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JPS576304A - Method and apparatus for cone plane inspection of circular member - Google Patents

Method and apparatus for cone plane inspection of circular member

Info

Publication number
JPS576304A
JPS576304A JP7983280A JP7983280A JPS576304A JP S576304 A JPS576304 A JP S576304A JP 7983280 A JP7983280 A JP 7983280A JP 7983280 A JP7983280 A JP 7983280A JP S576304 A JPS576304 A JP S576304A
Authority
JP
Japan
Prior art keywords
circular member
electric signal
inspection
cone surface
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7983280A
Other languages
Japanese (ja)
Other versions
JPS637322B2 (en
Inventor
Hiroshi Ito
Mitsuru Ezaki
Hiroshi Kuno
Kanji Kitou
Morihiro Matsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Central R&D Labs Inc
Original Assignee
Toyota Central R&D Labs Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Central R&D Labs Inc filed Critical Toyota Central R&D Labs Inc
Priority to JP7983280A priority Critical patent/JPS576304A/en
Publication of JPS576304A publication Critical patent/JPS576304A/en
Publication of JPS637322B2 publication Critical patent/JPS637322B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable noncontacting inspection of failures of cones, by irradiating a deflection scanning light on the cone plane of a circular member in revolution, receiving the regular reflection and converting it into an electric signal, and processing it electrically. CONSTITUTION:While a circular member is rotated, an inspection light deflected and scanned on the cone surface is irradiated, the regular reflected light is received and it is converted into an electric signal and a signal corresponding to a failure on the cone surface is picked up through electric processing. For example, a laser inspection light from a deflection scanning light source 26 is given to cone surface 10a and 10b of a circular member 10 placed on a rotating stand 12 via a projective lens 34, the regular reflected light is received at photoelectric detectors 36, 38 and it is converted into an electric signal. The electric signal is introduced to a failure detecting circuit together with signals indicating the angle of the rotating stand and the like to decide the presence or absence of failures and their location. Further, when a selecting mechanism 40 or the like is used, automatic selection of failed goods can be made, allowing to increase the inspection efficiency remarkably.
JP7983280A 1980-06-13 1980-06-13 Method and apparatus for cone plane inspection of circular member Granted JPS576304A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7983280A JPS576304A (en) 1980-06-13 1980-06-13 Method and apparatus for cone plane inspection of circular member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7983280A JPS576304A (en) 1980-06-13 1980-06-13 Method and apparatus for cone plane inspection of circular member

Publications (2)

Publication Number Publication Date
JPS576304A true JPS576304A (en) 1982-01-13
JPS637322B2 JPS637322B2 (en) 1988-02-16

Family

ID=13701174

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7983280A Granted JPS576304A (en) 1980-06-13 1980-06-13 Method and apparatus for cone plane inspection of circular member

Country Status (1)

Country Link
JP (1) JPS576304A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0120211A2 (en) * 1983-03-02 1984-10-03 CARBOLOY S.p.A. Method and apparatus for the dimension inspection of solid bodies

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49143543U (en) * 1973-03-30 1974-12-11
JPS5119789U (en) * 1974-07-30 1976-02-13

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49143543U (en) * 1973-03-30 1974-12-11
JPS5119789U (en) * 1974-07-30 1976-02-13

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0120211A2 (en) * 1983-03-02 1984-10-03 CARBOLOY S.p.A. Method and apparatus for the dimension inspection of solid bodies
EP0120211A3 (en) * 1983-03-02 1986-11-20 CARBOLOY S.p.A. Method and apparatus for the dimension inspection of solid bodies

Also Published As

Publication number Publication date
JPS637322B2 (en) 1988-02-16

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