (・The conventional first control section is E E P
RCI M can be easily used by simply controlling the memory without having to consider any control means for managing the number of writes per ipl, and it is also possible to obtain the maximum P tube (sweeping degree for the value and EEP).
This is useful because it allows you to easily manage the gogome returns in the ROMI.

【図面の簡単な説明】[Brief explanation of the drawing]

第1し1は従来の外部回路によって声込回数管理手役を
備またEEPROMのブロック図、第2図は本発明の一
実施例tこおける畳込〔+1数管理手段を備えたE&:
PR,OMによるICメモリのブロック図である。 図にあ・いて1.laは’IC1hJ XI tt:i
、2.2atJ第2制御部、3は第1Bピ憶部、4.4
aは第2記1意音阻 5cまカウンタ、6.6a番J比
11t7二囚iおよび7は第3七t4憶部である。
FIG. 1 is a block diagram of an EEPROM equipped with a conventional external circuit for managing the number of inputs; FIG.
FIG. 2 is a block diagram of an IC memory using PR and OM. See the diagram 1. la is 'IC1hJ XI tt:i
, 2.2atJ second control section, 3 is the first B memory section, 4.4
a is the 2nd note, 1st note, 5c, counter, 6.6a, J ratio, 11t7, 2nd i, and 7 are the 3rd, 7th, and 4th part.

Claims (1)

【特許請求の範囲】[Claims] 同一ノ九叛上に、汎用データをR+1体する帛lの記憶
1音手段、該第1記憶手段の書込1jJl数を泪Vする
手段、該iQ、込回数削数における初数σ戸11理値を
記憶、はする第2の記憶手段、該計数手段(こよる引数
データを記憶する第3の記119手段、該第:3記(、
ff ’4・段の言1nテータを第2記憶手段における
沙数の管理値々比較する手段を備えてなり、・21、第
3 ’fc +、W手段をits、気消去可能の読出し
専用記憶回路、第2WC憶手段を固足または電気消去可
能の読出し専用記+i′?I’ij回路により構成し、
制御部は〆I31記憶手段の一吉込信号を・−〇−信す
る毎に引数手段をして第3記1,11手段におC“)る
旧訓斂データに1を加pして計Vデータを更新せしめ、
更lこ言1数データを片軸手段lこy、η出して管理値
と比較させてその1′11屋結果を送出せしめることを
特徴とするICメモリ。
On the same number nine, storage means for storing R+1 pieces of general-purpose data, means for writing 1jJl number of the first storage means, iQ, the initial number σ door 11 in the number reduction number. a second storage means for storing and storing logical values; a third storage means for storing argument data;
It is provided with means for comparing the word 1n data of the 4th stage of ff with the management value of the number in the second storage means; circuit, the second WC storage means is fixed or electrically erasable read-only memory +i'? Consisting of an I'ij circuit,
Each time the control unit receives the Ichiyoshigo signal from the storage means, the control section uses the argument means to add 1 to the old training data stored in the means 1 and 11 of Section 3. Update the total V data,
Furthermore, the IC memory is characterized in that the first number data is outputted by a single-axis means, compared with a control value, and the 1'11 result is sent out.
JP57157217A 1982-09-07 1982-09-07 Ic memory Pending JPS5945695A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57157217A JPS5945695A (en) 1982-09-07 1982-09-07 Ic memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57157217A JPS5945695A (en) 1982-09-07 1982-09-07 Ic memory

Publications (1)

Publication Number Publication Date
JPS5945695A true JPS5945695A (en) 1984-03-14

Family

ID=15644773

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57157217A Pending JPS5945695A (en) 1982-09-07 1982-09-07 Ic memory

Country Status (1)

Country Link
JP (1) JPS5945695A (en)

