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JPS5647723A - Rotation measuring method for light phase and plane of polarization - Google Patents

Rotation measuring method for light phase and plane of polarization

Info

Publication number
JPS5647723A
JPS5647723A JP12319379A JP12319379A JPS5647723A JP S5647723 A JPS5647723 A JP S5647723A JP 12319379 A JP12319379 A JP 12319379A JP 12319379 A JP12319379 A JP 12319379A JP S5647723 A JPS5647723 A JP S5647723A
Authority
JP
Japan
Prior art keywords
crystal
voltage
sample
modulation
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12319379A
Other languages
Japanese (ja)
Inventor
Kuniharu Takizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Broadcasting Corp
Original Assignee
Nippon Hoso Kyokai NHK
Japan Broadcasting Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Hoso Kyokai NHK, Japan Broadcasting Corp filed Critical Nippon Hoso Kyokai NHK
Priority to JP12319379A priority Critical patent/JPS5647723A/en
Publication of JPS5647723A publication Critical patent/JPS5647723A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • G01J4/04Polarimeters using electric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To lower applied voltage by a method wherein the half-wavelength voltage of a crystal as a sample is indirectly measured from a phase change which gives by the applied voltage of the crystal as the sample to the optical beams of modulation at 100% by the applied voltage of a crystal, which is easily modulated, except the crystal as the sample. CONSTITUTION:Laser rays from a laser light source L pass through a polarizer P, pass through a crystal M in substance, which has a great Pockels effect, such as lithium tantalate (LiTaO3) or lithium niobate (LiNbO3) or the like, and is branched by means of a beam splitter BS. Modulation at 100% is previously provided to passing light easily by applying voltage to the crystal M, whose half-wavelength voltage value is small, here, voltage, which largely differs from the applied voltage of the crystal M and has frequency which is easily discriminated, is slightly applied to a crystal S as a sample, a phase change of the light of modulation at 100% generated by application of the voltage is detected, and a half-wavelength is measured from the applied value and the quantity on the change.
JP12319379A 1979-09-27 1979-09-27 Rotation measuring method for light phase and plane of polarization Pending JPS5647723A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12319379A JPS5647723A (en) 1979-09-27 1979-09-27 Rotation measuring method for light phase and plane of polarization

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12319379A JPS5647723A (en) 1979-09-27 1979-09-27 Rotation measuring method for light phase and plane of polarization

Publications (1)

Publication Number Publication Date
JPS5647723A true JPS5647723A (en) 1981-04-30

Family

ID=14854487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12319379A Pending JPS5647723A (en) 1979-09-27 1979-09-27 Rotation measuring method for light phase and plane of polarization

Country Status (1)

Country Link
JP (1) JPS5647723A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0599181A2 (en) * 1992-11-20 1994-06-01 Matsushita Electric Industrial Co., Ltd. Voltage sensor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0599181A2 (en) * 1992-11-20 1994-06-01 Matsushita Electric Industrial Co., Ltd. Voltage sensor
EP0599181A3 (en) * 1992-11-20 1995-03-08 Matsushita Electric Ind Co Ltd Voltage sensor.
US5477134A (en) * 1992-11-20 1995-12-19 Matsushita Electric Industrial Co., Ltd. Voltage sensor for use in optical power transformer including a pair of Pockels cells

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