JPS58137235A - Hermetic sealing method for semiconductor package - Google Patents
Hermetic sealing method for semiconductor packageInfo
- Publication number
- JPS58137235A JPS58137235A JP57020203A JP2020382A JPS58137235A JP S58137235 A JPS58137235 A JP S58137235A JP 57020203 A JP57020203 A JP 57020203A JP 2020382 A JP2020382 A JP 2020382A JP S58137235 A JPS58137235 A JP S58137235A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- ceramic
- metal layer
- container
- package
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、半導体の封入用1!器に実施して好適な半導
体用容器のハーメチックシール方法に関するものである
。DETAILED DESCRIPTION OF THE INVENTION The present invention provides 1! for encapsulation of semiconductors! The present invention relates to a hermetic sealing method for semiconductor containers suitable for use in semiconductor containers.
一般に半導体を塵埃、湿気などから保護するために、あ
るいはプリント板への取付けを容易にするために、半導
体をハーメチックシールされた容器内に収納することが
知られている。It is generally known that semiconductors are housed in hermetically sealed containers in order to protect them from dust, moisture, etc., or to facilitate attachment to printed circuit boards.
近年、エレクトロニクス技術の発達に伴ない、半導体装
置は電子機器を社しめ自動車、工作機械等あらゆる分野
に使用されるようにな〕、その需要社ますます増大して
きている。このため、半導体装置においては性能は勿論
のこと量産性および経済性の頁でも優れていることが要
請されるようになってきた。In recent years, with the development of electronics technology, semiconductor devices have come to be used in electronic equipment, automobiles, machine tools, and all other fields, and the demand for them has been increasing. For this reason, semiconductor devices are now required to be superior not only in performance but also in terms of mass production and economy.
しかるに、従来のハーメチックシール方法においては、
必ずしもこの要請を満たすものではなかった。これを#
!1図について説明すると、第1図は従来のハーメチッ
クシール方法を説明するための断面図で、先ず半導体素
子(1)を収納する凹陥部(2)とリード(至))とを
有しセラミックによって形成された容器(4)を用意し
、この容器(4)の開口側端面上に金属製リングあるい
はセラミック表面を金属化した金属化層(旬を形成する
。次にこの金属化層6)上に1金−錫の共晶合金などの
溶融性金属で、厚さ20乃至70ミクpンと極薄に形成
され九ろう肘用リング(6)を載置し、さらに接合面に
金メッキを施こした金属蓋CF)を載置する。そしてこ
れを加熱炉を通過させるととによ〕、前記ろう肘用リン
グ(6)を溶融させ金属蓋σ)を容器r)に溶着する。However, in conventional hermetic sealing methods,
This request was not necessarily met. this#
! Fig. 1 is a cross-sectional view for explaining the conventional hermetic sealing method. First, the semiconductor element (1) is housed in a recess (2) and a lead (to). Prepare the container (4) in which the container (4) has been formed, and form a metal ring or a metallized layer (metalized layer) on the ceramic surface on the opening side end surface of the container (4).Next, on this metalized layer 6) The ring is made of a meltable metal such as a gold-tin eutectic alloy and has a thickness of 20 to 70 μm, and the elbow ring (6) is placed thereon, and the joint surface is plated with gold. Place the strained metal lid CF). Then, by passing this through a heating furnace], the wax elbow ring (6) is melted and the metal lid σ) is welded to the container r).
このように従来のハーメチックシール方法においては、
それぞれ個別に形成されたろう肘用リング(6)と金属
蓋CI)と管容器(旬上に載置していた。ところが、ろ
う肘用リング・)は上述したように極薄に形成されてい
るために破損されやすく、このろう肘用リング(@)と
金属蓋(イ)とを容器(荀の金属化層(荀に位置合せす
ることが極めて難しくなる。そのため、作業時間が長く
なると共に、位置合せの不正確さに起因する不嵐品が発
生するために製造歩*tnが悪く、半導体装置の製造技
術にとって重要な課題となっていた。In this way, in the conventional hermetic sealing method,
The ring for deaf elbow (6), the metal lid CI) and the tube container (placed on top of each other) were formed individually, but the ring for deaf elbow () was formed extremely thin as mentioned above. This makes it extremely difficult to align the solder elbow ring (@) and the metal lid (A) to the metallized layer of the container (Xu). This increases the working time and The manufacturing process is poor due to the occurrence of defective products due to the inaccuracy of positioning, which has become an important issue for the manufacturing technology of semiconductor devices.