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US5268870A (en) * 1988-06-08 1993-12-07 Eliyahou Harari Flash EEPROM system and intelligent programming and erasing methods therefor
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US5388083A (en) * 1993-03-26 1995-02-07 Cirrus Logic, Inc. Flash memory mass storage architecture
US5602987A (en) * 1989-04-13 1997-02-11 Sandisk Corporation Flash EEprom system
US5838614A (en) * 1995-07-31 1998-11-17 Lexar Microsystems, Inc. Identification and verification of a sector within a block of mass storage flash memory
US5907856A (en) * 1995-07-31 1999-05-25 Lexar Media, Inc. Moving sectors within a block of information in a flash memory mass storage architecture
US5930815A (en) * 1995-07-31 1999-07-27 Lexar Media, Inc. Moving sequential sectors within a block of information in a flash memory mass storage architecture
US5928370A (en) * 1997-02-05 1999-07-27 Lexar Media, Inc. Method and apparatus for verifying erasure of memory blocks within a non-volatile memory structure
US5963480A (en) * 1988-06-08 1999-10-05 Harari; Eliyahou Highly compact EPROM and flash EEPROM devices
US6034897A (en) * 1999-04-01 2000-03-07 Lexar Media, Inc. Space management for managing high capacity nonvolatile memory
US6040997A (en) * 1998-03-25 2000-03-21 Lexar Media, Inc. Flash memory leveling architecture having no external latch
US6076137A (en) * 1997-12-11 2000-06-13 Lexar Media, Inc. Method and apparatus for storing location identification information within non-volatile memory devices
US6081878A (en) * 1997-03-31 2000-06-27 Lexar Media, Inc. Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices
US6081447A (en) * 1991-09-13 2000-06-27 Western Digital Corporation Wear leveling techniques for flash EEPROM systems
US6115785A (en) * 1995-07-31 2000-09-05 Lexar Media, Inc. Direct logical block addressing flash memory mass storage architecture
US6122195A (en) * 1997-03-31 2000-09-19 Lexar Media, Inc. Method and apparatus for decreasing block write operation times performed on nonvolatile memory
US6125435A (en) * 1995-09-13 2000-09-26 Lexar Media, Inc. Alignment of cluster address to block addresses within a semiconductor non-volatile mass storage memory
US6141249A (en) * 1999-04-01 2000-10-31 Lexar Media, Inc. Organization of blocks within a nonvolatile memory unit to effectively decrease sector write operation time
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US5909390A (en) * 1988-06-08 1999-06-01 Harari; Eliyahou Techniques of programming and erasing an array of multi-state flash EEPROM cells including comparing the states of the cells to desired values
US5268870A (en) * 1988-06-08 1993-12-07 Eliyahou Harari Flash EEPROM system and intelligent programming and erasing methods therefor
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US5544118A (en) * 1988-06-08 1996-08-06 Harari; Eliyahou Flash EEPROM system cell array with defect management including an error correction scheme
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US5862081A (en) * 1988-06-08 1999-01-19 Harari; Eliyahou Multi-state flash EEPROM system with defect management including an error correction scheme
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US5479638A (en) * 1993-03-26 1995-12-26 Cirrus Logic, Inc. Flash memory mass storage architecture incorporation wear leveling technique
US5388083A (en) * 1993-03-26 1995-02-07 Cirrus Logic, Inc. Flash memory mass storage architecture
US6223308B1 (en) 1995-07-31 2001-04-24 Lexar Media, Inc. Identification and verification of a sector within a block of mass STO rage flash memory
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US6128695A (en) * 1995-07-31 2000-10-03 Lexar Media, Inc. Identification and verification of a sector within a block of mass storage flash memory
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US5907856A (en) * 1995-07-31 1999-05-25 Lexar Media, Inc. Moving sectors within a block of information in a flash memory mass storage architecture
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US6125435A (en) * 1995-09-13 2000-09-26 Lexar Media, Inc. Alignment of cluster address to block addresses within a semiconductor non-volatile mass storage memory
US5928370A (en) * 1997-02-05 1999-07-27 Lexar Media, Inc. Method and apparatus for verifying erasure of memory blocks within a non-volatile memory structure
US6081878A (en) * 1997-03-31 2000-06-27 Lexar Media, Inc. Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices
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US6813678B1 (en) 1998-01-22 2004-11-02 Lexar Media, Inc. Flash memory system
US6040997A (en) * 1998-03-25 2000-03-21 Lexar Media, Inc. Flash memory leveling architecture having no external latch
US6134151A (en) * 1999-04-01 2000-10-17 Lexar Media, Inc. Space management for managing high capacity nonvolatile memory
US6034897A (en) * 1999-04-01 2000-03-07 Lexar Media, Inc. Space management for managing high capacity nonvolatile memory
US6141249A (en) * 1999-04-01 2000-10-31 Lexar Media, Inc. Organization of blocks within a nonvolatile memory unit to effectively decrease sector write operation time
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US6957295B1 (en) 2002-01-18 2005-10-18 Lexar Media, Inc. File management of one-time-programmable nonvolatile memory devices
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US10049207B2 (en) 2004-04-30 2018-08-14 Micron Technology, Inc. Methods of operating storage systems including encrypting a key salt
US7464306B1 (en) 2004-08-27 2008-12-09 Lexar Media, Inc. Status of overall health of nonvolatile memory
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