JPS5726441A - Cvd method and device therefor - Google Patents
Cvd method and device thereforInfo
- Publication number
- JPS5726441A JPS5726441A JP9993680A JP9993680A JPS5726441A JP S5726441 A JPS5726441 A JP S5726441A JP 9993680 A JP9993680 A JP 9993680A JP 9993680 A JP9993680 A JP 9993680A JP S5726441 A JPS5726441 A JP S5726441A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- excited
- heating
- furnace
- psg film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H01L21/02129—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material being boron or phosphorus doped silicon oxides, e.g. BPSG, BSG or PSG
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
Abstract
PURPOSE:To effectively and readily obtain a CVD film of desired components by mixing gas difficult to be excited with other gas after preliminarily exciting (heating) or varying the degree of the preliminarily exciting (heating) and reacting them. CONSTITUTION:To form a PSG film, PH3+N2O is necessary for gas (I) and SiH4+N2O is necessary for the second (II) gas. Since the gas (I) is more difficult to be excited than the gas (II), the gas (I) is supplied to a reaction furnace 11 after passing through a preliminary excitation (heating) chamber 8 from a supply port 5. The gas (II) is supplied from a tube 7 directly to the furnace 11. The gases (I) and (II) are mixed in the furnace 11, are then excited by an induction coil 3, are thus reacted in plasma state, and a PSG film is formed on the surface of a water W. At this time the gas (I) is sufficiently excited due to the preliminary excitation, and the PSG film containing the prescribed component density can be formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9993680A JPS5726441A (en) | 1980-07-23 | 1980-07-23 | Cvd method and device therefor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9993680A JPS5726441A (en) | 1980-07-23 | 1980-07-23 | Cvd method and device therefor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5726441A true JPS5726441A (en) | 1982-02-12 |
Family
ID=14260598
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9993680A Pending JPS5726441A (en) | 1980-07-23 | 1980-07-23 | Cvd method and device therefor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5726441A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0167703A2 (en) * | 1984-06-29 | 1986-01-15 | International Business Machines Corporation | A method of homogeneous chemical vapour deposition |
US4919077A (en) * | 1986-12-27 | 1990-04-24 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor producing apparatus |
US5021114A (en) * | 1987-07-20 | 1991-06-04 | Hitachi, Ltd. | Apparatus for treating material by using plasma |
WO1993013552A1 (en) * | 1986-12-27 | 1993-07-08 | Masao Oda | Semiconductor fabricating unit |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5391665A (en) * | 1977-01-24 | 1978-08-11 | Hitachi Ltd | Plasma cvd device |
-
1980
- 1980-07-23 JP JP9993680A patent/JPS5726441A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5391665A (en) * | 1977-01-24 | 1978-08-11 | Hitachi Ltd | Plasma cvd device |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0167703A2 (en) * | 1984-06-29 | 1986-01-15 | International Business Machines Corporation | A method of homogeneous chemical vapour deposition |
US4919077A (en) * | 1986-12-27 | 1990-04-24 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor producing apparatus |
WO1993013552A1 (en) * | 1986-12-27 | 1993-07-08 | Masao Oda | Semiconductor fabricating unit |
US5021114A (en) * | 1987-07-20 | 1991-06-04 | Hitachi, Ltd. | Apparatus for treating material by using plasma |
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