JPS59152470U - voltage measuring device - Google Patents
voltage measuring deviceInfo
- Publication number
- JPS59152470U JPS59152470U JP4780083U JP4780083U JPS59152470U JP S59152470 U JPS59152470 U JP S59152470U JP 4780083 U JP4780083 U JP 4780083U JP 4780083 U JP4780083 U JP 4780083U JP S59152470 U JPS59152470 U JP S59152470U
- Authority
- JP
- Japan
- Prior art keywords
- voltage measuring
- measuring device
- voltage
- signal
- converted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Arrangements For Transmission Of Measured Signals (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の光ファイバを用いた電圧測定装置のブロ
ックダイヤグラム、第２図は本考案の電圧測定装置の一
実施例のブロックダイアグラムである。第３図は本考案
の電圧測定装置の各部信号の波形図である。
１．２：電圧測定端子、３：測定部、４：表示部、５：
電圧計、■ＦＣ：電圧−周波数変換回路（Ｖ−Ｆコンバ
ータ）、ＥＯ：電気−光信号変換器（Ｅ−０変協器）、
ＯＦ＝光ファイバ、ＯＥ：光−電気信号変換器（０−Ｅ
変換器） 、ＦＶＣ：周波数−電圧変換回路（Ｆ−Ｖコ
ンバータ） 、ＡＤＣ：アナログ−デジタル変換器（Ａ
−Ｄコンバータ）、ＤＳＰ＝数字表示器、 、Ｃ０ＮＴ
、カウンタ、ＧＰＧ：ゲートパルス発生回路、Ｍ：メモ
リー、ＣＮＴＲ：制御回路。FIG. 1 is a block diagram of a conventional voltage measuring device using an optical fiber, and FIG. 2 is a block diagram of an embodiment of the voltage measuring device of the present invention. FIG. 3 is a waveform diagram of signals of various parts of the voltage measuring device of the present invention. 1.2: Voltage measurement terminal, 3: Measurement section, 4: Display section, 5:
Voltmeter, ■FC: Voltage-frequency conversion circuit (V-F converter), EO: Electrical-optical signal converter (E-0 converter),
OF=optical fiber, OE: optical-electrical signal converter (0-E
converter), FVC: frequency-voltage conversion circuit (F-V converter), ADC: analog-digital converter (A
-D converter), DSP=numeric display, , C0NT
, counter, GPG: gate pulse generation circuit, M: memory, CNTR: control circuit.
Claims (1)
で変換した電気周波数信号をさらに光パルス信号に変換
して光ファイバを介して光−電気信号変換器に伝送し、
再び電気周波数信号にした信号を、一定時間計数して、
その計数値を表示あるいはコード化し、被測定電圧と計
数値を校正することを特徴とする電圧測定装置。A voltage-frequency conversion circuit is provided in the voltage measuring section, and the electrical frequency signal converted by the conversion circuit is further converted into an optical pulse signal and transmitted to an optical-electrical signal converter via an optical fiber,
The signal, which has been converted into an electrical frequency signal again, is counted for a certain period of time,
A voltage measuring device characterized by displaying or encoding the counted value and calibrating the measured voltage and the counted value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4780083U JPS59152470U (en) | 1983-03-30 | 1983-03-30 | voltage measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4780083U JPS59152470U (en) | 1983-03-30 | 1983-03-30 | voltage measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59152470U true JPS59152470U (en) | 1984-10-12 |
Family
ID=30178346
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4780083U Pending JPS59152470U (en) | 1983-03-30 | 1983-03-30 | voltage measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59152470U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007049476A1 (en) * | 2005-10-27 | 2007-05-03 | Advantest Corporation | Testing apparatus and testing method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5529B2 (en) * | 1973-10-29 | 1980-01-05 |
-
1983
- 1983-03-30 JP JP4780083U patent/JPS59152470U/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5529B2 (en) * | 1973-10-29 | 1980-01-05 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007049476A1 (en) * | 2005-10-27 | 2007-05-03 | Advantest Corporation | Testing apparatus and testing method |
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