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JPS59174549A - Method for joining metal and glass - Google Patents

Method for joining metal and glass

Info

Publication number
JPS59174549A
JPS59174549A JP58045600A JP4560083A JPS59174549A JP S59174549 A JPS59174549 A JP S59174549A JP 58045600 A JP58045600 A JP 58045600A JP 4560083 A JP4560083 A JP 4560083A JP S59174549 A JPS59174549 A JP S59174549A
Authority
JP
Japan
Prior art keywords
glass
amorphous silicon
film
metal
silicon film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58045600A
Other languages
Japanese (ja)
Other versions
JPH0250066B2 (en
Inventor
Fumiya Furuno
古野 二三也
Akihiro Murata
明弘 村田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Hokushin Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hokushin Electric Corp filed Critical Yokogawa Hokushin Electric Corp
Priority to JP58045600A priority Critical patent/JPS59174549A/en
Publication of JPS59174549A publication Critical patent/JPS59174549A/en
Publication of JPH0250066B2 publication Critical patent/JPH0250066B2/ja
Granted legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B37/00Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding

Landscapes

  • Laminated Bodies (AREA)
  • Joining Of Glass To Other Materials (AREA)
  • Measuring Fluid Pressure (AREA)

Abstract

PURPOSE:To join firmly and airtightly metal and glass at a relatively low temp. while maintaining the accuracy in the thickness direction by forming an amorphous silicon film on a metallic material, placing glass on the surface of the film, and carrying out anodic joining. CONSTITUTION:An amorphous silicon film 2 is formed on the surface of a metallic plate 1 of stainless steel, aluminum, copper or the like by glow discharge, CVD or other method so as to provide high adhesive strength. A glass plate 3 is placed on the film 2, and voltage is applied between the plates 1, 3 under pressure to carry out anodic joining. Firm joining can be carried out at a relatively low temp. such as about 400 deg.C, and the thickness of the film 2 can be controlled with about 0.1-1mum accuracy, so the joining can be carried out while maintaining the accuracy in the thickness direction.

Description

【発明の詳細な説明】 a、産業上の利用分野 本発明は、金5とガラスを、厚さ方向の精度を精密に維
持し、比較的低温で1強力且つ気密K1合する方法に門
する。
Detailed Description of the Invention: a. Industrial Application Field The present invention is directed to a method of bonding gold and glass in a strong and airtight manner at a relatively low temperature while precisely maintaining accuracy in the thickness direction. .

b、従来例 金属とガラスを強力且つ気密に接合する方法として、ガ
ラスにコパールガラス或い唸軟質ガ2ス(低蝕点ガラス
)を用い、これ等が溶融し掛った状態で接合する方法が
知られている。
b. Conventional Example A method for strongly and airtightly bonding metal and glass is to use copal glass or soft gas (low corrosion point glass) for the glass, and to bond the glass while it is about to melt. Are known.

この方法は、厚さ寸法精度が余り良くなく、予め決めら
れたIi[に上記のガラスを光楓して接合する場合Ka
良いが、金属板とガラス板の接合後の厚さ寸法を精密に
得ため場合に社使兄な埴。
This method does not have very good thickness dimensional accuracy, and when bonding the above glass to a predetermined Ii [Ka
It's good, but it's useful when you want to precisely measure the thickness of a metal plate and a glass plate after they're joined.

更にこの方法では接合時に、コパールガラスでSOO〜
1100℃、軟質ガラスで400〜600℃の温度を必
要とする為、この温度で大気中で酸化したシ、溶融した
りする金属線使用出来な一欠点があった。
Furthermore, with this method, when bonding, SOO ~
Since it requires a temperature of 1100° C. (400 to 600° C. for soft glass), one drawback is that it cannot be used with metal wires that will oxidize or melt in the air at this temperature.

この他に接合方法として、陽極接合がある。この方法に
よれば厚さ方向の寸法の精度紘極めて高く、接合作業時
の温度も400℃以下と低い。しかし乍も1強力に接合
出来る物質が現在迄に知られて埴る範囲でシリコンとガ
ラスに限られ、これ以外の物lR%例えは金属とガラス
祉接合強度が弱い欠点があった。
Other bonding methods include anodic bonding. According to this method, the accuracy of the dimension in the thickness direction is extremely high, and the temperature during the bonding operation is as low as 400° C. or less. However, the materials that can be strongly bonded to date are limited to silicon and glass, and other materials, such as metals and glass, have the disadvantage of weak bonding strength.

