JPS56142533A - Automatic photographic mask testing device - Google Patents
Automatic photographic mask testing deviceInfo
- Publication number
- JPS56142533A JPS56142533A JP14373880A JP14373880A JPS56142533A JP S56142533 A JPS56142533 A JP S56142533A JP 14373880 A JP14373880 A JP 14373880A JP 14373880 A JP14373880 A JP 14373880A JP S56142533 A JPS56142533 A JP S56142533A
- Authority
- JP
- Japan
- Prior art keywords
- testing device
- automatic photographic
- photographic mask
- mask testing
- automatic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
- G03F1/84—Inspecting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DD21623879A DD146500A1 (en) | 1979-10-16 | 1979-10-16 | ARRANGEMENT FOR AUTOMATIC TESTING OF PHOTOMASKS |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56142533A true JPS56142533A (en) | 1981-11-06 |
Family
ID=5520612
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14373880A Pending JPS56142533A (en) | 1979-10-16 | 1980-10-16 | Automatic photographic mask testing device |
Country Status (6)
Country | Link |
---|---|
JP (1) | JPS56142533A (en) |
DD (1) | DD146500A1 (en) |
DE (1) | DE3037467A1 (en) |
FR (1) | FR2468100A1 (en) |
GB (1) | GB2060876B (en) |
SU (1) | SU1142733A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58204346A (en) * | 1982-05-24 | 1983-11-29 | Nippon Jido Seigyo Kk | Defect inspection device for pattern |
JPH05142754A (en) * | 1991-11-21 | 1993-06-11 | Sharp Corp | Inspecting method for phase shift mask |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3274015D1 (en) * | 1981-07-14 | 1986-12-04 | Hitachi Ltd | Pattern detection system |
WO2005026706A1 (en) * | 2003-09-04 | 2005-03-24 | Applied Materials Israel, Ltd. | Method for high efficiency multipass article inspection |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5265671A (en) * | 1975-11-26 | 1977-05-31 | Nippon Jidoseigyo Ltd | Apparatus for testing defects in pattern |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5419664A (en) * | 1977-07-15 | 1979-02-14 | Nippon Jidoseigyo Ltd | Device for inspecting fault of pattern |
-
1979
- 1979-10-16 DD DD21623879A patent/DD146500A1/en not_active IP Right Cessation
-
1980
- 1980-09-22 SU SU807771388A patent/SU1142733A1/en active
- 1980-10-03 DE DE19803037467 patent/DE3037467A1/en not_active Withdrawn
- 1980-10-10 FR FR8021700A patent/FR2468100A1/en active Granted
- 1980-10-16 JP JP14373880A patent/JPS56142533A/en active Pending
- 1980-10-16 GB GB8033396A patent/GB2060876B/en not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5265671A (en) * | 1975-11-26 | 1977-05-31 | Nippon Jidoseigyo Ltd | Apparatus for testing defects in pattern |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58204346A (en) * | 1982-05-24 | 1983-11-29 | Nippon Jido Seigyo Kk | Defect inspection device for pattern |
JPH05142754A (en) * | 1991-11-21 | 1993-06-11 | Sharp Corp | Inspecting method for phase shift mask |
Also Published As
Publication number | Publication date |
---|---|
DD146500A1 (en) | 1981-02-11 |
FR2468100A1 (en) | 1981-04-30 |
GB2060876B (en) | 1983-12-21 |
GB2060876A (en) | 1981-05-07 |
FR2468100B1 (en) | 1984-02-24 |
DE3037467A1 (en) | 1981-04-30 |
SU1142733A1 (en) | 1985-02-28 |
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