JPS56125845A - Formation of pattern - Google Patents
Formation of patternInfo
- Publication number
- JPS56125845A JPS56125845A JP3017280A JP3017280A JPS56125845A JP S56125845 A JPS56125845 A JP S56125845A JP 3017280 A JP3017280 A JP 3017280A JP 3017280 A JP3017280 A JP 3017280A JP S56125845 A JPS56125845 A JP S56125845A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- amorphous chalcogenide
- ion
- metal
- injected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0042—Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists
- G03F7/0044—Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists involving an interaction between the metallic and non-metallic component, e.g. photodope systems
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Drying Of Semiconductors (AREA)
- Weting (AREA)
Abstract
PURPOSE:To form an amorphous chalcogenide pattern by a simple process by a method wherein a metal is ion-injected for a desired pattern into the amorphous chalcogenide layer formed on a substrate, and a non-injected region is removed by etching. CONSTITUTION:After the amorphous chalcogenide layer 13 comprising a binary system of Se-Ge, As-Se or ternary system of As-Se-Ge or the like is formed on the substrate 11 by a vacuum depositing method, ion-beams 14 of metal such as Ag are radiated to the desired pattern to form an Ag injected region 15, and then, a non- injection region 13 is removed by a solution etching treatment with an alkaline solution or by a plasma etching with a gas of fluorine system to form the desired amorphous chalcogenide pattern 15. Whereby since a difference is formed in chemical corrosion resistance only by the metal ion-beams radiation, the process for forming the pattern is made simple to the extreme.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3017280A JPS56125845A (en) | 1980-03-10 | 1980-03-10 | Formation of pattern |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3017280A JPS56125845A (en) | 1980-03-10 | 1980-03-10 | Formation of pattern |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56125845A true JPS56125845A (en) | 1981-10-02 |
Family
ID=12296326
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3017280A Pending JPS56125845A (en) | 1980-03-10 | 1980-03-10 | Formation of pattern |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56125845A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6022321A (en) * | 1983-07-18 | 1985-02-04 | Mitsubishi Electric Corp | Formation of mask pattern for x-ray exposure |
| US6831019B1 (en) * | 2002-08-29 | 2004-12-14 | Micron Technology, Inc. | Plasma etching methods and methods of forming memory devices comprising a chalcogenide comprising layer received operably proximate conductive electrodes |
-
1980
- 1980-03-10 JP JP3017280A patent/JPS56125845A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6022321A (en) * | 1983-07-18 | 1985-02-04 | Mitsubishi Electric Corp | Formation of mask pattern for x-ray exposure |
| US6831019B1 (en) * | 2002-08-29 | 2004-12-14 | Micron Technology, Inc. | Plasma etching methods and methods of forming memory devices comprising a chalcogenide comprising layer received operably proximate conductive electrodes |
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