JPS58169079A - Abnormality detector - Google Patents
Abnormality detectorInfo
- Publication number
- JPS58169079A JPS58169079A JP57053210A JP5321082A JPS58169079A JP S58169079 A JPS58169079 A JP S58169079A JP 57053210 A JP57053210 A JP 57053210A JP 5321082 A JP5321082 A JP 5321082A JP S58169079 A JPS58169079 A JP S58169079A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- relays
- relay
- output
- majority
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005856 abnormality Effects 0.000 title claims abstract description 12
- 238000001514 detection method Methods 0.000 claims abstract description 23
- 238000005259 measurement Methods 0.000 claims description 2
- 230000002159 abnormal effect Effects 0.000 description 7
- 230000005855 radiation Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 235000000177 Indigofera tinctoria Nutrition 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229940097275 indigo Drugs 0.000 description 1
- COHYTHOBJLSHDF-UHFFFAOYSA-N indigo powder Natural products N1C2=CC=CC=C2C(=O)C1=C1C(=O)C2=CC=CC=C2N1 COHYTHOBJLSHDF-UHFFFAOYSA-N 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00392—Modifications for increasing the reliability for protection by circuit redundancy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/12—Provision for actuation of an alarm
-
- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B23/00—Alarms responsive to unspecified undesired or abnormal conditions
-
- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B29/00—Checking or monitoring of signalling or alarm systems; Prevention or correction of operating errors, e.g. preventing unauthorised operation
- G08B29/16—Security signalling or alarm systems, e.g. redundant systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Molecular Biology (AREA)
- Mathematical Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computing Systems (AREA)
- High Energy & Nuclear Physics (AREA)
- General Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Computer Hardware Design (AREA)
- Business, Economics & Management (AREA)
- Emergency Management (AREA)
- Monitoring And Testing Of Nuclear Reactors (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は異常検出装置、特に放射線の異常を検出するの
に適した装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an abnormality detection device, and particularly to a device suitable for detecting radiation abnormalities.
第1図は、従来の放射線異常検出装置の一例を示したも
のである。図示のように複数(、個)の被測定点P1〜
Pnの各々に3個の検出端ム、〜ム畠が設けられている
。そして、すべての被測定点P。FIG. 1 shows an example of a conventional radiation abnormality detection device. As shown in the figure, a plurality of measured points P1~
Each of Pn is provided with three detection ends. And all the measured points P.
〜Pn のすべての検出端ム、〜A、の出力を受けるよ
うに多数判定回路3が設けられている。この多数判定回
路すは、すべての被測定点P、〜Pnの第1、第2およ
び@Jの検出端ム、、ム3およびム1の出力をそれぞれ
受ける第1.第2および第Jのオア回路01m ONお
よび0.と、オア回路0.。A majority determination circuit 3 is provided to receive the outputs of all the detection terminals ~Pn, ~A. This multiple determination circuit 1 receives the outputs of the first, second and @J detection terminals M, , M3 and M1 of all the measured points P, -Pn, respectively. 2nd and J OR circuit 01m ON and 0. and OR circuit 0. .
0、およびO,の5ちコつ以上が信号を発生していると
鎗に、出力を発生する多数決回路Mとを備えている。リ
レーコイ、4−Cは、多数判定回路Bの出力により励磁
され、常開接点C5を動作させる。The circuit is provided with a majority circuit M that generates an output when five or more of the signals 0, 0, and 0 generate signals. Relay coil 4-C is excited by the output of majority determination circuit B and operates normally open contact C5.
接点C5は電源端子Eと出力端子りとを断続するが励磁
されると、接点C6が動作して、出力端子りに電源端子
藍の電圧が現われ餐→Φ今、これが異常信号として利用
される。即ち、この異常信号′″1す・出力端子DKI
i続門た図示しな゛装置が、トリップされまたは警報を
発生する。Contact C5 connects and connects the power terminal E and the output terminal, but when it is energized, contact C6 operates and the voltage of the power terminal indigo appears at the output terminal, which is now used as an abnormal signal. . That is, this abnormal signal '''1 output terminal DKI
A connected device, not shown, is tripped or generates an alarm.