これを解消するものとして、個別に形成されたろう肘用
リング(旬と金属蓋(nとを何らかの方法で融着させ一
体化することも考えられるが、ろう肘用リング(6)と
金属蓋ωとの位置合せに関しては上述のような不具合が
あるのはいうまでもない。As a solution to this problem, it is conceivable to integrate the separately formed ring for the elbow (6) and the metal lid (n) by fusing them together in some way, but Needless to say, there are the above-mentioned problems with respect to alignment.
本発明は以上のよ負な点に鑑みなされたもので、先ずセ
ラミック蓋の周縁部分に金属化層を形成する工程と、こ
の金属化層上にメツ、キ処理を施した後にこのメツ中層
上に溶融性金属層を形成する工St−採用することによ
〉、短時間に封止が行える半導体用容器のハーメチック
シール方法を提供するものである。以下、その構成等を
図に示す実施例によシ詳細に説明する。The present invention has been made in view of the above-mentioned disadvantages, and includes a step of first forming a metallized layer on the peripheral edge of the ceramic lid, and then performing a metallization and cutting process on this metallized layer, and then a layer on the middle layer of the metallized layer. The present invention provides a hermetic sealing method for a semiconductor container that can be sealed in a short time by employing a process for forming a meltable metal layer on the semiconductor container. Hereinafter, the configuration and the like will be explained in detail with reference to the embodiment shown in the drawings.
第2図は本発明に係る半導体用容器のハーメチックシー
ル方法を示す容器の断面図で、同図において第1図に示
すものと同一部材には同一符号を付しその説明は省略す
る。先ずセラミックの平板を容器(4)に対応した所定
の寸法に切断してセラミック蓋側)を形成し、このセラ
ミック蓋(8)の周縁部分の容器(4)の開口、側端面
上に形成された金属化層(5)に対応した位置に、モリ
ブ17あるいはタングステンなどの高融点金属を主成分
とする金属化層(!I)を形成する。次にこの金属化層
(a)上にメッキ処理を施すことによ〕ニッケル、会な
どのメッキ層(10)を形成し、このメッキ層(10)
上に容器(4)とセラミック蓋(8)とt溶着させるた
めの溶融性金属層(11)を形成する。FIG. 2 is a sectional view of a container showing the hermetic sealing method for a semiconductor container according to the present invention. In this figure, the same members as those shown in FIG. First, a ceramic flat plate is cut into a predetermined size corresponding to the container (4) to form a ceramic lid (ceramic lid side), and a ceramic lid (ceramic lid side) is formed by cutting a ceramic flat plate into a predetermined size corresponding to the container (4). A metallized layer (!I) whose main component is molyb 17 or a high melting point metal such as tungsten is formed at a position corresponding to the metallized layer (5). Next, by performing plating treatment on this metallized layer (a), a plating layer (10) of nickel, aluminum, etc. is formed, and this plating layer (10)
A fusible metal layer (11) for welding the container (4) and the ceramic lid (8) is formed thereon.
この溶融性金属層(11)が一体く形成されたセラミッ
ク蓋(8)を前記容IB(4)の開口側端面上に重合わ
せるように載置し、これを加熱炉を通過させることによ
シ、前記溶融性金属層(11)を溶融させセラミックi
i@)を容器(4)K溶着する。The ceramic lid (8) integrally formed with the meltable metal layer (11) is placed on the opening side end surface of the container IB (4) so as to overlap, and is passed through a heating furnace. C. The meltable metal layer (11) is melted to form a ceramic i.
Weld i@) to container (4)K.
なお、容器(4)およびセラミック蓋01)K形成され
る金属化層(5) 、 (9)は、一般に金属粉末およ
びガラスフリットなどからなるペーストをセラミック上
に印刷し、焼成炉内で焼成する金属化法によ多形成され
る。また溶融性金属層(11)は、メッキ層(10)が
形成されたセラミック蓋(@を溶融性金属が溶融してい
る溶融槽中に浸すことによシ、メッキ層(10)の表面
に溶融性金属が融着するので容易に形成される。Note that the metallized layers (5) and (9) to be formed on the container (4) and the ceramic lid 01) are generally formed by printing a paste made of metal powder, glass frit, etc. on the ceramic and firing it in a firing furnace. Polymer is formed by metallization method. The fusible metal layer (11) can be formed on the surface of the plating layer (10) by immersing the ceramic lid (@) on which the plating layer (10) is formed into a melting tank in which the fusible metal is melted. It is easily formed because meltable metals are fused together.
