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JPS5896202U - 歪みゲ−ジの温度補償回路 - Google Patents

歪みゲ−ジの温度補償回路

Info

Publication number
JPS5896202U
JPS5896202U JP1981194440U JP19444081U JPS5896202U JP S5896202 U JPS5896202 U JP S5896202U JP 1981194440 U JP1981194440 U JP 1981194440U JP 19444081 U JP19444081 U JP 19444081U JP S5896202 U JPS5896202 U JP S5896202U
Authority
JP
Japan
Prior art keywords
strain gauge
output
compensation circuit
temperature compensation
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1981194440U
Other languages
English (en)
Inventor
金沢　実雄
Original Assignee
株式会社石田衡器製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社石田衡器製作所 filed Critical 株式会社石田衡器製作所
Priority to JP1981194440U priority Critical patent/JPS5896202U/ja
Priority to IL8267346A priority patent/IL67346A/xx
Priority to US06/448,205 priority patent/US4510813A/en
Priority to AU91445/82A priority patent/AU542140B2/en
Priority to EP82306767A priority patent/EP0082698B1/en
Priority to DE8282306767T priority patent/DE3279738D1/de
Publication of JPS5896202U publication Critical patent/JPS5896202U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268—Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281—Arrangements for correcting or for compensating unwanted effects for temperature variations

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Measurement Of Force In General (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【図面の簡単な説明】
第１図は従来の一般的な温度補償回路を示す図である。 第２図乃至第５図は本考案の前提となる先願考案を説明
する図であって、第２図はその温度補償回路図、第３図
はそのブリッジ回路の出力電圧温度特性図、第４図はそ
の補償用の各抵抗の抵抗温度特性図、第５図はそのブリ
ッジ回路に印加される正味の印加電圧の温度特性図であ
る。第６図乃至第９図は本考案−実施例を説明する図で
あって、第６図はその温度補償回路図、第７図はそのブ
リッジ回路の出力電圧温度特性図、第８図はその補償抵
抗の抵抗温度特性図、第９図はそのブリッジ回路に印加
される正味の印加電圧の温度１．特性図である。

Claims (1)

    【実用新案登録請求の範囲】
  1. 被測定物に固定され、定電圧を供給することにより歪み
    に応じた出力を取出すようにした歪みゲージにおいて、
    歪みゲージのブリッジ回路自体の出力電圧温度特性と同
    様な抵抗温度特性を有する様に純粋な単一金属よりなる
    抵抗体を二種以上組合せた補償抵抗を、歪みゲージのブ
    リッジ回路の電圧仇梧側又は出力取出し側の所定位置に
    、連結又は分散した状態で、挿入・接続することにより
    、温度変化によって起きる歪みゲージ出力の変化を補償
    するようにしたことを特徴とする歪みゲージの温度補償
    回路。
JP1981194440U 1981-12-23 1981-12-23 歪みゲ−ジの温度補償回路 Pending JPS5896202U (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP1981194440U JPS5896202U (ja) 1981-12-23 1981-12-23 歪みゲ−ジの温度補償回路
IL8267346A IL67346A (en) 1981-12-23 1982-11-26 Temperature compensation circuit for strain gauges
US06/448,205 US4510813A (en) 1981-12-23 1982-12-09 Temperature compensation circuit for strain gauges
AU91445/82A AU542140B2 (en) 1981-12-23 1982-12-13 Temperature compensated strain gauge
EP82306767A EP0082698B1 (en) 1981-12-23 1982-12-17 Temperature compensation circuit for strain gauges
DE8282306767T DE3279738D1 (en) 1981-12-23 1982-12-17 Temperature compensation circuit for strain gauges

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981194440U JPS5896202U (ja) 1981-12-23 1981-12-23 歪みゲ−ジの温度補償回路

Publications (1)

Publication Number Publication Date
JPS5896202U true JPS5896202U (ja) 1983-06-30

Family

ID=16324621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981194440U Pending JPS5896202U (ja) 1981-12-23 1981-12-23 歪みゲ−ジの温度補償回路

Country Status (6)