上記のような構成とすれば、検出端ム、〜ム、のうちの
1つが一動作をして異常を示す信号を発生しても、◆数
決回路証が出力を発生しないので、出力端子りの電圧は
変化しない。With the above configuration, even if one of the detection terminals M, ~M performs one operation and generates a signal indicating an abnormality, the number decision circuit IC does not generate an output, so the output terminal The voltage on the other side does not change.
〔背景技術の問題点〕
しかしながら、多数判定回路BやリレーCが故障をする
と、これKより出力端子りの電圧が変化し、誤トリップ
等が発生するという問題があった。[Problems with Background Art] However, if the majority determination circuit B or the relay C fails, the voltage at the output terminal changes from the circuit K, causing a problem such as erroneous tripping.
特に、多数判定回路BやリレーCは多数の被測定点に対
して共通に設けられているものであるため、上記の間趨
が一層深刻なものであった。In particular, since the majority determination circuit B and the relay C are provided in common for a large number of measured points, the above-mentioned trend has become even more serious.
本発明の目的は、多数判定回路やリレーが7つ故障して
も誤トリップ等が生ずることのない異常検出装置を提供
することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide an abnormality detection device that does not cause false trips even if seven of the multiple determination circuits or relays fail.
本発明は、多数判定回路とこれによって励磁されるリレ
ーを3個ずつ設け、3個のリレーのうち一つ以上が動作
したとき、トリップ等のための異常信号を発生するよう
にしたものである。 ′〔発明の実施
例〕
第一図は本発明の一実施例を示したものである。The present invention includes a majority determination circuit and three relays each excited by the circuit, and when one or more of the three relays operates, an abnormal signal for tripping or the like is generated. . [Embodiment of the Invention] Figure 1 shows an embodiment of the present invention.
同図において、第1図と同様の部材は同一の符号で示さ
れている。図示のように、すべての被I11定点P1〜
Pnのすべての検出端ム、〜A、の出力を受ける第1.
第2および第3の多数判定回路B1〜B、が設けられて
いる。多数判定回路l、〜B、の各々は、第1図の多数
判定回路8と同様、すべての被測定点P1〜Pnの第1
の検出端ム1の出力を受ける第1のオア回路0.と、す
べての被測定点P、〜Pnの第2の検出端ム、の出力を
受ける第2のオア回路0.と、すべての被測定点P、〜
Pnの第3の検出端ム、の出力を受ける第30オア回路
01と、第1〜第3のオア回路01〜0.のうちの一つ
以上が信号を発生しているときに出力を発生する多数決
回路Mとを備えている。多数決回路Mの出力は多数判定
回路Ble m、、”a の出力を構合せ回路C0を形
成している。即ち、リレーCI。In this figure, members similar to those in FIG. 1 are designated by the same reference numerals. As shown, all the target I11 fixed points P1~
The first .
Second and third majority determination circuits B1-B are provided. Each of the majority determination circuits l, ~B, similarly to the majority determination circuit 8 in FIG.
A first OR circuit 0. receives the output of the detection terminal M1. and a second OR circuit 0. which receives the outputs of the second detection terminals of all the measured points P, -Pn. and all measured points P, ~
A 30th OR circuit 01 receiving the output of the third detection terminal of Pn, and the first to third OR circuits 01 to 0. and a majority circuit M that generates an output when one or more of them is generating a signal. The output of the majority decision circuit M is combined with the outputs of the majority decision circuit Ble m,,"a to form a combination circuit C0, that is, a relay CI.
C1の蕎給接点C,,C,,の直列回路、リレーC1s
C1の茎朔接点C2,,C,,の直列回路およびリレ
ーC,,C,の1#!接点Csb C1b の直列回
路が互いに並列接続されて成るものが、電源端子Eと出
力端子りとの間に設けられている。通常は電が閉じると
、出力端子りには電鍵端子Eの電圧が現われ着4鵡毒、
これが、異常信号として利用される。Series circuit of supply contacts C, , C, of C1, relay C1s
Series circuit of stem contacts C2,,C,, of C1 and 1# of relays C,,C,! A series circuit of contacts Csb C1b connected in parallel is provided between the power supply terminal E and the output terminal. Normally, when the power is closed, the voltage of the key terminal E appears at the output terminal, and the voltage at the key terminal E appears.
This is used as an abnormal signal.
