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JPS5684570A - Testing device for ic - Google Patents

Testing device for ic

Info

Publication number
JPS5684570A
JPS5684570A JP16212179A JP16212179A JPS5684570A JP S5684570 A JPS5684570 A JP S5684570A JP 16212179 A JP16212179 A JP 16212179A JP 16212179 A JP16212179 A JP 16212179A JP S5684570 A JPS5684570 A JP S5684570A
Authority
JP
Japan
Prior art keywords
operation circuit
tested
given
allowance
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16212179A
Other languages
Japanese (ja)
Inventor
Toshio Maruyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP16212179A priority Critical patent/JPS5684570A/en
Publication of JPS5684570A publication Critical patent/JPS5684570A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To test surely an element having a certain allowance by giving the output of the element to be tested to an operation circuit through a group of level determinating circuits and by comparing the result of operation with the pattern of expected value.
CONSTITUTION: To the operation circuit 7, data corresponding to the uper and lower limit values of allowance of an output value at that time are given from a pattern generator 1 in relation to an input value. Moreover, to the operation circuit 7 is also given an output obtained when an input is given to the element 2 to be tested, through the group 6 of the level determining circuits. The operation circuit 7 performs an operation to determine whether the element 2 to be tested is within the allowance or not, and the result of the operation is compared with the pattern of the expected value by a comparator 3, whereby the accord or discord thereof with the other is detected.
COPYRIGHT: (C)1981,JPO&Japio
JP16212179A 1979-12-12 1979-12-12 Testing device for ic Pending JPS5684570A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16212179A JPS5684570A (en) 1979-12-12 1979-12-12 Testing device for ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16212179A JPS5684570A (en) 1979-12-12 1979-12-12 Testing device for ic

Publications (1)

Publication Number Publication Date
JPS5684570A true JPS5684570A (en) 1981-07-09

Family

ID=15748430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16212179A Pending JPS5684570A (en) 1979-12-12 1979-12-12 Testing device for ic

Country Status (1)

Country Link
JP (1) JPS5684570A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174331A (en) * 1987-01-14 1988-07-18 Toshiba Corp Automatic control system for semiconductor production
JPH04110679A (en) * 1990-08-31 1992-04-13 Mitsubishi Electric Corp Semiconductor test device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4937748B1 (en) * 1970-08-20 1974-10-11

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4937748B1 (en) * 1970-08-20 1974-10-11

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174331A (en) * 1987-01-14 1988-07-18 Toshiba Corp Automatic control system for semiconductor production
JPH04110679A (en) * 1990-08-31 1992-04-13 Mitsubishi Electric Corp Semiconductor test device

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