JPS56134590A - Manufacture of highly nonstatic ammonium nitrate oil explosive - Google Patents
Manufacture of highly nonstatic ammonium nitrate oil explosiveInfo
- Publication number
- JPS56134590A JPS56134590A JP3540380A JP3540380A JPS56134590A JP S56134590 A JPS56134590 A JP S56134590A JP 3540380 A JP3540380 A JP 3540380A JP 3540380 A JP3540380 A JP 3540380A JP S56134590 A JPS56134590 A JP S56134590A
- Authority
- JP
- Japan
- Prior art keywords
- nonstatic
- highly
- manufacture
- ammonium nitrate
- oil explosive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3540380A JPS56134590A (en) | 1980-03-18 | 1980-03-18 | Manufacture of highly nonstatic ammonium nitrate oil explosive |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3540380A JPS56134590A (en) | 1980-03-18 | 1980-03-18 | Manufacture of highly nonstatic ammonium nitrate oil explosive |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56134590A true JPS56134590A (en) | 1981-10-21 |
JPS6251235B2 JPS6251235B2 (en) | 1987-10-29 |
Family
ID=12440934
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3540380A Granted JPS56134590A (en) | 1980-03-18 | 1980-03-18 | Manufacture of highly nonstatic ammonium nitrate oil explosive |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56134590A (en) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6380751B2 (en) | 1992-06-11 | 2002-04-30 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
US5345170A (en) | 1992-06-11 | 1994-09-06 | Cascade Microtech, Inc. | Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
US5561377A (en) | 1995-04-14 | 1996-10-01 | Cascade Microtech, Inc. | System for evaluating probing networks |
US6232789B1 (en) | 1997-05-28 | 2001-05-15 | Cascade Microtech, Inc. | Probe holder for low current measurements |
US5914613A (en) | 1996-08-08 | 1999-06-22 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
US6002263A (en) | 1997-06-06 | 1999-12-14 | Cascade Microtech, Inc. | Probe station having inner and outer shielding |
US6578264B1 (en) | 1999-06-04 | 2003-06-17 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
US6445202B1 (en) | 1999-06-30 | 2002-09-03 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
US6838890B2 (en) | 2000-02-25 | 2005-01-04 | Cascade Microtech, Inc. | Membrane probing system |
US6965226B2 (en) | 2000-09-05 | 2005-11-15 | Cascade Microtech, Inc. | Chuck for holding a device under test |
US6914423B2 (en) | 2000-09-05 | 2005-07-05 | Cascade Microtech, Inc. | Probe station |
DE10143173A1 (en) | 2000-12-04 | 2002-06-06 | Cascade Microtech Inc | Wafer probe has contact finger array with impedance matching network suitable for wide band |
US6777964B2 (en) | 2002-01-25 | 2004-08-17 | Cascade Microtech, Inc. | Probe station |
EP1509776A4 (en) | 2002-05-23 | 2010-08-18 | Cascade Microtech Inc | TEST PROBE OF A DEVICE SUBMITTED TEST |
US6847219B1 (en) | 2002-11-08 | 2005-01-25 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
US6724205B1 (en) | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
US7250779B2 (en) | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
US6861856B2 (en) | 2002-12-13 | 2005-03-01 | Cascade Microtech, Inc. | Guarded tub enclosure |
US7221172B2 (en) | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
WO2006017078A2 (en) | 2004-07-07 | 2006-02-16 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
EP1754072A2 (en) | 2004-06-07 | 2007-02-21 | CASCADE MICROTECH, INC. (an Oregon corporation) | Thermal optical chuck |
US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
DE202005021435U1 (en) | 2004-09-13 | 2008-02-28 | Cascade Microtech, Inc., Beaverton | Double-sided test setups |
US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
WO2006137979A2 (en) | 2005-06-13 | 2006-12-28 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
DE202007018733U1 (en) | 2006-06-09 | 2009-03-26 | Cascade Microtech, Inc., Beaverton | Transducer for differential signals with integrated balun |
US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
-
1980
- 1980-03-18 JP JP3540380A patent/JPS56134590A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6251235B2 (en) | 1987-10-29 |
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