[go: up one dir, main page]

JPS56148070A - Device for measuring characteristic of electric circuit - Google Patents

Device for measuring characteristic of electric circuit

Info

Publication number
JPS56148070A
JPS56148070A JP5247380A JP5247380A JPS56148070A JP S56148070 A JPS56148070 A JP S56148070A JP 5247380 A JP5247380 A JP 5247380A JP 5247380 A JP5247380 A JP 5247380A JP S56148070 A JPS56148070 A JP S56148070A
Authority
JP
Japan
Prior art keywords
voltage
diode
becomes
leakage current
resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5247380A
Other languages
Japanese (ja)
Other versions
JPS6026469B2 (en
Inventor
Hajime Horinouchi
Ryozo Fujiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP5247380A priority Critical patent/JPS6026469B2/en
Publication of JPS56148070A publication Critical patent/JPS56148070A/en
Publication of JPS6026469B2 publication Critical patent/JPS6026469B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To perform the measurement and the like of the characteristics of a diode which needs two power sources, i.e., a constant voltage power source and a constant current power source in a simple circuit constitution by employing two differential input type amplifiers comprising operation amplifiers as inverted type amplifiers. CONSTITUTION:When switches S1 and S2 are turned to a and a', a current value IF flowing in the diode under test 10 becomes -VIN/R7, and an output voltage VS from a voltage follower 2 becomes a forward voltage VF. When the switches S1 and S2 are turned to (b) and (b'), the voltage applied to the diode 10 becomes VR= -V1. A leakage current IR, which flows into a resistor 8, can be obtained by reading the voltage across the resistor 8 by using IR=VS/RS. Therefore, the voltage value to be applied to the diode 10 is defined by the input voltage value VIN in measuring the leakage current, and said leakage current IR can be readily measured by reading VS at this time.
JP5247380A 1980-04-21 1980-04-21 Characteristic measuring device for electric circuit elements Expired JPS6026469B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5247380A JPS6026469B2 (en) 1980-04-21 1980-04-21 Characteristic measuring device for electric circuit elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5247380A JPS6026469B2 (en) 1980-04-21 1980-04-21 Characteristic measuring device for electric circuit elements

Publications (2)

Publication Number Publication Date
JPS56148070A true JPS56148070A (en) 1981-11-17
JPS6026469B2 JPS6026469B2 (en) 1985-06-24

Family

ID=12915682

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5247380A Expired JPS6026469B2 (en) 1980-04-21 1980-04-21 Characteristic measuring device for electric circuit elements

Country Status (1)

Country Link
JP (1) JPS6026469B2 (en)

Also Published As

Publication number Publication date
JPS6026469B2 (en) 1985-06-24

Similar Documents

Publication Publication Date Title
ES458433A1 (en) Device for measuring at least one dimension of an object and a method of operating said device
JPS56128433A (en) Detecting apparatus of temperature
JPS5551361A (en) Range switching device for electric measuring instrument
JPS55108019A (en) Reference voltage generator
JPS56148070A (en) Device for measuring characteristic of electric circuit
JPS55110961A (en) Capacity measuring apparatus
FR2314502A1 (en) Electrical leakage measurement apparatus - applies high voltage across component and measures current using opto-electronic threshold detection circuit
JPS5644862A (en) Constant voltage constant electric current supply test device
US4968890A (en) Charged particle beam-dosimeter
JPS56107170A (en) Condenser electrostatic capacity measurement device
JPS573019A (en) Burn-out detector for resistance thermometer
JPS56148069A (en) Measuring device for characteristic of element in electric circuit
JPS5451757A (en) Signal generator
JPS6412724A (en) Digital/analog converter
JPS5651609A (en) Input circuit
JPS57206984A (en) Absolute value circuit
SU708270A1 (en) Arrangement for registering electric values
JPS5786917A (en) Direct-current stabilized power source device
JPS52102659A (en) Differential amplifier
SU1287019A1 (en) Device for measuring currents
JPS5574472A (en) Device for measuring conductivity of fluid
JPS576369A (en) Constant power load tester
JPS56165409A (en) Voltage-to-current converting circuit
JPS5669526A (en) Spectrometer
JPS57116467A (en) Original detector