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JPS59192938A - Sample box with automatic rotating polarizing plate - Google Patents

Sample box with automatic rotating polarizing plate

Info

Publication number
JPS59192938A
JPS59192938A JP6671383A JP6671383A JPS59192938A JP S59192938 A JPS59192938 A JP S59192938A JP 6671383 A JP6671383 A JP 6671383A JP 6671383 A JP6671383 A JP 6671383A JP S59192938 A JPS59192938 A JP S59192938A
Authority
JP
Japan
Prior art keywords
light
polarized light
polarizing plate
sample
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6671383A
Other languages
Japanese (ja)
Inventor
Takashi Yoshikawa
尚 吉川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP6671383A priority Critical patent/JPS59192938A/en
Publication of JPS59192938A publication Critical patent/JPS59192938A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6445Measuring fluorescence polarisation

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To control an analyzer deflecting plate with high precision and vary a measurement time upon occasion by leading out polarized light parallel to excitation light and polarized light perpendicular to the excitation light under the control of a stepping motor. CONSTITUTION:White light L1 emitted by a nanosecond light source 1 has the quantity of light adjusted by a diaphragm 2, a filter 3 selects only light with wavelength for exciting a sample, and a polarizing plate 4 of a polarizer irradiates a sample solution fixed in a sample cell 5 with only linear polarized light L2. Fluorescent light L3 emitted by the sample is incident to a polarizing plate 9 of an analyzer and rotated at 90 deg. angle intervals by the stepping motor 10, so that a detector 6 measures the polarized light parallel to the linear polarized light of the excitation light and polarized light perpendicular to it as to the intensity at predetermined intervals of time. This stepping motor is driven by following an optional procedure by inputting desired data by a control circuit.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、溶液中の高分子等のナノセカンド程度の微小
な回転運動を調べる為に、けい光の偏光解消を利用した
分析装置の試料箱の新規な改良に悪く、また偏光板の回
転角度の精度カニ落ちる為、データの信頼性が悪がった
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention is directed to a sample box of an analyzer that utilizes fluorescence depolarization to investigate minute rotational movements of nanoseconds such as polymers in a solution. This was bad for new improvements, and the accuracy of the rotation angle of the polarizing plate deteriorated, resulting in poor data reliability.

的としたものでおる。It's targeted.

調節する為の絞バ 3は絞り2を通過しfc元を狩定の
単色光を取り出すためのフィルタ、4はフィルタ3に密
着さnycポーラライザー偏光板、5は石英ガラス等か
らなる試料セルであり、このセル5の中空部5cLには
所望の試料溶液(図示せず〕が収納さn1偏光板4を通
過し几線偏光L2が、照射さnるようになっている。6
は試料から放射さnるけい光L3iフィルタ7、絞り8
を介して受ける、光電子増倍管からなる検出器、9は、
フィルタ7の直前にあるアナライザ偏光板、10はこの
偏光板9を回転軸10αを介して所定量の回転を行なわ
せるためのステップモーターであり、このモーターは図
示さ几ない制御回路にJニー D X駆動さ肚るように
なっている。
Aperture bar for adjustment 3 is a filter for extracting the monochromatic light that passes through the aperture 2 and detects the fc source, 4 is a nyc polarizer polarizing plate that is in close contact with the filter 3, and 5 is a sample cell made of quartz glass or the like. A desired sample solution (not shown) is stored in the hollow portion 5cL of the cell 5, passes through the polarizing plate 4, and is irradiated with brightly polarized light L2.6.
is the fluorescent light emitted from the sample L3i filter 7, aperture 8
A detector, 9, consisting of a photomultiplier tube, receives via
The analyzer polarizing plate 10 located immediately in front of the filter 7 is a step motor for rotating the polarizing plate 9 by a predetermined amount through a rotation axis 10α. It's like being driven by X.

又、アナライザー偏光板9は平面的には、第2図で示す
ように、樹脂材からなる支持具11を介して、回転軸1
0αに接続さ几ている。
In addition, as shown in FIG.
It is connected to 0α.

発明の作用 ナノセカンド光源1から出た白色光L1は、絞り2で光
量ft調節さn1フイルター3により試料を励起させる
波長の光のみ選択さ肚、ポーラライザー偏光板4により
線側光L2のみ試料セル5で、固定さ肚た試料溶液に照
射さ几る。この試料から出たけい光L3は、アナライザ
ー偏光板9に入射すχし、ステップモーター10により
角度90度づつ回転させることにより、励起光の線側光
に平行な偏光と垂直な偏光の各々の強度を予め決めた時
間間隔毎に、検出器6にエリ測定させる。こσ〕ステッ
プモーターの駆動は、図示さしない制御回路で所望のデ
ータを入力することによハ任意の手順で行なわするよう
になっている。
Effect of the Invention The white light L1 emitted from the nanosecond light source 1 is adjusted in light intensity by the aperture 2, and only the light having a wavelength that excites the sample is selected by the N1 filter 3.Only the line-side light L2 is selected by the polarizer polarizing plate 4. In cell 5, the fixed sample solution is irradiated. The fluorescent light L3 emitted from this sample enters the analyzer polarizing plate 9, which is rotated by a step motor 10 by 90 degrees to separate polarized light parallel to and perpendicular to the line side light of the excitation light. The detector 6 measures the intensity at predetermined time intervals. The step motor is driven in an arbitrary manner by inputting desired data to a control circuit (not shown).

