JPS59220942A - Wafer transfer device - Google Patents
Wafer transfer deviceInfo
- Publication number
- JPS59220942A JPS59220942A JP9500483A JP9500483A JPS59220942A JP S59220942 A JPS59220942 A JP S59220942A JP 9500483 A JP9500483 A JP 9500483A JP 9500483 A JP9500483 A JP 9500483A JP S59220942 A JPS59220942 A JP S59220942A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- carrier
- hand
- wafers
- suction hand
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007664 blowing Methods 0.000 claims description 3
- 235000012431 wafers Nutrition 0.000 abstract description 55
- 238000000034 method Methods 0.000 abstract description 10
- 238000001179 sorption measurement Methods 0.000 abstract description 5
- 238000010276 construction Methods 0.000 abstract 1
- 239000000969 carrier Substances 0.000 description 14
- 238000010586 diagram Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
この発明はウェハ移し替え装置に関し、ウエノ・に対す
る加工工程で、工程毎に異なるウエノ・キャリヤ間に移
し替えを行なう装置を改卑するO〔発明の背景技術とそ
の問題点〕
ウェハの加工工程で用いられるキャリヤは、例えばウェ
ハ洗浄工程ではTFEキャリヤ、不純物拡散工程では石
英ボート、写真蝕刻工程ではアルミ製キャリヤなどの夫
々異なる形状の専用キャリヤが用いられていた。このた
め、上記各工程間でけウェハのキャリヤ間移し替えが必
須であった。[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a wafer transfer device, and relates to a device for transferring wafers between different wafer carriers for each process in a wafer processing process. Background technology and its problems] The carriers used in the wafer processing process are dedicated carriers with different shapes, such as TFE carriers in the wafer cleaning process, quartz boats in the impurity diffusion process, and aluminum carriers in the photo-etching process. It was getting worse. For this reason, it is essential to transfer wafers between carriers between each of the above steps.
上記ウェハのキャリヤ間移し替えに、人手ニヨってウェ
ハを1枚ずつピンセットで挾持して施す方式が広く用い
られていたが、多大な労力を要する上に、ウエノ・に擦
過傷↑クラック等を発生させる危険性が高いなどの欠点
があった。この欠点は最近急速に進みつつあるウエノ・
の太径化と、加工速度の向上の傾向に伴なって重大な問
題となりつつある。A widely used method for transferring the wafers between carriers was to manually hold the wafers one by one with tweezers, but this method required a great deal of labor and caused scratches, cracks, etc. on the wafers. There were disadvantages such as a high risk of This drawback is a problem with Ueno, which has been rapidly progressing recently.
This is becoming a serious problem as the diameters of metals become larger and processing speeds increase.
そこで、専用移し替え治具で、ウエノ1の自重によって
自然落下させる方式のものは一度に移し替えることがで
きるが、キャリヤの変形、割れなどを生じやすい上に、
ウエノ翫の径が変わったりキャリヤの収納枚数に変更な
どが生ずるとその都度治具を更新する必要があって支障
が多い。Therefore, using a special transfer jig that allows the Ueno 1 to fall naturally due to its own weight can be used to transfer the Ueno 1 all at once, but it is prone to deformation and cracking of the carrier, and
When the diameter of the Ueno rod changes or the number of sheets stored in the carrier changes, it is necessary to update the jig each time, which causes many problems.
この発明は半導体ウェハの加工工程で用いられるウェハ
移し替え装置を改良するもので、ウェハを収納するキャ
リヤ、ボート等の材質、形状、収納枚数、収納ピッチ等
が異なるものに人手を要せず全自動にて収納キャリヤか
らウェハを取出したのち移し替え対象のキャリヤに収納
する。This invention improves the wafer transfer device used in the processing process of semiconductor wafers, and allows the transfer of wafers, such as carriers and boats, which are different in material, shape, number of wafers, storage pitch, etc., without the need for manpower. After the wafer is automatically taken out from the storage carrier, it is stored in the carrier to be transferred.
