JPS57179705A - Method and device for measuring thickness of alloy plating - Google Patents
Method and device for measuring thickness of alloy platingInfo
- Publication number
- JPS57179705A JPS57179705A JP6586281A JP6586281A JPS57179705A JP S57179705 A JPS57179705 A JP S57179705A JP 6586281 A JP6586281 A JP 6586281A JP 6586281 A JP6586281 A JP 6586281A JP S57179705 A JPS57179705 A JP S57179705A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- fluorescent
- plating
- thickness
- radiated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007747 plating Methods 0.000 title abstract 6
- 239000000956 alloy Substances 0.000 title abstract 2
- 229910045601 alloy Inorganic materials 0.000 title abstract 2
- 238000000034 method Methods 0.000 title 1
- 229910052759 nickel Inorganic materials 0.000 abstract 3
- 229910052742 iron Inorganic materials 0.000 abstract 2
- 229910052725 zinc Inorganic materials 0.000 abstract 2
- QFTYEBTUFIFTHD-UHFFFAOYSA-N 1-[6,7-dimethoxy-1-[1-(6-methoxynaphthalen-2-yl)ethyl]-3,4-dihydro-1H-isoquinolin-2-yl]-2-piperidin-1-ylethanone Chemical compound C1=CC2=CC(OC)=CC=C2C=C1C(C)C(C1=CC(OC)=C(OC)C=C1CC1)N1C(=O)CN1CCCCC1 QFTYEBTUFIFTHD-UHFFFAOYSA-N 0.000 abstract 1
- 229910000831 Steel Inorganic materials 0.000 abstract 1
- 239000002131 composite material Substances 0.000 abstract 1
- 230000007423 decrease Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 abstract 1
- 239000010959 steel Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To make the accurate measurement of the thickness of alloy plating without contact possible by separating the fluorescent X-rays radiated secondarily by X-ray irradiation to those from the underlying metal and from the plating and measuring the intensities of the respective components. CONSTITUTION:When X-rays 13 are irradiated to a steel plate 2 applied with composite plating 3 of Ni and Zn, fluorescent X-rays 14 are radiated secondarily. Since the fluorescent X-rays are radiated from Fe, Ni, Zn respectively, Fe fluorescent X-rays 14a, and Ni fluorescent X-rays 14b are extracted through a filter 15 consisting of Fe and a filter 16 consisting of Ni. The outputs D1, D2 corresponding to the intensities of the respective fluorescent X-rays are obtained from the pulses P1, P2 from ionization boxes 17, 18 and are inputted to a CPU23. From the difference in these two signals, an Ni-content data is obtained, from which the data on the intensity of the Fe fluorescent X-rays is corrected. Since the intensity of the Fe fluorescent X-rays decreases with an increase in the thickness of the plating, the thickness of the plating is operated from this relation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6586281A JPS57179705A (en) | 1981-04-30 | 1981-04-30 | Method and device for measuring thickness of alloy plating |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6586281A JPS57179705A (en) | 1981-04-30 | 1981-04-30 | Method and device for measuring thickness of alloy plating |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57179705A true JPS57179705A (en) | 1982-11-05 |
Family
ID=13299234
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6586281A Pending JPS57179705A (en) | 1981-04-30 | 1981-04-30 | Method and device for measuring thickness of alloy plating |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57179705A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61139749A (en) * | 1984-12-12 | 1986-06-27 | Seiko Instr & Electronics Ltd | Alloy plating adhesion amount meter |
| JPS61283859A (en) * | 1985-06-08 | 1986-12-13 | Horiba Ltd | Detector for nickel and vanadium in oil |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57172207A (en) * | 1981-04-16 | 1982-10-23 | Seiko Instr & Electronics Ltd | Measuring method for plating thickness by x rays |
-
1981
- 1981-04-30 JP JP6586281A patent/JPS57179705A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57172207A (en) * | 1981-04-16 | 1982-10-23 | Seiko Instr & Electronics Ltd | Measuring method for plating thickness by x rays |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61139749A (en) * | 1984-12-12 | 1986-06-27 | Seiko Instr & Electronics Ltd | Alloy plating adhesion amount meter |
| JPS61283859A (en) * | 1985-06-08 | 1986-12-13 | Horiba Ltd | Detector for nickel and vanadium in oil |
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