JPS57110672A - Etching method for germaninum - Google Patents
Etching method for germaninumInfo
- Publication number
- JPS57110672A JPS57110672A JP18727080A JP18727080A JPS57110672A JP S57110672 A JPS57110672 A JP S57110672A JP 18727080 A JP18727080 A JP 18727080A JP 18727080 A JP18727080 A JP 18727080A JP S57110672 A JPS57110672 A JP S57110672A
- Authority
- JP
- Japan
- Prior art keywords
- soln
- etching
- wafer
- h3po4
- diluted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02019—Chemical etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30604—Chemical etching
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Inorganic Chemistry (AREA)
- Organic Chemistry (AREA)
- ing And Chemical Polishing (AREA)
- Weting (AREA)
Abstract
PURPOSE:To enhance the work efficiency and to obtain a satisfactory etching state by using an etching soln. consisting of H3PO4 and H2O2. CONSTITUTION:An etching soln. is prepared by mixing H3PO4 with H2O2 having 31% concn. in H3PO4:H2O2=1,3. A germanium wafer to be etched to a mirror surface is immersed in the etching soln. The wafer is put in a holder made of quartz beforehand. In case of selective etching, makes of an oxide film, a resist or the like is formed. After finishing the etching, the soln. is diluted with a large quantity of water, and the wafer is dipped in an aqueous soln. of hydrogen peroxide for several sec. The soln. is diluted with a large quantity of water, and the wafer is washed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18727080A JPS5817264B2 (en) | 1980-12-29 | 1980-12-29 | Germanium etching method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18727080A JPS5817264B2 (en) | 1980-12-29 | 1980-12-29 | Germanium etching method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57110672A true JPS57110672A (en) | 1982-07-09 |
JPS5817264B2 JPS5817264B2 (en) | 1983-04-06 |
Family
ID=16203044
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18727080A Expired JPS5817264B2 (en) | 1980-12-29 | 1980-12-29 | Germanium etching method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5817264B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0669187A (en) * | 1992-06-04 | 1994-03-11 | Micron Technol Inc | Treatment method of semiconductor |
CN105937052A (en) * | 2016-06-20 | 2016-09-14 | 云南中科鑫圆晶体材料有限公司 | Method for removing blue drug mark on surface of monocrystalline germanium slice after acidic chemical corrosion |
-
1980
- 1980-12-29 JP JP18727080A patent/JPS5817264B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0669187A (en) * | 1992-06-04 | 1994-03-11 | Micron Technol Inc | Treatment method of semiconductor |
CN105937052A (en) * | 2016-06-20 | 2016-09-14 | 云南中科鑫圆晶体材料有限公司 | Method for removing blue drug mark on surface of monocrystalline germanium slice after acidic chemical corrosion |
Also Published As
Publication number | Publication date |
---|---|
JPS5817264B2 (en) | 1983-04-06 |
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