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JPS59195649A - Device for washing photomask - Google Patents

Device for washing photomask

Info

Publication number
JPS59195649A
JPS59195649A JP58070498A JP7049883A JPS59195649A JP S59195649 A JPS59195649 A JP S59195649A JP 58070498 A JP58070498 A JP 58070498A JP 7049883 A JP7049883 A JP 7049883A JP S59195649 A JPS59195649 A JP S59195649A
Authority
JP
Japan
Prior art keywords
washing
cleaning
soln
photomask
brush
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58070498A
Other languages
Japanese (ja)
Inventor
Yoji Yamanaka
山中 洋示
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP58070498A priority Critical patent/JPS59195649A/en
Publication of JPS59195649A publication Critical patent/JPS59195649A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82Auxiliary processes, e.g. cleaning or inspecting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To carry out washing of a scrubbing brush itself easily and effectively in a short time by generating ultrasonic waves in a washing soln. same as that used for washing a photomask, filled in a washing vessel having the brush before washing the photomask. CONSTITUTION:When a washing vessel 4 is filled with a washing soln. from a shower supply pipe 2 to immerse a scrubbing brush 1 in the washing soln. an ultrasonic wave oscillator 8 is actuated. The soln. is continuously supplied but the soln. does not increase up to a liquid level 7 due to an overflow drain pipe 6 kept open, and dust lower in specific gravity than the soln. flows out through the pipe 6. After the lapse of a prescribed time, feed of the soln. through the pipe 2 is stopped, and a drain valve 3 is opened to drain dust higher in specific gravity than the soln. Said processes are carried out in 2-3 times. After the completion of washing of the brush, a photomask is inserted between the two brushes and scrubbed by rotating the brushes to wash the photomask.

Description

【発明の詳細な説明】 本発明は投影式露光機に使用するレチクル又はホトマス
クの洗浄装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a reticle or photomask cleaning device used in a projection exposure machine.

近年、半導体集積回路装置の微細化が進んでおり、それ
とともに集積回路装置の製造に使用する製造設備も高級
な装置になりつつある。例えば投影式露光機などがその
良い例であろう。具体的には、1対1のミラー系プロジ
ェクション公党機。
In recent years, the miniaturization of semiconductor integrated circuit devices has progressed, and the manufacturing equipment used to manufacture the integrated circuit devices has also become more sophisticated. A good example would be a projection exposure machine. Specifically, it is a one-to-one mirror-type projection public party machine.

縮小投影露光機などがあるが、それらの露光機に使用す
るホトマスク又はレチクル(以下ホトマスクと総称する
)の清浄度が大きな問題となってきている。例えば縮小
投影露光機に使用するレチクル表面に電気的欠陥となり
得る塵埃が付着していると、<シ返し露光を行なうため
その塵埃に当るチップは全部不良となってしまう。また
ミラープロジェククヨンのホトマスクにおいても、縮小
投影式に比べその被害は軽減されるとはいうもののマス
ク表面に付着した塵埃に当るチップは不良となり、歩留
漫に多大な影響を及はす。従ってホトマスクの洗浄技術
が重要なものとなる。
There are reduction projection exposure machines and the like, but the cleanliness of photomasks or reticles (hereinafter collectively referred to as photomasks) used in these exposure machines has become a major problem. For example, if dust that can cause an electrical defect is attached to the surface of a reticle used in a reduction projection exposure machine, all chips that hit the dust will be defective because the reticle is subjected to reverse exposure. Also, in the case of a mirror projection type photomask, although the damage is less than that of a reduced projection type, chips that hit the dust attached to the mask surface become defective, which greatly affects the yield. Therefore, photomask cleaning technology becomes important.

ホトマスク洗浄法としては両面スクラブ方法が一般的で
あるが、従来のホトマスク洗浄装置ではスクラブに使用
するプラノ自身の洗浄に関しとくに配慮がなされていな
い。すなわち、スクラブに使用するブラシ(以後単にブ
ラシと言う)が汚れると洗浄効果が劣化し、完壁な洗浄
が不可能となる。従来のホトマスク洗浄装置では、プラ
クが汚れるとブラシを取りはずして交換するがまたはブ
ラシを洗浄して取り付は直していた。この方法ではプラ
クの交換時間に数時間を要し、さらに交換後も洗浄槽及
びブラシの清浄度を維持するため、空運動を数時間実施
する必要があった。
A double-sided scrubbing method is common as a photomask cleaning method, but in conventional photomask cleaning equipment, no particular consideration is given to cleaning the plane itself used for scrubbing. That is, if the brush used for scrubbing (hereinafter simply referred to as a brush) becomes dirty, the cleaning effect deteriorates and thorough cleaning becomes impossible. In conventional photomask cleaning equipment, when plaque becomes dirty, the brush is removed and replaced, or the brush is cleaned and reattached. In this method, it took several hours to replace the plaque, and furthermore, it was necessary to carry out empty exercise for several hours in order to maintain the cleanliness of the cleaning tank and brushes even after the replacement.

