JPS56112616A - Spectroscope with concave diffraction grating - Google Patents
Spectroscope with concave diffraction gratingInfo
- Publication number
- JPS56112616A JPS56112616A JP1630580A JP1630580A JPS56112616A JP S56112616 A JPS56112616 A JP S56112616A JP 1630580 A JP1630580 A JP 1630580A JP 1630580 A JP1630580 A JP 1630580A JP S56112616 A JPS56112616 A JP S56112616A
- Authority
- JP
- Japan
- Prior art keywords
- grating
- diffraction grating
- concave diffraction
- exposure
- center
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000004075 alteration Effects 0.000 abstract 1
- 238000001093 holography Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Abstract
PURPOSE:To reduce aberration in the scanning range of wavelength as a whole by setting properly the central position of grating and the positional relation of a light incidence slit with a light emission slit. CONSTITUTION:As the condition of exposure is used the concave diffraction grating prepared by setting the 1st light source for exposure in the vicinity of the center Q of curvature of the concave diffraction grating, by setting the 2nd light source 2 for exposure on the lateral side of the 1st light source separated at a distance of the radius of curvature of the grating approximately from the center Q thereof and by using holography. The incidence slit SI and the emission slit SO are arranged in two positions the angular distance between which is smaller than that between the 1st and 2nd light sources for exposure in relation to the center Q of the grating and whose distances from the center Q approximate to the radius of curvature of the grating. The central position Q of the concave diffraction grating is fixed, and around the position Q as an axis the concave diffraction grating is rotated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1630580A JPS56112616A (en) | 1980-02-12 | 1980-02-12 | Spectroscope with concave diffraction grating |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1630580A JPS56112616A (en) | 1980-02-12 | 1980-02-12 | Spectroscope with concave diffraction grating |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56112616A true JPS56112616A (en) | 1981-09-05 |
JPS634126B2 JPS634126B2 (en) | 1988-01-27 |
Family
ID=11912818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1630580A Granted JPS56112616A (en) | 1980-02-12 | 1980-02-12 | Spectroscope with concave diffraction grating |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56112616A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6392907A (en) * | 1986-10-07 | 1988-04-23 | Matsushita Electric Ind Co Ltd | Optical multiplexer/demultiplexer |
JPS63289427A (en) * | 1987-03-31 | 1988-11-25 | Shimadzu Corp | Concave diffraction grating spectroscope |
JPH01144832U (en) * | 1988-03-29 | 1989-10-04 | ||
JPH0617199U (en) * | 1991-09-19 | 1994-03-04 | 森川産業株式会社 | X-ray transmission inspection device |
-
1980
- 1980-02-12 JP JP1630580A patent/JPS56112616A/en active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6392907A (en) * | 1986-10-07 | 1988-04-23 | Matsushita Electric Ind Co Ltd | Optical multiplexer/demultiplexer |
JPS63289427A (en) * | 1987-03-31 | 1988-11-25 | Shimadzu Corp | Concave diffraction grating spectroscope |
JPH01144832U (en) * | 1988-03-29 | 1989-10-04 | ||
JPH0617199U (en) * | 1991-09-19 | 1994-03-04 | 森川産業株式会社 | X-ray transmission inspection device |
Also Published As
Publication number | Publication date |
---|---|
JPS634126B2 (en) | 1988-01-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees | ||
R154 | Certificate of patent or utility model (reissue) |
Free format text: JAPANESE INTERMEDIATE CODE: R154 |