C0発明の目的 本発明で解決しようとする技術的課題は、金属とガラス
を、厚さ方向の精度を精密に維持し、比較的低温で、強
力且つ気密に接合することである。
C0 Object of the Invention The technical problem to be solved by the present invention is to bond metal and glass strongly and airtightly at a relatively low temperature while maintaining precision in the thickness direction.

d0発明の構成 従来、ステンレス、アルミ二りム、銅等の金属板表面忙
アモルファスシリコン膜を形成する技術が知られている
が、この技f[cよればアモルファスシリコンHを強度
に金属板に密着できる。この点に着目し1本発明では、
この技術を用いて金円表面にアモルファスシリコン膜を
形成し、この膜を介し上記陽riS接合技術を用いてガ
ラスを接合するようKしたことにおる。
d0 Structure of the Invention Conventionally, a technique for forming an amorphous silicon film on the surface of a metal plate made of stainless steel, aluminum, copper, etc. has been known. You can get close to it. Focusing on this point, in the present invention,
Using this technique, an amorphous silicon film was formed on the surface of the gold circle, and glass was bonded through this film using the positive RiS bonding technique described above.

着 θ、実施例 以下図面に従い本発明を説明する。第1図社金属板10
表面にアモルファスシリコン膜2を形成する工程を示す
。金属板IKは、ステンレス、アルミニウム、銅等多く
の全周が利用出来る。アモルファスシリコン膜2はグロ
ー放電、OVD法等により金属板1表面に大なる密着強
度で形成される。このときの温r!c#1150〜30
0’Cと比較的低温である。
EXAMPLES The present invention will be described below with reference to the drawings. Figure 1: Company metal plate 10
The process of forming an amorphous silicon film 2 on the surface is shown. Metal plate IK can be used in many circumferences such as stainless steel, aluminum, and copper. The amorphous silicon film 2 is formed with high adhesive strength on the surface of the metal plate 1 by glow discharge, OVD method, or the like. The temperature at this time! c#1150-30
The temperature is relatively low at 0'C.

#¥2図は、金j板1にその表面に形成されたアモルフ
ァスシリコン膜2を介しガラス3を接合する工程を示す
。金属板1表面のアモルファスシリコン膜2上にガラス
板3を載せ、接合圧力を加えた状態・で、金j板1とガ
ラス板3との間に電圧を印加して陽極接合を行う。この
ときの作業温度社400℃と比較的低温で強力な接合が
行える。
Figure #2 shows the process of bonding glass 3 to a gold j-plate 1 via an amorphous silicon film 2 formed on its surface. A glass plate 3 is placed on the amorphous silicon film 2 on the surface of the metal plate 1, and with bonding pressure applied, a voltage is applied between the gold plate 1 and the glass plate 3 to perform anodic bonding. Strong bonding can be achieved at a relatively low working temperature of 400°C.

上記第1図に示す工程では、アモルファスシリコン膜2
の厚さを0.1〜1μmの精度で制御出来。
In the step shown in FIG. 1 above, the amorphous silicon film 2
The thickness can be controlled with an accuracy of 0.1 to 1 μm.

また、第2図に示す工程で杜、接着物がアモルファスシ
リコン膜2とガラス板3との間に介在せず、接合による
金属板11ガラス板3等の厚さ変化も無視出来る程小さ
い。
Further, in the process shown in FIG. 2, no adhesive is present between the amorphous silicon film 2 and the glass plate 3, and changes in the thickness of the metal plate 11, glass plate 3, etc. due to bonding are negligibly small.