Country Link
US (1) US4510813A (ja)
EP (1) EP0082698B1 (ja)
JP (1) JPS5896202U (ja)
AU (1) AU542140B2 (ja)
DE (1) DE3279738D1 (ja)
IL (1) IL67346A (ja)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3427743A1 (de) * 1984-07-27 1986-02-06 Keller AG für Druckmeßtechnik, Winterthur Verfahren zur temperaturkompensation und messschaltung hierfuer
US4672853A (en) * 1984-10-30 1987-06-16 Burr-Brown Corporation Apparatus and method for a pressure-sensitive device
JPH0797010B2 (ja) * 1986-03-26 1995-10-18 株式会社日立製作所 半導体歪ゲ−ジブリツジ回路
JPS62226029A (ja) * 1986-03-28 1987-10-05 Tokyo Electric Co Ltd ロ−ドセルの温度補正方法
US4798093A (en) * 1986-06-06 1989-01-17 Motorola, Inc. Apparatus for sensor compensation
US5253532A (en) * 1992-03-09 1993-10-19 Timex Corporation Temperature compensated pressure transducer with digital output for low voltage power supply
FR2728689A1 (fr) * 1994-12-23 1996-06-28 Sgs Thomson Microelectronics Circuit d'etalonnage de resistances
US6700473B2 (en) * 2000-02-14 2004-03-02 Kulite Semiconductor Products, Inc. Pressure transducer employing on-chip resistor compensation
US6725165B1 (en) 2000-08-10 2004-04-20 Autoliv Asp, Inc. Weight measurement system, method and weight sensor
GB2370122B (en) * 2000-12-16 2005-04-27 Senstronics Ltd Temperature compensated strain gauge
AU2003232216A1 (en) * 2002-06-24 2004-01-06 Papst-Motoren Gmbh And Co. Kg Temperature compensation of a sensor arrangement (gmr) with double-sided potential changes
CN102226682A (zh) * 2011-03-29 2011-10-26 中国科学院电工研究所 一种用于聚变超导磁体的应变测量装置
RU2569925C1 (ru) * 2014-08-22 2015-12-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Ульяновский государственный технический университет" Косвенный способ настройки тензорезисторных датчиков с мостовой измерительной цепью по мультипликативной температурной погрешности с учетом нелинейности температурной характеристики выходного сигнала датчика
JP6511336B2 (ja) * 2015-06-02 2019-05-15 エイブリック株式会社 温度補償回路およびセンサ装置
US20170284846A1 (en) * 2016-04-01 2017-10-05 Honeywell International Inc. Low cost heating regulation circuit for self-heating flow mems
EP3771895B1 (en) * 2019-07-31 2023-11-01 ABB Schweiz AG Temperature compensated strain gauge measurements

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2120335A (en) * 1936-04-20 1938-06-14 Weston Electrical Instr Corp Resistance element
US2470051A (en) * 1947-06-14 1949-05-10 Baldwin Locomotive Works Electrical impedance filament and the method of making same
FR1120738A (fr) * 1955-01-31 1956-07-11 Charles Testut Ets Dynamomètres à jauges à fils résistants de haute précision
US3111620A (en) * 1962-04-23 1963-11-19 Statham Instrument Inc Bridge compensation circuits
DE1231031B (de) * 1964-05-12 1966-12-22 Hottinger Messtechnik Baldwin Kraftmessvorrichtung
US3178938A (en) * 1964-06-12 1965-04-20 Baldwin Lima Hamilton Corp Temperature compensation for condition response of a condition-responsive network
GB1175076A (en) * 1967-04-14 1969-12-23 Revere Corp America Improved Apparatus for Measuring Force
US3575053A (en) * 1968-07-11 1971-04-13 Mc Donnell Douglas Corp Cryogenic linear temperature sensor
US4174639A (en) * 1978-04-06 1979-11-20 American Chain & Cable Company, Inc. Bridge circuits
US4325048A (en) * 1980-02-29 1982-04-13 Gould Inc. Deformable flexure element for strain gage transducer and method of manufacture
JPS56138305U (ja) * 1980-03-19 1981-10-20
GB2087144B (en) * 1980-11-07 1984-04-26 Gould Inc Temperature compensation in strain gage transducers

Also Published As

Publication number Publication date
AU542140B2 (en) 1985-02-07
IL67346A0 (en) 1984-05-31
AU9144582A (en) 1983-06-30
DE3279738D1 (en) 1989-07-06
IL67346A (en) 1988-06-30
EP0082698A3 (en) 1984-08-22
EP0082698A2 (en) 1983-06-29
EP0082698B1 (en) 1989-05-31
US4510813A (en) 1985-04-16

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