JPS5758689Y2 - - Google Patents

Info

Publication number: JPS5758689Y2
Authority: JP; Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

JP1977014129U

Other languages

Other versions

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1977-02-08

Filing date

1977-02-08

Publication date

1982-12-15

1977-02-08 Application filed filed Critical

1977-02-08 Priority to JP1977014129U priority Critical patent/JPS5758689Y2/ja

1978-08-31 Publication of JPS53108860U publication Critical patent/JPS53108860U/ja

1982-12-15 Application granted granted Critical

1982-12-15 Publication of JPS5758689Y2 publication Critical patent/JPS5758689Y2/ja

Status Expired legal-status Critical Current

Links

JP1977014129U 1977-02-08 1977-02-08 Expired JPS5758689Y2 (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP1977014129U JPS5758689Y2 (en)	1977-02-08	1977-02-08

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP1977014129U JPS5758689Y2 (en)	1977-02-08	1977-02-08

Publications (2)

Publication Number	Publication Date
JPS53108860U JPS53108860U (en)	1978-08-31
JPS5758689Y2 true JPS5758689Y2 (en)	1982-12-15

Family

ID=28833476

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP1977014129U Expired JPS5758689Y2 (en)	1977-02-08	1977-02-08

Country Status (1)

Country	Link
JP (1)	JPS5758689Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
WO1991002374A1 (en) *	1988-03-09	1991-02-21	Seiko Instruments Inc.	Charged particle ray apparatus and method of observing samples

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS57118357A (en) *	1981-01-14	1982-07-23	Jeol Ltd	Objective lens for scan type electron microscope
JPS57145259A (en) *	1981-03-03	1982-09-08	Akashi Seisakusho Co Ltd	Scanning type electron microscope and its similar device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS574379U (en) *	1980-06-06	1982-01-09

1977
- 1977-02-08 JP JP1977014129U patent/JPS5758689Y2/ja not_active Expired

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS574379U (en) *	1980-06-06	1982-01-09

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
WO1991002374A1 (en) *	1988-03-09	1991-02-21	Seiko Instruments Inc.	Charged particle ray apparatus and method of observing samples

Also Published As

Publication number	Publication date
JPS53108860U (en)	1978-08-31

Similar Documents

Publication	Publication Date	Title
FR2378751B1 (en)	1982-04-16
CH643698GA3 (en)	1984-06-29
FR2378998B3 (en)	1980-09-05
FR2379109B1 (en)	1982-12-10
FR2378935B1 (en)	1980-12-05
FR2378845B2 (en)	1979-05-11
FR2378106B1 (en)	1982-02-26
JPS53108860U (en)	1978-08-31
DE2858284A1 (en)	1985-07-04
FR2377182B1 (en)	1982-05-14
FR2339258B3 (en)	1979-10-19
FR2378543B3 (en)	1981-11-06
BG25850A1 (en)	1979-01-12
BG25839A1 (en)	1979-01-12
CH613248A5 (en)	1979-09-14
CH613232A5 (en)	1979-09-14
CH611933A5 (en)	1979-06-29
CH607844A5 (en)	1978-11-30
CH597953A5 (en)	1978-04-14
BG25860A1 (en)	1979-01-12
BG25855A1 (en)	1979-01-12
BG25853A1 (en)	1979-01-12
BG25852A1 (en)	1979-01-12
BG25851A1 (en)	1979-01-12
BG25837A1 (en)	1979-01-12