この発明にかかるウェハ移し替え装置は、2つの定点間
を移行しかつ各定点で昇降する移動ユニットと、移1助
ユニットに一端を軸着した第1の吸着ハンドと、第1の
吸着ハンドの他端にこの吸着ハンドの軸と垂直方向の軸
により一端を軸着した第2の吸着ハンドと、第2の吸着
ハンドの他端に設けられウェハキャリヤの溝によって遊
動的に並立されたウェハの主面をブローして所定の傾度
にするとともに減圧吸引して支持する開孔と、前記第1
の吸着ハンドとNシ2の吸着ハンドとを個々に固定する
固定機構とを具備したものである。The wafer transfer device according to the present invention includes a moving unit that moves between two fixed points and moves up and down at each fixed point, a first suction hand whose one end is pivoted to the transfer assisting unit, and a first suction hand that moves between two fixed points and moves up and down at each fixed point. A second suction hand has one end pivoted on the other end by an axis perpendicular to the axis of the suction hand; an opening for blowing the main surface to a predetermined slope and supporting the main surface by vacuum suction;
This device is equipped with a fixing mechanism for individually fixing the suction hand 1 and the suction hand N2.
次にこの発明を1実施例につき図面を参照して詳細に説
明する。Next, one embodiment of the present invention will be explained in detail with reference to the drawings.
第1図はこの発明の1実施例のウェハ移し替え装置の概
略の構成を説明するための平面図、第2図は第1図に示
すものの正面図で、(1)は一方の定点にある第1のキ
ャリヤで例えばウェハが装填されており、(2)は他方
の定点にある第2のキャリヤで、例えば第1のキャリヤ
からウェハを受は入れる空のキャリヤである。これらの
定点間の距#Xを移行するとともに各定点で昇降する移
動ユニット(3)がガイド(4)によって両キャリヤ間
を第3図に示すように移行し、かつ、各キャリヤ上にて
2方向の昇降をする。この昇降ごとにギヤリヤはウェハ
間のピッチに相当する距f’rIfずつY方向に前進ま
たは後退する。この前進ま7+j:け後退は移動ユニッ
トの動作とともにコンピュータ開側1され、−例のステ
ップモータ(図示省略)を駆動源として構成される。な
お、両キャリヤはウェハ間のピッチ、収納数、高さなど
について相違していても第1図のガイド(4)に設けら
れたリードネジ(4a)でガイドをY一方向に微動させ
て対応できる。すなわち、収納数が少い側のキャリヤは
次のキャリヤへの転換が早められ、移し替え繰作は連続
で進行される。FIG. 1 is a plan view for explaining the general configuration of a wafer transfer device according to an embodiment of the present invention, and FIG. 2 is a front view of the device shown in FIG. 1, where (1) is at one fixed point. A first carrier, for example loaded with wafers, and (2) at the other fixed point a second carrier, for example an empty carrier, which receives wafers from the first carrier. The moving unit (3), which moves the distance #X between these fixed points and moves up and down at each fixed point, moves between both carriers by the guide (4) as shown in FIG. Go up and down in the direction. Each time the gear is raised or lowered, the gear moves forward or backward in the Y direction by a distance f'rIf corresponding to the pitch between wafers. This forward movement or backward movement is performed by the computer along with the operation of the moving unit, and is configured using a step motor (not shown) as a driving source. Furthermore, even if the two carriers are different in pitch between wafers, number of wafers stored, height, etc., it can be accommodated by slightly moving the guide in one direction, Y, using the lead screw (4a) provided on the guide (4) in Figure 1. . In other words, the carrier with the smaller number of carriers stored is quickly converted to the next carrier, and the transfer operation is continued continuously.
なお、吸着ハンドの機構については次に詳述するので、
第1図および第2図には省略しである。The mechanism of the suction hand will be explained in detail next.
It is omitted from FIGS. 1 and 2.
