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JPS55155204A - Measuring instrument for thickness of film - Google Patents

Measuring instrument for thickness of film

Info

Publication number
JPS55155204A
JPS55155204A JP6258079A JP6258079A JPS55155204A JP S55155204 A JPS55155204 A JP S55155204A JP 6258079 A JP6258079 A JP 6258079A JP 6258079 A JP6258079 A JP 6258079A JP S55155204 A JPS55155204 A JP S55155204A
Authority
JP
Japan
Prior art keywords
film
thickness
light
probe
measuring instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6258079A
Other languages
Japanese (ja)
Inventor
Koichi Suzuki
Kiyoshi Yokomori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP6258079A priority Critical patent/JPS55155204A/en
Publication of JPS55155204A publication Critical patent/JPS55155204A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE: To continuously measure the thickness of a film without bringing a measuring instrument into contact therewith, by measuring the quantity of light reflected on upper and lower surfaces of the film with photoelectric displacement meters, and applying outputs from the displacement meters to an operator to calculate the thickness of the film on the basis of the difference between the outputs from the displacement meters.
CONSTITUTION: The first displacement meter 1 consists of a probe P1 composed of a bundle of optical fibers, a light source L1, a filter F1 adapted to permeate therethrough the light of a wave- length reflected on an absorption region of a film C on a block B, a light-receiving element D1, and an amplifier A1 an output l1 from which corresponds to a distance between the probe P1 and an upper surface of the film C. The second displacement meter 2 also consists of a probe P2, a light source L2, a filter F2 adapted to permeate therethrough the light of a wave-length reflected on a transparent region of the film C, a light-receiving element D2, and an amplifier A2 an output l2 from which corresponds to a distance between the probe P2 and a lower surface of the film C. The thickness of the film is calculated in an operator 3 by using a calibration value on the basis of a difference between the outputs l1, l2. Thus, the thickness of a film can be continuously measured without bringing a measuring instrument into contact therewith.
COPYRIGHT: (C)1980,JPO&Japio
JP6258079A 1979-05-23 1979-05-23 Measuring instrument for thickness of film Pending JPS55155204A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6258079A JPS55155204A (en) 1979-05-23 1979-05-23 Measuring instrument for thickness of film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6258079A JPS55155204A (en) 1979-05-23 1979-05-23 Measuring instrument for thickness of film

Publications (1)

Publication Number Publication Date
JPS55155204A true JPS55155204A (en) 1980-12-03

Family

ID=13204388

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6258079A Pending JPS55155204A (en) 1979-05-23 1979-05-23 Measuring instrument for thickness of film

Country Status (1)

Country Link
JP (1) JPS55155204A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5392123A (en) * 1991-09-06 1995-02-21 Eastman Kodak Company Optical monitor for measuring a gap between two rollers
US5581351A (en) * 1994-02-22 1996-12-03 Eastman Kodak Company Optical monitor for measuring thermal expansion of a rotating roller
EP1069401A1 (en) * 1999-07-13 2001-01-17 ODME International B.V. Optical film thickness measuring device
EP1564572A4 (en) * 2002-11-01 2007-02-07 Omron Tateisi Electronics Co OPTICAL MULTIPLEXER / DEMULTIPLEXER AND METHOD FOR PRODUCING OPTICAL MULTIPLEXER / DEMULTIPLEXER
CN100422777C (en) * 2002-11-01 2008-10-01 欧姆龙株式会社 Optical combiner and demultiplexer and method for manufacturing optical combiner and demultiplexer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5392123A (en) * 1991-09-06 1995-02-21 Eastman Kodak Company Optical monitor for measuring a gap between two rollers
US5581351A (en) * 1994-02-22 1996-12-03 Eastman Kodak Company Optical monitor for measuring thermal expansion of a rotating roller
EP1069401A1 (en) * 1999-07-13 2001-01-17 ODME International B.V. Optical film thickness measuring device
EP1564572A4 (en) * 2002-11-01 2007-02-07 Omron Tateisi Electronics Co OPTICAL MULTIPLEXER / DEMULTIPLEXER AND METHOD FOR PRODUCING OPTICAL MULTIPLEXER / DEMULTIPLEXER
CN100422777C (en) * 2002-11-01 2008-10-01 欧姆龙株式会社 Optical combiner and demultiplexer and method for manufacturing optical combiner and demultiplexer

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