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JPS5568672A - Fabrication of semiconductor device - Google Patents

Fabrication of semiconductor device

Info

Publication number
JPS5568672A
JPS5568672A JP14273878A JP14273878A JPS5568672A JP S5568672 A JPS5568672 A JP S5568672A JP 14273878 A JP14273878 A JP 14273878A JP 14273878 A JP14273878 A JP 14273878A JP S5568672 A JPS5568672 A JP S5568672A
Authority
JP
Japan
Prior art keywords
region
substrate
type
film
diffused
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14273878A
Other languages
Japanese (ja)
Inventor
Isao Taguchi
Shigeaki Yamashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP14273878A priority Critical patent/JPS5568672A/en
Publication of JPS5568672A publication Critical patent/JPS5568672A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D18/00Thyristors
    • H10D18/01Manufacture or treatment
    • H10D18/031Manufacture or treatment of lateral or planar thyristors

Landscapes

  • Thyristors (AREA)

Abstract

PURPOSE:To reduce the ON voltage and trigger current of a thyristor while shortening the step of fabricating a semiconductor device by similarly diffusing opposite conductivity layers on both front and back surfaces of a one-conductivity semiconductor substrate and etching to remove one layer until the surface becomes predetermined impurity density. CONSTITUTION:SiO2 films 10, 11 are coated on both front and back surfaces of an n-type silicon substrate 1, openings 12, 13 are perforated on both ends thereof, and p-type impurity is diffused thereat to thereby form a p-type isolation region 4 in the substrate 1. Then, an opening 14 is perforated at the surface film 10, the back film 11 is removed, the p-type impurity is diffused thereat, a p-type gate region 2 is formed in the substrate 1 exposed with the opening 14, and a p-type anode region 3 is simultaneously formed on the back surface of the substrate 1 to thereby connect the region 3 to the region 4. Then, the film 10 is removed, the surface of the exposed substrate 1 is polished, the region 2 is formed thinner than the region 3 by t1-t2 so as to set the surface impurity density to predetermined value. Then, the entire surface is coated by a SiO2 film 9, an opening 15 is perforated, and an n-type cathode region 5 is diffused in the region 2.
JP14273878A 1978-11-18 1978-11-18 Fabrication of semiconductor device Pending JPS5568672A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14273878A JPS5568672A (en) 1978-11-18 1978-11-18 Fabrication of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14273878A JPS5568672A (en) 1978-11-18 1978-11-18 Fabrication of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5568672A true JPS5568672A (en) 1980-05-23

Family

ID=15322424

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14273878A Pending JPS5568672A (en) 1978-11-18 1978-11-18 Fabrication of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5568672A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006073710A (en) * 2004-09-01 2006-03-16 Sanken Electric Co Ltd Semiconductor device and manufacturing method of semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006073710A (en) * 2004-09-01 2006-03-16 Sanken Electric Co Ltd Semiconductor device and manufacturing method of semiconductor device

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