次に、この1実施例における吸着ノ1ンドにつき第4図
以降によって詳述する。吸着ノ・ンド(5)は移動ユニ
ット(3)の下端に−E部を軸着した第1の吸着ハンド
(6)が設けられ、その軸(7)よりもやや上部に軸と
垂直方向に両(111から突出して挾みとの吸〃↑)・
ンドの揺動を制止するロッド(8)、(8)がシリンダ
(9)。Next, the adsorption node in this embodiment will be explained in detail with reference to FIG. 4 and subsequent figures. The suction hand (5) is provided with a first suction hand (6) with the -E part pivoted on the lower end of the moving unit (3), and a first suction hand (6) with the -E part pivoted on the lower end of the moving unit (3), and a first suction hand (6) mounted slightly above the shaft (7) in a direction perpendicular to the shaft. Both (protruding from 111 and sucking with the sandwich ↑)・
The cylinder (9) is a rod (8) that stops the swing of the hand.
(9)によって駆動される。このロッドが突出すれば吸
着ハンドは揺動が制止されて固定し、ロッドが退けば揺
動自在になる。次に、第2の吸着ノ・ンドaeは第1の
吸着ノ・ンド(6)の下端に上部を軸招じ、その軸αη
よりもやや下部に111と垂直方向に両側から突出して
挾んでこの吸着ノ・ンドの揺動を制止するロッドtt8
1.(t81がシリンダu鐘、(1cmによって駆動さ
れる。このロッドの作用は第1の吸着ハンドと変わらな
いので説明は省略する。この第2の吸着ハンド(161
は下端に開孔翰が設けられ、高圧空気のブローと減圧吸
引とが任意に施せるように切換コツターを備えた夫々の
導管(2+1.(2湯が配設されている。(9). When this rod protrudes, the suction hand is prevented from swinging and is fixed, and when the rod is retracted, it becomes free to swing. Next, the second adsorption node ae has its upper part attached to the lower end of the first suction node (6), and its axis αη
A rod tt8 is located slightly lower than 111 and protrudes from both sides in the vertical direction to clamp the suction node and prevent it from swinging.
1. (t81 is driven by the cylinder u bell (1cm).The action of this rod is the same as the first suction hand, so the explanation will be omitted.This second suction hand (161
Each conduit (2+1. (2 hot water is installed) is provided with a perforated canopy at the lower end and equipped with a switching cockter so that high-pressure air blowing and vacuum suction can be performed at will.
なお、01はウェハを破線で示す。Note that 01 indicates the wafer with a broken line.
次にこの装置がコンピュータによって連続して自動的に
ウェハをキャリヤ間に移し替える状態を第3図以降によ
って説明する。Next, the state in which this apparatus continuously and automatically transfers wafers between carriers using a computer will be explained with reference to FIGS. 3 and subsequent figures.
(al 第3図のAはスタートで、X方向、Y方向の
bずれも固定の状態で下降する(第4図および第5図)
。(al A in Figure 3 is the start, and the shift b in the X and Y directions is also fixed and descends (Figures 4 and 5)
.
(bl 先端の開孔(至)からウェハキャリヤに並立
されたウェハの主面にエヤブローを施す。キャリヤ上の
ウェハはウェハの厚さよりも広い溝に並立し遊動するの
で、このエヤブローによって所定の傾斜θにさせたのち
、全部のロッド(8,8,18゜18)を退きX、Y方
向にフリーにし、第2の吸着ハンドの開孔(軸をウェハ
に対接させ吸着させる(第6図)。(bl) Air blow is applied to the main surface of the wafer parallel to the wafer carrier from the opening (end) at the tip.Since the wafer on the carrier moves parallel to the groove wider than the thickness of the wafer, this air blow blows air to the main surface of the wafer parallel to the wafer carrier. After setting the wafer to θ, all the rods (8, 8, 18° 18) are moved back to be free in the X and Y directions, and the opening (shaft) of the second suction hand is brought into contact with the wafer and suctioned (see Fig. 6). ).
