JPS56138224A - Spectroscope using concave surface diffraction grating - Google Patents
Spectroscope using concave surface diffraction gratingInfo
- Publication number
- JPS56138224A JPS56138224A JP4242480A JP4242480A JPS56138224A JP S56138224 A JPS56138224 A JP S56138224A JP 4242480 A JP4242480 A JP 4242480A JP 4242480 A JP4242480 A JP 4242480A JP S56138224 A JPS56138224 A JP S56138224A
- Authority
- JP
- Japan
- Prior art keywords
- diffraction grating
- concave surface
- backward
- scanning
- spectroscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/06—Scanning arrangements arrangements for order-selection
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
PURPOSE:To make it possible to execute the wavelength scanning with higher accuracy, by constituting so that a rotary axis of the diffraction grating can move forward and backward against the line connecting the incident and emitting slits, and making it move finely so as to satisfy the prescribed condition by being interlocked with the wavelength scanning. CONSTITUTION:In a simple rotation concave surface diffraction grating spectroscope, the concave surface diffraction grating 1 is fixed to the pin 9 which has been fitted into the fixed guide 8. When a screw shaft 4 is rotated, a nut which is spirally fitted into the screw shaft 4 is moved, and a bar 6 which is fixed to the nut 7 so as to freely rotate is rotated around a rotary axis 5 of the diffraction grating 1, and simultaneously is moved forward and backward. The diffraction grating 1 is interlocked with rotation by the sine bar mechanism, and finely moves forward and backward around both the ends of the scanning wavelength area, and in the center area, respectively. Accordingly, the wavelength scanning of high accuracy can be executed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4242480A JPS56138224A (en) | 1980-03-31 | 1980-03-31 | Spectroscope using concave surface diffraction grating |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4242480A JPS56138224A (en) | 1980-03-31 | 1980-03-31 | Spectroscope using concave surface diffraction grating |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56138224A true JPS56138224A (en) | 1981-10-28 |
JPS6330567B2 JPS6330567B2 (en) | 1988-06-20 |
Family
ID=12635672
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4242480A Granted JPS56138224A (en) | 1980-03-31 | 1980-03-31 | Spectroscope using concave surface diffraction grating |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56138224A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4613233A (en) * | 1983-03-02 | 1986-09-23 | U.S. Philips Corporation | Sine bar mechanism and monochromator and spectrophotometer including such a sine bar mechanism |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53135350A (en) * | 1977-04-30 | 1978-11-25 | Hitachi Ltd | Recess diffraction grating monochromatic meter |
-
1980
- 1980-03-31 JP JP4242480A patent/JPS56138224A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53135350A (en) * | 1977-04-30 | 1978-11-25 | Hitachi Ltd | Recess diffraction grating monochromatic meter |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4613233A (en) * | 1983-03-02 | 1986-09-23 | U.S. Philips Corporation | Sine bar mechanism and monochromator and spectrophotometer including such a sine bar mechanism |
Also Published As
Publication number | Publication date |
---|---|
JPS6330567B2 (en) | 1988-06-20 |
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