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JPS5748665A - Resistance component measuring circuit - Google Patents

Resistance component measuring circuit

Info

Publication number
JPS5748665A
JPS5748665A JP55124332A JP12433280A JPS5748665A JP S5748665 A JPS5748665 A JP S5748665A JP 55124332 A JP55124332 A JP 55124332A JP 12433280 A JP12433280 A JP 12433280A JP S5748665 A JPS5748665 A JP S5748665A
Authority
JP
Japan
Prior art keywords
resistance
sample
resistance value
series
resistance component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55124332A
Other languages
Japanese (ja)
Inventor
Toshiharu Takeuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55124332A priority Critical patent/JPS5748665A/en
Publication of JPS5748665A publication Critical patent/JPS5748665A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To measure the resistance component added in series to a P-N junction element by operating a sample like pulses, and at the same time constituting a high frequency AM modulating circuit synchronized with this, and incorporating the differentiating resistance for sample to said element. CONSTITUTION:A high frequency signal is not amplified by FETs 7, 16 when there is no output from a pulse generator 21, and since no electric current flows to a sample 25 during this period, measurement errors by temp. can be reduced. When a pulse output is generated from the pulse generator 21, the electric current inversely proportional to the combined resistance value of the 1st series resistance value of a bias resistance 26 and the sample 25 and the 2nd series resistance value of a variable resistance 12 and a bias resistance 27 flows. If the resistances 26, 27 are assumed to be of the same values, ther is no compared output of a comparator 22 only when the resistance component of the sample 25 and the resistance value of the variable resistance 12 are equal. In this way, the resistance component of a P-N junction element is measured quickly without receiving thermal changes.
JP55124332A 1980-09-08 1980-09-08 Resistance component measuring circuit Pending JPS5748665A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55124332A JPS5748665A (en) 1980-09-08 1980-09-08 Resistance component measuring circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55124332A JPS5748665A (en) 1980-09-08 1980-09-08 Resistance component measuring circuit

Publications (1)

Publication Number Publication Date
JPS5748665A true JPS5748665A (en) 1982-03-20

Family

ID=14882712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55124332A Pending JPS5748665A (en) 1980-09-08 1980-09-08 Resistance component measuring circuit

Country Status (1)

Country Link
JP (1) JPS5748665A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6021972U (en) * 1983-07-21 1985-02-15 本重　正行 Insulation checker for live wires
JPH11233872A (en) * 1998-02-09 1999-08-27 Nippon Telegr & Teleph Corp <Ntt> Discrimination of semiconductor laser
CN116735980A (en) * 2023-08-14 2023-09-12 西安图为电气技术有限公司 Method and device for testing inductance bias inductance by double pulses

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6021972U (en) * 1983-07-21 1985-02-15 本重　正行 Insulation checker for live wires
JPH11233872A (en) * 1998-02-09 1999-08-27 Nippon Telegr & Teleph Corp <Ntt> Discrimination of semiconductor laser
CN116735980A (en) * 2023-08-14 2023-09-12 西安图为电气技术有限公司 Method and device for testing inductance bias inductance by double pulses
CN116735980B (en) * 2023-08-14 2023-10-24 西安图为电气技术有限公司 Method and device for testing inductance bias inductance by double pulses

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