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JPS57111444A - Ultrasonic flaw detecting method based on observation of waveform - Google Patents

Ultrasonic flaw detecting method based on observation of waveform

Info

Publication number
JPS57111444A
JPS57111444A JP55185188A JP18518880A JPS57111444A JP S57111444 A JPS57111444 A JP S57111444A JP 55185188 A JP55185188 A JP 55185188A JP 18518880 A JP18518880 A JP 18518880A JP S57111444 A JPS57111444 A JP S57111444A
Authority
JP
Japan
Prior art keywords
corner
ultrasonic
probe
wave
plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55185188A
Other languages
Japanese (ja)
Other versions
JPH0128340B2 (en
Inventor
Keizaburo Harumi
Noriaki Fujimori
Tetsuo Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimizu Construction Co Ltd
Original Assignee
Shimizu Construction Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimizu Construction Co Ltd filed Critical Shimizu Construction Co Ltd
Priority to JP55185188A priority Critical patent/JPS57111444A/en
Publication of JPS57111444A publication Critical patent/JPS57111444A/en
Publication of JPH0128340B2 publication Critical patent/JPH0128340B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
    • G01N29/075—Analysing solids by measuring propagation velocity or propagation time of acoustic waves by measuring or comparing phase angle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/056—Angular incidence, angular propagation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/267—Welds
    • G01N2291/2675—Seam, butt welding

Landscapes

  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To clearly discriminate a defect that forms a corner based on the difference of forms of the ultrasonic reflected wave, by applying the ultrasonic pulse given from a probe to the inspecting part and receiving the reflected wave from the insecting part by the probe. CONSTITUTION:For the high frequency wave forms of the ultrasonic waves reflected from a plane 8, i.e., an inspecting part and from a corner 9, it is found that a difference exists for the reflected waveform between diagrams (A) and (B) through an experiment carried out with an angle (refraction angle theta) with which the ultrasonic wave give from a probe 5 goes into a test material 10 used as a parameter. Accordingly whether the reflecting source has the plane 8 or the corner 9 can be known by observing the form of the ultrasonic reflected wave. In other words, a shift of phase of almost 180 deg. is detected in the plane 8 and the corner 9 by observing these high frequency waveforms. Thus whether or not a defect is caused at a corner part can be clearly discriminated from the difference of these high frequency waveforms.
JP55185188A 1980-12-29 1980-12-29 Ultrasonic flaw detecting method based on observation of waveform Granted JPS57111444A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55185188A JPS57111444A (en) 1980-12-29 1980-12-29 Ultrasonic flaw detecting method based on observation of waveform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55185188A JPS57111444A (en) 1980-12-29 1980-12-29 Ultrasonic flaw detecting method based on observation of waveform

Publications (2)

Publication Number Publication Date
JPS57111444A true JPS57111444A (en) 1982-07-10
JPH0128340B2 JPH0128340B2 (en) 1989-06-02

Family

ID=16166384

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55185188A Granted JPS57111444A (en) 1980-12-29 1980-12-29 Ultrasonic flaw detecting method based on observation of waveform

Country Status (1)

Country Link
JP (1) JPS57111444A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178322A (en) * 1983-03-30 1984-10-09 Akashi Seisakusho Co Ltd Method and apparatus for judging acoustic impedance

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53100283A (en) * 1977-02-15 1978-09-01 Japan National Railway Supersonic crack detecting digitized method for wheel axels

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53100283A (en) * 1977-02-15 1978-09-01 Japan National Railway Supersonic crack detecting digitized method for wheel axels

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178322A (en) * 1983-03-30 1984-10-09 Akashi Seisakusho Co Ltd Method and apparatus for judging acoustic impedance

Also Published As

Publication number Publication date
JPH0128340B2 (en) 1989-06-02

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