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JPS5737221A - Thermal compensation system for light measuring circuit - Google Patents

Thermal compensation system for light measuring circuit

Info

Publication number
JPS5737221A
JPS5737221A JP11359880A JP11359880A JPS5737221A JP S5737221 A JPS5737221 A JP S5737221A JP 11359880 A JP11359880 A JP 11359880A JP 11359880 A JP11359880 A JP 11359880A JP S5737221 A JPS5737221 A JP S5737221A
Authority
JP
Japan
Prior art keywords
temperature
diode
constant
thermal
measuring circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11359880A
Other languages
Japanese (ja)
Inventor
Masamichi Furukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP11359880A priority Critical patent/JPS5737221A/en
Publication of JPS5737221A publication Critical patent/JPS5737221A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

PURPOSE:To enable manufacturing of a compact device, having a high performance, at a low cost, by a method wherein a thermal compensation for a light measuring circuit is conducted by the use of a diode. CONSTITUTION:An output of a photodiode D is logarithmically compressed by means of an operational amplifier OP1 and a logarithmic-compressing diode D1 and is inputted to an AD converter A/D. A thermal compensating diode D2 has a thermal dependence characteristic, and a constant current is supplied from a constant-current source Is1. However, a voltage between opposite ends changes, and a change in voltage due to the temperature of the D1 is erased. In the AD converter A/D, a constant current is supplied from a constant-current source Is2 to a thermal compensating diode D3, a voltage between opposite ends changes according to a temperature, and a charging current to a capacitor C via an operational amplifier OP4 and a TrQ1 changes according to a temperature. As a result, a change in temperature of a digital output is compensated, which permits the manufacture of a compact device, having a high performance, at a low cost.
JP11359880A 1980-08-19 1980-08-19 Thermal compensation system for light measuring circuit Pending JPS5737221A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11359880A JPS5737221A (en) 1980-08-19 1980-08-19 Thermal compensation system for light measuring circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11359880A JPS5737221A (en) 1980-08-19 1980-08-19 Thermal compensation system for light measuring circuit

Publications (1)

Publication Number Publication Date
JPS5737221A true JPS5737221A (en) 1982-03-01

Family

ID=14616261

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11359880A Pending JPS5737221A (en) 1980-08-19 1980-08-19 Thermal compensation system for light measuring circuit

Country Status (1)

Country Link
JP (1) JPS5737221A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2296281A1 (en) * 2009-09-08 2011-03-16 Dialog Semiconductor GmbH Logarithmic DAC with diode
JP2014222226A (en) * 2008-09-04 2014-11-27 株式会社半導体エネルギー研究所 Photodetection circuit
EP3742134A1 (en) * 2019-05-23 2020-11-25 IMEC vzw Circuit and method for ratiometric light change detection
US12004943B2 (en) 2019-12-20 2024-06-11 Imec Vzw Artificial iris, a method for controlling an artificial iris, an artificial iris, a method for controlling an artificial iris, and a method for determining a user-specific profile for an artificial iris and a method for determining a user-specific profile for an artificial iris

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54161983A (en) * 1978-06-12 1979-12-22 Canon Inc Temperature compensating circuit of photometric circuit
JPS556924B2 (en) * 1974-08-12 1980-02-21

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS556924B2 (en) * 1974-08-12 1980-02-21
JPS54161983A (en) * 1978-06-12 1979-12-22 Canon Inc Temperature compensating circuit of photometric circuit

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014222226A (en) * 2008-09-04 2014-11-27 株式会社半導体エネルギー研究所 Photodetection circuit
EP2296281A1 (en) * 2009-09-08 2011-03-16 Dialog Semiconductor GmbH Logarithmic DAC with diode
US7936292B2 (en) 2009-09-08 2011-05-03 Dialog Semiconductor Gmbh Diode smart track
EP3742134A1 (en) * 2019-05-23 2020-11-25 IMEC vzw Circuit and method for ratiometric light change detection
WO2020234278A1 (en) * 2019-05-23 2020-11-26 Imec Vzw Smart contact lens with ratiometric light change detection
US11927479B2 (en) 2019-05-23 2024-03-12 Imec Vzw Smart contact lens with ratiometric light change detection
US12004943B2 (en) 2019-12-20 2024-06-11 Imec Vzw Artificial iris, a method for controlling an artificial iris, an artificial iris, a method for controlling an artificial iris, and a method for determining a user-specific profile for an artificial iris and a method for determining a user-specific profile for an artificial iris

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