JPS57193291A - Laser working device - Google Patents
Laser working deviceInfo
- Publication number
- JPS57193291A JPS57193291A JP56076663A JP7666381A JPS57193291A JP S57193291 A JPS57193291 A JP S57193291A JP 56076663 A JP56076663 A JP 56076663A JP 7666381 A JP7666381 A JP 7666381A JP S57193291 A JPS57193291 A JP S57193291A
- Authority
- JP
- Japan
- Prior art keywords
- laser light
- transmittance
- changing
- size
- laser oscillator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract 4
- 229910052757 nitrogen Inorganic materials 0.000 abstract 2
- 238000002834 transmittance Methods 0.000 abstract 2
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
Abstract
PURPOSE:To permit changing of power density and working area continuously over a wide range by providing means of changing the transmittance of the laser light oscillated from a laser oscillator and means of changing the beam diameter of the laser light. CONSTITUTION:A dye laser oscillator 3 is excited by the nitrogen laser light 2 from a nitrogen laser oscillator 1, and the oscillated dye laser light is bent by reflecting mirrors 5, 5' and is passed through a continuous transmittance-variable filter 6 and a beam expander 7. The transmittance is changed continuously by this filter 6, and the power density and working area of the working part are changed continuously by the expander 7. The beam is bent by a dichroic mirror 8 and is irradiated to a variable slit 9. Here, the laser light 4 is formed to a rectangular shape of an arbitrary size and is condensed and irradiated onto the work 12 by an objective lens 10 to the size of an inverse number of 10 times the lens, whereby the work is worked to exactly the same position and size of the projected image of the slit 9 by the reference light from a reference light source 13.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56076663A JPS57193291A (en) | 1981-05-22 | 1981-05-22 | Laser working device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56076663A JPS57193291A (en) | 1981-05-22 | 1981-05-22 | Laser working device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57193291A true JPS57193291A (en) | 1982-11-27 |
| JPS628277B2 JPS628277B2 (en) | 1987-02-21 |
Family
ID=13611645
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56076663A Granted JPS57193291A (en) | 1981-05-22 | 1981-05-22 | Laser working device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57193291A (en) |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6086833A (en) * | 1983-10-19 | 1985-05-16 | Hitachi Ltd | Method and apparatus for measuring depth of etching of semiconductor device |
| US4749840A (en) * | 1986-05-16 | 1988-06-07 | Image Micro Systems, Inc. | Intense laser irradiation using reflective optics |
| JPH03207587A (en) * | 1990-01-08 | 1991-09-10 | Mitsubishi Heavy Ind Ltd | Monitoring device for laser beam welding |
| US5708252A (en) * | 1986-09-26 | 1998-01-13 | Semiconductor Energy Laboratory Co., Ltd. | Excimer laser scanning system |
| US6149988A (en) * | 1986-09-26 | 2000-11-21 | Semiconductor Energy Laboratory Co., Ltd. | Method and system of laser processing |
| US6204099B1 (en) | 1995-02-21 | 2001-03-20 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6261856B1 (en) | 1987-09-16 | 2001-07-17 | Semiconductor Energy Laboratory Co., Ltd. | Method and system of laser processing |
| US6410374B1 (en) | 1992-12-26 | 2002-06-25 | Semiconductor Energy Laborartory Co., Ltd. | Method of crystallizing a semiconductor layer in a MIS transistor |
| US6475839B2 (en) | 1993-11-05 | 2002-11-05 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing of TFT device by backside laser irradiation |
| US6544825B1 (en) | 1992-12-26 | 2003-04-08 | Semiconductor Energy Laboratory Co., Ltd. | Method of fabricating a MIS transistor |
| US6638800B1 (en) | 1992-11-06 | 2003-10-28 | Semiconductor Energy Laboratory Co., Ltd. | Laser processing apparatus and laser processing process |
| WO2006129473A1 (en) * | 2005-06-01 | 2006-12-07 | Phoeton Corp. | Laser processing apparatus and laser processing method |
| JP2012091191A (en) * | 2010-10-26 | 2012-05-17 | Panasonic Electric Works Sunx Co Ltd | Laser beam machining apparatus |