多数判定回路B1〜B、の動作は、第1図のものと同様
であるが、3つの多数判定回路のうち一つ動作したとき
にはじめて、出力端子りに異常信号が現われる。即ち、
仮に、1つの多数判定回路が故障により誤って出力を発
生しても、また1つのリレーが故障しても参咎肴4出力
端子には異常信号が発生せず、娯トリップ等が生じない
。The operations of the majority determination circuits B1 to B are similar to those shown in FIG. 1, but an abnormal signal appears at the output terminal only when one of the three majority determination circuits operates. That is,
Even if one majority determination circuit erroneously generates an output due to a failure, or even if one relay fails, no abnormal signal will be generated at the 4th output terminal of the sample, and no trip will occur.
第一図のように構成することにより、異常検出装置内の
単一の部材(多数判定回路、リレー)の故障に際し、検
出装置全体を停止させることなく、故障した部材の修理
を行なうことができる。故障の発見は、1つの多数判定
回路、リレーの故障を図示しない手段により検出して警
報を発生させることにより、または定期点検により、行
な5ことができる。By configuring as shown in Figure 1, when a single component (multiple judgment circuit, relay) in the abnormality detection device fails, the failed component can be repaired without stopping the entire detection device. . Faults can be discovered by detecting faults in one majority judgment circuit or relay by means not shown and generating an alarm, or by periodic inspection.
このため、MTTF(平均修復時間)は大幅に改善され
る。第3図(&) @ (kl)はそれぞれ第1図、第
一図のMTTFの算出のための説明、図で、λ8.λ鵞
はそれぞれ多数判定回路、リレーの故障率(眠4r )
を示し、λ1+λ、 t= /Q −’ /hyである
と仮定する。Therefore, the MTTF (Mean Time to Repair) is significantly improved. FIG. 3 (&) @ (kl) is an explanation for calculating the MTTF in FIG. 1 and FIG. 1, respectively, and λ8. λ is the failure rate of the majority judgment circuit and relay (Nem4r), respectively.
Assume that λ1+λ, t=/Q −'/hy.
第1図、第3図(、)の場合には、直列系であるので、
故障時には修理不可能であり、
第1図、第3図(b)の場合には、修理可能であり、修
理率をμmo、i/by とするとこのようにMTT
Fが大幅に改善される。In the case of Figures 1 and 3 (,), it is a series system, so
When a failure occurs, it cannot be repaired, but in the cases shown in Figures 1 and 3 (b), it can be repaired.If the repair rate is μmo, i/by, then MTT
F is significantly improved.
以上のように本発明によれば、7つの多数判定回路また
はリレーが故障しても、異常信号が発生されることがな
く、また、装置全体を停止させることなく、故障した多
数判定回路またはリレーを修理することができる。従っ
てMTTFが着しく向上する。As described above, according to the present invention, even if seven majority determination circuits or relays fail, an abnormal signal is not generated, and the malfunctioning majority determination circuits or relays are can be repaired. Therefore, MTTF improves considerably.
第1図は従来の放射線異常検出装置の一例を示すブロッ
ク図、第一図は本発明一実施例の放射線異常検出装置を
示すブロック図、第3図(1) t (b)は、第1図
、第1図の装置のMTTFtt算出するための説明図で
ある。
P、−Pn・・・被測定点、A、−A、−・・検出端、
B1〜B、・・・多数判定回路s01〜03・・・オア
回路、M・・・多数決回路、c、−c、・・・ リレー
、cl、 C2,。
C5b・・・庸捌張点、C0・・・接点の組合せ。FIG. 1 is a block diagram showing an example of a conventional radiation abnormality detection device, FIG. 1 is a block diagram showing a radiation abnormality detection device according to an embodiment of the present invention, and FIG. FIG. 2 is an explanatory diagram for calculating MTTFtt of the apparatus shown in FIG. P, -Pn...Measurement point, A, -A, -...Detection end,
B1-B,... Majority judgment circuit s01-03... OR circuit, M... Majority decision circuit, c, -c,... Relay, cl, C2,. C5b... A combination of tension points, C0... Contact points.
