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JPS55159556A - Mass analyzer - Google Patents

Mass analyzer

Info

Publication number
JPS55159556A
JPS55159556A JP6767779A JP6767779A JPS55159556A JP S55159556 A JPS55159556 A JP S55159556A JP 6767779 A JP6767779 A JP 6767779A JP 6767779 A JP6767779 A JP 6767779A JP S55159556 A JPS55159556 A JP S55159556A
Authority
JP
Japan
Prior art keywords
face
electric field
converged
mass
field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6767779A
Other languages
Japanese (ja)
Inventor
Munehiro Naitou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP6767779A priority Critical patent/JPS55159556A/en
Publication of JPS55159556A publication Critical patent/JPS55159556A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To eliminate the influence due to overlapped field in the proximity of border between magnetic and electric fields, by departing the electric field from the magnetic field without sacrifice of the convergency of uniform electric field. CONSTITUTION:An ion beam I is converged through a lens 2 and injected vertically through point O on end face alpha of magnetic field B. In the magnetic field B the ion is rotated with radius corresponding to the number of mass and dispersed, then it is forcused and projected in parallel from end face beta. Then it enters into an electric field E crossing perpendicularly with the beam. Thereafter the ions I1-I3 separated in accordance with the number of mass and projected in parallel from end face beta move parabolically under uniform electric field E to be converged on end face S. Said converged ion beam is caught and detected by a collector C through a collector slit CS arranged on the end face S. When sweeping the strength of the electric field E properly, mass specter can be obtained on the collector C.
JP6767779A 1979-05-31 1979-05-31 Mass analyzer Pending JPS55159556A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6767779A JPS55159556A (en) 1979-05-31 1979-05-31 Mass analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6767779A JPS55159556A (en) 1979-05-31 1979-05-31 Mass analyzer

Publications (1)

Publication Number Publication Date
JPS55159556A true JPS55159556A (en) 1980-12-11

Family

ID=13351858

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6767779A Pending JPS55159556A (en) 1979-05-31 1979-05-31 Mass analyzer

Country Status (1)

Country Link
JP (1) JPS55159556A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6113543A (en) * 1984-06-27 1986-01-21 Shimadzu Corp Analysis tube for helium leak detector
JPH03504780A (en) * 1988-06-01 1991-10-17 マイクロマス・リミテッド variable dispersion mass spectrometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6113543A (en) * 1984-06-27 1986-01-21 Shimadzu Corp Analysis tube for helium leak detector
JPH03504780A (en) * 1988-06-01 1991-10-17 マイクロマス・リミテッド variable dispersion mass spectrometer

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