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JPS57163878A - Test signal generating circuit for integrated circuit - Google Patents

Test signal generating circuit for integrated circuit

Info

Publication number
JPS57163878A
JPS57163878A JP57032470A JP3247082A JPS57163878A JP S57163878 A JPS57163878 A JP S57163878A JP 57032470 A JP57032470 A JP 57032470A JP 3247082 A JP3247082 A JP 3247082A JP S57163878 A JPS57163878 A JP S57163878A
Authority
JP
Japan
Prior art keywords
test
test signal
levels
generated
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57032470A
Other languages
Japanese (ja)
Other versions
JPH0320710B2 (en
Inventor
Tsuneo Funabashi
Hideo Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57032470A priority Critical patent/JPS57163878A/en
Publication of JPS57163878A publication Critical patent/JPS57163878A/en
Publication of JPH0320710B2 publication Critical patent/JPH0320710B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To evade malfunction due to a noise, etc., to an input terminal by generating a test signal only when a test instruction generated inside an LSI resides while a test mode specified for an input terminal is not used as the test signal as it is. CONSTITUTION:System specification is so determined that both input terminals 1 and 2 have not levels of logic 1 for normal operation. For the specification of a test mode, when the input terminals 1 and 2 are both held at the levels of logic 1 and a strobe signal C is supplied, information showing that signals from the input terminals 1 and 2 are both held at levels 1 is stored in a succeeding latch 7 and a test signal B has a level 1, thus specifying the test mode. In this way, only when the signals from the terminal 1 and 2 both have the levels 1 and a test command C is supplied, the test signal is generated and even if the test command C generated in an LSI erroneously during normal operation, no test signal is generated.
JP57032470A 1982-03-03 1982-03-03 Test signal generating circuit for integrated circuit Granted JPS57163878A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57032470A JPS57163878A (en) 1982-03-03 1982-03-03 Test signal generating circuit for integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57032470A JPS57163878A (en) 1982-03-03 1982-03-03 Test signal generating circuit for integrated circuit

Publications (2)

Publication Number Publication Date
JPS57163878A true JPS57163878A (en) 1982-10-08
JPH0320710B2 JPH0320710B2 (en) 1991-03-20

Family

ID=12359853

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57032470A Granted JPS57163878A (en) 1982-03-03 1982-03-03 Test signal generating circuit for integrated circuit

Country Status (1)

Country Link
JP (1) JPS57163878A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6525967B1 (en) 1995-02-10 2003-02-25 Micron Technology, Inc. Fast-sensing amplifier for flash memory
US6578124B1 (en) 1995-02-10 2003-06-10 Micron Technology, Inc. Serial command port method, circuit, and system including main and command clock generators to filter signals of less than a predetermined duration

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53121543A (en) * 1977-03-31 1978-10-24 Toshiba Corp Check circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53121543A (en) * 1977-03-31 1978-10-24 Toshiba Corp Check circuit

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6525967B1 (en) 1995-02-10 2003-02-25 Micron Technology, Inc. Fast-sensing amplifier for flash memory
US6578124B1 (en) 1995-02-10 2003-06-10 Micron Technology, Inc. Serial command port method, circuit, and system including main and command clock generators to filter signals of less than a predetermined duration
US6581146B1 (en) 1995-02-10 2003-06-17 Micron Technology, Inc. Serial command port method, circuit, and system including main and command clock generators to filter signals of less than a predetermined duration
US6744673B2 (en) 1995-02-10 2004-06-01 Micron Technology, Inc. Feedback biasing integrated circuit
US6914822B2 (en) 1995-02-10 2005-07-05 Micron Technology Inc. Read-biasing and amplifying system
US6996010B2 (en) 1995-02-10 2006-02-07 Micron Technology, Inc. Fast-sensing amplifier for flash memory

Also Published As

Publication number Publication date
JPH0320710B2 (en) 1991-03-20

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