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JPS58114775U - probe card - Google Patents

probe card

Info

Publication number
JPS58114775U
JPS58114775U JP1239482U JP1239482U JPS58114775U JP S58114775 U JPS58114775 U JP S58114775U JP 1239482 U JP1239482 U JP 1239482U JP 1239482 U JP1239482 U JP 1239482U JP S58114775 U JPS58114775 U JP S58114775U
Authority
JP
Japan
Prior art keywords
probe card
component mounting
mounting board
main body
point conductive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1239482U
Other languages
Japanese (ja)
Other versions
JPS6231888Y2 (en
Inventor
昌男 大久保
吉光　康良
中井　文男
Original Assignee
日本電子材料株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子材料株式会社 filed Critical 日本電子材料株式会社
Priority to JP1239482U priority Critical patent/JPS58114775U/en
Publication of JPS58114775U publication Critical patent/JPS58114775U/en
Application granted granted Critical
Publication of JPS6231888Y2 publication Critical patent/JPS6231888Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は従来技術を説明するための概略図、第２図は本
案品に用いられる多点式導電マットの一実施例の概略斜
視図、第３図は本案品の一実施例の概略図、第４図は本
案品の他の一実施例、第５図は本案品のさらに他の一実
施例である。 ２０・・・多点式導電マット、３１・・・プローブカー
ド本体、３３・・・部品塔載基板、４４・・・小孔、４
５・・・絶縁シート。 ３３　　　　　　　。 Ｘム　１　（ 、３’　　　３４　　３６Fig. 1 is a schematic diagram for explaining the prior art, Fig. 2 is a schematic perspective view of an embodiment of a multi-point conductive mat used in the proposed product, and Fig. 3 is a schematic diagram of an embodiment of the proposed product. , FIG. 4 shows another embodiment of the present product, and FIG. 5 shows still another embodiment of the present product. 20...Multi-point conductive mat, 31...Probe card body, 33...Component mounting board, 44...Small hole, 4
5...Insulating sheet. 33. Xmu 1 ( , 3' 34 36

Claims (3)

【実用新案登録請求の範囲】[Scope of utility model registration request] （１）プローブカード本体と部品塔載基板との間に、前
記プローブカード本体と部品塔載基板の所定端子間の電
気的接続をなす多点式導電マットを介在させていること
を特徴とするプローブカード。(1) A multi-point conductive mat is interposed between the probe card main body and the component mounting board for electrically connecting predetermined terminals of the probe card main body and the component mounting board. probe card. （２）前記多点式導電マットは半田付部の逃げを与える
手段を具備することを特徴とする実用新案登録請求の範
囲第１項記載のプローブカード。(2) The probe card according to claim 1, wherein the multi-point conductive mat is provided with means for providing relief to the soldered portion. （３）前記多点式導電マットは、プローブカ・−ド本体
と部品塔載基板との間に介在する絶縁シートによって、
プローブカード本体と部品塔載基板の端子間を選択的に
接続されるものであることを特徴とする実用新案登録請
求の範囲第１項記載のプローブカード。(3) The multi-point conductive mat has an insulating sheet interposed between the probe card body and the component mounting board.
The probe card according to claim 1, wherein the probe card is selectively connected between the terminals of the probe card main body and the component mounting board.
JP1239482U 1982-01-30 1982-01-30 probe card Granted JPS58114775U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1239482U JPS58114775U (en) 1982-01-30 1982-01-30 probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1239482U JPS58114775U (en) 1982-01-30 1982-01-30 probe card

Publications (2)

Publication Number Publication Date
JPS58114775U true JPS58114775U (en) 1983-08-05
JPS6231888Y2 JPS6231888Y2 (en) 1987-08-15

Family

ID=30024967

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1239482U Granted JPS58114775U (en) 1982-01-30 1982-01-30 probe card

Country Status (1)

Country Link
JP (1) JPS58114775U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61178482U (en) * 1985-04-25 1986-11-07

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4800564B2 (en) * 2003-06-26 2011-10-26 株式会社日本マイクロニクス Probe card

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5277780U (en) * 1975-12-08 1977-06-10

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5277780U (en) * 1975-12-08 1977-06-10

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61178482U (en) * 1985-04-25 1986-11-07

Also Published As

Publication number Publication date
JPS6231888Y2 (en) 1987-08-15

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