発明の効果 本発明は、上記のようにステップモーターを用いて、ア
ナライザー偏光板を回転させる構成にしたので、 (1)各々の回転誤差が積算さnず高い精度でアナライ
ザー偏光板を制御できる。
Effects of the Invention Since the present invention uses a step motor as described above to rotate the analyzer polarizing plate, (1) the analyzer polarizing plate can be controlled with high precision without integrating each rotational error.

(21回転速度及び回転の周期は、)(ルスモーターに
入2する信号パルスの毎秒の個数及び、周波数によって
制御できる為、測定時間を測足者の必要に応じて変更す
ることができる。
(21) The rotation speed and period of rotation can be controlled by the number of signal pulses per second entering the Luss motor and the frequency, so the measurement time can be changed according to the needs of the foot measurer.

(3)コンピューターにより、全自動で制御でき、時間
のかがる実験の効率を上げることが可能となる。
(3) Fully automated control using a computer makes it possible to increase the efficiency of time-consuming experiments.

等の顕著な効果がある。There are significant effects such as

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第2図は本発明に係わる装置の平面図およ
び、アナライザー偏光板のみの平面図である。 第1図の1は紫外線領域から可視光領域までの広い範囲
の光を出すナノセカンド光源、2は絞り、3はフィルタ
ー、4はポーラライザー偏光板、5は試料セル、5αは
試料を入nる中空、6は光電子増倍管からなる検出器、
7は絞り、8はフィルタ、9はアナライザー偏光板、1
0αはステップモータ、10とアナライザー偏光板9を
接続する支持具、10はアナライザー偏光板を回転する
為のステップモータ。             以上
出願人 株式会社第二精工舎 代理人 弁理士最上  務 第1図 第2図
1 and 2 are a plan view of the apparatus according to the present invention and a plan view of only the analyzer polarizing plate. In Figure 1, 1 is a nanosecond light source that emits light in a wide range from the ultraviolet region to the visible light region, 2 is an aperture, 3 is a filter, 4 is a polarizer polarizing plate, 5 is a sample cell, and 5α is a sample cell. 6 is a detector consisting of a photomultiplier tube;
7 is an aperture, 8 is a filter, 9 is an analyzer polarizing plate, 1
0α is a step motor, a support for connecting 10 and the analyzer polarizing plate 9, and 10 is a step motor for rotating the analyzer polarizing plate. Applicant Daini Seikosha Co., Ltd. Agent Patent Attorney Mogami Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] ナノセカンド光源とその光から、線偏光を取り出す、ポ
ーラライザー偏光板とその線偏光で、励起さ几る試料を
保持する石英ガラス試料セルと試料から出さ几るけい光
のうち励起光と平行な偏光と垂直な偏光を取り出すアナ
ライザー偏光板と、その各々の偏光の強度全測定する光
電子増倍管検出器からなる試料箱で、ステップモーター
により制御さn1励起光と平行な偏光と励起光と垂直な
偏光を交互に取り出せるようにしたことを特徴とする、
偏光板自動回転試料箱。
A nanosecond light source extracts linearly polarized light from its light, and a polarizer polarizer and its linearly polarized light extract the fluorescent light parallel to the excitation light from the quartz glass sample cell that holds the excited sample and the sample. This sample box consists of an analyzer polarizing plate that extracts polarized light perpendicular to the polarized light, and a photomultiplier tube detector that measures the total intensity of each polarized light.It is controlled by a step motor to detect polarized light parallel to the n1 excitation light and perpendicular to the excitation light. It is characterized by being able to take out polarized light alternately.
Polarizing plate automatic rotating sample box.
JP6671383A 1983-04-15 1983-04-15 Sample box with automatic rotating polarizing plate Pending JPS59192938A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6671383A JPS59192938A (en) 1983-04-15 1983-04-15 Sample box with automatic rotating polarizing plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6671383A JPS59192938A (en) 1983-04-15 1983-04-15 Sample box with automatic rotating polarizing plate

Publications (1)

Publication Number Publication Date
JPS59192938A true JPS59192938A (en) 1984-11-01

Family

ID=13323826

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6671383A Pending JPS59192938A (en) 1983-04-15 1983-04-15 Sample box with automatic rotating polarizing plate

Country Status (1)

Country Link
JP (1) JPS59192938A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2692353A1 (en) * 1992-06-12 1993-12-17 Zeiss Jena Gmbh Carl Optical measurement head.
WO1998001817A1 (en) * 1996-07-06 1998-01-15 The Secretary Of State For Defence In Her Britannic Majesty's Government Of The United Kingdom Of Great Britain And Northern Ireland A covert mark and security marking system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2692353A1 (en) * 1992-06-12 1993-12-17 Zeiss Jena Gmbh Carl Optical measurement head.
WO1998001817A1 (en) * 1996-07-06 1998-01-15 The Secretary Of State For Defence In Her Britannic Majesty's Government Of The United Kingdom Of Great Britain And Northern Ireland A covert mark and security marking system
GB2329610A (en) * 1996-07-06 1999-03-31 Secr Defence A covert mark and security marking system
GB2329610B (en) * 1996-07-06 2000-11-01 Secr Defence A security marking system and covert mark production

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