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JPS56138268A - Radial fault photographing equipment for positron - Google Patents

Radial fault photographing equipment for positron

Info

Publication number
JPS56138268A
JPS56138268A JP4189580A JP4189580A JPS56138268A JP S56138268 A JPS56138268 A JP S56138268A JP 4189580 A JP4189580 A JP 4189580A JP 4189580 A JP4189580 A JP 4189580A JP S56138268 A JPS56138268 A JP S56138268A
Authority
JP
Japan
Prior art keywords
photographed
detector
radiation detectors
move
positron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4189580A
Other languages
Japanese (ja)
Inventor
Tsunekazu Matsuyama
Masahiro Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP4189580A priority Critical patent/JPS56138268A/en
Publication of JPS56138268A publication Critical patent/JPS56138268A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Nuclear Medicine (AREA)

Abstract

PURPOSE:To decrease the number of radiation detectors to be used, by moving one pair of radiation detectors which have been opposed, onto the circumference surrounding the physical axis of an object to be photographed, so that each of them can make an independent movement. CONSTITUTION:One pair of radiation detectors 1, 2 which have been opposed are mounted to the moving frames 3, 4, respectively. These frames 3, 4 are formed so that each of them can move independently on the rail making a circumference surrounding the physical axis of an object to be photographed 6. And, the detector 1 is stopped at one point, and the detector 2 is made to move on the circumference so as to cover the object to be photographed 6. Subsequently, the detector 1 is stopped after making it move a little, and once again the detector 2 is made to move so as to cover the object to be photographed 6. When it is repeated and the detector 1 is rotated continuously, it is possible to obtain a data in the same way as the case a number of radiation detectors have been arrayed on the whole circumference surrounding the object to be photographed 6.
JP4189580A 1980-03-31 1980-03-31 Radial fault photographing equipment for positron Pending JPS56138268A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4189580A JPS56138268A (en) 1980-03-31 1980-03-31 Radial fault photographing equipment for positron

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4189580A JPS56138268A (en) 1980-03-31 1980-03-31 Radial fault photographing equipment for positron

Publications (1)

Publication Number Publication Date
JPS56138268A true JPS56138268A (en) 1981-10-28

Family

ID=12621014

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4189580A Pending JPS56138268A (en) 1980-03-31 1980-03-31 Radial fault photographing equipment for positron

Country Status (1)

Country Link
JP (1) JPS56138268A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60237383A (en) * 1984-05-10 1985-11-26 Toshiba Corp Ring type ect apparatus
WO2007054837A2 (en) * 2005-05-31 2007-05-18 Ge Homeland Proctection, Inc. Gantry for housing an x-ray source and method of examining an item for examination by means of x-radiation
WO2009084581A1 (en) * 2007-12-27 2009-07-09 Omron Corporation X-ray examining apparatus and x-ray examining method
JP2009156855A (en) * 2008-03-14 2009-07-16 Omron Corp X-ray inspection device and method
JP2009156788A (en) * 2007-12-27 2009-07-16 Omron Corp X-ray inspection device and method
KR100916237B1 (en) * 2002-06-28 2009-09-10 주식회사 포스코 3D Measurement System of Hopper Using Radiation
CN105813570A (en) * 2013-12-20 2016-07-27 通用电气公司 Imaging system using independently controllable detectors

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60237383A (en) * 1984-05-10 1985-11-26 Toshiba Corp Ring type ect apparatus
KR100916237B1 (en) * 2002-06-28 2009-09-10 주식회사 포스코 3D Measurement System of Hopper Using Radiation
WO2007054837A2 (en) * 2005-05-31 2007-05-18 Ge Homeland Proctection, Inc. Gantry for housing an x-ray source and method of examining an item for examination by means of x-radiation
WO2007054837A3 (en) * 2005-05-31 2007-10-04 Ge Homeland Proctection Inc Gantry for housing an x-ray source and method of examining an item for examination by means of x-radiation
WO2009084581A1 (en) * 2007-12-27 2009-07-09 Omron Corporation X-ray examining apparatus and x-ray examining method
JP2009156788A (en) * 2007-12-27 2009-07-16 Omron Corp X-ray inspection device and method
US8391581B2 (en) 2007-12-27 2013-03-05 Omron Corporation X-ray inspecting apparatus and X-ray inspecting method
JP2009156855A (en) * 2008-03-14 2009-07-16 Omron Corp X-ray inspection device and method
CN105813570A (en) * 2013-12-20 2016-07-27 通用电气公司 Imaging system using independently controllable detectors

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