JPS59125667A - Diode - Google Patents
DiodeInfo
- Publication number
- JPS59125667A JPS59125667A JP58000895A JP89583A JPS59125667A JP S59125667 A JPS59125667 A JP S59125667A JP 58000895 A JP58000895 A JP 58000895A JP 89583 A JP89583 A JP 89583A JP S59125667 A JPS59125667 A JP S59125667A
- Authority
- JP
- Japan
- Prior art keywords
- diode
- substrate
- pellet
- electrode
- metal layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims description 19
- 239000002184 metal Substances 0.000 claims description 15
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000004065 semiconductor Substances 0.000 claims description 2
- 239000008188 pellet Substances 0.000 description 14
- 238000004519 manufacturing process Methods 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 238000003486 chemical etching Methods 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 239000010931 gold Substances 0.000 description 5
- 230000010355 oscillation Effects 0.000 description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 229910018885 Pt—Au Inorganic materials 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000002500 effect on skin Effects 0.000 description 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
Landscapes
- Electrodes Of Semiconductors (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
本発明は高周波帯1例えばミl)波帯で動作させるダイ
オードのベレット構造に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a pellet structure of a diode that operates in a high frequency band (for example, a milliwave band).
従来より、例えばインバットダイオードは高周波ダイオ
ードとして使われCいる。この場合、発振特性及び信頼
度を上げるために熱抵抗を低くする必要がある。そのた
めP−N接合部がヒートシンク側にくる、いわゆるアッ
プサイドダウン構造で組立゛Cられている。したがって
、ペレット構造も組立てやすい様に、第1図に示す如く
円板状のN++シリコン基板1.N−動作層2及びP+
+コンタクト層3から成るシリコンチップの両端に′1
゛1−Pt−Auの多層構造から成る電極用金属層4゜
4′を有し、メサ構造となっている。Conventionally, for example, an invat diode has been used as a high frequency diode. In this case, it is necessary to lower thermal resistance in order to improve oscillation characteristics and reliability. Therefore, they are assembled in a so-called upside-down structure in which the P-N junction is on the heat sink side. Therefore, in order to easily assemble the pellet structure, as shown in FIG. 1, a disk-shaped N++ silicon substrate 1. N- operating layer 2 and P+
+ '1 on both ends of the silicon chip consisting of contact layer 3
It has an electrode metal layer 4.4' having a multilayer structure of 1-Pt-Au, and has a mesa structure.
第2図(a)〜(C)はこのベレットの製造法を示す各
断面図で、壕ずN++シリコン基板l上にN−動作層2
.P″コンタクト層3順次形成されたエピタキシャルウ
ェハーを基板側から約50μmの厚さまで削り、その両
側]にTi−Pt−A、uの多層構造から成る円形電極
4,4′を相対し〔形成する(第2図(a))。次に、
P−N接合側の電極4をマスクにして化学的食刻法によ
りメサ部を形成しく第2図(b) ) 、最後に基板側
の電極4′をマスクにして化学的食刻法によす逓・板を
切貼すれば、図示形状のペレットが形成される(第2図
(C))。FIGS. 2(a) to (C) are cross-sectional views showing the manufacturing method of this pellet.
.. The epitaxial wafer on which the P'' contact layer 3 was sequentially formed was ground down to a thickness of about 50 μm from the substrate side, and circular electrodes 4 and 4' made of a multilayer structure of Ti-Pt-A and U were formed on both sides of the epitaxial wafer. (Figure 2(a)). Next,
A mesa portion is formed by chemical etching using the electrode 4 on the P-N junction side as a mask (Fig. 2(b)), and finally, using the electrode 4' on the substrate side as a mask, a mesa portion is formed by chemical etching. By cutting and pasting the strips and plates, pellets of the shape shown are formed (FIG. 2(C)).
第3図はインバットダイオードの一般的な組立図である
。110はインパットダ・fオードペレ。FIG. 3 is a general assembly diagram of an invat diode. 110 is impat da f eau de peret.