| JP2013013905A (en) * | 2011-06-30 | 2013-01-24 | Panasonic Industrial Devices Sunx Co Ltd | Laser beam machining device |
| CN111781897A (en) * | 2020-07-14 | 2020-10-16 | 上海柏楚电子科技股份有限公司 | Machining control method, control device, machining control system, and storage medium |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55109588A (en) * | 1979-02-16 | 1980-08-23 | Hitachi Ltd | Laser working apparatus |
| JPS5647288A (en) * | 1979-09-28 | 1981-04-28 | Hitachi Ltd | Laser working apparatus |
-
1981
- 1981-05-22 JP JP56076663A patent/JPS57193291A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55109588A (en) * | 1979-02-16 | 1980-08-23 | Hitachi Ltd | Laser working apparatus |
| JPS5647288A (en) * | 1979-09-28 | 1981-04-28 | Hitachi Ltd | Laser working apparatus |
Cited By (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6086833A (en) * | 1983-10-19 | 1985-05-16 | Hitachi Ltd | Method and apparatus for measuring depth of etching of semiconductor device |
| US4749840A (en) * | 1986-05-16 | 1988-06-07 | Image Micro Systems, Inc. | Intense laser irradiation using reflective optics |
| US5708252A (en) * | 1986-09-26 | 1998-01-13 | Semiconductor Energy Laboratory Co., Ltd. | Excimer laser scanning system |
| US6149988A (en) * | 1986-09-26 | 2000-11-21 | Semiconductor Energy Laboratory Co., Ltd. | Method and system of laser processing |
| US6261856B1 (en) | 1987-09-16 | 2001-07-17 | Semiconductor Energy Laboratory Co., Ltd. | Method and system of laser processing |
| JPH03207587A (en) * | 1990-01-08 | 1991-09-10 | Mitsubishi Heavy Ind Ltd | Monitoring device for laser beam welding |
| US6638800B1 (en) | 1992-11-06 | 2003-10-28 | Semiconductor Energy Laboratory Co., Ltd. | Laser processing apparatus and laser processing process |
| US7179726B2 (en) | 1992-11-06 | 2007-02-20 | Semiconductor Energy Laboratory Co., Ltd. | Laser processing apparatus and laser processing process |
| US7799665B2 (en) | 1992-11-06 | 2010-09-21 | Semiconductor Energy Laboratory Co., Ltd. | Laser processing apparatus and laser processing process |
| US6410374B1 (en) | 1992-12-26 | 2002-06-25 | Semiconductor Energy Laborartory Co., Ltd. | Method of crystallizing a semiconductor layer in a MIS transistor |
| US6544825B1 (en) | 1992-12-26 | 2003-04-08 | Semiconductor Energy Laboratory Co., Ltd. | Method of fabricating a MIS transistor |
| US7351615B2 (en) | 1992-12-26 | 2008-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Method of fabricating a MIS transistor |
| US6475839B2 (en) | 1993-11-05 | 2002-11-05 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing of TFT device by backside laser irradiation |
| US6617612B2 (en) | 1993-11-05 | 2003-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and a semiconductor integrated circuit |
| US7045403B2 (en) | 1995-02-21 | 2006-05-16 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6265745B1 (en) | 1995-02-21 | 2001-07-24 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6921686B2 (en) | 1995-02-21 | 2005-07-26 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6709905B2 (en) | 1995-02-21 | 2004-03-23 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US7615423B2 (en) | 1995-02-21 | 2009-11-10 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6204099B1 (en) | 1995-02-21 | 2001-03-20 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| WO2006129473A1 (en) * | 2005-06-01 | 2006-12-07 | Phoeton Corp. | Laser processing apparatus and laser processing method |
| US8389894B2 (en) | 2005-06-01 | 2013-03-05 | Phoeton Corp. | Laser processing apparatus and laser processing method |
| JP2012091191A (en) * | 2010-10-26 | 2012-05-17 | Panasonic Electric Works Sunx Co Ltd | Laser beam machining apparatus |
| JP2013013905A (en) * | 2011-06-30 | 2013-01-24 | Panasonic Industrial Devices Sunx Co Ltd | Laser beam machining device |
| CN111781897A (en) * | 2020-07-14 | 2020-10-16 | 上海柏楚电子科技股份有限公司 | Machining control method, control device, machining control system, and storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS628277B2 (en) | 1987-02-21 |
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