JPS57185429A - Measuring device for shutter exposure time - Google Patents
Measuring device for shutter exposure timeInfo
- Publication number
- JPS57185429A JPS57185429A JP6930281A JP6930281A JPS57185429A JP S57185429 A JPS57185429 A JP S57185429A JP 6930281 A JP6930281 A JP 6930281A JP 6930281 A JP6930281 A JP 6930281A JP S57185429 A JPS57185429 A JP S57185429A
- Authority
- JP
- Japan
- Prior art keywords
- exposure time
- computer
- shutter
- drift
- receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013256 coordination polymer Substances 0.000 abstract 2
- 238000005070 sampling Methods 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B7/00—Control of exposure by setting shutters, diaphragms or filters, separately or conjointly
- G03B7/08—Control effected solely on the basis of the response, to the intensity of the light received by the camera, of a built-in light-sensitive device
- G03B7/091—Digital circuits
- G03B7/093—Digital circuits for control of exposure time
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Control Of Exposure In Printing And Copying (AREA)
- Exposure Control For Cameras (AREA)
Abstract
PURPOSE:To ensure the accurate measurement for shutter exposure time without receiving the effect of a drift, etc., by calculating the exposure time through the process of a computer in place of a comparator. CONSTITUTION:The shutter opening/closing waveform obtained by a photodetector PC is amplified up to a proper level through an amplifier AMP and then fed to an A/D converter ADC. This input signal is sampled synchronously with the clock pulse supplied from an oscillator OSC and then successively converted into the digital code to be supplied to a computer CP which functions as a storage arithmetic means. The computer CP stores the sample value corresponding to the sampling time and sets the reference value from the storage value. Then two sampling times corresponding to the two sample values equal to the reference value are obtained to calculate the exposure time. In such a way, the shutter exposure time can be measured with high accuracy and without receiving an effect of a drift, etc.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6930281A JPS57185429A (en) | 1981-05-11 | 1981-05-11 | Measuring device for shutter exposure time |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6930281A JPS57185429A (en) | 1981-05-11 | 1981-05-11 | Measuring device for shutter exposure time |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57185429A true JPS57185429A (en) | 1982-11-15 |
Family
ID=13398627
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6930281A Pending JPS57185429A (en) | 1981-05-11 | 1981-05-11 | Measuring device for shutter exposure time |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57185429A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4598575A (en) * | 1985-01-24 | 1986-07-08 | Tektronix, Inc. | Timer calibration method and apparatus |
-
1981
- 1981-05-11 JP JP6930281A patent/JPS57185429A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4598575A (en) * | 1985-01-24 | 1986-07-08 | Tektronix, Inc. | Timer calibration method and apparatus |
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