上記実施例においては、溶融性金属層(11)をセラミ
ック蓋伽)と一体に形成しているが、容器(4)に形成
された金属化層■にメッキ処理を施しこの表面に形成し
ても同様表効果が得られるのは勿論である。In the above embodiment, the fusible metal layer (11) is formed integrally with the ceramic lid, but the metallized layer (1) formed on the container (4) is plated and formed on this surface. Of course, a similar surface effect can also be obtained.
以上説明したように本発明によれば、溶融性金属層をセ
ラミック蓋上に形成する工程によ)、従来、取扱いが困
難で位置合せに要時間を必要としていた溶着用の部材を
敗扱いが容異なセラミック蓋と一体に形成することがで
きる。As explained above, according to the present invention, by the process of forming a fusible metal layer on a ceramic lid, members for welding, which were conventionally difficult to handle and required time to align, can be handled as waste. Can be integrally formed with different ceramic lids.
したがって、7%−メチツクする工程において位置合せ
が短時間にしかも正確に行えるので、生産性および製造
歩留〉の向上がはかれるという効果がある。Therefore, in the 7%-meshing process, alignment can be accomplished in a short time and accurately, resulting in improved productivity and manufacturing yield.
第1図は従来の半導体用容器のハーメチックシール方法
を示す容器の断面図、第2図は本発明に係る半導体重容
器のハーメチックシール方法を示す容器の断面図である
。
(1)・・・・半導体素子、(4・・・・容器、(8)
・・・嗜セラミック蓋、Φ)@#@・金属化層、(11
)・拳・・溶融性金属層。
代理人 葛野信−(外1名)FIG. 1 is a sectional view of a container showing a conventional hermetic sealing method for a semiconductor container, and FIG. 2 is a sectional view of a container showing a hermetic sealing method for a semiconductor heavy container according to the present invention. (1)... Semiconductor element, (4... Container, (8)
...Ceramic lid, Φ) @#@・Metalized layer, (11
)・Fist: Molten metal layer. Agent Shin Kuzuno (1 other person)
Claims (1)
形成したセラミックからな1容器を一止する方法におい
て、前記開口端に接合するセラミック蓋の周縁部分に金
属化層を形成する工程と、この金属化層上にメッキ処理
を施す工程と、とのメッキ層上に溶融性金属層を形成す
る工1と、このセラミック蓋を前記容器の開口端に重合
せ加熱する工程とからなる半導体用容器のハーメチック
シール方法。In a method for temporarily holding a container made of ceramic having a recessed part for storing a semiconductor and having a metallized layer formed on the opening end, a metallized layer is formed on the peripheral part of the ceramic lid that is joined to the opening end. step 1 of forming a fusible metal layer on the plating layer; and a step of superimposing the ceramic lid on the open end of the container and heating it. A hermetic sealing method for semiconductor containers consisting of:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57020203A JPS58137235A (en) | 1982-02-09 | 1982-02-09 | Hermetic sealing method for semiconductor package |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57020203A JPS58137235A (en) | 1982-02-09 | 1982-02-09 | Hermetic sealing method for semiconductor package |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58137235A true JPS58137235A (en) | 1983-08-15 |
Family
ID=12020602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57020203A Pending JPS58137235A (en) | 1982-02-09 | 1982-02-09 | Hermetic sealing method for semiconductor package |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58137235A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63240051A (en) * | 1987-03-27 | 1988-10-05 | Nec Corp | Ceramic cap |
JPH04277528A (en) * | 1991-03-04 | 1992-10-02 | Toray Ind Inc | Sulfur-containing aromatic resin molding |
US6928719B2 (en) * | 2001-12-07 | 2005-08-16 | Samsung Electro-Mechanics Co., Ltd. | Method for fabricating surface acoustic wave filter package |
-
1982
- 1982-02-09 JP JP57020203A patent/JPS58137235A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63240051A (en) * | 1987-03-27 | 1988-10-05 | Nec Corp | Ceramic cap |
JPH04277528A (en) * | 1991-03-04 | 1992-10-02 | Toray Ind Inc | Sulfur-containing aromatic resin molding |
US6928719B2 (en) * | 2001-12-07 | 2005-08-16 | Samsung Electro-Mechanics Co., Ltd. | Method for fabricating surface acoustic wave filter package |
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