Claims (2)
第11館コおよび第2の検出端と、すべての検出端の出
力をそれぞれ受ける第1.第一おる第1.第一および第
一のリレーを有し、前記リレーのうち一つ以上が動作し
たときに前記リレーの接点の綴金せKより信号を生ずる
リレー回路とを備え、前記第11第コおよび第3の多数
判定回路の各々は、すべての被測定点の第7の検出端の
出力を入力とする第1のオア回路と、すべての被槻定点
の第一の検出端の出力を入力とする第一のオア回路と、
すべての被測定点の第3の検出端の出力を入力とする第
3のオア回路と、前記第1.第一および第一のオア回路
の5ち一つ以上が信号を出力しているとき出力を発生す
る多数決回路とを備えていることを特徴とする異常検出
装置。(1) An 11th sensor and a second detection terminal installed at each of the plurality of measurement points to detect an abnormality, and a first detection terminal that receives the outputs of all the detection terminals, respectively. 1st or 1st. and a relay circuit that has a first and a first relay, and generates a signal from a buckle K of a contact of the relay when one or more of the relays is operated, and the eleventh and third Each of the multiple determination circuits includes a first OR circuit that receives as input the output of the seventh detection terminal of all the measured points, and a first OR circuit that receives as input the output of the first detection terminal of all the fixed points to be measured. One OR circuit,
a third OR circuit which receives as input the outputs of the third detection terminals of all the measured points; An abnormality detection device comprising: a majority circuit that generates an output when one or more of the first and first OR circuits outputs a signal.
前接点の直列回路と、第一および第3のリレーのを裕接
点−の直列回路と、第3および第1のリレーのll1v
!接点の直列回路とを互いに並列接続して成るものであ
ることを特徴とする特許請求の範囲第1項記載の装置。(2) The relay circuit includes a series circuit of the front contacts of the first and first relays, a series circuit of the front contacts of the first and third relays, and a series circuit of the front contacts of the first and third relays, and an ll1v of the third and first relays.
! 2. The device according to claim 1, wherein the device comprises a series circuit of contacts and a series circuit of contacts connected in parallel.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57053210A JPS58169079A (en) | 1982-03-31 | 1982-03-31 | Abnormality detector |
FR8305128A FR2524674A1 (en) | 1982-03-31 | 1983-03-29 | Radiation detector network monitoring several locations - has three detectors at each location connected to logic gate system to provide reliable radiation warning |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57053210A JPS58169079A (en) | 1982-03-31 | 1982-03-31 | Abnormality detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58169079A true JPS58169079A (en) | 1983-10-05 |
JPH0554079B2 JPH0554079B2 (en) | 1993-08-11 |
Family
ID=12936485
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57053210A Granted JPS58169079A (en) | 1982-03-31 | 1982-03-31 | Abnormality detector |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS58169079A (en) |
FR (1) | FR2524674A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011109842A (en) * | 2009-11-19 | 2011-06-02 | General Electric Co <Ge> | Circuit and topology for ultra-high reliability power electronics system |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2600775B1 (en) * | 1986-06-26 | 1990-03-23 | Kis Photo Ind | BIOMEDICAL ANALYSIS DEVICE |
FR2861881B1 (en) * | 2003-11-03 | 2006-01-20 | Airbus France | SYSTEM FOR MONITORING A PLURALITY OF ZONES |
JP4738933B2 (en) * | 2005-08-02 | 2011-08-03 | 住友重機械工業株式会社 | Radiation inspection device for detecting the part of a subject that has emitted radiation |
EP2326007B1 (en) | 2009-11-19 | 2013-01-09 | General Electric Company | Circuit and topology for very high reliability power electronics system |
RU2533317C2 (en) * | 2009-11-23 | 2014-11-20 | Дженерал Электрик Компани | Circuit and topology for high reliability power electronics system |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56123003A (en) * | 1980-02-25 | 1981-09-26 | Gen Electric | Control device |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE847141A (en) * | 1976-10-11 | 1977-04-12 | Acec | PROCESS CONTROL INSTALLATION. |
-
1982
- 1982-03-31 JP JP57053210A patent/JPS58169079A/en active Granted
-
1983
- 1983-03-29 FR FR8305128A patent/FR2524674A1/en not_active Withdrawn
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56123003A (en) * | 1980-02-25 | 1981-09-26 | Gen Electric | Control device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011109842A (en) * | 2009-11-19 | 2011-06-02 | General Electric Co <Ge> | Circuit and topology for ultra-high reliability power electronics system |
Also Published As
Publication number | Publication date |
---|---|
JPH0554079B2 (en) | 1993-08-11 |
FR2524674A1 (en) | 1983-10-07 |
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