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JPS5779456A - Voltage readout system by electron beam - Google Patents

Voltage readout system by electron beam

Info

Publication number
JPS5779456A
JPS5779456A JP55156808A JP15680880A JPS5779456A JP S5779456 A JPS5779456 A JP S5779456A JP 55156808 A JP55156808 A JP 55156808A JP 15680880 A JP15680880 A JP 15680880A JP S5779456 A JPS5779456 A JP S5779456A
Authority
JP
Japan
Prior art keywords
electron
reflected
signal
materials
radiation ratio
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55156808A
Other languages
Japanese (ja)
Inventor
Yoshiaki Goto
Toshihiro Ishizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55156808A priority Critical patent/JPS5779456A/en
Publication of JPS5779456A publication Critical patent/JPS5779456A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/305Contactless testing using electron beams

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To correct an error in voltage readout due to differences of materials, by specifying materials by a reflected electron and correcting a secondary electron signal by using the radiation ratio of the secondary electron characteristics to the materials. CONSTITUTION:When a sample 2 is irradiated with an electron beam 1, a secondary electron and a high-speed reflected electron are obtained from an electron beam probe point and then detected by corresponding detectors 4 and 3 to obtain a secondary-electron signal Ss and a reflected-electron signal Sr. The reflected-electron signal Sr is inputted to a determining circuit 5 for a secondary- electron radiation ratio having an incorporated coordinate table of secondary electron radiation ratios, thus obtaining the secondary electron radiation ratio. Then, the secondary-electron signal Ss and the secondary-electron radiation ratio are inputted to a dividing circuit 6, which finds a voltage at the probe point. Thus, unstable elements due to material effect are removed and the functions of an integrated circuit device are inspected accurately.
JP55156808A 1980-11-06 1980-11-06 Voltage readout system by electron beam Pending JPS5779456A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55156808A JPS5779456A (en) 1980-11-06 1980-11-06 Voltage readout system by electron beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55156808A JPS5779456A (en) 1980-11-06 1980-11-06 Voltage readout system by electron beam

Publications (1)

Publication Number Publication Date
JPS5779456A true JPS5779456A (en) 1982-05-18

Family

ID=15635770

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55156808A Pending JPS5779456A (en) 1980-11-06 1980-11-06 Voltage readout system by electron beam

Country Status (1)

Country Link
JP (1) JPS5779456A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EA026694B1 (en) * 2011-03-14 2017-05-31 Кова Компани, Лтд. Phenylpyridine derivative and drug containing same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EA026694B1 (en) * 2011-03-14 2017-05-31 Кова Компани, Лтд. Phenylpyridine derivative and drug containing same

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