トでダイオードケースのペデスタル120上にアップサ
イドダウン方式で熱圧着されていて、更に電極用金テー
プ130がペレット構造に熱圧着されている。同図から
判る様にインバットダイオードの動作時に於ける高周波
電流は、ベレットを縦方向に流れるが、周波数がミリ波
帯になると表皮効果により電流がベレットの衣面を流れ
る禄になり、シリコン基板の有する抵抗が無視出来なく
なり、筒周波発振出力特性に多大な悪影響を及ばずこと
になる。また、シリコン基板の厚さは50μmが限度で
あり、これより薄くするとベレット製造中にウェハー割
れが生じ歩留が著しく低下するという欠点があった。The electrode tape 130 is thermocompression bonded on the pedestal 120 of the diode case in an upside-down manner, and furthermore, the electrode gold tape 130 is thermocompression bonded to the pellet structure. As can be seen from the figure, when the invat diode operates, high-frequency current flows vertically through the pellet, but when the frequency reaches the millimeter wave band, the current flows through the pellet surface due to the skin effect, and the silicon substrate The resistance of the cylindrical frequency oscillation can no longer be ignored, and the cylindrical frequency oscillation output characteristics are not significantly affected. Further, the thickness of the silicon substrate is limited to 50 μm, and if it is made thinner than this, there is a drawback that wafer cracking occurs during pellet production, resulting in a significant decrease in yield.
本発明は高周波帯で動作させるダイオードのベレット製
造歩留りを低下させることなく、高周波動作特性の優れ
たものを提供することを目的としている。An object of the present invention is to provide a diode operating in a high frequency band with excellent high frequency operating characteristics without reducing the pellet manufacturing yield.
本発明のダイオードは動作層及びコンタクト層が順次形
成烙れた半導体基板に対して、この基板側に設けられる
電極用金属層が基板底面からその龜
側面に延在するように形成したことを特徴とする。The diode of the present invention is characterized in that the electrode metal layer provided on the semiconductor substrate on which the active layer and the contact layer are sequentially formed extends from the bottom surface of the substrate to the side surface of the substrate. shall be.
基板側面への金属層の形成は基板切断前に基板側から化
学的穴開が施された際に生じた基板面に金属層を形成ず
れはよい。もちろんこの金属層は前記基板底面の金属層
と電気的に接続する方がよい。Formation of the metal layer on the side surface of the substrate is free from misalignment of the metal layer on the substrate surface that occurs when chemical holes are formed from the substrate side before cutting the substrate. Of course, it is preferable that this metal layer be electrically connected to the metal layer on the bottom surface of the substrate.
次に、本発明の一実施例を図面を用いで説明する。Next, one embodiment of the present invention will be described with reference to the drawings.
第4図(a)〜(d)は本発明をインバットダイオード
に適用してそのベレットの製造工程を順に示した断面図
である。厚さ300μm程度のN4+/IJコン基板1
1上にN−動作層12及びP++コンタクト層13が順
次形成されたシリコンエビタキンヤルウエハーを、機械
的食刻あるいは化学的食刻により50μm程の厚さまで
削り、コンタクト層側に’I” i −P t−Auの
多R4構造から成る円形電極14を、基板側に位置出し
用の金pA電極15を形成する(第4図(a))。次に
フォトレジスト16を金属電極15の上に形成し、化学
的食刻にj17基板側にメサ構造を形成する(第4図(
b))。更に、フォトレジスト16及び位置出し用電極
を剥離した後、基板側全面にT i −P t −A−
uの多層構造から成る電極用金属層17を何者する(第
4図(C))。その後電極用金属層17の谷の部分を機
械的あるいは化学的食刻により切断した後、コンタクト
層側より電Mj!、14をマスクにして化学的食刻によ
りメサ形成並びにス(板切断を施せば目標のチップが得
られる(第4図(d))。FIGS. 4(a) to 4(d) are cross-sectional views sequentially showing the manufacturing process of a pellet by applying the present invention to an invat diode. N4+/IJ contact board 1 with a thickness of about 300μm
A silicon Evita core wafer on which an N- active layer 12 and a P++ contact layer 13 are sequentially formed is ground to a thickness of about 50 μm by mechanical or chemical etching, and an 'I' i is formed on the contact layer side. A gold pA electrode 15 for positioning the circular electrode 14 made of -Pt-Au multi-R4 structure is formed on the substrate side (FIG. 4(a)). Next, a photoresist 16 is placed on the metal electrode 15. A mesa structure is formed on the j17 substrate side by chemical etching (see Fig. 4).
b)). Furthermore, after peeling off the photoresist 16 and the positioning electrode, Ti-Pt-A- is applied to the entire surface of the substrate side.
