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JPS5641664A - Sample-introducing system for mass spectrometer - Google Patents

Sample-introducing system for mass spectrometer

Info

Publication number
JPS5641664A
JPS5641664A JP11617779A JP11617779A JPS5641664A JP S5641664 A JPS5641664 A JP S5641664A JP 11617779 A JP11617779 A JP 11617779A JP 11617779 A JP11617779 A JP 11617779A JP S5641664 A JPS5641664 A JP S5641664A
Authority
JP
Japan
Prior art keywords
probe
sample
ion
source room
introducing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11617779A
Other languages
Japanese (ja)
Other versions
JPS5829573B2 (en
Inventor
Sadao Takahashi
Tadao Mimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP54116177A priority Critical patent/JPS5829573B2/en
Publication of JPS5641664A publication Critical patent/JPS5641664A/en
Publication of JPS5829573B2 publication Critical patent/JPS5829573B2/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To obviate any damage to a sample-introducing probe of a mass spectrometer by detecting the location of the sample-introducing probe, and thereby maintaining a gate valve which seal an ion-source room opened while the probe is in the ion-source room. CONSTITUTION:A sample 10 is held in a sample holder 2, which is attached to the end of a sample-introducing probe 3, and is heated with a heater 11 with a heater 11 which is installed in an ion-source room 1, thereby an analysis being carried out. The probe 3 is provided with two grooves, 4a and 4b, which control the action of micro-switches, 5a and 5b, that are attached to a case 15 which guides the probe 3. The output signals that are given by the actions of the micro-switches cause a gate valve 7 which seals the probe-introducing hole of the ion-source room 1 to be shifted. Consequently, if the point of the probe 3 is in the ion-source room 1, the ion- source room can be automatically kept opened by the action of the valve 7. Therefore, any damage to the probe 3 can be definitely prevented.
JP54116177A 1979-09-12 1979-09-12 Mass spectrometer sample introduction device Expired JPS5829573B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54116177A JPS5829573B2 (en) 1979-09-12 1979-09-12 Mass spectrometer sample introduction device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54116177A JPS5829573B2 (en) 1979-09-12 1979-09-12 Mass spectrometer sample introduction device

Publications (2)

Publication Number Publication Date
JPS5641664A true JPS5641664A (en) 1981-04-18
JPS5829573B2 JPS5829573B2 (en) 1983-06-23

Family

ID=14680694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54116177A Expired JPS5829573B2 (en) 1979-09-12 1979-09-12 Mass spectrometer sample introduction device

Country Status (1)

Country Link
JP (1) JPS5829573B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6099772U (en) * 1983-12-14 1985-07-08 日本電子株式会社 Direct sample introduction device
JP2021178581A (en) * 2020-05-14 2021-11-18 日本プラスト株式会社 Wind direction adjustment device
CN114664638A (en) * 2022-03-31 2022-06-24 宁波大学 An ion source with enrichment function

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5825741U (en) * 1981-08-15 1983-02-18 関東自動車工業株式会社 Headrest storage device
JPS6052155U (en) * 1983-09-20 1985-04-12 プレス工業株式会社 Car roof storage

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6099772U (en) * 1983-12-14 1985-07-08 日本電子株式会社 Direct sample introduction device
JPS6348053Y2 (en) * 1983-12-14 1988-12-12
JP2021178581A (en) * 2020-05-14 2021-11-18 日本プラスト株式会社 Wind direction adjustment device
CN114664638A (en) * 2022-03-31 2022-06-24 宁波大学 An ion source with enrichment function

Also Published As

Publication number Publication date
JPS5829573B2 (en) 1983-06-23

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