そこで本発明の目的は、ホトマスク洗浄用スクラップラ
フ自身の洗浄を容易にかつ短時間に効果的に行う機能を
兼ね備えたホトマスク洗浄装置を提供することである。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a photomask cleaning apparatus that has the ability to easily and effectively clean the scrap rough for photomask cleaning in a short period of time.

本発明は、ブラシを有する洗浄槽内にホトマスク洗浄に
使用すると同じ洗浄液を満たし、その洗浄液に超音波振
動を生せしめる超音波発生器を具備することによって構
成され、ホトマスク洗浄を行なう前に、この満たされた
洗浄液内で超音波を発生させることにより、ブラシ及び
槽内に付着している汚れを洗浄することを特徴とする。
The present invention is constructed by filling a cleaning tank with a brush with the same cleaning liquid used for photomask cleaning, and equipping the cleaning liquid with an ultrasonic generator that generates ultrasonic vibrations. It is characterized by cleaning dirt adhering to the brush and the tank by generating ultrasonic waves in the filled cleaning liquid.

本発明による効果は%まずブラシの取りはずし取シクけ
などが不要となるため、短時間にてブラシの洗浄を行な
えることがあげられる。また、ブックの取りはずし取ル
つけによって生じる塵埃が無いため、塵埃を外部から持
ち込むことがない。
The advantage of the present invention is that the brushes can be cleaned in a short time because it is no longer necessary to remove and sift the brushes. Further, since there is no dust generated by removing and attaching the book, no dust is brought in from outside.

従って清浄度を維持したままブックのみならず同時に洗
浄槽内の洗浄を行うことができる。
Therefore, not only the book but also the interior of the cleaning tank can be cleaned while maintaining cleanliness.

次に図面を用いて本発明の実施例を詳細に説明する。第
1図は本発明の詳細な説明するための正面方向から見た
断面図であり、第2図は側面方向から見た部分断面図で
ある。
Next, embodiments of the present invention will be described in detail using the drawings. FIG. 1 is a sectional view seen from the front direction for explaining the present invention in detail, and FIG. 2 is a partial sectional view seen from the side direction.

まず適当な間隔をあけて洗浄槽4内に平行に設置された
2本のスクラブ用ブラシ1を洗浄液に浸漬させるだめ、
シャワー供給パイプ2から洗浄液を供給する。このとき
洗浄液排水弁3は閉じておく。洗浄液が洗浄槽4内に満
たされた時、この洗浄槽の下面に取付けられている超音
波発生器8を作動させる。衆知のとおり超音波には洗浄
効果があり、特に微細な部分でも洗浄されるため、ブラ
フの洗浄には好適である。洗浄液は絶えず供給し続ける
が、液はオーバー70−ドレイン6を開にしているため
、液面7以上に増加することがない。
First, two scrubbing brushes 1 installed in parallel in the cleaning tank 4 with an appropriate interval are immersed in the cleaning solution.
Cleaning liquid is supplied from the shower supply pipe 2. At this time, the cleaning liquid drain valve 3 is kept closed. When the cleaning tank 4 is filled with the cleaning liquid, an ultrasonic generator 8 attached to the lower surface of the cleaning tank is activated. As is well known, ultrasonic waves have a cleaning effect, and are suitable for cleaning bluffs, especially since they can clean even minute areas. Although the cleaning liquid is continuously supplied, the liquid does not increase above the liquid level 7 because the over 70-drain 6 is kept open.

この方法によって洗浄液より比重の軽い塵埃はオーバー
70−ドレイ/6より流出する。また必要に応じてモー
ター5を回転させればスクラブ用ブラフ1の洗浄効果は
さらに向上する。
By this method, dust having a specific gravity lower than that of the cleaning liquid flows out from the over 70-dray/6. Further, if the motor 5 is rotated as necessary, the cleaning effect of the scrubbing bluff 1 can be further improved.

一定時間経過後シャワー供給パイプ2からの洗浄液の供
給を止め、排水弁3を開にする。これによって洗浄液よ
り重い塵埃は排水弁3よシ排出される。以上の工程を2
〜3回行うことによってスクラブ用プラク1を完全に洗
浄できることになる。
After a certain period of time has elapsed, the supply of cleaning liquid from the shower supply pipe 2 is stopped and the drain valve 3 is opened. As a result, dust that is heavier than the cleaning liquid is discharged through the drain valve 3. The above process 2
The scrubbing plaque 1 can be completely cleaned by performing this procedure ~3 times.

このようにブラシの洗浄が完了後、ホトマスクを2本の
プランの間に送り込み、ブラシを回転させてスクラブ洗
浄を行なうことにより、塵埃付着のない高品質のホトマ
スクが得られる。
After the cleaning of the brushes is completed in this way, the photomask is sent between the two plans, and the brushes are rotated to perform scrub cleaning, thereby obtaining a high-quality photomask free from dust.