(cl 吸着ハンド(房が移動ユニット(1)の上昇
にともなって上昇し、第2のキャリヤ(2)上に移行す
る。(cl suction hand (the tuft rises as the moving unit (1) rises and moves onto the second carrier (2).
(d) 前後方向のみ固定させる、すなわち、シリン
ダ(9)のロッド(8)を突出させて下降する(第7図
)。(d) Fix only in the front-back direction, that is, make the rod (8) of the cylinder (9) protrude and descend (Fig. 7).
(el 下降位置で減圧を解除してウェハ0(1)を
フリーにすることにより、ウェハは第2のキャリヤ(2
)の溝内に置かれる。こののち、吸着ハンドは移動ユニ
ットとともに上昇しスタート位置にもどる。(el) By releasing the vacuum in the lowered position and freeing wafer 0 (1), the wafer is transferred to the second carrier (2
) is placed in the groove. Thereafter, the suction hand moves up together with the moving unit and returns to the starting position.
以下、上記(a)〜(elの繰返しにより全部のウェハ
の移し替えが達成される。Thereafter, by repeating steps (a) to (el) above, all wafers are transferred.
この発明は吸着ハンドがウェハまたはキャリヤに対して
自在に変位するので、例えば第7図と第8図に夫々示さ
れるように、搬出側と搬入(1111とで位置ずれがあ
っても、位置のずれた状態で吸着したウェハはキャリヤ
溝に沿って上昇(第7図)し、また下降(第8図)する
ため、ウェハを破損することなく移し替えが達成できる
。In this invention, since the suction hand can be freely displaced with respect to the wafer or carrier, even if there is a positional deviation between the unloading side and the loading side (1111), as shown in FIGS. The wafer picked up in a shifted state moves up (FIG. 7) and down (FIG. 8) along the carrier groove, so that the wafer can be transferred without damaging the wafer.
さらにこの装置は移動ユニットの動作を含み、各部の動
作がメモリされCPUによる指令で動作されて自動化に
対応する。Furthermore, this device includes the operation of the mobile unit, and the operation of each part is stored in memory and operated according to instructions from the CPU, making it compatible with automation.
この発明によれば、一般にキャリヤ内のウェハは溝に挿
入支持されているので前後の何れに傾斜しているか不明
であるが、これを強制的に一方向に傾斜させておき、例
えば第1の吸着ハンドが前後方向に自在に回転し傾斜で
きるので確実にウェハを吸着支持する。また、ウェハを
収納しているキャリヤと、空のキャリヤが、右左方向の
位置ずれに対し7ても例えば第2の吸着ハンドの回転に
よって確実にウェハを吸着支持できる。According to this invention, since the wafer in the carrier is generally inserted and supported in a groove, it is unclear whether it is tilted forward or backward, but the wafer is forcibly tilted in one direction, for example, in the first direction. Since the suction hand can freely rotate and tilt in the front and rear directions, it can reliably suction and support the wafer. Further, even if the carrier containing the wafer and the empty carrier are misaligned in the right and left directions, the wafer can be reliably sucked and supported by, for example, rotation of the second suction hand.
斜上の如く工程間のウエノ・の移し替えが完全に自・肋
化できる。そして、キャリヤのピッチサイズか異なり、
あるいは収納数(キャリヤの長さ)の異なるキャリヤ間
にもウェハの移し替えがウェハに損傷を与えることなく
良好な歩留で達成できるなどの顕著な利点がある。The transfer of Ueno between processes can be completely carried out as shown on the diagonal. And the pitch size of the carrier is different,
Furthermore, there is a remarkable advantage that wafers can be transferred between carriers having different numbers of carriers (carrier lengths) without damaging the wafers and at a good yield.
