JPS5740659A - Testing burden setting device for current transformer - Google Patents
Testing burden setting device for current transformerInfo
- Publication number
- JPS5740659A JPS5740659A JP55115590A JP11559080A JPS5740659A JP S5740659 A JPS5740659 A JP S5740659A JP 55115590 A JP55115590 A JP 55115590A JP 11559080 A JP11559080 A JP 11559080A JP S5740659 A JPS5740659 A JP S5740659A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- current transformer
- voltage
- output
- amplitude
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title abstract 5
- 230000001105 regulatory effect Effects 0.000 abstract 5
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 abstract 2
- 239000002131 composite material Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 230000010363 phase shift Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/62—Testing of transformers
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
PURPOSE:To eliminate the need for consideration to burden such as a lead wire, a current transformer and the like and permit a fine setting, by a method wherein a detecting circuit to detect the secondary terminal voltage of a current transformer under test is provided, and the voltage detected by said detecting circuit is made to coincide with the composite voltage of the output voltages of two amplitude regulating circuits. CONSTITUTION:The secondary terminal voltage of a current transformer CT under test is detected by means of a detecting circuit 5 and fed to a circuit 6. On the other hand, said circuit 6 is fed with the output of an amplitude regulating circuit 3, obtained by regulating the amplitude of the output of an I/V converting circuit 1 which converts the secondary current of the current transformer CT into a voltage, and the output of an amplitude regulating circuit 4, obtained by regulating the amplitude of the output of a 90-degree phase-shifting circuit which phase-shifts, by 90 degrees, the output voltage of the circuit 1. Then, in the circuit 6, the sum voltage of the outputs of the circuits 3 and 4, and the output voltage of the detecting circuit 5 are made to coincide with each other. Thereby, if there are other burden factors in the testing circuit, they are treated as burden in setting. Accordingly, it becomes unnecessary to consider burden such as a lead wire, a current transformer testing device and the like.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55115590A JPS5740659A (en) | 1980-08-22 | 1980-08-22 | Testing burden setting device for current transformer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55115590A JPS5740659A (en) | 1980-08-22 | 1980-08-22 | Testing burden setting device for current transformer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5740659A true JPS5740659A (en) | 1982-03-06 |
| JPS6367670B2 JPS6367670B2 (en) | 1988-12-27 |
Family
ID=14666363
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55115590A Granted JPS5740659A (en) | 1980-08-22 | 1980-08-22 | Testing burden setting device for current transformer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5740659A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4857827A (en) * | 1986-04-04 | 1989-08-15 | Tettex Ag | Electronic load for testing transformers |
| CN103743994A (en) * | 2014-01-27 | 2014-04-23 | 广州供电局有限公司 | Low-voltage load test method and device |
-
1980
- 1980-08-22 JP JP55115590A patent/JPS5740659A/en active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4857827A (en) * | 1986-04-04 | 1989-08-15 | Tettex Ag | Electronic load for testing transformers |
| CN103743994A (en) * | 2014-01-27 | 2014-04-23 | 广州供电局有限公司 | Low-voltage load test method and device |
| CN103743994B (en) * | 2014-01-27 | 2017-02-01 | 广州供电局有限公司 | Low-voltage load test method and device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6367670B2 (en) | 1988-12-27 |
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