また洗浄液としては界面活性剤やアンモニア水溶液など
を使用すると効果があるが、フィルターを通した純水、
有機溶液でも良い。また洗浄液の供給手段としてブラシ
より上位にあるシャワー供給パイプを利用したがプラン
よシ下方に供給口を設けてもよい。
Also, it is effective to use surfactants or aqueous ammonia solutions as a cleaning solution, but pure water passed through a filter,
An organic solution may also be used. Further, although the shower supply pipe located above the brush is used as a means for supplying cleaning liquid, a supply port may be provided below the plan.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の詳細な説明するための正面方向から見
た断面図であり、第2図は側面方向から見た部分断面図
である。 1・・・・・・スクラブ用ブラシ、2・・・・・・シャ
ワー供給パイプ、3・・・・・・排水弁、4・・・・・
・洗浄槽、訃・団・モーfi−16・・・・・・オーバ
ーフロードレイン、7・・・・・・液面、8・・・・・
・超音波発生器。 27 図 6 z 図
FIG. 1 is a sectional view seen from the front direction for explaining the present invention in detail, and FIG. 2 is a partial sectional view seen from the side direction. 1... Scrub brush, 2... Shower supply pipe, 3... Drain valve, 4...
・Cleaning tank, Morfi-16...Overflow drain, 7...Liquid level, 8...
・Ultrasonic generator. 27 Figure 6 z diagram

Claims (1)

【特許請求の範囲】[Claims] 半導体集積回路装置製造用ホトマスクを洗浄するために
スクラブ用ブラシを具備した洗浄装置において、洗浄槽
内に洗浄液をシャワー供給する機構と、洗浄液をオーバ
ーフロー及び底部排水させる機構と、洗浄液に超音波を
発生させる機構とを有し、スクラブ用ブラシを洗浄液に
浸漬させて該ブラシを超音波洗浄せしめる手段、さらに
前記スクラブ用プラク洗浄後ホトマスクを洗浄槽内に搬
送し、前記洗浄液を供給して該ホトマスクをスクラブ洗
浄せしめる手段とを備えたことを特徴とするホトマスク
洗浄装置。
A cleaning device equipped with a scrubbing brush for cleaning photomasks for manufacturing semiconductor integrated circuit devices includes a mechanism for showering cleaning liquid into a cleaning tank, a mechanism for overflowing and draining the cleaning liquid from the bottom, and generating ultrasonic waves in the cleaning liquid. a mechanism for immersing the scrubbing brush in a cleaning solution to perform ultrasonic cleaning on the brush; and a means for transporting the photomask into a cleaning tank after cleaning the scrubbing plaque and supplying the cleaning solution to clean the photomask. 1. A photomask cleaning device comprising: scrub cleaning means.
JP58070498A 1983-04-21 1983-04-21 Device for washing photomask Pending JPS59195649A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58070498A JPS59195649A (en) 1983-04-21 1983-04-21 Device for washing photomask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58070498A JPS59195649A (en) 1983-04-21 1983-04-21 Device for washing photomask

Publications (1)

Publication Number Publication Date
JPS59195649A true JPS59195649A (en) 1984-11-06

Family

ID=13433246

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58070498A Pending JPS59195649A (en) 1983-04-21 1983-04-21 Device for washing photomask

Country Status (1)

Country Link
JP (1) JPS59195649A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61181134A (en) * 1985-02-07 1986-08-13 Hitachi Ltd Cleansing apparatus
JPH0353524A (en) * 1989-07-20 1991-03-07 Tokyo Electron Ltd Cleaning equipment and cleaning method
KR100456760B1 (en) * 2001-04-18 2004-11-10 미쓰비시덴키 가부시키가이샤 Cleaning Process for Photomasks
CN108043812A (en) * 2017-12-25 2018-05-18 芜湖锐进医疗设备有限公司 The drill bit cleaning plant of medical electric drill
JP2021505720A (en) * 2017-12-04 2021-02-18 インテグリス・インコーポレーテッド Compositions and Methods for Reducing Interactions Between Abrasive Particles and Cleaning Brushes

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61181134A (en) * 1985-02-07 1986-08-13 Hitachi Ltd Cleansing apparatus
JPH0353524A (en) * 1989-07-20 1991-03-07 Tokyo Electron Ltd Cleaning equipment and cleaning method
KR100456760B1 (en) * 2001-04-18 2004-11-10 미쓰비시덴키 가부시키가이샤 Cleaning Process for Photomasks
JP2021505720A (en) * 2017-12-04 2021-02-18 インテグリス・インコーポレーテッド Compositions and Methods for Reducing Interactions Between Abrasive Particles and Cleaning Brushes
US11446708B2 (en) 2017-12-04 2022-09-20 Entegris, Inc. Compositions and methods for reducing interaction between abrasive particles and a cleaning brush
CN108043812A (en) * 2017-12-25 2018-05-18 芜湖锐进医疗设备有限公司 The drill bit cleaning plant of medical electric drill

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