従って、接合後の全体の厚さは接合前の材料の厚さで決
められ、アモルファスシリコン[2が形成された金属板
1と、ガラス板3との厚さ方向の精度を精密に維持して
接合することが出来る。更に、比較的低温度で且つ強力
な接合が出来る。
Therefore, the overall thickness after bonding is determined by the thickness of the materials before bonding, and the accuracy in the thickness direction of the metal plate 1 on which amorphous silicon [2 is formed and the glass plate 3 is maintained precisely. Can be joined. Furthermore, strong bonding can be achieved at relatively low temperatures.

第3図は金属板1を2枚のガラス板3.3′で挾んで接
合した場合を示す。金属板1の上面、下面に夫々アモル
ファスシリコン膜z、2’を形成した後、先の場合と同
様2枚のガラス板3,3′を陽極接合に−よって接合す
る。
FIG. 3 shows a case in which a metal plate 1 is sandwiched between two glass plates 3 and 3' and joined together. After forming amorphous silicon films z and 2' on the upper and lower surfaces of the metal plate 1, respectively, the two glass plates 3 and 3' are bonded together by anodic bonding as in the previous case.

第4図はガラス板3を2枚の金属板1.1′で挾んで接
合した場合を示す。金属板1の上面と、金属板1′の下
面にアモルファスシリコンp1.2゜2′を形成し、夫
々のアモルファス膜面が向い合うよう金属板1,11で
ガラス板3を挾んで陽極接合する。
FIG. 4 shows a case where a glass plate 3 is sandwiched between two metal plates 1.1' and joined together. Amorphous silicon p1.2°2' is formed on the upper surface of the metal plate 1 and the lower surface of the metal plate 1', and anodic bonding is performed by sandwiching the glass plate 3 between the metal plates 1 and 11 so that the respective amorphous film surfaces face each other. .

Wc5図及び第6図は圧力栓用素子に本発明方法を応用
した実施例でちる。t45図において、4はエツチング
等で断面梯形状の空室が形成された金属ブロックで、薄
肉部分4aが圧力を受けるダイアフラム部分となる。ア
モルファスシリコン膜2は金属プ四ツク4下側の厚肉部
周面に形成され、この部分において、圧力導孔5aが設
けられたガラスブロック5と陽極接合される。肉、アモ
ルファスシ+7 jン膜2は、金属ブロック4に:、I
Cッチングが施される前に形成しても良い。
Figures Wc5 and 6 show examples in which the method of the present invention is applied to elements for pressure plugs. In Figure t45, numeral 4 is a metal block in which a cavity with a ladder-shaped cross section is formed by etching or the like, and the thin wall portion 4a serves as a diaphragm portion that receives pressure. The amorphous silicon film 2 is formed on the peripheral surface of the thick part on the lower side of the metal block 4, and is anodically bonded to the glass block 5 provided with the pressure guide hole 5a in this part. Meat, amorphous film +7 film 2 to metal block 4:, I
It may be formed before C-etching.

第6図は第5図に示す圧カ検出素子罠金属管を接合した
ものを示す。6は圧力導入孔6aが設けられた金属管で
、ガラスブロック5飼の端面にアモルファスシリコン膜
2′が形成され、陽極接合によりガラスブロック5下面
Km合される。
FIG. 6 shows a structure in which the pressure detection element trap metal tube shown in FIG. 5 is joined. Reference numeral 6 denotes a metal tube provided with a pressure introduction hole 6a, an amorphous silicon film 2' is formed on the end face of the glass block 5, and the lower surface Km of the glass block 5 is joined by anodic bonding.

本実、雄側の場合、金1表面に形成されたアモルファス
シリコン膜z、2/を介しガラスブロック5と金属ブロ
ック4或は金属管6を強力且つ気密に接合でき、また、
比較的低温で接合できる為金属同志の溶接の場合に比較
してダイヤスラム4aに与える残留応力を小さくするこ
とが出来る。
In fact, in the case of the male side, the glass block 5 and the metal block 4 or metal tube 6 can be strongly and airtightly joined through the amorphous silicon film z, 2/ formed on the surface of the gold 1, and
Since the welding can be performed at a relatively low temperature, the residual stress applied to the diamond slam 4a can be reduced compared to the case of welding metals together.