What is the electrode metal layer 17 having a multilayer structure of u (FIG. 4(C))? After that, the valley portion of the electrode metal layer 17 is cut by mechanical or chemical etching, and then electrical Mj! is applied from the contact layer side. , 14 are used as a mask to form a mesa by chemical etching and cut the target chip (FIG. 4(d)).
本発明によればインパy)ダイオードが動作中、チップ
を流れる高周波電流が表皮効果により、チップの側面を
流れても、その通路には金属層が施されている為、従来
のチップより直列抵抗が減少し、発振出力特性が優れた
ものになる。更に、チップの製造面から見ても、従来は
ミ’J波帯で使用されるインバットダイオードは、特性
劣化を防止するためウエノ・−厚を15μm程匿に湖、
ぐする必要があり、このためウェハー加工中にウエノ・
−割れが生じ歩留が著しく低下していたが、本発明によ
ればそのように基板を薄くしなくても、厚いままで加工
できる為、歩留低下を効果的に防止できるという利点が
ある。尚、本発明の説明に当っ゛C1直列抵抗防止用の
金属をTi−Pt−Auの多層膜に例を享げたが、電気
抵抗の小さな金属膜ならその種類を問わないことは言う
までもない。According to the present invention, when the diode is in operation, even if the high-frequency current flowing through the chip flows along the side of the chip due to the skin effect, the passage has a metal layer, so the series resistance is higher than that of conventional chips. decreases, resulting in excellent oscillation output characteristics. Furthermore, from the perspective of chip manufacturing, in-bat diodes conventionally used in the MI'J wave band have a thickness of about 15 μm to prevent characteristic deterioration.
Therefore, during wafer processing, wafer
- Cracks occur and the yield drops significantly, but according to the present invention, the substrate can be processed as it is thick without having to be made thinner, which has the advantage of effectively preventing the drop in yield. . Incidentally, in explaining the present invention, a multilayer film of Ti--Pt--Au was used as the metal for preventing C1 series resistance, but it goes without saying that any type of metal film with low electrical resistance may be used.
第1図は従来のベレットの断面図、第2図(a)〜(C
)は従来のベレットの製造法を示す各断面図、第3図は
インバットダイオードの組立図、第4図(a)〜(d)
は本発明の一実施例のペレット製造法に基つく各工程断
面図である。
1.11・・・・・・シリコン基板、2.12・・・・
・・動作層、3,13゛°゛コンタクト層、4.4’、
14゜17−− T i −P t−Au多層金属膜、
15 ゛位置出し用金属膜、16−==゛フォトレジ
スト、 110・パパ°インバットダイオードベレット
、120・・・・・・ケースのペデスタル、130°旧
″電極用金テープ〇第 / 霞
第、3 国Figure 1 is a cross-sectional view of a conventional pellet, Figures 2 (a) to (C)
) are cross-sectional views showing the conventional method of manufacturing a pellet, Figure 3 is an assembly diagram of an invat diode, and Figures 4 (a) to (d).
1A and 1B are cross-sectional views of each process based on a pellet manufacturing method according to an embodiment of the present invention. 1.11...Silicon substrate, 2.12...
...Active layer, 3,13゛°゛Contact layer, 4.4',
14゜17--T i -P t-Au multilayer metal film,
15゛Positioning metal film, 16-==゛Photoresist, 110.Paper °In-butt diode pellet, 120... Case pedestal, 130゛Old'' gold tape for electrode No. 0/Kasumi No. 3 countries
Claims (1)
底面および側面に連続して電極用金属層を設けたことを
特徴とするダイオード。A diode characterized in that an electrode metal layer is continuously provided on the bottom and side surfaces of a semiconductor substrate on which an active layer and a contact layer are sequentially formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58000895A JPS59125667A (en) | 1983-01-07 | 1983-01-07 | Diode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58000895A JPS59125667A (en) | 1983-01-07 | 1983-01-07 | Diode |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59125667A true JPS59125667A (en) | 1984-07-20 |
Family
ID=11486413
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58000895A Pending JPS59125667A (en) | 1983-01-07 | 1983-01-07 | Diode |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59125667A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1609879A1 (en) * | 2004-06-21 | 2005-12-28 | Seiko Epson Corporation | Method for producing a mask |
-
1983
- 1983-01-07 JP JP58000895A patent/JPS59125667A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1609879A1 (en) * | 2004-06-21 | 2005-12-28 | Seiko Epson Corporation | Method for producing a mask |
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