第1図はこの発明の1実施例のウェハ移し替え装置の上
面図、第2図L−i第1図に示す装置の正面図、第3図
は動作シーケンス図、2套4図は吸着ハンド部の正面図
、第5図は第4図の侃面図、第6図ないし第8ジ1は吸
着ノ・ンド部の動作を説明する図で第6図は正面図、第
7図および第8図はいずれも仙1面図である。
1 第1のキャリヤ
2 第2のキャリヤ
3 移動ユニット
4 ガイド
5 1J着ノ17ド
6 j[1の吸着ハンド
7 第1の吸着ハンドの軸
8 、8 第1の職層ハンドのロッド16
r+;2の吸着ハンド
17 第2の吸〃1ハンドのIQl+18.
18 >>、2の吸う?1ハンドのロッド20
ttr、 2の吸着)・ンドの開孔代理人
弁理士 井 −ヒ − 男
第 1 図
第2図
第 3 図
第 4 図 第 5 同第 7
図
第 8 図Figure 1 is a top view of a wafer transfer device according to an embodiment of the present invention, Figure 2 is a front view of the device shown in Figure 1, Figure 3 is an operation sequence diagram, and Figure 2 is a suction hand. Figure 5 is a side view of Figure 4, Figures 6 to 8 are diagrams explaining the operation of the suction nozzle, Figure 6 is a front view, Figures 7 and All figures 8 are 1-side views of the sacrum. 1 First carrier 2 Second carrier 3 Moving unit 4 Guide 5 1J arrival node 17 6 j [1 suction hand 7 First suction hand shaft 8 , 8 First occupational hand rod 16
r+; 2 suction hand 17 2nd suction 1 hand IQl+18.
18 >>, 2 suck? 1 hand rod 20
ttr, adsorption of 2) and pore-opening agent
Patent Attorney I-H-O Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 7
Figure 8
Claims (1)
記移動ユニットに1端を軸着した第1の吸着ハンドと、
前記第1の吸着ノ・ンドの他端にこの吸着ハンドの軸と
垂直方向の軸により一端を軸着した第2の吸着ハンドと
、前記第2の吸着/・ンドの他端に設けられウェハキャ
リヤの溝によって遊動的に並立されたウェハの主面をブ
ローして所定の傾度にするとともに減圧吸引してこの吸
着ハンドの端部にウェハを吸着支持するための開孔と、
前記第1の吸着ハンドと第2の吸着ハンドとを個々に固
定する固定機構とを具備したウェハ移し替え装置、a moving unit that moves between two fixed points and moves up and down at each fixed point; a first suction hand that has one end pivoted to the moving unit;
A second suction hand whose one end is pivoted to the other end of the first suction nozzle by an axis perpendicular to the axis of the suction hand; an opening for sucking and supporting the wafer at the end of the suction hand by blowing the main surface of the wafer, which is freely aligned in parallel with the groove of the carrier, to a predetermined inclination and suctioning the wafer under reduced pressure;
a wafer transfer device comprising a fixing mechanism for individually fixing the first suction hand and the second suction hand;
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9500483A JPS59220942A (en) | 1983-05-31 | 1983-05-31 | Wafer transfer device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9500483A JPS59220942A (en) | 1983-05-31 | 1983-05-31 | Wafer transfer device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59220942A true JPS59220942A (en) | 1984-12-12 |
JPS6329411B2 JPS6329411B2 (en) | 1988-06-14 |
Family
ID=14125767
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9500483A Granted JPS59220942A (en) | 1983-05-31 | 1983-05-31 | Wafer transfer device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59220942A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63211645A (en) * | 1986-12-02 | 1988-09-02 | テラダイン・インコーポレーテッド | Method and apparatus for attaching and detaching wafer |
-
1983
- 1983-05-31 JP JP9500483A patent/JPS59220942A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63211645A (en) * | 1986-12-02 | 1988-09-02 | テラダイン・インコーポレーテッド | Method and apparatus for attaching and detaching wafer |
Also Published As
Publication number | Publication date |
---|---|
JPS6329411B2 (en) | 1988-06-14 |
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