5、発明の効果 本発明によれば、金属とガラスを、接合の厚さ方向精度
を精密に維持し、比較的低温で1強力且つ気密に接合で
きる。
5. Effects of the Invention According to the present invention, metal and glass can be joined strongly and airtightly at a relatively low temperature while maintaining precision in the thickness direction of joining.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明において、金属板表面にアモルファスシ
リコン膜を形成する工程を示す斜視図、第2図は第1図
に示す工程において金属板表面に形成されたアモルファ
スシリコンg[上にガラスである。 1・・・金M板、2,2/・・・アモルファスシリコン
膜、3・・・ガラス板、4・−・金属ブロック。 5・・・ガラスブロック、6・・・金R1特許出願人 
   株式金社北辰電t%4判作所代表者  清 水 
正 傅 第S図 第6 図
FIG. 1 is a perspective view showing the process of forming an amorphous silicon film on the surface of a metal plate in the present invention, and FIG. be. DESCRIPTION OF SYMBOLS 1... Gold M plate, 2,2/... Amorphous silicon film, 3... Glass plate, 4... Metal block. 5...Glass block, 6...Gold R1 patent applicant
Kinsha Hokushin Den Co., Ltd. T%4 Bansakusho Representative Shimizu
Seifu Figure S Figure 6

Claims (1)

【特許請求の範囲】 金属材料にアモルファスシリコン膜を形成し。 このアモルファスシリコン膜面にガラスをWk極接合忙
よ抄接合したことを特徴とする金属とガラスの接合方法
[Claims] An amorphous silicon film is formed on a metal material. A method for joining metal and glass, characterized in that glass is joined to the surface of this amorphous silicon film using a Wk electrode bonding process.
JP58045600A 1983-03-18 1983-03-18 Method for joining metal and glass Granted JPS59174549A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58045600A JPS59174549A (en) 1983-03-18 1983-03-18 Method for joining metal and glass

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58045600A JPS59174549A (en) 1983-03-18 1983-03-18 Method for joining metal and glass

Publications (2)

Publication Number Publication Date
JPS59174549A true JPS59174549A (en) 1984-10-03
JPH0250066B2 JPH0250066B2 (en) 1990-11-01

Family

ID=12723841

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58045600A Granted JPS59174549A (en) 1983-03-18 1983-03-18 Method for joining metal and glass

Country Status (1)

Country Link
JP (1) JPS59174549A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5141148A (en) * 1990-07-20 1992-08-25 Mitsubishi Denki Kabushiki Kaisha Method of anodic bonding a semiconductor wafer to an insulator
WO2003097552A1 (en) * 2002-04-30 2003-11-27 Agency For Science Technology And Research A method of wafer/substrate bonding
JP2006248895A (en) * 2003-12-02 2006-09-21 Bondtech Inc JOINING METHOD, DEVICE PRODUCED BY THIS METHOD, AND JOINING DEVICE
US7927975B2 (en) 2009-02-04 2011-04-19 Micron Technology, Inc. Semiconductor material manufacture
CN110246769A (en) * 2019-05-10 2019-09-17 太原理工大学 Based on cationic electroconductive metal and glass surface original position metallization eutectic bonding method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5141148A (en) * 1990-07-20 1992-08-25 Mitsubishi Denki Kabushiki Kaisha Method of anodic bonding a semiconductor wafer to an insulator
WO2003097552A1 (en) * 2002-04-30 2003-11-27 Agency For Science Technology And Research A method of wafer/substrate bonding
US7192841B2 (en) 2002-04-30 2007-03-20 Agency For Science, Technology And Research Method of wafer/substrate bonding
JP2006248895A (en) * 2003-12-02 2006-09-21 Bondtech Inc JOINING METHOD, DEVICE PRODUCED BY THIS METHOD, AND JOINING DEVICE
US7927975B2 (en) 2009-02-04 2011-04-19 Micron Technology, Inc. Semiconductor material manufacture
US8389385B2 (en) 2009-02-04 2013-03-05 Micron Technology, Inc. Semiconductor material manufacture
CN110246769A (en) * 2019-05-10 2019-09-17 太原理工大学 Based on cationic electroconductive metal and glass surface original position metallization eutectic bonding method

Also Published As

Publication number Publication date
JPH0250066B2 (en) 1990-11-01

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